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Plenary

Z01 MM 2015 Plenary

New Molecular Tools for Light and Electron Microscopy; RY Tsien, EA Rodriguez, SF Palida,SR Adams, MR Mackey, R Ramachandra, MH Ellisman; University of California, San Diego [1]

Some Unexpected Difficulties in Microscope Operation in Microgravity; DR Pettit; NASA Johnson Space Center [2]

Sorby Lecture

X99 Sorby Lecture

Microstructural Developments Leading to New Advanced High Strength Sheet Steels: A Historical Assessment of Critical Metallographic Observations; DK Matlock, LS Thomas, MD Taylor, E De Moor, JG Speer; Colorado School of Mines [3]

Analytical and Instrumentation Science Symposia

A01 Vendor Symposium: New Tools for Life and Materials Sciences

The Biodynamic Microscope: Doppler Imaging inside Living 3D Biological Tissues; D Nolte, R An, J Turek; Animated Dynamics Inc [4]

Field-portable Nano-imaging: A New Tool for On-Demand Microscopy; CS Own, MF Murfitt, LS Own; Voxa [5]

Automated, Programmable Processing of Specimens and Grids with the mPrepª ASP-1000; TE Strader, SL Goodman; Microscopy Innovations LLC [6]

Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High- Sensitivity Nano-Analytics; T Wirtz, D Dowsett, S Eswara-Moorthy; Luxembourg Institute of Science and Technology [7]

Mastering the Multi-scale Challenge: A Modern Correlation Environment; AP Merkle, L Lechner, A Steinbach, J Gelb; Carl Zeiss X-ray Microscopy, Inc; F Perez-Willard; Carl Zeiss Microscopy GmbH; D Unrau, MW Phaneuf; Fibics Incorporated [8]

RISE Microscopy: Correlative Raman and SEM Imaging; U Schmidt, O Hollricher; WITec GmbH; W Liu; WITec Instruments; EL Principe; Tescan USA [9]

337

New Developments in Automated Particle Analysis in the Electron Microscope Ð from Micro to Nano;C Lang, M Hiscock, J Holland; Oxford Instruments Nanoanalysis; S Yamaguchi; OIKK; D Joyce, G Vatougia; Mantis Deposition Ltd [169]

339

STEM-EDXS System for Atomic-Sensitivity Elemental Mapping; TC Lovejoy, RM Stroud; Nion;ND Bassim; Naval Research Lab; GJ Corbin, N Dellby; Nion; W Hahn, M Falke; Bruker Nano GmbH, O Krivanek; Nion et al [170]

341

Aberration Correction System Using Segmanted Detector in STEM; Y Kohno, H Sawada; JEOL Ltd;N Shibata; Institute of Engineering Innavation, School of Engineering, The University of Tokyo [171]

343

From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging; H Guo, L Jin; Direct Electron, LP; P Lu, Z Wang, Z Shan; Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, XiÕan Jiaotong University; B Bammes, M Spilman, R Bilhorn; Direct Electron, LP [172]

701

Imaging Contrast with Multiple Ion Beams; H Wu, S Sijbrandij, S McVey, J Notte; Carl Zeiss Microscopy LLC [173]

347

The Ultra-stable Scanning Transmission Electron Holography Microscope; RA Herring, D Hoyle; University of Victoria [174]

147

Application of a semi-in-lens FE-SEM to the crystallographic analysis with the EBSD technique; H Ito, Y Hashimoto, S Takeuchi, M Sasajima, H Sato; Hitachi High-Technologies Corporation; H Morita; Oxford Instruments [74]

149

Optimized Solutions for the Arrangement of Digital Imaging Detectors; T Hashimoto, J Mancuso,K Nakano, E Nakazawa; Hitachi High-Technologies Corporation; L Blubaugh, B Armbruster; Hitachi High Technologies America, Inc [75]

151

Cooling Temperature Control System for the Cross Section Polisher; S Kataoka, M Kozuka; IB Business Unit, JEOL Ltd; T Wakasa; SASM Design, JEOL Ltd; K Todoroki, T Kasai, T Negishi, M Matsusita,T Suzuki; IB Business Unit, JEOL Ltd et al [76]

153

Correlative SEM and Raman imaging of hot spots on SERS substrate; R V‡_a, M Kocman, J Jiru_e; TESCAN Brno s r o [77]

155

Electron Diffraction Phase Analysis and Pattern Simulations Using the ICDD Powder Diffraction File (PDF-4+); S Gates, K Zhong, T Blanton, J Blanton; International Centre for Diffraction Data [78]

157

Reel-to-Reel Electron Microscopy: Latency-Free Continuous Imaging of Large Sample Volumes; CS Own, MF Murfitt, LS Own; Voxa; D Brittain, N de Costa, RC Reid; Allen Institute for Brain Science; DG Hildebrand, B Graham; Harvard Medical School et al [79]

159

The New Zeiss GeminiSEM 500 Meets the Needs of Challenging Biological Applications; I Angert,C Berger, M Edelmann, R Kirmse, A Thesen; Carl Zeiss Microscopy GmbH; K Czymmek; Carl Zeiss Microscopy, LLC [80]

161

Effective new Plasma Cleaning Strategies for Scanning Electron Microscopes and FIBs; RA Vane, ML Cable; XEI Scientific Inc [81]

163

Ease of Use Solution for Fast and Automated TEM-Lamella Preparation; T Volkenandt, G Pavia, I Schulmeyer, M Kienle; Carl Zeiss Microscopy GmbH [82]

165

Correlative Light and Electron Microscopy for Materials Science; JL Riesterer, G Heiss; FEI Company [83]

167

Setup and Practical Applications of a pnCCD Based XRF System; JM Davis, J Schmidt;PNDetector GmbH; M Huth, S Ihle, D Steigenhšfer, P Holl, G Lutz; PNSensor GmbH, U Weber; PNDetector et al [84]

169

Electrical Probing and Current Imaging for Failure Analysis in the SEM/FIB; AJ Smith, A Rummel, M Kemmler, K Schock, G Renka, S Kleindiek; Kleindiek Nanotechnik [85]

171

Principal Component Analysis in EDS; DL West