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Analytical and Instrumentation Science Symposia

A01 Vendor Symposium: New Tools for Life and Materials Sciences

The Biodynamic Microscope: Doppler Imaging inside Living 3D Biological Tissues; D Nolte, R An, J Turek; Animated Dynamics Inc [4]

Field-portable Nano-imaging: A New Tool for On-Demand Microscopy; CS Own, MF Murfitt, LS Own; Voxa [5]

Automated, Programmable Processing of Specimens and Grids with the mPrepª ASP-1000; TE Strader, SL Goodman; Microscopy Innovations LLC [6]

Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High- Sensitivity Nano-Analytics; T Wirtz, D Dowsett, S Eswara-Moorthy; Luxembourg Institute of Science and Technology [7]

Mastering the Multi-scale Challenge: A Modern Correlation Environment; AP Merkle, L Lechner, A Steinbach, J Gelb; Carl Zeiss X-ray Microscopy, Inc; F Perez-Willard; Carl Zeiss Microscopy GmbH; D Unrau, MW Phaneuf; Fibics Incorporated [8]

RISE Microscopy: Correlative Raman and SEM Imaging; U Schmidt, O Hollricher; WITec GmbH; W Liu; WITec Instruments; EL Principe; Tescan USA [9]

337

New Developments in Automated Particle Analysis in the Electron Microscope Ð from Micro to Nano;C Lang, M Hiscock, J Holland; Oxford Instruments Nanoanalysis; S Yamaguchi; OIKK; D Joyce, G Vatougia; Mantis Deposition Ltd [169]

339

STEM-EDXS System for Atomic-Sensitivity Elemental Mapping; TC Lovejoy, RM Stroud; Nion;ND Bassim; Naval Research Lab; GJ Corbin, N Dellby; Nion; W Hahn, M Falke; Bruker Nano GmbH, O Krivanek; Nion et al [170]

341

Aberration Correction System Using Segmanted Detector in STEM; Y Kohno, H Sawada; JEOL Ltd;N Shibata; Institute of Engineering Innavation, School of Engineering, The University of Tokyo [171]

343

From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging; H Guo, L Jin; Direct Electron, LP; P Lu, Z Wang, Z Shan; Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, XiÕan Jiaotong University; B Bammes, M Spilman, R Bilhorn; Direct Electron, LP [172]

701

Imaging Contrast with Multiple Ion Beams; H Wu, S Sijbrandij, S McVey, J Notte; Carl Zeiss Microscopy LLC [173]

347

The Ultra-stable Scanning Transmission Electron Holography Microscope; RA Herring, D Hoyle; University of Victoria [174]

147

Application of a semi-in-lens FE-SEM to the crystallographic analysis with the EBSD technique; H Ito, Y Hashimoto, S Takeuchi, M Sasajima, H Sato; Hitachi High-Technologies Corporation; H Morita; Oxford Instruments [74]

149

Optimized Solutions for the Arrangement of Digital Imaging Detectors; T Hashimoto, J Mancuso,K Nakano, E Nakazawa; Hitachi High-Technologies Corporation; L Blubaugh, B Armbruster; Hitachi High Technologies America, Inc [75]

151

Cooling Temperature Control System for the Cross Section Polisher; S Kataoka, M Kozuka; IB Business Unit, JEOL Ltd; T Wakasa; SASM Design, JEOL Ltd; K Todoroki, T Kasai, T Negishi, M Matsusita,T Suzuki; IB Business Unit, JEOL Ltd et al [76]

153

Correlative SEM and Raman imaging of hot spots on SERS substrate; R V‡_a, M Kocman, J Jiru_e; TESCAN Brno s r o [77]

155

Electron Diffraction Phase Analysis and Pattern Simulations Using the ICDD Powder Diffraction File (PDF-4+); S Gates, K Zhong, T Blanton, J Blanton; International Centre for Diffraction Data [78]

157

Reel-to-Reel Electron Microscopy: Latency-Free Continuous Imaging of Large Sample Volumes; CS Own, MF Murfitt, LS Own; Voxa; D Brittain, N de Costa, RC Reid; Allen Institute for Brain Science; DG Hildebrand, B Graham; Harvard Medical School et al [79]

159

The New Zeiss GeminiSEM 500 Meets the Needs of Challenging Biological Applications; I Angert,C Berger, M Edelmann, R Kirmse, A Thesen; Carl Zeiss Microscopy GmbH; K Czymmek; Carl Zeiss Microscopy, LLC [80]

161

Effective new Plasma Cleaning Strategies for Scanning Electron Microscopes and FIBs; RA Vane, ML Cable; XEI Scientific Inc [81]

163

Ease of Use Solution for Fast and Automated TEM-Lamella Preparation; T Volkenandt, G Pavia, I Schulmeyer, M Kienle; Carl Zeiss Microscopy GmbH [82]

165

Correlative Light and Electron Microscopy for Materials Science; JL Riesterer, G Heiss; FEI Company [83]

167

Setup and Practical Applications of a pnCCD Based XRF System; JM Davis, J Schmidt;PNDetector GmbH; M Huth, S Ihle, D Steigenhšfer, P Holl, G Lutz; PNSensor GmbH, U Weber; PNDetector et al [84]

169

Electrical Probing and Current Imaging for Failure Analysis in the SEM/FIB; AJ Smith, A Rummel, M Kemmler, K Schock, G Renka, S Kleindiek; Kleindiek Nanotechnik [85]

171

Principal Component Analysis in EDS; DL West; Thermo Fisher Scientific [86]

173

A Software for Lab Access and Chemical Process Logging in Shared Facilities; S Li, F Camino; FOM Networks, Inc [87]

A02 TEM Phase Contrast Imaging

1385

Electron beam-induced charging and modifications of thin films; M Malac, M Beleggia; Nat Inst for Nanotechnology; T Rowan; University of British Columbia; RF Egerton; University of Alberta;M Kawasaki; JEOL USA Inc; Y Okura; JEOL Ltd; RA McLeod; Fondation Nanosciences [692]

1389

Comparison of Cryo TEM Images Obtained with Zernike and Hole-Free Phase Plates; N Hosogi, H Iijima, A Sen; JEOL Ltd [693]

1391

Practical Aspects and Usage Tips for the Volta Phase Plate; R Danev, B Buijsse, M Khoshouei, Y Fukuda, W Baumeister; Max Planck Institute of Biochemistry [694]

1393

Combination of Different Techniques in Cryo-Electron Tomography with a Volta Phase Plate;M Khoshouei, G Gerisch, M Ecke, J Ortiz; Max-Planck Institute of Biochemistry; J Plitzko;Max-Planck Institue of Biochemistry; R Danev; Max-Planck Institute of Biochemistry; W Baumeister; Max-Planck Institue of Biochemistry [695]

1833

Automated cryo electron tomography and sub-tomogram averaging with the FEI Volta phase plate;WJ Hagen; European Molecular Biology Laboratory [915]

1835

In situ studies of cellular architecture by Electron Cryo-Tomography with Volta Phase Plate; Y Fukuda, S Asano, U Laugks, F Beck, A Aufderheide, F Fšrster, V Lu_i_, W Baumeister; Max Planck Institute of Biochemistry et al [916]

1837

Applications and New Investigations of the Volta Phase Plate; K Sader, B Buijsse; FEICompany; I Peschiera; Novartis Vaccines, Structural Microscopy; F Novartis Vaccines, Structural Microscopy [917]

2141

Zernike Phase Contrast Electron Microscopy: Observation of the Image Formation and Improvement of the Image Quality using Direct Detector; K Murata, N Miyazaki; National Institute for Physiological Sciences; K Nagayama; The Graduate University for Advanced Studies (SOKENDAI) [1069]

2143

Zernike Phase Plate Configuration at Intermediate Lens Position on JEM2200FS; W Chiu, C Fu, H Khant; Baylor College of Medicine; S Motoki; JEOL [1070]

2145

Zernike cryo-EM with a direct electron camera enables tracking protein conformations in the temporal dimension; W-H Chang; Institute of Chemistry, Academia Sinica [1071]

2297

Use of Ultrananocrystalline Diamond as a Phase-contrast Aperture Material; RM Glaeser,D Larson; University of California, Berkeley; B Muddiman, S Sassollini, S Cabrini, J Jin; University of California [1147]

2299

Evolution of Magnetic Ring Designs for Phase Plates; CJ Edgcombe; University of Cambridge, UK [1148]

2301

Development of Phase Contrast Scanning Transmission Electron Microscopy and its application; H Minoda, T Tamai; Tokyo University of Agriculture and Technology; H IIjima, K Yukihito; JEOL Ltd [1149]

2303

High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors; H Yang, L Jones; University of Oxford; H Ryll; PNSensor GmbH; M Simson, H Soltau; PNDetector GmbH; Y Kondo; JEOL Ltd; TJ Pennycook; University of Vienna, PD Nellist; University of Oxford et al [1150]

2305

Electron beam shaping; R Shiloh, R Remez; Tel Aviv University; A Arie; Tel-Aviv University [1151]

1573

Development of Amorphous Carbon Thin Film Phase Plate; Y Konyuba, H Iijima, N Hosogi;JEOL Ltd; Y Abe; Yamagata Research Institute of Technology; I Ishikawa, Y Ohkura; JEOL Ltd [785]

1575

Thin-Film-Based Phase Plates for Transmission Electron Microscopy Fabricated From Metallic Glasses; M Dries, S Hettler, T Schulze, W Send, E MŸller, R Schneider, D Gerthsen; Karlsruher Institut fŸr Technologie/Laboratorium fŸr Elektronenmikroskopie, Y Luo; UniversitŠt Gšttingen/IPhysikalisches Institut et al [786]

1577

Optimization of JEM2200FS for Zernike Phase Contrast Cryo-EM; HA Khant, C Fu; Baylor College of Medicine; S Motoki; JEOL; MH Sullivan, G DeRose; California Institute of Technology; W Chiu; Baylor College of Medicine [787]

1579

Initial Experience with the Volta Phase Plate; M Marko, C Hsieh; Wadsworth Center [788]

1581

High-Resolution Transmission Electron Microscopy With Zach Phase Plate; S Hettler, M Dries, T Schulze; Karlsruhe Institute for Technology - Laboratory for Electron Microscopy; M Oster,C Wacker, RR Schršder; BioQuant CellNetworks - University of Heidelberg; D Gerthsen; Karsruhe Institute for Technology - Laboratory for Electron Microscopy [789]

1941

Another Phase Plate in the Zoo: Reducing Charging and Optimizing the Design of Electrostatic Phase Plates; A Walter, S Steltenkamp; Lawrence Berkeley National Laboratory, National Center for X-ray Tomography; D Rhinow, W KŸhlbrandt; Max Planck Institute of Biophysics [969]

1943

Development of Phase Contrast Scanning Transmission Electron Microscopy; H Iijima, H Minoda; JEOL Ltd; T Tamai; Tokyo University of Agriculture and Technology; F Hosokawa, T Fukuda,Y Kondo; JEOL Ltd [970]

1945

Electron Differential Phase Microscopy with an A-B Effect Phase Plate; H Niimi, J Usukura, Y Yamamoto; Nagoya University; S Ohta; JEOL Ltd [971]

1947

Lorentz Transmission Electron Microscopy for Imaging Magnetic Fields from a Perpendicular Ferromagnetic Stripe Domain Thin Film; TR Kim, O Hellwig, R Sinclair; Stanford University [972]

1949

Fabrication of Self-Supporting Annular Apertures for Use in the Transmission Electron Microscope;L YU, A Johnston-Peck, A Herzing, V Luciani; National Institute of Standards and Technology [973]

A03 Electron Holography for Nanofields in Solids

1395

Electron Holography for Measuring Electrostatic Potentials and Strain Fields; M Lehmann; Technische UniversitŠt Berlin, Institut fŸr Optik und Atomare Physik, Sekr ER 1-1 [696]

1397

Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography; Z Gan, M Gu; Arizona State University; J Tang; University of California at Los Angeles; C-Y Wang; National Taiwan University of Science and Technology; KL Wang; Universityof California at Los Angeles; C Wang; Pacific Northwest National Laboratory; DJ Smith, MR McCartney; Arizona State University [697]

1399

Aberration Corrected Off-Axis Electron Holography of Layered Transition Metal Dichalcogenides; AH Tavabi, F Winkler; Ernst Ruska- Centre for Microscopy and Spectroscopy with Electrons and Peter GrŸnberg Institute 5, Forschungszentrum JŸlich; Y-C Lin; National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan; K Suenaga; National Institute of Advanced Industrial Science and Technology (AIST); E Yucelen; FEI Company; RE Dunin-Borkowski; Ernst Ruska- Centre for Microscopy and Spectroscopy with Electrons and Peter GrŸnberg Institute 5, Forschungszentrum JŸlich; B Kardynal; Peter GrŸnberg Institute 9, Forschungszentrum JŸlich, Germany [698]

1401

In Situ Electron Holography of Ferroelectric Thin Films; M-G Han, MS Marshall, L Wu; Brookhaven National Laboratory; FJ Walker, CH Ahn; Yale University; Y Zhu; Condensed Matter Physics Materials Science [699]

2147

Off-axis electron holography for the quantitative study of magnetic properties of nanostructures: from the single nanomagnet to the complex device; C Gatel, A Masseboeuf, E Snoeck; CEMES-CNRS;FJ Bonnilla, T Blon, L-M Lacroix, A Meffre; LPCNO, INSA, University of Toulouse, JF Einsle; Centre for Nanostructured Media, School of Mathematics and Physics, QueenÕs University Belfast et al [1072]

2149

Three-Dimensional Magnetic Vortex Cores Visualized by Electron Holographic Vector Field Tomography; T Tanigaki, Y Takahashi, T Shimakura, T Akashi, R Tsuneta, A Sugawara; Central Research Laboratory, Hitachi, Ltd; D Shindo; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University [1073]

2151

Towards Multiresolution Phase Retrieval using Electron Ptychography; C Phatak, Y Nashed, T Peterka; Argonne National Laboratory [1074]

2153

Skyrmion lattices observed by high-voltage holography electron microscopes; HS Park; Dong-A University [1075]

2307

A Phase Space Perspective on Electron Holography - Building Bridges Between Inline-, Off-axis Holography, Differential Phase Contrast and Diffractive Imaging; A Lubk, F Ršder, H Lichte; Triebenberg Laboratory, Institute of Structure Physics, Technische UniversitŠt Dresden [1152]

2309

Lorentz-STEM imaging of Fields and Domains using a High-Speed, High-Dynamic Range Pixel Array Detector at Atomic Resolution; KX Nguyen, RM Hovden, MW Tate, P Purohit, JT Heron; Cornell University; CS Chang; Cornell Unviersity; SM Gruner, DA Muller; Cornell University [1153]

2311

Hybrid Electron Holography; C Ozsoy Keskinbora, CB Boothroyd; MPI-IS; RE Dunin Borkowski; Forschungszentrum Julich; PA van Aken; MPI-IS; CT Koch; Ulm University [1154]

2313

Interface Magnetism Studied by Electron Holography with Multiple-biprisms; Y Murakami; Tohoku University [1155]

1951

Low Dose Electron Holography: First Steps; E Voelkl, R Herring; Hitachi High Technologies America, Inc; B Bammes; Direct Electron, LP; D Hoyle; Hitachi High-Technologies Canada Inc [974]

1953

A Practically Simple and Easy Approach for Minimizing the Influence of Fresnel Fringes on Phase Sensitivity Measured from Electron Holography; Z Wang; Micron Technology, Inc [975]

1955

Optimising Electron Holography in the Presence of Partial Coherence and Instrument Instabilities with Conventional and Direct Detection Cameras; SL Chang, C Dwyer, J Barthel, CB Boothroyd,RE Dunin-Borkowski; Forschungszentrum JŸlich [976]

1957

Coherent Electron Interference of Diffracted Beams from Amorphous Materials; RA Herring; University of Victoria [977]

1959

Three dimensional magnetic field reconstruction of artificial Skyrmion heterostructures; S Zhang, A Petford-Long, C Phatak; Argonne National Laboratory [978]

1961

Spin-Multislice applied to the electron spin interaction with materials; V Grillo, S Alexander; CNR-Istituto Nanoscienze, Centro S3; J Rusz, A Edstršm; Uppsala University; A Lubk;Triebenberg Laboratory, TU Dresden; BJ McMorran; University of Oregon; E Karimi; University of Ottawa [979]

1963

Nanoscale strain distributions in embedded SiGe semiconductor devices by precession electron diffraction and dual lens dark field electron holography; D Cooper, J Rouviere; CEA LETI MINATEC Campus; C Murray; IBM Watson Research Center; J Bruley; IBM; N Bernier; CEA LETI MINATEC Campus [980]

1965

Strain Measurement through the Thickness of Crystal using DBI; M Norouzpour, RA Herring; University of Victoria [981]

1967

Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations; J Li, P Morin; IBM; Q Liu; STMicroelectronics; K Cheng; IBM; N Loubet; STMicroelectronics; B Doris, J Gaudiello; IBM [982]

1969

Electrostatic-Potential Analysis of Charged Particles by Split-Illumination Electron Holography; T Tanigaki, Z Akase; Central Research Laboratory, Hitachi, Ltd; S Aizawa; Center for Emergent Matter Science (CEMS), RIKEN; HS Park; Dong-A University; Y Murakami, D Shindo; Tohoku University; H Kawase; Ricoh Institute of Technology, RICOH Co , Ltd [983]

1971

Crystalline phase mapping associated to the magnetic flux in cobalt nanowires; A Ponce, BJ Stadler,F Ruiz Zepeda, F Mendoza Santoyo; University of Texas at San Antonio; MM Maqableh; University of Minnesota; I Betancourt; University of Texas at San Antoni; J Cantu Valle, JE Sanchez; University of Texas at San Antonio [984]

1973

New Quantitative Phase Reconstruction Technique using Hollow-cone Probe and Annularly Arrayed Detectors in STEM; T Ishida, T Kawasaki, T Tanji; Nagoya University; T Ikuta; Osaka Electro- Communication University [985]

1975

Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM; H Sasaki, S Otomo, R Minato; Furukawa Electric Ltd; K Yamamoto, K Yamamoto; Nanostructure Research Laboratory, Japan Fine Ceramics Center; J Yamasaki; Osaka University; N Shibata; Institute of Engineering Innovation, The University of Tokyo [986]

1977

Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures; C Phatak, A Masseboeuf; Argonne National Laboratory; L de Knoop, C Gatel, M Hytch; CEMES-CNRS [987]

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

1403

The Perfect Cut: Focused Ion Beam Preparation for In Situ TEM; ML Taheri; Drexel University [700]

1405

In-Situ EDS Characterization of TEM Lamellae Created by Xe Plasma FIB; T Hrn_’_, C Lang, JV Obo_a; TESCAN Brno s r o; T Bartak; Oxford Instruments [701]

1407

Vacuum Assisted ex situ Lift Out of FIB Prepared Specimens; LA Giannuzzi, D Hess; EXpressLO LLC; T Clark; The Pennsylvania State University [702]

1409

Focused Ne+ Ion Beams for Final Polishing of TEM Lamella Prepared Through Ga-FIB Systems; D Wei, C Huynh; Ion Microscopy Innovation Center, Carl Zeiss Microscopy, LLC; A Ribbe; University of Massachusetts, Amherst [703]

1411

Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries; M Presley, D Huber, HL Fraser; The Ohio State University [704]

1839

A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation;J Huang, M Loeffler; Dresden Center for Nanoanalysis, Technische Universitaet Dresden; U Muehle; Fraunhofer Institute for Ceramic Technologies and Systems; W Moeller; Helmholtz-Zentrum Dresden-Rossendorf; H Mulders, L Kwakman; FEI Company; E Zschech; Dresden Center for Nanoanalysis, Technische Universitaet Dresden [918]

1841

Probe Optimization Studies For High current Focused Ion Beam Instruments; S Subramaniam, J Richards, K Johnson; Intel Corporation [919]

1843

Methodology for Studying Nanoscale Details of Focused Ion Beam Gas-Assisted Etching and Deposition by TEM and Numerical Modeling; V Ray, E Chang, K Toula, S-C Liou, W-A Chiou; University of Maryland [920]

1845

Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics;AW Sanders, AE Fox, PD Dresselhaus; NIST [921]

1847

In situ Femtosecond Laser and Argon Ion Beams for 3D Microanalysis using the TriBeam; MP Echlin, WC Lenthe; University California Santa Barbara; J Douglas, M Titus; UCSB; R Geurts, M Straw; FEI Company; TM Pollock; UCSB [922]

2155

Roles of Self-Assembly and Beam Damage in Gas-Assisted Electron and Ion Beam Induced Processing;M Toth; University of Technology [1076]

2157

Site-Specific TEM Specimen Preparation of Samples with Sub-Surface Features; J Deitz, S Carnevale, D McComb; The Ohio State University; S Ringel; The Ohio State Univeristy; T Grassman; The Ohio State University [1077]

2159

Micro-micromechanical Properties of Weld Metal; AK Basak, WL Costin; Adelaide Microscopy [1078]

2161

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/ SEM and TEM; JA Taillon, C Pellegrinelli, Y Huang, E Wachsman, L Salamanca-Riba; University of Maryland [1079]

2315

A Cryo-FIB Lift-Out Procedure for Cryo-TEM Sample Preparation at Soft-Hard Matter Interfaces;K Leifer; Uppsala University [1156]

2317

Temporospatial Relationship of Lipid Droplets and Mitochondria in Cardiac Muscle by Focused Ion Beam Scanning Electron Microscopy; T Chou, C Sztalryd-Woodle; Stevens Institute of Technology; R-C Hsia; University of Maryland Baltimore [1157]

2319

SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics;T Wirtz, D Dowsett, P Philipp, J-N Audinot, S Eswara-Moorthy; Luxembourg Institute of Science and Technology [1158]

2321

Application of Focused Helium Ion Beams for Direct-write Lithography of Superconducting Electronics;SA Cybart, EY Cho, BH Wehlin, MK Ma, TJ Wong, RC Dynes; University of California San Diego; C Huynh; Carl Zeiss Microscope, LLC [1159]

1979

Progression of Focused Helium Ion Beam Milling in Gold Substrates; EM Mutunga, S Tan; University of Tennessee, Knoxville; A Vladar; National Institute of Standards and Technology; K Klein; University of the District of Columbia [988]

1981

Investigation of Ar ion-milling rates for transmission electron microscopy specimens; MH Lee, K-H Kim; Korea Institute of Industrial Technology (KITECH) [989]

1983

Focused Ion Beam Micromachining Enables Novel Optics for X-ray Microscopy; K Keskinbora, UT Sanli, C GrŽvent, M Hirscher, G SchŸtz; Max Planck Institute for Intelligent Systems [990]

1985

In Situ Probing Biological Structures by Combining Focused Ion Beam and Atomic Force Microscopy;B Liu, V Adineh, J Fu; Monash University [991]

1987

Multilayer Fresnel Zone Plates for X-ray Microscopy; UT Sanli, K Keskinbora, C GrŽvent; Max Planck Institute for Intelligent Systems; A Szeghalmi; Friedrich-Schiller-UniversitŠt Jena Institut fŸrAngewandte Physik; M Knez; CIC nanoGUNE, San Sebastian and IKERBASQUE Basque Foundation for Science, Spain; G SchŸtz; Max Planck Institute for Intelligent Systems [992]

1989

FIB-assisted TEM Sample Preparation Refinement Using TRIM Simulations; BD Gauntt, AL Sutor; Intel Corporation [993]

1991

Utilization of FIB Technique in TEM Specimen Preparation of GaN-based Devices for Dislocation Investigation; J-G Zheng, Z Shao; University of California at Irvine; D Chen; Nanjing University [994]

1993

Nano and Microscale Patterning on Soft Matters with Ion Beam Irradiation; Y Kim, J Huang, AY Abuelfilat, J Fu; Monash University [995]

1995

Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns; J Jiru_e, M Havelka, J Polster, T Hrn_’_; TESCAN Brno s r o [996]

1997

Superconducting Nano Wire Circuits Fabricated using a Focused Helium Beam; EY Cho, MK Ma; University of California, San Diego; C Huynh; Carl Zeiss Microscopy, LLC; RC Dynes, SA Cybart; University of California, San Diego [997]

1999

Manipulations of Submicro-fibers of Culex Pipiens with the Help of Nano-tweezers with Shape Memory Effect into Vacuum _hamber of FIB; A Kamantsev, A Mashirov, P Mazaev, V Koledov, V Shavrov; Kotelnikov Institute of Radio-engineering and Electronics of RAS [998]

2001

Advantages of using Plasma FIB over a Gallium LMIS source; BW Arey, DE Perea, L Kovarik, J Liu; EMSL- PNNL-Battelle; O Qafoku, AR Felmy; PNNL-Battelle; R Kelley, T Landin; FEI Company et al [999]

2003

Large Volume 3D Characterization by Plasma FIB DualBeam Microscopy; T Burnett, R Kelley; University of Manchester [1000]

A05 Fast and Ultrafast Imaging with Electrons and Photons

483

Direct Observations of Photoexcitation Induced Dynamics of Charge Density Wave and Charge- Orbital Ordered State Using 2.8 MeV Ultrafast Electron Diffraction; Y Zhu, P Zhu, L Wu, J Li, T Konstantinova; Brookhaven National Laboratory; J Cao; Florida State University; Y Hidaka; Brookhaven National Laboratory, X Wang; SLAC National Accelerator Laboratory et al [242]

485

Pump-probe x-ray holographic imaging of dynamic magnetization processes down to the femtosecond timescale; S Eisebitt; Institut fŸr Optik und Atomare Physik, Technische UniversitŠt Berlin [243]

487

Probing ultrafast carrier dynamics by laser-combined STM; H Shigekawa, S Yoshida, O Takeuchi; Faculty of pure and applied sciences, University of Tsukuba [244]

649

Magnetic dynamics studied by time-resolved electron microscopy; F Carbone; EPFL [325]

651

Toward Ultrafast Electron Microscope with Femtosecond Temporal Resolution, Atomic-Level Spatial Resolution, and Single-Shot Imaging Capability; K Tanimura; The Institute of Scientific and Industrial Research, Osaka University [326]

653

RF Photoinjector Based Time-Resolved MeV Electron Microscopy; P Musumeci; UCLA [327]

655

Ultrafast Lattice Dynamics of Granular L10 Phase FePt Measured by MeV Electron Diffraction; AH Reid, X Shen; Stanford Institute for Materials and Energy Science, SLAC National Accelerator Laboratory; RK Li; SLAC National Accelerator Laboratory [328]

1203

Ultrafast transmission electron microscopy with nanoscale photoemitters; A Feist, K Echternkamp, J Schauss, SV Yalunin, S SchŠfer, C Ropers; University of Gšttingen [601]

1205

Observing Liquid Flow in Nanotubes; UJ Lorenz, AH Zewail; California Institute of Technology [602]

1207

Ultrabright Femtosecond Electron Sources: Ultrafast Structural Dynamics in Labile Organic Crystals;G Sciaini; University of Waterloo [603]

1209

Development of MeV Ultrafast Electron Scattering Instruments at SLAC National Accelerator Laboratory; R Li; SLAC National Accelerator Laboratory [604]

1413

Nanoscale Probes in Ultrafast Transmission Electron Microscopy; A Yurtsever; Centre Energie, MatŽriaux et TŽlŽcommunications, Institut National de la Recherche Scientifique (INRS) [705]

1415

Infrared Pump-Probe Spectroscopy of Plasmons in Graphene and Semiconductors; M Wagner; University of California San Diego [706]

1417

Ultrafast Plasmonic Forces Imposed by Fast Electrons on Metal Particles; MJ Lagos, A Reyes- Coronado; Rutgers University; A Konecna, P Echenique, J Aizpurua; Donostia International Physics Center; P Batson; Rutgers University [707]

1419

Photonic Processes Visualized with Electrons in Photoemission Electron Microscopy (PEEM);R Kšnenkamp, RC Word; Portland State University; JP Fitzgerald; Portland State University, [708]

1849

Using Ultrafast X-ray Lasers to Image Structure Dynamics; S Boutet; SLAC National Accelerator Laboratory [923]

1851

Studying Shocked Material Dynamics with Ultrafast X-ray Sources; RL Sandberg; Los Alamos National Laboratory [924]

1853

Imaging Irreversible Transformations with Movie-Mode Dynamic Transmission Electron Microscopy; JT McKeown, MK Santala, T Li, JD Roehling, GH Campbell; Lawrence Livermore National Laboratory [925]

1855

Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films; TT Li, MK Santala, LB Bayu Aji; Lawrence Livermore National Laboratory; H-YM Cheng; IBM/Macronix PCRAM Joint Project, IBM T J Watson Research Center; SO Kucheyev, GH Campbell; Lawrence Livermore National Laboratory [926]

2163

Ultrafast Infrared Nanoscopy with Sub-Cycle Temporal Resolution; TL Cocker, M Eisele, MA Huber, M Plankl; University of Regensburg; L Viti; Istituto Nanoscienze and Scuola Normale Superiore;D Ercolani, M Vitiello, R Huber; et al [1080]

2165

Lensless imaging of nano- and meso-scale dynamics with x-rays; JN Clark; Stanford PULSE Institute [1081]

2167

High-Resolution Phase-Contrast Imaging at XFELs; A Schropp, R Hoppe; DESY Hamburg; V Meier,J Patommel, F Seiboth; Technische UniversitŠt Dresden; HJ Lee, B Nagler, EC Galtier; SLAC National Accelerator Laboratory et al [1082]

2169

Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis; A Liebel, G Lutz, U Weber, A Niculae, H Soltau; PNDetector GmbH [1083]

2323

Materials processes observed using dynamical environmental TEM at University of Illinois; J-M Zuo, A Yoon; University of Illinois; W Gao, J Wu; Univ of Illinois; H Park; University of Illinois [1160]

2325

Strain mapping during in-situ deformation using a high-speed electron detector; C Gammer, J Kacher; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory; J Ciston; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory; C Czarnik4; Gatan, Inc; OL Warren; Hysitron, Inc; AM Minor; National Center for Electron Microscopy Molecular Foundry Lawrence Berkeley National Laboratory [1161]

2327

Fast imaging of carbon nanotube carpet growth by environmental TEM; DN Zakharov, M Bedewy; Center for Functional Nanomaterials, Brookhaven National Laboratory; V Balakrishnan,SW Pattinson; The Laboratory for Manufacturing and Productivity, Massachusetts Institute of Technology; ER Meshot; Lawrence Livermore National Laboratory; JA Hart; The Laboratory for Manufacturing and Productivity, Massachusetts Institute of Technology; AS; PO Box 5000 [1162]

2329

Compression Algorithm Analysis of In-Situ (S)TEM Video: Towards Automatic Event Detection and Characterization; JR Teuton, RL Griswold, BL Mehdi, ND Browning; Pacific Northwest National Laboratory [1163]

805

Effects of Quantized, Transient Chromatic Aberrations in Ultrafast Electron Microscopy; DA Plemmons, AJ McKenna, DJ Flannigan; University of Minnesota [403]

807

Effects of Electron-Gun and Laser Parameters on Collection Efficiency and Packet Duration in Ultrafast Electron Microscopy; E Kieft, KB Schliep; FEI; PK Suri, DJ Flannigan; University of Minnesota [404]

809

Ultrafast point projection electron microscopy; P Shakya, B Barwick; Trinity College [405]

811

Quantitative Determination of Thermal Fields and Transformation Rates in Rapidly Solidifying Aluminum by Numerical Modeling and In-situ TEM; C Liu, K Zweiacker; University of Pittsburgh; JT McKeown; Materials Science Division, Lawrence Livermore National Laboratory; T LaGrange, BW Reed; Integrated Dynamic Electron Solutions, Inc; GH Campbell; Materials Science Division, Lawrence Livermore National Laboratory; JM Wiezorek; University of Pittsburgh [406]

1583

TEM Video Compressive Sensing; A Stevens, L Kovarik; Duke University ECE; P Abellan; Pacific Northwest National Laboratory; X Yuan, L Carin; Duke University ECE; ND Browning; Pacific Northwest National Laboratory [790]

1585

Imaging At the Timescale of Micro- And Milliseconds With the pnCCD (S)TEM Camera; H Ryll,M Simson; PNSensor GmbH; M Den Hertog; Institut NŽel-CNRS; R Dunin-Borkowski; Ernst Ruska- Centre , Peter GrŸnberg Institute, Forschungszentrum JŸlich; K El Hajraoui; Institut NŽel-CNRS;V Migunov; Ernst Ruska-Centre , Peter GrŸnberg Institute, Forschungszentrum JŸlich; H Soltau; PNDetector GmbH, L StrŸder; PNSensor GmbH et al [791]

1587

NO2 Hydrogenation over Pt and Rh Catalysts: a Study at The Atomic Level by Field Emission Microscopy; C Barroo, Y De Decker; Harvard University; T Visart de BocarmŽ; UniversitŽ libre de Bruxelles (ULB); N Kruse; Washington State University [792]

1589

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime; TA Stenmark, RC Word, R Kšnenkamp; Portland State University [793]

1591

Characterization of Laser Ablation Dynamics for Nickel Thin Films on Silicon Using Movie Mode Dynamic TEM; S Hihath, M Santala; University of California Davis; G Campbell; Lawrence Livermore National Laboratory; K van Benthem; University of California Davis [794]

A06 Advanced Analytical TEM/STEM

489

Advanced Analytical Electron Microscopy: New Perspectives on Real Materials; MG Burke, SJ Haigh, J Lim, A Janssen; University of Manchester [245]

491

Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy; WJ Bowman, A Darbal; School for the Engineering of Matter, Transport and Energy, Arizona State University; M Kelly, GS Rohrer; Materials ResearchScience and Engineering Center, Carnegie Mellon University; CA Hernandez, K McGuinness, PA Crozier; School for the Engineering of Matter, Transport and Energy, Arizona State University [246]

493

Super-X EDS Characterization of Chemical Segregation within a Superlattice Extrinsic Stacking Fault of a Ni- based Superalloy; RE Williams, T Smith, BD Esser, N Antolin, W Windl, DW McComb,MJ Mills, HL Fraser; The Ohio State University [247]

495

Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices; PJ Phillips, P Longo; University of Illinois at Chicago; E Okunishi; JEOL EM Application Group; RF Klie; University of Illinois at Chicago [248]

497

Oxygen Intercalation and Doping-Induced 2D High-Tc Superconductivity at the CaCuO2/SrTiO3 Interface; C Cantoni, D Di Castro; Oak Ridge National Laboratory; G Balestrino; Universitˆ di Roma Tor Vergata [249]

657

High Spatial/Energy Resolution Band Gap Measurements: Delocalization and Other Effects in a Monochromated Cold FEG Nion Dedicated STEM; RW Carpenter, H Xie, T Aoki, F Ponce; Arizona State University [329]

659

Avoidance of Radiation Damage in Vibrational-Mode Energy-Loss Spectroscopy; RF Egerton, P Rez; University of Alberta; PA Crozier; Arizona State University [330]

661

Hydrogen Analysis by Ultra-High Energy Resolution EELS; H Cohen, P Rez; Weizmann Institute of Science; T Aoki; Center for Solid State Science; PA Crozier; School for Engineering of Matter, Transport and Energy; N Dellby; Nion Co; D Gur; Structural Biology; TC Lovejoy, OL Krivanek; Nion Co et al [331]

663

Applications of Plasmon Energy Expansion Thermometry; MH Mecklenburg, WA Hubbard; University of Southern Califronia; ER White; University of California Los Angeles; R Dhall, S Cronin; University of Southern California; S Aloni; Molecular Foundry, LBNL; BC Regan; University of California Los Angeles [332]

665

Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors; M Bugnet, G Radtke; McMaster University; S Lšffler, P Schattschneider; Vienna University of Technology;D Hawthorn; University of Waterloo; GA Sawatzky; University of British Columbia; GA Botton; McMaster University [333]

1075

What Does Quantitative Mean In Atomic-Resolution EDS STEM?; NR Lugg, G Kothleitner, B Feng, N Shibata, Y Ikuhara; Institute of Engineering Innovation, School of Engineering, The University of Tokyo [537]

1077

Channelling and atomic resolution STEM using X-ray emissions with absorption; CJ Rossouw; Monash University [538]

1079

Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy; Z Chen, AJ DÕAlfonso, M Weyland, DJ Taplin, SD Findlay; Monash University; LJ Allen; University of Melbourne [539]

1081

Theoretical Evaluation of Atomic-Resolution X-ray Analysis toward Quantification; M Watanabe; Lehigh University [540]

1083

Quantitative EDS of Surface Modified Powders for Hydrogen Storage; JD Sugar, M Homer,PG Kotula; Sandia National Laboratories; PJ Cappillino; University of Massachusetts Dartmouth; M Ong; Whitworth University; DB Robinson; Sandia National Laboratories [541]

1211

Inconsistent Normalized Intensities for Quantitative STEM: Detector Scans and Single Electron Counting; X Sang, JM LeBeau; North Carolina State University [605]

1213

Quantitative Annular Dark-Field Imaging of Single-Layer Graphene; S Yamashita, S Koshiya; Kyushu University; K Ishizuka; HREM Research Inc; K Kimoto; National Institute for Materials Science [606]

1215

Improving the SNR of Atomic Resolution STEM EELS EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging; L Jones, R Beanland, S Lozano-Perez; University of Oxford; K Baba-kishi; Department of Applied Physics, Hong Kong Polytechnic University; PD Nellist; University of Oxford [607]

1217

Correction of Linear and Nonlinear Raster Distortion from Orthogonal Image Pairs; CT Nelson, AM Minor; Lawrence Berkeley National Laboratory [608]

1219

Ptychographic Imaging in an Aberration Corrected STEM; AR Lupini, M Chi, SV Kalinin, AY Borisevich, JC Idrobo, S Jesse; Oak Ridge National Laboratory [609]

1221

Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides; I MacLaren, H Yang; University of Glasgow; L Jones, PD Nellist; University of Oxford; H Ryll; PNSensor GmbH; M Simson, H Soltau; PNDetector GmbH, Y Kondo; JEOL Ltd et al [610]

1421

Global Analysis Peak Fitting Applied to EELS Images; MH Van Benthem, PG Kotula, M Marinella, WM Mook, KL Jungjohann; Sandia National Laboratories [709]

1423

Revisiting Noise Scaling for Multivariate Statistical Analysis; PG Kotula, MH Van Benthem; Sandia National Laboratories [710]

1425

When will low-contrast features be visible in a STEM X-ray spectrum image?; CM Parish; Oak Ridge National Laboratory [711]

1427

Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials; RM Stroud, TC Lovejoy; Naval Research Laboratory; M Falke; Bruker Nano GmbH; ND Bassim; Naval Research Laboratory; A Kaeppel; Bruker Nano GmbH; N Delby, P Hrncirik, O Krivanek; Nion, Co et al [712]

1429

Single atom detection through HAADF-STEM and EELS/EDX characterization of fluorophore Ru(bpy)32+ for optical DNA-chip applications; G Nicotra, E Sciuto; CNR-IMM; MF Santangelo; distretto Tecnologico Sicilia Micro e Nano Sistemi; G Villaggio, F Sinatra; Universitˆ degli studi di Catania; C Bongiorno, S Libertino; CNR-IMM [713]

1857

Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3/SrTiO3 interface; P Longo, T Topuria; Gatan, Inc; PM Rice; IBM Research Division; A Aitouchen, PJ Thomas, RD Twesten; Gatan, Inc [927]

1859

Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS; S Eswara-Moorthy, D Dowsett, L Yedra, T Wirtz; Luxembourg Institute of Science and Technology [928]

1861

Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope; T Sasaki, H Sawada, E Okunishi, Y Jimbo, Y Iwasawa, K Miyatake,S Yuasa, T Kaneyama; JEOL Ltd [929]

1863

STEM in 4 Dimensions: Using Multivariate Analysis of Ptychographic Data to Reveal Material Functionality; S Jesse, M Chi, AY Borisevich, A Belianinov, RR Unocic, RK Archibald, SV Kalinin, AR Lupini; Oak Ridge National Laboratory et al [930]

1865

Resolution Assessment of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope; Y Takahashi, T Akashi, T Shimakura, T Tanigaki, T Kawasaki, H Shinada, N Osakabe; Central Research Laboratory, Hitachi, Ltd [931]

1867

Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a conventional SEM Using an Off-the-Shelf Transmission Detector; J Holm, R Keller; National Institute of Standards and Technology [932]

2171

Analytical Electron Tomography: Methods and Applications; G Haberfehlner, A Orthacker; Graz Centre for Electron Microscopy and Nanoanalysis; FP Schmidt; Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology; A Hšrl; Institute of Physics, University of Graz;D Knez; Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology;A TrŸgler, U Hohenester; Institute of Physics, University of Graz, G Kothleitner; Graz Centre for Electron Microscopy and Nanoanalysis Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology [1084]

2173

Multi-Dimensional Machine Learning Aided Analysis of a Nickel-Based Superalloy; D Rossouw, R Krakow, Z Saghi, CS Yeoh, P Burdet, RK Leary, PA Midgley; University of Cambridge [1085]

2175

Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution; C Zheng, Y Zhu; Monash Centre for Electron Microscopy, Monash University; S Lazar; FEI Electron Optics; J Etheridge; Monash Centre for Electron Microscopy, Monash University [1086]

2177

Depth Sensitivity of Atomic Resolution Aberration-Corrected Through-Focus STEM Imaging of Bi Dopants on Cu Grain Boundaries; CA Wade, M Watanabe; Lehigh University [1087]

2179

Super-X XEDS STEM Tomography of Gamma Prime Precipitates in the LSHR Nickel Superalloy; SJ Kuhr, JM Sosa; Center for the Accelerated Maturation of Materials,The Ohio State University; DE Huber,HL Fraser; Center for the Accelerated Maturation of Materials, The Ohio State University [1088]

2331

A New Discrete Tomographic Reconstruction Method for Electron Tomography; I Arslan, T Sanders; Pacific Northwest National Laboratory; P Binev; University of South Carolina; BC Gates; University of California-Davis; A Katz; University of California-Berkeley [1164]

2333

Challenges and Opportunities in 3D Tri-gate Transistor Characterization; J Zhang, L Pan; Intel Corporation, Corporate Quality Network; AA Herzing; National Institute of Standards and Technology, Material Measurement Laboratory; R Twesten, P Longo; Gatan Inc; N Franco,K Johnson; Intel Corporation, Corporate Quality Network, Z Ma; Intel Corporation, Corporate Quality Network [1165]

2335

Robust Physical Alignment Models for Electron Tomography; T Sanders, M Prange, P Binev; University of South Carolina; C Akatay; UOP LLC, a Honeywell Company; I Arslan; Pacific Northwest National Laboratory [1166]

2337

Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy; T Dahmen, H Kohr, P Slusallek; German Research Center for Artificial Intelligence GmbH (DFKI); N de Jonge; INM Leibniz Institute for New Materials [1167]

2339

STEM-HAADF and Super-Xª XEDS Tomographic Reconstruction of Complex Nano-scale Precipitates in a High Entropy Alloy, AlMo0.5NbTa0.5TiZr; JK Jensen, JM Sosa, DE Huber, GB Viswanathan,RE Williams, HL Fraser; The Ohio State University [1168]

2341

Linear chemically sensitive electron tomography using DualEELS and compressed sensing;A Al Afeef, WP Cockshitt; University of Glasgow; P Barges, I Zuazo; ArcelorMittal Maizires Research; J Bobynko, AJ Craven, I MacLaren; University of Glasgow [1169]

813

Dynamical Effects on Atomic-Resolution Imaging and Diffraction of the Tetragonal and Orthorhombic Phases of LaFeAsO; PK Suri, J Yan; University of Minnesota; D Mandrus; University of Tennessee;F University of Minnesota [407]

815

Phase determination of black TiO2 nanoparticles; M Tian; University of Tennessee, Knoxville [408]

817

Scanning Transmission Electron Microscopy Investigation of the Structure of Multilayered Perpendicular Magnetic Tunnel Junctions; D Reifsnyder Hickey, KA Mkhoyan; University of Minnesota [409]

819

Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis; Z Chen, SD Findlay, M Weyland; Monash University; AJ DÕAlfonso, LJ Allen; University of Melbourne [410]

821

Algorithms for quantitative symmetry measurement and symmetry mapping using convergent beam electron diffraction; K-H Kim, J-M Zuo; Korea Institue of Industrial Technology [411]

823

Concentration at Detection Limit of Dopant for Semiconductor Samples Using Dual SDD Analysis System; K-I Fukunaga, N Endo; JEOL Ltd; M Suzuki; Thermo Fisher Scientific Japan; Y Kondo; JEOL Ltd [412]

825

Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra; F Eggert, PP Camus, A Sandborg; Edax; NJ Zaluzec; Electron Microscopy Center, NST Div, Argonne National Laboratory [413]

827

Materials Selection for Ultra-Thin Diamond-Like Carbon Film Metrology and Structural Characterization by TEM; GP Souza, KC Ruthe, L Chen, L Hong, H Wang; Western Digital Corporation [414]

829

STEM characterization of Gold-Copper anisotropic nanocrystals; LS Baz‡n-D’az, R Mendoza-Cruz, JJ Vel‡zquez-Salazar, U Santiago; The University of Texas at San Antonio; D Bahena; Laboratorio Avanzado de Nanoscopia Electr—nica, CINVESTAV zacatenco; M JosŽ-Yacam‡n; The University of Texas at San Antonio [415]

831

EFTEM Contrast Tuning and EELS Fine Structure Analysis for Characterization of Carbon Containing Ultra-Low-k Dielectric Materials; BI Prenitzer, S Schwarz, B Kempshall, I Rezadad; NanoSpective [416]

1593

New Approach to Analysis of Noisy EELS Data; E Firlar, T Prozorov; Ames Laboratory [795]

1595

Use of a hybrid silicon pixel (Medipix) detector as a STEM detector; D McGrouther, M Krajnak,I MacLaren, D Maneuski, V OÕShea; University of Glasgow; PD Nellist; University of Oxford [796]

1597

Development of an Aberration corrected 1.2-MV Field Emission Transmission Electron Microscope; H Shinada, T Tanigaki, T Akashi, Y Takahashi, T Furutsu, T Shimakura, T Kawasaki, K Kasuya; Central Research Laboratory, Hitachi, Ltd , et al [797]

1599

Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages; T Ishikawa, E Okunishi, T Kaneyama, Y Kondo; JEOL Ltd; S Matsumura; Research laboratory of high-voltage electron microscope, Kyushu University [798]

1601

Ettention: building blocks for iterative reconstruction algorithms; T Dahmen, L Marsalek; German Research Center for Artificial Intelligence (DFKI) GmbH; N Marniok; Saarland University;B Turo_ov‡; Max-Planck Institute for Informatics; S Bogachev; Saarland University; P Trampert; German Research Center for Artificial Intelligence (DFKI) GmbH; S Nickels; Saarland University, P Slusallek; German Research Center for Artificial Intelligence (DFKI) GmbH [799]

1603

Analysis of TEM tomography artifacts with experiments on model specimens; JP Winterstein, J Schumacher, JA Liddle; NIST CNST [800]

1605

Rapid 3D Reconstruction in the EDS Tomography by using Iterative Series Reduction (ISER) Method;Y Aoyama, H Nishioka, Y Kondo; JEOL Ltd [801]

1607

Moving atomic-resolution imaging into the age of deep data; O Ovchinnikov, S Jesse; Vanderbilt University; A Belianinov; Oak Ridge National Laboratory; S Pantelides; Vanderbilt University; S Kalinin, A Borisevich; Oak Ridge National Laboratory [802]

1609

High-accuracy electron tomography of semiconductor devices; M Hayashida, L Gunawan; National Institute for Nanotechnology; C Pawlowicz; TechInsights; M Malac; National Institute for Nanotechnology; M Couliard; National Research Council Canada [803]

A07 Scanning Probe Microscopy: New Methods and Applications

1431

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions; R Dianoux, A Scheidemann; NanoScan AG; E Niehuis, R Moellers, F Kollmer, H Arlinghaus; ION-TOF GmbH; H-J Hug, L Bernard; Empa et al [714]

1433

AFM integrated with SEM/FIB for complete 3D metrology measurements; A Lewis, A Komissar; Hebrew University; A Ignatov, O Fedoroyov, E Maayan; Nanonics Imaging [715]

1435

Integrating Atomic Force Microscopy in Scanning Electron Microscopy; AJ Smith, K Schock,G Renka; Kleindiek Nanotechnik; A Lieb; Nanosurf; M Dadras; Centre Suisse dÕƒlectronique et de Microtechnique, CSEM SA; S Kleindiek; Kleindiek Nanotechnik [716]

1437

Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis; Y Fleming, T Wirtz, S Eswara-Moorthy; Luxembourg Institute of Science and Technology [717]

1869

Nanoscale Chemical Imaging via AFM coupled IR Spectroscopy; K Kjoller, C Prater, M Lo, Q Hu, H Yang; Anasys Instruments; C Marcott; Light Light Solutions [933]

1871

Introducing nano-FTIR - Imaging and Spectroscopy at 10nm Spatial Resolution; T Gokus, A Huber; Neaspec GmbH [934]

1873

New Hybrid Peak-Force Tapping/Near-Field Microscope for Nano-Chemical and Nano-Mechanical Imaging of Graphene Plasmons, Polymers and Proteins; M Wagner, G Andreev; Bruker Nano Surfaces; K Carneiro, S Habelitz; University of California; T Mueller; Bruker Nano Surfaces [935]

2181

Nanoscale Mechanical Scattering Experiments towards the Local Analysis of Thermal Active Modes and Dispersion Interactions at Interfaces; RM Overney; University of Washington [1089]

2183

High-Resolution Mapping of Quantitative Elastic Modulus of Polymers; S Magonov, S Belikov; NT-MDT Development Inc; M Surtchev; NT-MDT Development Inc; S Leesment, I Malovichko; NT-MDT [1090]

2185

Environmental AFM as a probe of the morphology, viscoelasticity and lubricity of crosslinked hydrophilic biomedical coatings; G Haugstad, C Colling, A McCormick, K Wormuth; University of Minnesota; M Zeng; Boston Scientific Corporation [1091]

2187

A New Variable Temperature Solution-Solid Interface Scanning Tunneling Microscope; A Jahanbekam, U Mazur, KW Hipps; Washington State University [1092]

2189

The Power of confocal Raman-AFM and Raman-SEM (RISE) Imaging in Polymer Research;U Schmidt, W Liu; WITec GmbH; J Yang; WITec Instruments Corp; T Dieing, K Weishaupt; WITec GmbH [1093]

2343

In-situ AFM and SEM Investigation of Slip Steps Evolving during Nanoindentation; MJ Cordill,J Kreith; Erich Schmid Institute of Materials Science, Austrian Academy of Sciences; GE Fantner; Laboratoray for Bio- and Nano-Instrumentation, EPFL [1170]

2345

Deep Data Analysis of Atomic Level Structure-Property Relationship in an Iron Superconductor Fe1.05Te0.75Se0.25; AG Gianfrancesco, A Belianinov; UT/ORNL Bredesen Center; SV Kalinin; Oak Ridge National Laboratory, Center for Nanophase Materials Sciences; S Jesse; Oak Ridge NationalLaboratory, Center for Nanophase Materials Science [1171]

2347

Nanoscale Photocurrent Microscopy for Thin Film Solar Cells Using Focused Electron Beam and Near-Field Optical Excitations; H Yoon, Y Yoon, P Haney, S An, J Schumacher, K Siebein, A Myers, N Zhitenev; National Institute of Standards and Technology [1172]

2349

Faster Time-Resolved Electrostatic Force Microscopy; DU Karatay, JS Harrison, M Glaz, PA Cox, DS Ginger; University of Washington [1173]

2351

Correlative nanoscopy: super resolved fluorescence and atomic force microscopy towards nanoscale manipulation and multimodal investigations; A Diaspro, J Varghese Chacko, F Cella Zanacchi,R Oropesa, S Dante, C Canale; Istituto Italiano di Tecnologia [1174]

1611

Progress in Crystallographic Image Processing for Scanning Probe Microscopy; P Moeck, JC Straton; Portland State University [804]

1613

Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads; S Mejia, SP Leary, GP Souza, KC Ruthe; Western Digital Corporation [805]

1615

Characterization of Nanocarrier Complexes with Plasmid DNA using SEM, TEM and AFM; J-Y Cho, UD Hemraz; National Institute for Nanotechnology, National Research Council CANADA;P Bhowmik, G Nowak, PL Polowick; National Research Council CANADA [806]

1617

Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy;AE Sanders, JK Faulk; NIST; DT Edwards, TT Perkins; JILA [807]

1619

Comparison of Magnetic Domain Observation by Means of Magnetic Force Microscopy and Lorentz Transmission Electron Microscopy; S Hua, M DeGraef; Carnegie Mellon University [808]

1621

Use of the unroofing technique for AFM direct imaging of the intra-cellular structure at high resolution;J Usukura, E Usukura, A Narita; Nagoya University; A Yagi, S Ito; Olympus Corporation [809]

1623

Lateral Force Microscopy using Nanomanipulation; Y-K Hseu, H McNally; Birck Nanotechnology Center, Purdue University [810]

1625

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

1085

Computational Method for Composition Determination of Multilayer Epitaxial Semiconductor Structures Using Standards-Based Energy-Dispersive X-Ray Spectrometry; M Rathi, N Zheng; University of Houston; P Ahrenkiel; South Dakota School of Mines Technology [542]

1087

Practical Considerations in Quantitative Nanoscale Energy-Dispersive X-ray Spectroscopy (EDX) and Its Application in SiGe; W Weng, FH Baumann, Y Ke, R Loesing, A Madan, Z Zhu, AD Katnani; IBM Microelectronics Division [543]

1089

Quantification of Phase Compositions and Diffusional Profiles in Simulated Solid-State Welds of Ti-17 via Super-X Energy-Dispersive X-Ray Spectroscopy; J Orsborn, RE Williams; Center forElectron Microscopy and Analysis, The Ohio State University; HL Fraser; Center for the Accelerated Maturation of Materials, The Ohio State University [544]

1091

Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors;W Xu, JH Dycus, X Sang, AA Oni, JM Lebeau; North Carolina State University [545]

1093

Influence of Convergence Angle and Finite Effective Source Size for Quantitative Atomic Resolution EDXS; JH Dycus, SD Findlay, W Xu, XH Sang; North Carolina State University; LJ Allen; University of Melbourne; JM LeBeau; North Carolina State University [546]

1223

Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM; M Watanabe, T Sasaki; Lehigh University; Y Jimbo, E Okunishi, H Sawada; JEOL ltd [611]

1225

Characterizing Atomic Ordering of High Entropy Alloys Using Super-X EDS Characterization; RE Williams, B Welk, J Jensen, BD Esser, DW McComb, HL Fraser; The Ohio State University [612]

1227

Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis; D Rossouw, P Burdet, F de la Pe–a, C Ducati, BR Knappett, AE Wheatley, PA Midgley; University of Cambridge [613]

1229

Gold and Arsenopyrite Exsolution and Limits of Arsenic Solubility in Pyrite Investigated by SEM, EPMA, and LA-ICPMS; K Goemann, AS Stepanov, S Meffre, RR Large; University of Tasmania [614]

1231

Characterization of Stannous Fluoride Uptake in Human Dentine by Super-X XEDS and Dual-EELS analysis; IN David, RE Williams, D Huber; Center for Electron Microscopy and Analysis (CEMAS), The Ohio State University; JC Earl; GlaxoSmithKline (GSK); DW McComb; Center for Electron Microscopy and Analysis, The Ohio State University [615]

1439

Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages; C Merlet; CNRS, University Montpellier [718]

1441

Multi-beam energy acquisition in FE-EPMA; S Richter, PT Pinard; RWTH Aachen [719]

1443

Improvements in EPMA: Spatial Resolution and Analytical Accuracy; PK Carpenter, BL Jolliff; Washington University [720]

1445

Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements; JJ Donovan, JT Armstrong; University of Oregon [721]

1447

Using EPMA, Raman LS, Hyperspectral CL, SIMS and EBSD to Study Impact Melt Induced Decomposition of Zircon; M Zanetti, A Wittmann, P Carpenter, BL Jolliff; Washington University in St Louis; E Vicenzi; Museum Conservation Institute, Smithsonian Institution; A Nemchin,NE Timms; Curtin University [722]

1875

Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy; DE NEWBURY, NW RITCHIE; National Institute of Standards and Technology [936]

1877

Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Electron Microprobes and SEMs; SM Seddio, JH Fournelle; Thermo Fisher Scientific [937]

1879

Evaluation of combined quantification of Cr-Ni steel using EDS and WDS; PT Pinard, R Terborg; RWTH Aachen University; T Salge; Natural History Museum; S Richter; RWTH Aachen University [938]

1881

Comparison of WDS and EDS Rare Earth Element Analysis; HA Lowers, PK Carpenter; U S Geological Survey [939]

2191

Dedicated X-Ray Mapping System for Quantitative X-Ray Mapping with Single and Multiple SDD Detectors and Processing the Data; R Wuhrer, K Moran; University of Western Sydney, Advanced Materials Characterisation Facility (AMCF), Australia [1094]

2193

Quantitative Elemental Mapping with Electron Microprobe and Automated Data Analysis;J Chouinard, J Donovan; University of Oregon [1095]

2195

Homogeneity Testing of Microanalytical Reference Materials by Electron Probe Microanalysis;D Harries; Friedrich Schiller University Jena [1096]

2353

Nanomineralogy of Meteorites by Advanced Electron Microscopy: Discovering New Minerals and New Materials from the Early Solar System; C Ma; Caltech [1175]

2355

Soft X-ray emission spectroscopy on chemical states of 3d-transition metal elements with SEM;M Terauchi, H Takahashi; IMRAM, Tohoku University; T Murano; JEOL Ltd; T Imazono, M Koike; JAEA; T Nagano, M Koeda; SHIMADZU [1176]

2357

Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!; P Hovington, M LagacŽ; Hydro-Quebec; E Principe; Tescan USA; S Burgess; Oxford Instruments NanoAnalysis; A Guerfi; Hydro-Quebec; H Demers; McGill University; K Zaghib; Hydro-Quebec, R Gauvin; McGill University [1177]

2359

High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector; H Demers, N Brodusch;McGill University; P Woo; Hitachi High-Technologies Canada Inc; R Gauvin; McGill University [1178]

1627

Pushing the Limits on SEM Quantification Ð Combined Quantification with SDD and Fully Focussing WD detectors; CL Collins, J Holland, SR Burgess; Oxford Instruments NanoAnalysis [812]

1629

Factors Affecting WDS Performance Superiority over EDS; PP Camus; EDAX Inc [813]

1631

Enhanced Theoretical Model for Avoiding Mistakes in SEM-EDS Analysis; PJ Statham; Oxford Instruments NanoAnalysis [814]

1633

Regarding the Quantitative Analysis of Heterogenous Samples by SEM/EDS; JF Konopka; Thermo Fisher Scientific [815]

1635

Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM; H Takahashi, S Asahina; JEOL Ltd;M Terauchi; Tohoku University; C Nielsen, P McSwiggen; JEOL USA [816]

1637

Characterization and Comparison of Detector Systems for Large Area X-ray Imaging; J Davis,J Schmidt; PNDetector; M Huth; PNSensor GmbH; U Weber, H Soltau, A Niculae; PNDetector GmbH; L StrŸder; PNSensor GmbH [817]

1639

Accurate EPMA Quantification of the First Series Transition Metals Using Ll Lines; M Moret, C Hombourger, M Outrequin; CAMECA [818]

1641

Multilayer Thin Films as Pseudo-Homogeneous EDX Standards; HO Colijn, J Orsborn, DJ Chmielewski, DW McComb; Ohio State University [819]

1643

A method of component extraction of EDS and EELS maps; S Wang; Micron Technology Inc [820]

1645

Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits; J Rafaelsen, T Nylese, M Bolorizadeh; EDAX Inc, A division of Ametek, Materials Analysis Division; V Carlino; ibss Group INC [821]

2005

Bulge Testing for Strength Metrics of Detector X-Ray Windows; JT Rowley, K Berry, RC Davis,RR Vanfleet; Brigham Young University; SW Cornaby, M Harker, J Abbott; MOXTEK, Inc [1001]

2007

Elemental and Phase Analysis of the Stomatopod Dactyl Club by X-Ray Mapping; NA Yaraghi, L Grunenfelder; University of California, Riverside; N Suksangpanya, N Guarin; Purdue University; S Herrera; University of California, Riverside; G Milliron; Max Planck Institute for Colloids and Interfaces; P Zavattieri; Purdue University, L Sheppard; University of Western Sydney et al [1002]

2009

EPMA analysis of corroded hot-dip galvanized carbon steel using the ÒPhaseMap MakerÓ software; R Kamiyama, P McSwiggen, N Kato, S Honda, N Mori; JEOL Ltd; C Nielsen; JEOL USA, Inc [1003]

2011

Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-XRF; AH Lee; EDAX Inc [1004]

2013

EDX Analysis of Low Concentration Dopant using HD-2700 Aberration Corrected STEM Equipped with Dual SDD; T Sato, Y Suzuki, H Matsumoto, T Hashimoto, K Nakamura; Hitachi high- technologies corporation; T Miura, H Yoshida; Vacuum Device Inc [1005]

2015

Quantitative ED(X)S: The Zeta-Factor Method; M Falke, A Kaeppel, I Nemeth, R Terborg; Bruker Nano GmbH [1006]

2017

Standardless Quantification Of Actinides By EPMA; A Moy, C Merlet; University Montpellier, CEA; O Dugne; CEA [1007]

2019

Focused Interest Group on Microanalytical Standards (FIGMAS): Assessing the Quality, Availability and Need for Standards in the Microanalytical Community; JM Allaz, OK Neill; University of Colorado Boulder; A von der Handt; University of Minnesota Twin Cities [1008]

2021

Improved Background Correction for the Quantification of Actinide M-lines in EPMA; X Ritter, P Pšml; Institut fŸr Mineralogie, WestfŠlische Wilhelms-UniversitŠt; S BrŽmier; European Commission, Joint Research Centre, Institute for Transuranium Elements; J Berndt; Institut fŸr Mineralogie, WestfŠlische Wilhelms-UniversitŠt [1009]

2023

Phase Analysis of Large EDS Datasets with Matlab; RC Hugo, S Bernsen; Portland State University; K Breen; US Geological Survey; A Ruzicka; Portland State University [1010]

2025

Investigation of Mg-Li-Ca alloys using a Wavelength Dispersive Soft X-ray Emission Spectrometer and EPMA; H Takahashi, M Takakura; JEOL Ltd; T Murano; JEOL Ltd; M Terauchi; Institute for Multidisciplinary Research for Advanced Materials, Tohoku University; M Yamasaki; Magnesium Research Center, Kumamoto University; Y Kawamura; Magnesium Research Center, Kumamoto University; P McSwiggen; JEOL USA [1011]

2027

Use of a Fast WDS Instrument for Identification of Minor EDS Peaks; JF Konopka; Thermo Fisher Scientific [1012]

A09 Advances in Combining Simulation and Experiment for Materials Design

1233

Three-Dimensional Imaging of Point Defects in Functional Materials Using Quantitative STEM;J Hwang; The Ohio State University [616]

1235

Removing elastic scattering effects from chemical maps taken under incoherent conditions; C Dwyer; Forschungszentrum Juelich [617]

1237

Identifying Atomic Reconstruction at Complex Oxide Interfaces Using Quantitative STEM;JM Johnson, J Thompson; The Ohio State University; SSA Seo; University of Kentucky; J Hwang; The Ohio State University [618]

1239

Revealing Unit Cell Level Distortions in Random Oxide Solid Solutions by Scanning Transmission Electron Microscopy and the Projected Pair Distribution Function; X Sang, E Grimley, C Niu, D Irving, JM LeBeau; North Carolina State University [619]

1449

Quantitative Electron Microscopy and the Application by Single Electron Signals; R Ishikawa,AR Lupini; University of Tokyo; SD Findlay; Monash University; T Taniguchi; NIMS; SJ Pennycook; University of Tennessee [723]

1451

Large-Scale Molecular Dynamics and High-Resolution Transmission Electron Microscopy Study of Graphene Grain Boundaries; C Ophus, HI Rasool; Lawrence Berkeley National Laboratory; A Zettl; University of California Berkeley; A Shekhawat; Lawrence Berkeley National Laboratory [724]

1453

Applications of Bicrystallography: Revealing Generic Similarities in Coincidence Site Lattice Boundaries of all Holohedral Cubic Materials and Facilitating the Design of 3D Printed Models of such Grain Boundaries; P Moeck, A Maas, J Stone-Sundberg, B York; Portland State University;W Kaminsky; University of Washington; ND Browning; Pacific Northwest National Laboratory [725]

1455

Defect Character at Grain Boundary Facet Junctions: A Combined HRSTEM and Atomistic Modeling Study of a Sigma=5 Grain Boundary in Fe; DL Medlin, KM Hattar, JA Zimmerman, FF Abdeljawad, SM Foiles; Sandia National Laboratories [726]

1883

Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential; W Van den Broek, CT Koch; Institute for Experimental Physics, Ulm University [940]

1885

Simulating inelastic scattering in scanning transmission electron microscopy using µSTEM;AJ DÕAlfonso, SD Findlay, LJ Allen; The University of Melbourne [941]

1887

Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy; J Feng, AV Kvit, AB Yankovich, C Zhang, D Morgan, PM Voyles; University of Wisconsin-Madison [942]

1889

Propagation of Bessel beams along atomic columns in crystal : a Bloch wave and multslice analysis; V Grillo, E Rotunno; CNR-Istituto Nanoscienze, Centro S3; BJ McMorran; University of Oregon; S Frabboni; Universitˆ di Modena e Reggio Emilia [943]

2197

Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design; L Jones, KE MacArthur; University of Oxford; J Aarons,C-K Skylaris; University of Southampton; M Sarwar, D Ozkaya; Johnson Matthey; PD Nellist; University of Oxford [1097]

2199

Probing Complex Nanostructures by Combining Atomic-Scale Theory and Scanning Transmission Electron Microscopy; ST Pantelides, SJ Pennycook; Vanderbilt University [1098]

2201

Integrated Computational and Experimental Structure Determination for Nanoparticles; M Yu, AB Yankovich, A Kaczmarowski, D Morgan, P Voyles; University of Wisconsin-Madison [1099]

2203

Local crystallography: phase recognition and local symmetry analysis; A Belianinov, Q He; 1 Institute for Functional Imaging of Materials, 2 The Center for Nanophase Materials Sciences; M Kravchenko; 1 Institute for Functional Imaging of Materials 2 The Center for Nanophase Materials Sciences;S Jesse; Institute for Functional Imaging of Materials The Center for Nanophase Materials Sciences; A Borisevich; Institute for Functional Imaging of Materials Materials Sciences and TechnologyDivision; S Kalinin; Institute for Functional Imaging of Materials The Center for Nanophase Materials Sciences [1100]

2205

HAADF/MAADF Observations and Image Simulations of Dislocation Core Structures in a High Entropy Alloy; TM Smith, BD Esser; The Ohio State University; EP George, F Otto; Ruhr University; M Ghazisaeidi, DW McComb, MJ Mills; The Ohio State University [1101]

2207

Strain-Mediated Asymmetric Growth of Plasmonic Nanocrystals: A Monometallic Au Nanorod- Au Nanoparticle Heterodimer; Y Zhu, J Huang, Y Han; King Abdullah University of Science and Technology [1102]

2361

Mapping Electronic Orbitals in Real Space; S Lšffler; McMaster University [1179]

2363

Excitonic Calculations of ELNES: Low Energy and High Energy Spectra; K Tomita, T Mizoguchi; Institute of Industrial Science, University of Tokyo [1180]

2365

Probing Bonding Environments in Osmium-Based Double Perovskites Using Monochromated Dual Electron-Energy Loss Spectroscopy; BD Esser, MR Ball, RC Morrow; The Ohio State University; AE Goode; Imperial College London; RE Williams, PM Woodward, WE Windl, DW McComb; The Ohio State University [1181]

2367

Analytical Method for Thickness and Wrinkling Measurements of 2D Zeolites; P Kumar, VK Agrawal, M Tsapatsis, AK Mkhoyan; University of Minnesota [1182]

2369

Determination of Surface Topography from Laser Ablation using EBSD; PG Callahan,MP Echlin, TM Pollock; University of California at Santa Barbara; M DeGraef; Carnegie Mellon University [1183]

1647

Transmission Electron Microscopic and First-principles Study of SrTiO3/GaAs Hetero-interfaces; L Hong, S Ogut, R Klie; University of Illinois at Chicago [822]

1649

Observation of Skyrmions at Room-temperature in Amorphous Fe/Gd Films; JJ Chess, S Montoya, J Lee; University of Oregon; S Roy, S Kevan; Lawrence Berkeley National Lab; EE Fullerton; University of California, San Diego; BJ McMorran; University of Oregon [823]

1651

A Biomimetic-Computational Approach to Optimizing the Quantum Efficiency of Photovoltaics;LM Perez, A Holzenburg; Texas AM University [824]

1653

Combine Simulation and Experiment EELS to Characterize Ionomer Conformation; C Wang, SJ Paddison; National Institute for Occupational Safety and Health; G Duscher; University of Tennessee [825]

1655

Investigation of the structural and electronic properties of Pt/_-Al2O3, a model catalyst system; CS Bonifacio, Q Zhu; University of Pittsburgh; D Su; Center for Functional Nanomaterials; F Vila;University of Washington; HO Ayoola, SD House; University of Pittsburgh; J Kas, JJ Rehr; University of Washington et al [826]

1657

Analysis of Surface Structures in Ru Nanocatalysts; NP Walker, BK Miller, PA Crozier; Arizona State University [827]

1659

Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structural Refinement Based on Fluctuation Microscopy; JJ Maldonis, P Zhang; University of Madison, Wisconsin; M Besser; Ames Laboratory; K Ames Laboratory; 225 Wilhelm; V University of Madison, Wisconsin [828]

A10 Advances in Electron Diffraction and Automated Mapping Techniques

1095

TEM based high resolution electron diffraction techniques for three-dimensional nanostructure determination; J-M Zuo, Y Meng, P Vivek Deshpande; University of Illinois, Urbana- Champaign [547]

1097

Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED; R dos Reis, C Ophus, J Ciston; National Center for Electron Microscopy/Molecular Foundry, LBNL; P Ercius, U Dahmen; National Center for Electron Microscopy/Molecular Foundry, LBNL [548]

1099

Mapping Valence Electron Distribution of Iron-Based Superconductors using Quantitative CBED and Precession Electron Diffraction; L Wu, C Ma; Brookhaven National Laboratory; B Ge; Institute of Physics, Chinese Academy of Sciences; W Yin, Y Zhu; Brookhaven National Laboratory [549]

1101

Transmission Kikuchi Diffraction (TKD) via a horizontally positioned detector; E Bouzy, J-J Fundenberger; UniversitŽ de Lorraine; D Goran; Bruker Nano GmbH; J Guyon,H Yuan; UniversitŽ de Lorraine; A Morawiec; Institute of Metallurgy and Materials Science - Polish Academy of Science [550]

1103

Utility of Precession Electron Diffraction Patterns with Varying Degrees of Non-parallel Illumination from the Same Nominal Sample Area; P Moeck, JC Straton; Portland State University; DJ Edwards; Pacific Northwest National Laboratory; I HŠusler; Humboldt University Berlin [551]

1241

Decomposing electron diffraction signals in multi-component microstructures; AS Eggeman,D Johnstone, R Krakow; University of Cambridge; J Hu; University of Oxford; PA Midgley; University of Cambridge; C Grovenor, S Lozano-Perez; University of Oxford [620]

1243

Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction; A Valery, EF Rauch, A Pofelski, L ClŽment, F Lorut; STMicroelectronics [621]

1245

Principles and Applications of Energy-Filtered Scanning CBED for Ferroelectric Domain Imaging and Symmetry Determination; Y-T Shao, K Kim, J-M Zuo; University of Illinois at Urbana-Champaign [622]

1247

A statistical dictionary approach to automated orientation determination from precession electron diffraction patterns; A Wang, A Leff; Carnegie Mellon University; M Taheri; Drexel University; M DeGraef; Carnegie Mellon University [623]

1249

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires; RH Geiss; Colorado State University [624]

1457

Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy; S-T Hu, L Morganti; University of Texas - Austin; S Rajesekhara, K Hattar; Sandia National Laboratories; P Ferreira; University of Texas - Austin [727]

1459

Application of EBSD and Precession-Enhanced Diffraction (PED) to Study Crystallography of -Titanium Alloy During Transformation under Severe Hot Plastic Deformation; SV Prikhodko, PE Markovsky; University of California Los Angeles; SD Sitzman; Oxford Instruments America; MA Gordillo, JM Wiezorek; University of Pittsburgh; OM Ivasishin; Kurdyumov Institute for Metal Physics, National Academy of Science of Ukraine [728]

1461

Precession Electron Diffraction and Orientation Phase Mapping of Assembled Ag/ZnO Nanoantennas; JE Sanchez, F Ruiz Zepeda, M Jose Yacaman, A Ponce-Pedraza; The University of Texas at San Antonio [729]

1463

A Precession Electron Diffraction and EELS Study of Beta-phase Evolution in Nano-crystalline Mg-9 wt.% Al Thin Films during Heat Treatment; K Kruska, DJ Edwards, RS Vemuri, L Kovarik, A Rohatgi, ND Browning; Pacific Northwest National Laboratory [730]

1465

Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by Automated Crystal Orientation Mapping in the TEM; KW Zweiacker, MA Gordillo, C Liu; University of Pittsburgh;J McKeown, G Campbell; Lawrence Livermore National Laboratory; B Reed, T LaGrange; Integrated Dynamic Electron Solutions, J Wiezorek; University of Pittsburgh [731]

1891

Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction;A Vilalta-Clemete, J Jiang; Department of Materials, University of Oxford; TB Britton; Department of Materials, Imperial College London; DM Collins, AJ Wilkinson; University of Oxford [944]

1893

Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution; AC Leff, CR Weinberger, ML Taheri; Drexel University [945]

1895

Certified Reference Material for Strain Measurement Using EBSD; MD Vaudin, WA Osborn, LH Friedman, K Siebein; National Institute of Standards and Technology [946]

1897

Novel Applications of Electron Channeling Contrast Imaging; J Deitz, S Carnevale, D McComb, S Ringel, T Grassman; The Ohio State University [947]

1899

Advances in HREBSD for Elastic Strain Measurement and its Application to Mechanical Testing;DJ Dingley; University of Bristol [948]

2209

Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution; J-L Rouviere, Y Martin; University Grenoble Alpes; N Bernier, M Vigouroux, D Cooper; CEA; ZM Zuo; University of Illinois [1103]

2211

4D-STEM imaging with the pnCCD (S)TEM-Camera; M Simson, H Ryll; PNDetector GmbH; L Jones; University of Oxford; Y Kondo; JEOL Ltd; K MŸller; UniversitŠt Bremen; PD Nellist; University of Oxford; H Soltau; PNDetector GmbH, H Yang; University of Oxford et al [1104]

2213

GPU-based defect image simulations using the scattering matrix formalism; S Singh, M DeGraef; Carnegie Mellon University [1105]

2215

EBSD Surface Topography Determination in a Martensitic Au-Cu-Zn Alloy; M Chapman, P Callahan, M DeGraef; Carnegie Mellon University [1106]

2217

High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors; A Vilalta-Clemente, G Naresh-Kumar; Department of Materials University of Oxford; M Nouf-Allehiani; Department of Physics, SUPA; PJ Parbrook; Tyndall National Institute University College Cork; ED Le Boulbar; Department of Electronic and Electrical Engineering; D Allsopp; Department of Electronic and Electrical Engineering; PA Shields; Department of Electronic and Electrical Engineering, C Trager- Cowan; Department of Physics, SUPA et al [1107]

2371

Comparison in 3D of Experiments on, and Simulations of Plastic Deformation of Polycrystals; AD Rollett, R Pokharel; Carnegie Mellon Univ; RA Lebensohn; Los Alamos Natl Lab; RM Suter; Carnegie Mellon Univ [1184]

2373

Improved EBSD Map Fidelity through Re-indexing of Neighbor Averaged Patterns; SI Wright, MM Nowell, LP Lindeman, P Camus; EDAX [1185]

2375

A novel way for determining Bravais lattice using a single electron backscatter diffractionpattern; L Li, M Han; School of Materials Science and Engineering, Fujian University of Technology [1186]

2377

Tackling Characterization Challenges in High Deformation/Stress Steel Alloys Using Transmission Kikuchi Diffraction (TKD); A Avishai, AH Heuer; Case Western Reserve University; S Sitzman; Oxford Instruments America, Inc; K Abassi, D Wang; Case Western Reserve University; V Bedekar, D wu, S Hyde; The Timken Company et al [1187]

2379

Rotation Axes Analysis of Deformed Magnesium Using Electron Backscatter Diffraction and Rotation Contour Contrast Reconstruction; S Kaboli, H Demers, R Gauvin; McGill University [1188]

1661

Orientation Mapping by Precession Transmission Electron Microscopy; D Wang, A Avishai, A Heuer; Case Western Reserve University [829]

1663

Determination of reliable grain boundary orientation using automated crystallographic orientation mapping in the transmission electron microscope; X Zhang, JF Rufner; Department of Chemical Engineering and Materials Science, University of California,Davis; T LaGrange; Ecole Polytechnique Federale de Lausanne, Interdisciplinary Center of Electron Microscopy; RH Castro, JM Schoenung; Department of Chemical Engineering and Materials Science, University of California, Davis;GH Campell; Physical and Life Sciences Directory, Lawrence Livermore National Laboratory; K van Benthem; Department of Chemical Engineering and Materials Science, University of California, Davis [830]

1665

The presence of higher-order Laue zone intensities and the Relrod effect in cubic metals in the Transmission Electron Microscope; C Miller, R Field, M Kaufman; Colorado School of Mines [831]

1667

Semi-Automated DigitalMicrograph Routine for Real-Time Phase Identification; ER White, J Weiner, A Garc’a-Trenco, SD Pike, CK Williams, MS Shaffer; Imperial College London [832]

1669

Improving Spatial Detection of Twins Achieved by Measuring Individual Kikuchi Band Intensity in EBSD Patterns; TM Rampton, DT Fullwood, SI Wright; EDAX [833]

1671

Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films; EC Estrine, N Seaton, P Dulal, B Stadler; University of Minnesota [834]

1673

Automated Image Alignment and Distortion Removal for 3D Serial Sectioning with Electron Backscatter Diffraction; AJ Levinson, DJ Rowenhorst; Naval Research Laboratory; AC Lewis; Formerly Naval Research Laboratory [835]

1675

Growth and Characterization of (110) InAs Quantum Well Heterostructures by Transmission Electron Microscopy and Electron Channeling Contrast Imaging; MB Katz, ME Twigg, AA Podpirka; US Naval Research Laboratory; M Hernandez; Hitachi High Technologies America, Inc; SC Mack, BR Bennett; US Naval Research Laboratory [836]

1677

Techniques for Transmission EBSD Mapping of Atom Probe Specimens; KP Rice, Y Chen, TJ Prosa, DJ Larson; CAMECA Instruments, Inc; M Nowell; EDAX Inc; MP Stoykovich; University of Colorado Ð Boulder [837]

2029

The Reliability of EBSD-based Microstructure Analysis; K Davut, S Zaefferer; Metal Forming Center of Excellence, Atilim University [1013]

2031

Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope; N Brodusch, H Demers, R Gauvin; McGill University [1014]

2033

Real-time discrimination of phases with similar Kikuchi patterns but different chemistry through simultaneous EBSD and EDS; J Goulden, S Sitzman, K Larsen, R Jones; Oxford Instruments [1015]

2035

Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup; J Guyon, N Gey; Laboratoire dÕEtude des Microstructures et de MŽcanique des MatŽriaux (LEM3); D Goran; Bruker Nano GmbH; S Chalal, F PŽrez-Willard; Carl Zeiss Microscopy GmbH [1016]

2037

Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of Gamma-TiAl with High Accuracy Band Detection; SD Sitzman, N-H Schmidt; Oxford Instruments NanoAnalysis; A Palomares-Garcia; IMDEA Materials Institute; R Munoz-Moreno; Rolls Royce UTC; J Goulden; Oxford Instruments NanoAnalysis [1017]

2039

Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?; M Chapman, S Singh, M DeGraef; Carnegie Mellon University [1018]

2041

Automated Dictionary-based Indexing of Electron Channeling Patterns; S Singh, M DeGraef; Carnegie Mellon University [1019]

2043

Quantitative Analysis of Correlated 3D Strontium Titanate Datasets Collected by TriBeam and Diffraction Contrast Tomography; WC Lenthe, MP Echlin; University of California, Santa Barbara; M Syha, A Trenkle, P Gumbsch; Karlsruhe Institute of Technology; TM Pollock; University of California, Santa Barbara [1020]

2045

Pattern overlap and high resolution electron backscatter diffraction; V Tong, J Jiang; Imperial College London; AJ Wilkinson; University of Oxford; B Britton; Imperial College London [1021]

2047

Electron and X-ray Diffraction Measurements of Elastic Stress and Plastic Strain from Ultrasonic Impact Treatment of Aluminum-Magnesium Alloys; LN Brewer, EF Fakhouri; University of Alabama; ME Haggett; Naval Postgraduate School; KN Tran; Naval Surface Warfare Center- Carderock Division [1022]

A11 Electron Vortex Beams and Higher-Order Beam Modes

The Surprising Dynamics of Electron Vortex Beams; S Lšffler, T Schachinger; McMaster University; M Stšger-Pollach, P Schattschneider; Vienna University of Technology [10]

Unveiling the OAM and acceleration of electron beams; R Shiloh, Y Tsur, R Remez, Y Lereah,BA Malomed; Tel-Aviv University; V Shvedov, C Hnatovsky, W Krolikowski; Australian National University et al [11]

An orbital angular momentum spectrometer for electrons; TR Harvey, V Grillo, BJ McMorran; University of Oregon [12]

Structured Electron beam illumination: a new control over the electron probe. Weird probes and new experiments; V Grillo, J Pierce; CNR-Istituto Nanoscienze, Centro S3; E Karimi; University of Ottawa; TR Harvey; of Oregon; R Balboni; CNR-IMM Bologna; GC Gazzadi; CNR-Istituto Nanoscienze, Centro S3; E Mafakheri; Universit‡ di Modena e Reggio Emilia, F Venturi; Universit‡ di Modena e Reggio Emilia, et al [13]

499

Mapping Magnetic Properties of Materials At Atomic Spatial Resolution; J Rusz, J-C Idrobo; Uppsala University; S Bhowmick; Indian Institute of Technology; J Spiegelberg; Uppsala University; S Bhowmick; Indian Institute of Technology [250]

501

At-Focus Observations of High Quality Electron Vortex Beams Created from Ferromagnetic Rods;AM Blackburn, JC Loudon; Hitachi Cambridge Laboratory; R Herring; University of Victoria; A Hrabec; University of Leeds; D Hoyle; Hitachi High-Technologies Canada [251]

503

Electron holograms encoding amplitude and phase for the generation of arbitrary wavefunctions;V Grillo, E Karimi; CNR-Istituto Nanoscienze, Centro S3; R Balboni; CNR-IMM; GC Gazzadi; CNR- Istituto Nanoscienze centro S3; F Venturi, S Frabboni; Universit‡ di Modena e Reggio Emilia;BJ McMorran; University of Oregon, RW Boyd; University of Ottawa et al [252]

505

Electron vortex beams for magnetic measurements on ferromagnetic samples via STEM; D Pohl, J Rusz, S Schneider; IFW Dresden; P Tiemeijer; FEI Company; B Rellinghaus; IFW Dresden [253]

667

Holograms for the generation of Vortex states with L=500_ fabricated by electron beam lithography; E Mafakheri, V Grillo; Dipartimento FIM, Universitˆ di Modena e Reggio Emilia; R Balboni; CNR- IMM; GC Gazzadi; CNR-Istituto Nanoscienze, Centro S3; C Menozzi, S Frabboni; Universitˆ di Modena e Reggio Emilia; E Karimi, RW Boyd; University of Ottawa [334]

669

Synthesization of vortex beams by combining fork-shaped gratings for transmission electron microscopy; K Harada, T Kohashi, T Iwane; Central Research Laboratory, Hitachi Ltd [335]

671

Propagation properties of Electron Vortex Beams; K Saitoh, H Nambu, N Tanaka; EcoTopia Science Institute, Nagoya University; M Uchida; Advanced Science Research Laboratory, Saitama Institute of Technology [336]

673

Electron singularities, matter wave catastrophes, and vortex lattice singularimetry; TC Petersen, M Welyand, DM Paganin, TP Simula, SA Eastwood, AI Bishop, MJ Morgan; Monash University [337]

675

Holographic generation of highly twisted electron beams; V Grillo, GC Gazzadi; CNR-Istituto Nanoscienze, Centro S3; E Mafakheri, S Frabboni; Universit‡ di Modena e Reggio Emilia; E Karimi, RW Boyd; University of Ottawa [338]

A12 Low Voltage Electron Microscopy

Direct Observation of Nano-porous Materials Using Low Voltage High Resolution SEM; S ASAHINA, Y SAKUDA; JEOL ltd; O TERASAKI; Stockholm Univ Sweden and KAIST Korea [14]

Examination of Graphene in a Scanning Low Energy Electron Microscope; I MŸllerov‡, E Mikmekov‡, L Frank; Institute of Scientific Instruments ASCR, v v i [15]

Conductivity contrast in SEM images of hydrogenated graphene grown on SiC; I Jozwik,JM Baranowski, K Grodecki; Institute of Electronic Materials Technology; P Dabrowski; University of Lodz; W Strupinski; Institute of Electronic Materials Technology [16]

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques; MD Zotta, YP Kandel, AN Caferra, E Lifshin; College of Nanoscale Science and Engineering, SUNY Polytechnic Institute [17]

20-kV Diffractive Imaging of Graphene by using an SEM-based Dedicated Microscope; O Kamimura, T Dobashi; Central Research Laboratory, Hitachi, Ltd; Y Maehara; Hokkaido University; R Kitaura, H Shinohara; Nagoya University; K Gohara; Hokkaido University [18]

349

Opportunities for Low-Voltage TEM/STEM; RF Egerton; University of Alberta [175]

351

Development of a monochromated and aberration-corrected low-voltage (S)TEM; M Mukai,S Morishita, H Sawada; JEOL Ltd; LH Tizei, Y-C Lin; AIST; K Kimoto; NIMS; K Suenaga; AIST [176]

353

Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis; A Barnum, J Jiao; Portland State University [177]

355

Strategies for High-Resolution Imaging of Radiation-Sensitive Materials in an Aberration-Corrected Transmission Electron Microscope; UA Kaiser; Ulm University [178]

507

Low Voltage SEM and Correlative Microscopy to Analyze Delicate Biological Material; H- Schatten; Department of Veterinary Pathobiology University of Missouri [254]

509

Structural Biology at The Single Particle Level: Imaging Tobacco Mosaic Virus by Low-Energy Electron Holography; J-N Longchamp, T Latychevskaia, C Escher, H-W Fink; University of Zurich [255]

511

Helium Ion Microscopy of Plant Tissues and Mammalian Cells; AF Loftus, MS Joens, SE Dunn, MW Adams; Salk Institute for Biological Studies; C Huynh, B Goetze; Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC; JA Fitzpatrick; Salk Institute for Biological Studies [256]

513

Imaging of Carbon Nanotubes Embedded in Polymer Composites via Low Energy Scanning Electron Microscopy and Scanning Lithium Ion Microscopy; M Zhao, KA Twedt, JJ McClelland, JA Liddle; National Institute of Standards and Technology [257]

677

Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes; H Demers, N Brodusch; McGill University; P Hovington; Institut de Recherche dÕHydro QuŽbec (IREQ); R Gauvin; McGill University; K Zaghib; Institut de Recherche dÕHydro QuŽbec (IREQ) [339]

679

Low Accelerating Voltage X-ray Microanalysis Ð Strategies and challenges; PL McSwiggen; McSwiggen Associates/JEOL USA, Inc [340]

681

Advantage of Beam Deceleration for Low kV EDS Analysis; DC Edwards, N Erdman, D Guarrera, M Shibata, V Robertson; JEOL USA, Inc; F Timischl, Y Nemoto; JEOL Technics Ltd [341]

683

Nanostructures Viewed through Low Voltage Electron Microscopy; DR Radu, C-Y Lai; Delaware State University [342]

833

The OTO Specimen Preparation Method for Optimal Scanning Electron Microscopy Imaging of Pseudomonas aeruginosa; TYJ Lee, N Avishai, KP Connie Tam; Cleveland Clinic Cole Eye Institute [417]

835

Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope; NC Barbi, MB Tzolov, OE Healy, RB Mott; PulseTor LLC; WM McDonald; Lock Haven University [418]

837

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage; Y Hashimoto, A Muto; Hitachi High Technologies America, Inc; T Walters, E Woods; Georgia Institute of Technology; DC Joy; The University of Tennessee [419]

839

Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source; I-S Hwang, W-T Chang, C-Y Lin, W-H Hsu; Institute of Physics, Academia Sinica [420]

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Bridging the gap between the modeling approach and the experiment in Atom Probe Tomography;F Vurpillot, W Lefebvre, L Rigutti, N Rolland, F Moyon, H Hideur, D Blavette; Groupe de Physique des MatŽriaux, UMR CNRS 6634, UniversitŽ et INSA de Rouen [19]

Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic Nanodiamonds; JB Lewis, D Isheim, C Floss, TL Daulton; Washington University; DN Seidman; Northwestern University [20]

Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR; RM Ulfig, TJ Prosa; CAMECA Instruments, Inc; DR Lenz, TR Payne; CAMECA Instruments, Inc [21]

Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM and APT; A Stokes, M Al-Jassim, D Diercks; Colorado School of Mines; B Egaas; Nation Renewable Energy Laboratory; B Gorman; Colorado School of Mines [22]

Development of Quantitative Standards for Atom Probe Reconstruction Parameters for Analysis of Interfacial Chemistry; S Broderick, S Dumpala, S Young, K Kaluskar, S Srinivasan, K Rajan; Iowa State University [23]

357

Investigation into Solute Stabilizing Effects in Nanocrystalline Materials: An Atom Probe Characterization Study; GB Thompson, M Kapoor, T Kaub; The University of Alabama; B Boyce,B Clarke; Sandia National Laboratories; K Darling; Army Research Laboratory; P Felfer; University of Sydney, J Cairney; The University of Sydney [179]

359

Precipitation in Highly Supersaturated Al-Sc-V, Al-Sc-Nb, and Al-Sc-Ta Alloys During Isochronal Aging; KE Knipling; U S Naval Research Laboratory [180]

361

Co-deformation of crystalline-amorphous nanolaminates; W Guo, J Yao, EA JŠgle, P-P Choi, D Raabe; Max Planck Institut fŸr Eisenforschung [181]

363

An experimental and simulation studies of a high strain-rate deformation shear band in a high-nickel steel; S-I Baik, D Isheim; Northwestern University; D Jain; Northwestern edu; RK Gupta, S Kumar; Brown University; DN Seidman; Northwestern University [182]

365

Characterization of Element Partitioning at the Austenite/Ferrite Interface of as Cast CF-3 and CF-8 Duplex Stainless Steels; RP Kolli, S Mburu; University of Maryland; DE Perea, J Liu; Pacific Northwest National Laboratory; SC Schwarm; University of Maryland; A Eaton; Pacific Northwest National Laboratory; S Ankem; University of Maryland [183]

515

Probing the Organic/Inorganic Interface of the Ferritin Protein using Atom Probe Tomography; DE Perea, J Liu, J Bartrand, Q Dicken, T Thevuthasan, N Browning, JE Evans; Pacific Northwest National Laboratory [258]

517

Methods in creating, transferring, measuring cryogenic samples for APT; SS Gerstl, R Wepf; ScopeM, ETH Zurich [259]

519

Atom Probe of Apatites Ð from Single Crystals to Interphases in Tooth Enamel; LM Gordon, KA Derocher, MJ Cohen, D Joester; Northwestern University [260]

521

3D Atomic Scale Analysis of CMOS type structures for 14 nm UTBB-SOI technology; R Estivill, A Grenier; STMicroelectronics; T Printemps; CEA, LETI; M Juhel, M Gregoire, P Caubet;STMicroelectronics; D Blavette; Groupe de Physique des MatŽriaux Ð GPM UMR CNRS 6634 [261]

523

Microscopy of Chemical and Mechanical Heterogeneities in Lithium Cobalt Oxide; DR Diercks, M Musselman, M Kumar, BP Gorman, CE Packard; Colorado School of Mines [262]

685

Nanoscale characterization of Li-ion battery cathode nanoparticles by atom probe tomography correlated with Transmission electron microscopy and scanning transmission x-ray microscopy; A Devaraj, C Szymanski, P Yan, C Wang, V Murugesan, J Zheng, JJ Zhang; Pacific Northwest National Laboratory, T Tyliszczak; Adavanced Light Source, LBNL et al [343]

687

Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy; Y Chen, KP Rice, TJ Prosa; CAMECA Instruments, Inc; EA Marquis; University of Michigan; RC Reed; University of Oxford, Impact Laboratory [344]

689

A comparative analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF- SIMS; R Estivill, P Chevalier, F Lorut, M Juhel, L ClŽment, G Servanton; STMicroelectronics; A Grenier; CEA,LETI, D Blavette; Groupe de Physique des Materiaux (GPM) - UMR CNRS 6634 et al [345]

691

CdSe1-xTex Phase Segregation in CdSe/CdTe Based Solar Cells; JD Poplawsky, NR Paudel; Oak Ridge National Laboratory; A Ng; Vanderbilt University; K More; Oak Ridge National Laboratory; Y Yan; The University of Toledo [346]

693

Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography; GL Burton, DR Diercks, BP Gorman; Colorado School of Mines [347]

695

In-Situ Deuterium Charging for Direct Detection of Hydrogen in Vanadium by Atom Probe Tomography; S Dumpala, D Haley, SR Broderick; Iowa State University; PA Bagot; University of Oxford; MP Moody; University of Oxford; K Rajan; Iowa State University [348]

841

Level Set Method for Tip Shape evolution Simulation for Atom Probe Tomography; J Bao, Z Xu,R Colby; Pacific Northwest National Laboratory; S Thevuthasan; Qatar Energy and Environmental Research Institute; A Devaraj; Pacific Northwest National Laboratory [421]

843

Atom Probe Analysis of Bulk Chemistry in Mineral Standards; FA Laiginhas, A Perez-Huerta; Dept of Geological Sciences; RL Martens; Central Analytical Facility; TJ Prosa; CAMECA Instruments, Inc; D Reinhard; CAMECA Instruments, Inc , [422]

845

Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures;MI Nandasiri, N Madaan; Environmental Molecular Sciences Laboratory (EMSL), Pacific Northwest National Laboratory; A Devaraj; EMSL, Pacific Northwest National Laboratory; J Bao, Z Xu; Computational Material Sciences, Pacific Northwest National Laboratory; T Varga, V Shutthanandan; EMSL, Pacific Northwest National Laboratory, S Thevuthasan; Qatar Environment and Energy Research Institute, Qatar Foundation [423]

847

Creating Isoconcentration Surfaces in Low-Chemical-Partitioning, High Solute-Containing Alloys;BC Hornbuckle, M Kapoor, GB Thompson; The University of Alabama [424]

849

Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography; TJ Prosa, D Lawrence, D Olson, S Strennen; CAMECA Instruments, Inc; RL Martens, J Goodwin; The University of Alabama; A Portavoce; Aix-Marseille UniversitŽ IM2NPFacultŽ des Sciences et Techniques, D Mangelinck; Aix-Marseille UniversitŽ IM2NP FacultŽ des Sciences et Techniques et al [425]

851

Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards; DA Geochronology,DE Moser; CAMECA Instruments, Inc; I Barker; University of Western Ontario - Zircon Accessory Phase Laboratory; D Olson, I Martin, KP Rice, Y Chen, D Lawrence; CAMECA Instruments, Inc et al [426]

853

Atom probe tomography of feldspars and aluminosilicate glasses; LM Gordon; Environmental Molecular Spectroscopy Lab [427]

855

Catalysis and Atom Probe Tomography: Recent Progresses and Future Developments towards the Analysis of Nanoporous Samples; C Barroo, AP Magyar, DC Bell; School of Engineering and Applied Sciences, Harvard University [428]

857

Background Recovery through the Quantification of Delayed Evaporation Multi-Ion Events in Atom- Probe Data; K Kruska, DK Schreiber; Pacific Northwest National Laboratory [429]

859

Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards; FA Laiginhas, AP Perez- Huerta, RL Martens; University of Alabama; TJ Prosa, D Reinhard; Cameca Instruments, Inc [430]

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

1251

Quest for an optical circuit probe; NX Fang, J Xu; MIT [625]

1253

Quantum and time-resolved nano-optics using auto-correlated cathodoluminescence in a STEM;S Meuret, L Tizei, R Bourrellier; Laboratoire de Physique des Solides; T Auzelle; CEA-CNRS Group ÒNanophysique et SemiconducteursÓ; F Treussart; Laboratoire AimŽ Cotton; B Daudin, B Gayral; CEA-CNRS Group ÒNanophysique et SemiconducteursÓ, M Kociak; Laboratoire de Physique des Solides et al [626]

1255

Correlative STEM-Cathodoluminescence and Low-Loss EELS of Semiconducting Oxide Nano- Heterostructures for Resistive Gas-Sensing Applications; DR Miller, S Akbar, P Morris; The Ohio State University; RE Williams, DW McComb; Center for Electron Microscopy and Analysis [627]

1257

Investigating the Origin of Luminescence in Zinc Oxide Nanostructures With STEM- Cathodoluminescence; ER White, A Howkins, CK Williams, MS Shaffer; Imperial College London [628]

1259

Combined EELS and Cathodoluminescence analysis in a STEM microscope of GaN/InGaN quantum wells for LED applications; P Longo, DJ Stowe, RD Twesten; Gatan, Inc; A Howkins; Brunel University [629]

1467

Electron Energy-Loss Spectroscopy of Organic Photovoltaics; FJ Scheltens, LF Drummy; The Ohio State University; MF Durstock; Materials and Manufacturing Directorate; JB Gilchrist, S Heutz; Imperial College London; JA Alexander, DW McComb; The Ohio State University [732]

1469

Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment; R Nicholls, FS Hage; University of Oxford; K Refson; STFC Rutherford Appleton Laboratory; J Yates; University of Oxford; DM Kepaptsoglou; SuperSTEM Laboratory; TC Lovejoy, OL Krivanek; Nion Company, QM Ramasse; SuperSTEM Laboratory et al [733]

1471

Variable Angle Spectroscopic Ellipsometry and Electron Energy-Loss Spectroscopy; JA Alexander, FJ Scheltens; The Ohio State University; LF Drummy, MF Durstock; Materials and Manufacturing Directorate; JB Gilchrist, SE Heutz; Imperial College London; DW McComb; The Ohio State University [734]

1473

Detection and Characterization of OH Vibrational Modes using High Energy Resolution EELS;L Zhang, Q Liu, PA Crozier, T Aoki; Arizona State University [735]

1475

Study Using Low-loss EELS to Compare Properties of TMDs Produced by Mechanical and Liquid Phase Exfoliation; HC Nerl, FS Hage; Trinity College Dublin; L Houben; Ernst Ruska Center for Microscopy and Spectroscopy with Electrons; QM Ramasse; SuperSTEM Laboratory; V Nicolosi; Trinity College Dublin [736]

1901

Valence-loss EELS Spectroscopy of Refractory Plasmonic Nanomaterials; AA Herzing, U Guler; Material Measurement Laboratory, National Institute of Standards and Technology; X Zhou, TB Norris; Center for Ultrafast Optical Science [949]

1903

Bandgaps and Surface Inter-Band States in Photocatalysts with High Energy Resolution EELS; Q Liu, L Zhang; Arizona State University; K March; UniversitŽ Paris-Sud; T Aoki, PA Crozier; Arizona State University [950]

1905

Observation of Inter-Bandgap States in Doped Ceria via Monochromated EELS; WJ Bowman, K March; School for the Engineering of Matter, Transport and Energy, Arizona State University; T Aoki; LeRoy Eyring Center for Solid State Science, Arizona State University; CA Hernandez, PA Crozier; School for the Engineering of Matter, Transport and Energy, Arizona State University [951]

1907

Introduction to Plasmon Energy Expansion Thermometry; BC Regan, WA Hubbard, ER White; UCLA; R Dhall, SB Cronin; USC; S Aloni; Molecular Foundary; M Mecklenburg; USC [952]

1909

Nanoscopic imaging of energy transfer from single plasmonic particles to semiconductor substrates via STEM/EELS; G Li, C Cherqui; University of Notre Dame; N Bigelow; University of Washington; G Duscher; University of Tennessee; P Straney, J Millstone; University of Pittsburgh; D Masiello; University of Washington, JP Camden; University of Notre Dame [953]

2219

Nanoplasmonics in the TEM; M Bosman; Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research) [1108]

2221

Real-space Imaging of Plasmonic Modes of Gold Tapers by EFTEM and EELS; W Sigle, N Talebi, S Guo; Max Planck Institute for Intelligent Systems; M Esmann, SF Becker, R Vogelgesang,CT Lienau; Carl von Ossietzky UniversitŠt Oldenburg, PA van Aken; Max Planck Institute for Intelligent Systems [1109]

2223

Local Variations in the Surface Plasmon at Al Grain Boundaries and its Effect on the Optical Properties of Al Nanostructures; AM Thron, CG Bischak; Molecular Foundry, Lawrence Berkeley National Laboratory; S Dhuey; Molecular Foundry, Lawrence Berkeley; S Aloni; Molecular Foundry, Lawrence Berkeley National Laboratory [1110]

2225

Three-dimensional Surface Charge Reconstructions of Surface Plasmon Modes of Silver Right Bipyramids; SM Collins, M Duchamp; University of Cambridge; E Ringe; Rice University; Z Saghi, PA Midgley; University of Cambridge [1111]

2227

High-Resolution Characterization of Plasmonic Hybridization in Silver Nanostructures; EP Bellido, IC Bicket, J McNeil, GA Botton; McMaster University [1112]

2381

Ferroplasmons: Novel Plasmons in Metal-Ferromagnetic Bimetallic Nanostructures; J Ge, A Malasi; The University of Tennessee; N Passarelli; INFIQC, Departamento de Fisicoqu’mica; LA PŽrez; INFIQC, Departamento de Fisicoqu’mica, Facultad de Ciencias Qu’micas; E Coronado; The University of Tennessee, Knoxville; R Sachan; Oak Ridge National Labs; G Duscher; The University of Tennessee, R Kalyanaraman; The University of Tennessee, Knoxville [1189]

2383

Electron impact investigation of hybridization schemes in coupled split-ring resonators; Q Liang, Y Wen; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy;T Reindl; Max Planck Institute for Solid State Research; N Talebi, PA van Aken; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy [1190]

2385

Visualizing Plasmonic Coupling in Metamaterials and Applying Angular Resolved EELS; F von Cube, J Niegemann, DC Bell; School of Engineering and Applied Sciences, Harvard University; S Irsen; Electron Microscopy and Analysis (EMA), Center of Advanced European Studies and Research (caesar); S Linden; Physikalisches Institut, UniversitŠt Bonn [1191]

2387

Edge modes of surface plasmon nanodisk antennas visualized in 3-photon PEEM; RC Word, R Kšnenkamp; Portland State University [1192]

2389

Direct Observation of Plasmonic Enhancement of Emission in Ag-nanoparticle-decorated ZnO nanostructures; JA Hachtel, DC Mayo, CE Marvinney; Vanderbilt University; R Mu; Fisk University; SJ Pennycook; National University of Singapore; MF Chisholm; Oak Ridge National Laboratory;RF Haglund, ST Pantelides; Vanderbilt University et al [1193]

1679

Characterization of Sulfonated Polysulfone Polymers by EELS; C Wang, SJ Paddison; National Institute for Occupational Safety and Health; JR Dunlap, G Duscher; University of Tennessee [838]

1681

Structural and Optical Properties of AlGaN MQWs Grown by MOCVD Using One and Two TMG Sources; S Wang, H Xie, Y Wei, AM Fischer, FA Ponce; Arizona State University; M Moseley,B Gunning, AW Doolittle; Georgia Institute of Technology [839]

1683

Probing Plasmons in Three Dimensions within Random Morphology Nanostructures; JA Hachtel, A Mouti, DC Mayo; Vanderbilt University; SJ Pennycook; National University of Singapore; AR Lupini, MF Chisholm; Oak Ridge National Laboratory; RF Haglund, ST Pantelides; Vanderbilt University et al [840]

1685

Strong Coupling between ZnO Exciton and Localized Surface Plasmon in Ag Nanoparticles Studied by STEM-EELS; J Wei, J Xu, J Liu; Arizona State University [841]

1687

Advances in Scanning Transmission Electron Microscope Cathodoluminescence; S Meuret, L Tizei, A Losquin, R Bourrellier, LF Zagonel, M TencŽ, A Zobelli, M Kociak; Laboratoire de Physique des Solides et al [842]

2049

Pushing the limits of cathodoluminescence detection: analyzing 2D materials; A Mouti, R Sachan, A Lupini, MF Chisholm; Oak Ridge National Laboratory; SJ Pennycook; National University of Singapore [1023]

2051

SPARC: a Cathodoluminescence Platform for Nanoscale Plasmonics in a Scanning Electron Microscope; T Coenen, JJ de Boer; Delmic B V [1024]

2053

Measuring Gas Adsorption on Individual Facets of a Nanoparticle by a Surface Plasmon Nanoprobe; PA Lin, JM Kohoutek, J Winterstein, H Lezec, R Sharma; National Institute of Standards and Technology [1025]

2055

Evaluating Adhesion Layers for Plasmonic Nanostructures with Monochromated STEM-EELS and Surface Enhanced Raman Spectroscopy; SJ Madsen, AL Koh, R Sinclair; Stanford University [1026]

2057

Unconventional Surface Plasmon Excitations in Bi2Se3; C Ozsoy Keskinbora, N Talebi; MPI-IS; HM Benia; MPI-FKF; CT Koch; Ulm University; PA van Aken; MPI-IS [1027]

A15 Imaging Mass Spectrometry

2229

MALDI Imaging MS: Molecular Visualization of Tissues in Drug Discovery and Development;S Castellino, MR Groseclose; GSK [1113]

2231

Development of Laser Ionization Imaging Mass Spectrometry for Multiple Drugs Administered to Cancer Cells; H Hazama, H Kannen; Graduate School of Engineering, Osaka University; J Aoki, M Toyoda; Graduate School of Science, Osaka University; T Fujino; Graduate School of Science and Engineering, Tokyo Metropolitan University; Y Kaneda; Graduate School of Medicine, Osaka University; K Awazu; Graduate School of Engineering, Osaka University [1114]

2233

Mass spectrometry imaging of microbial interactions using matrix-enhanced laser desorption/ ionization Fourier-transform ion cyclotron resonance mass spectrometry; CR Anderton, RK Chu, JB Shaw, EM Zink; Pacific Northwest National Laboratory; CA Zeiner; School of Engineering and Applied Sciences, Harvard University; D Trede; SCiLS GmbH; CM Hansel; Woods Hole Oceanographic Institution, L Pa_a-Toli_; Pacific Northwest National Laboratory [1115]

2235

Multimodal molecular imaging: Insight into the complexity of biological surfaces through speed, resolution and identification; RM Heeren, A Bruinen; M4I, The Maastricht Multimodal Molecular Imaging Insitute; N Mascini; FOM-AMOLF; G Fisher; Physical Electronics; T Porta, S Ellis; M4I [1116]

2391

Nanoscale Imaging Mass Spectrometry using Cluster Ion Beams; N Winograd; Penn State University [1194]

2393

Multimodal Imaging of Environmental and Biological Liquid Surfaces and Interfaces Using Imaging Mass Spectrometry; X-Y Yu; Pacific Northwest National Laboratory [1195]

2395

Molecular Characterization of Lubricant Degradation Produced in a Tribological Wear Test Using TOF-SIMS Imaging MS; GL Fisher, T LeMogne; Physical Electronics; JM Martin, C Forest; Ecole Centrale de Lyon [1196]

2397

High-Resolution Imaging of the Distributions of Cholesterol, Sphingolipids, and Specific Proteins in the Plasma Membrane with Secondary Ion Mass Spectrometry; MK Kraft, PK Weber, JF Frisz,HA Klitzing, RL Wilson, A Yeager; University of Illinois; J Zimmerberg; Eunice Kennedy Shriver National Institute of Child Health and Human Development [1197]

2059

Imaging Mass Spectrometry Using Ultra-high Mass Resolution Matrix-Assisted Laser Desorption/ Ionization Time-of-Flight Mass Spectrometer, SpiralTOF; T Satoh, A Kubo; JEOL Ltd; M Ubukata; JEOL USA Inc; N Moriguchi, H Hazama, K Awazu; Graduate School of Engineering, Osaka University; M Toyoda; Graduate School of Science, Osaka University [1028]

2061

MALDI and LDI Imaging of Forensic Samples by Using A Spiral-Trajectory Ion Optics Time-of-Flight Mass Spectrometer; M Ubukata, AJ Dane, RB Cody, D Guarrera, DC Edwards, N Erdman, M Shibata; JEOL USA, INC, T Satoh; JEOL Ltd [1029]

2063

Synthesis of Monolayer Molybdenum Disulfide and ToF-SIMS Characterization; X Chen, M Ambrogio; Northwestern University [1030]

2065

An Investigation of the Pancreatic Islet Tumor Microenvironment with Time-of-Flight Secondary Ion Mass Spectrometry; BM Bluestein, F Morrish; University of Washington; D Hockenbery; Fred Hutchinson Cancer Research Center; LJ Gamble; University of Washington [1031]

A16 Advances in Electron and Ion Scanning Microscopies

697

High-Throughput SEM via Multi-Beam SEM: Applications in Materials Science; JR Michael,CY Nakakura; Sandia National Laboratories; T Garbowski, A-L Eberle, T Kemen, D Zeidler; Carl Zeiss Microscopy GmbH [349]

699

Measurement of the Electron Beam Point Spread Function (PSF) in a Scanning Electron Microscope (SEM); YP Kandel, MD Zotta, AN Caferra; CNSE, SUNY PI; RL Moore; Nanojehm Inc; E Lifshin; CNSE, SUNY PI [350]

703

Low Energy BSE Imaging with a New Scintillation Detector; J Fiala, J Kolosova, J Jiruse, J Beranek; TESCAN BRNO s r o [352]

705

Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High Resolution Imaging; H Demers, N Brodusch; Department of Mining andMaterials Engineering, McGill University; P Woo; Hitachi High-Technologies Canada Inc; R Gauvin; Department of Mining and Materials Engineering, McGill University [353]

1105

Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope; MT Postek, J Villarrubia, AE Vlad‡r; National Institute of Standards and Technology; A Muto; Hitachi High Technologies America [552]

1107

Variation in Band Gap Contrast in Natural Molybdenum Disulphide (MoS2) with BSE Collection Angle and Stage Bias using a Segmented Annular BSED; BJ Griffin, DC Joy; The University of Western Australia; JR Michael; Sandia National Laboratory [553]

1109

Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM; V Nedela, I Konvalina, M Oral, J Hudec; Institute of Scientific Instruments of ASCR [554]

1111

Electron Microscopy in Air: Transparent Atomic Membranes and Imaging Modes; Y Han, K Nguyen; Applied and Engineering Physics, Cornell University; Y Ogawa; Chemistry and Chemical Biology Department, Cornell University; H Shi; Physics Department, Cornell University; J Park; Chemistry and Chemical Biology Department, Cornell University; DA Muller; Applied and Engineering Physics, Cornell University [555]

1113

Advances In Variable Pressure Imaging and Detection; L Han, C Berger, M Boese, A Thesen, F Zhou, S Meyer, E Essers; Carl-Zeiss Microscopy, FE-SEM Department [556]

1261

Low kV High Resolution Scanning Electron Microscopy study of Si nanowire surfaces; C Alfonso, L Roussel; Aix-Marseille UniversitŽ-CNRS-IM2NP; A Chara•; Aix-Marseille UniversitŽ-CNRS, IM2NP; C Dominici, AP Campos; Aix-Marseille UniversitŽ-CP2M; LY Han, F Zhou; Carl Zeiss Microscopy GmbH [630]

1263

An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy; TJ Woehl, J Holm, RR Keller; Material Measurement Laboratory, NIST [631]

1265

Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging; JY Howe, Y Hashimoto; Hitachi High-Technologies Canada Inc; X Wang, M Vara; Georgia Institute of Technology; D Hoyle; Hitachi High-Technologies Canada Inc; T Schamp; Hitachi High-Technologies America Inc; Y Xia; Georgia Institute of Technology, DC Joy; Oak Ridge National Laboratory [632]

1267

Sub-surface Serial Block Face Scanning Electron Microscopy; Q He, MA Aronova; National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health; DC Joy; University of Tennessee; G Zhang, RD Leapman; National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health [633]

1269

Applications of energy dependent backscatter yield variations at low voltage; A Thesen, M Boese; Zeiss Microscopy; K Sempf; Fraunhofer-Institute IKTS; F Zhou; Zeiss Microscopy [634]

1689

Modeling Ion Beam Induced Secondary Electrons; U Huh, V Iberi, W Cho; The University of Tennessee, Knoxville; R Ramachandra; The University of California, San Diego; DC Joy; The Oak Ridge National Laboratory [843]

1691

Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials; V Iberi, U Huh; University of Tennessee Knoxville; Y Wu; University of Tennessee; PD Rack; University of Tennessee Knoxville; AJ Rondinone; Center for Nanophase Materials Sciences; DC Joy; University of Tennessee Knoxville [844]

1693

Study of SEM images obtained with an electron energy and take-off angle (E-_) selective detector;T Otsuka, M Nakamura, K-I Yamashita, M Hara; JEOL Ltd; F Timischl; JEOL Technics Ltd; K Honda; JEOL Ltd; M Kudo; JEOL Technics Ltd, S-I Kitamura; JEOL Ltd [845]

1695

Repetitive Observation of Coniferous Samples in ESEM and SEM; E Tihlarikova, V Nedela; Institute of Scientific Instruments of ASCR [846]

1697

The Size and Morphological Study of Spherical Polyelectrolyte Complex Beads Using Environmental Scanning Electron Microscopy; V Nedela, M Bucko, E Tihlarikova; Institute of Scientific Instruments of ASCR; T Kraj_ovi_, P Gemeiner; Institute of Chemistry, Centre for Glycomics SAV [847]

1699

Morphological and Chemical Analysis of Impurities in Ice Using the Environmental Scanning Electron Microscopy and Fluorescence Spectroscopy; V Nedela, J Runstuk; Institute of Scientific Instruments of ASCR; J Krausko, P Klan, D Heger; Faculty of Science, Masaryk University [848]

1701

Dynamic Gas Environmental System Development for in situ Real-time SEM Imaging under Atmospheric Pressure; T Daio, H-W Li, T Ikuta, T Nishiyama; Kyushu University; K Takahashi; International Institute for Carbon-Neutral Energy Research (WPI-I2CNER); Y Takata, SM Lyth, K Sasaki; Kyushu University et al [849]

1703

Determining the Causes of Scanning Distortions in SEM and FIB; M Pluska, A Czerwinski, M Wzorek, M Juchniewicz, J K_tcki; Institute of Electron Technology [850]

1705

Secondary Electron Yield at High Voltages up to 300 keV; JY Howe; Hitachi High-Technologies Canada Inc [851]

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

1477

Standardization and Metrology for Efficiency and Reliability in Microbeam Analysis Ð No pain, no gain; V-D Hodoroaba, RB Marinenko; BAM Federal Institute for Materials Research and Testing; M Matthews; AWE; J Zhao; SAC [737]

1479

Characterizing the Geometric Detection Efficiency of EDX Detectors; FH Schamber; Retired [738]

1481

Determination of the Effective EDS Detector Area Using Experimental and Theoretical X-ray Emission Yields; M Procop, V-D Hodoroaba; IfG-Institute for Scientific Instruments; R Terborg; Bruker-nano GmbH [739]

1483

Energy Resolution of Modern EDS Spectrometers: Is the current ISO standard definition outdated?;R Terborg, M Falke; Bruker Nano GmbH [740]

2237

Standard Methods and Reference Materials for Performing a Complete EPMA WDS Instrument Diagnostic; DC Meier, ES Windsor; National Institute of Standards and Technology; JM Davis; PNDetector; RB Marinenko, JR Anderson, F Meisenkothen, SA Wight; NIST [1117]

2239

Testing of the DR Method for Image Sharpness Determination; M Matthews, J Shah; AWE [1118]

2241

The Use of Color in Elemental Maps and Electron-Microscope Images; RF Egerton; University of Alberta [1119]

2243

Tomographic measurement of buried interface roughness; M Hayashida, S Ogawa, M Malac; National Institute for Nanotechnology [1120]

2245

Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy; JH Dycus, JS Harris, XH Sang; North Carolina State University; SD Findlay; Monash University; AA Oni; North Carolina State University; LJ Allen; University of Melbourne; DL Irving, JM LeBeau; North Carolina State University et al [1121]

2399

Standardization on particle size distribution measurement of nanomaterials; K Yamamoto; National Institute of Advanced Industrial Science and Technology (AIST) [1198]

2401

Shape Recognition of Nanoparticles by High-Resolution SEM and TSEM; E Ortel, L Pelluti; BAM Federal Institute for Materials Research and Testing Division 6 8; F Pellegrino, V Maurino; University of Turin Department of Chemistry; J Mielke; BAM Federal Institute for Materials Research and Testing Division 6 8; I HŠusler, W …sterle; BAM Federal Institute for Materials Research and Testing Division5 1, V-D Hodoroaba; BAM Federal Institute for Materials Research and Testing Division 6 8 et al [1199]

2403

Assessment of Different Electron Microscopy Techniques for Particle Size Quantification of Potential Nanomaterials; P MŸller, J Mielke; BASF SE; V-D Hodoroaba; BAM Federal Institute for Materials Research and Testing; R KŠgi; EAWAG aquatic research; M Ryner; Vironova AB [1200]

2405

Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomography; M Hayashida, K Kumagai, M Malac; National Institute for Nanotechnology [1201]

2407

Repeatable and Transferable Processing for Electron Tomography: An Open Platform for Visualization and Reconstruction of 3D Materials; R Hovden, MD Hanwell; Cornell University; U Ayachit; Kitware Inc; Y Jiang; Cornell University; M Kitware Inc., M Cornell University [1202]

1707

Thin Film Porosity Determined by X-Rays at SEM; E Ortel, R Kraehnert; BAM Federal Institute for Materials Research and Testing Division 6 8; F Galbert; Technical University of Berlin;V-D Hodoroaba; BAM Federal Institute for Materials Research and Testing Division 6 8 [852]

1709

Specimen Preparation Method for Size Distribution Measurements of Nano-materials by Scanning Electron Microscopy - Fixing of Nano-particles on a Substrate with Adhesive Coating; K KUMAGAI, A KUROKAWA; National Institute of Advanced Industrial Science and Technology [853]

1711

Quantitative Measurement of Resolution as a Function of Defocus in Different Microscopy Modalities Using a Simplified Technique; AW Sanders, AE Curtin; NIST; R Skinner; University of Colorado [854]

1713

Improved Spatial Resolution of EDX/SEM for the Elemental Analysis of Nanoparticles; J Mielke, S Rades, E Ortel; BAM; T Salge; Core Research Laboratories, Natural History Museum;V-D Hodoroaba; BAM [855]

1715

What about Ionic Liquids as a ÓhotÓ Certified Reference Material Candidate to check Your EDS below 1 keV?; M Holzweber, V-D Hodoroaba, WE Unger; BAM Federal Institute for Materials Research and Testing [856]

A18 Core Facility Management

367

Designing Analytical Instrument Control Systems for Longevity and Maximum Upward Compatibility;EL Principe, V Filip; Tescan USA [184]

369

Now What am I Going to doÉ..This is Going to be a Large Data Set; CA Brantner; The George Washington University, GW Center for Nanofabrication and Imaging [185]

371

Networked Data Storage and Analysis for the Wisconsin Regional Materials Network; JJ McCarthy, PM Voyles; Wisconsin Materials Institute, University of Wisconsin - Madison; JA Last; Materials Science Center, University of Wisconsin; DR Bittner, IW Sadkovich; COMPUTER-AIDED ENGINEERING, University of Wisconsin [186]

373

Strategies for Managing Information Technology (IT) in Microscopy Facilities; JHJ Scott; National Institute of Standards and Technology [187]

525

Considerations for Physical Facility Design and Management of a State-of-the-Art Electron Microscopy and Analysis Laboratory; DE Huber, J Orsborn, H Colijn, C Begg; The Ohio State University; MJ Mills; The Ohio State Universtiy; D McComb; The Ohio State Univeristy; HL Fraser; The Ohio State University [263]

527

The Use of Online Tools in Microscopy and Microanalysis Core Facilities; MH Apperley, J Whiting, B Cribb; Australian Microscopy and Microanalysis Research Facility; C Anna; The University of Sydney [264]

529

Evolution of Data Acquisition, Storage and Analysis in a Multi-user Facility; NJ Zaluzec; Argonne National Laboratory [265]

175

Do-It-Yourself Database for Core Facility Management; R-C Hsia; University of Maryland Baltimore [88]

177

High Performance Remote Electron Microscopy; DE Huber, J Orsborn, F Scheltens, DW McComb, HL Fraser; The Ohio State University [89]

179

Lock-n-Sync for Secure Data Storage in Shared Electron Microscopy Facilities; K Li, S Li; FOM Networks, Inc [90]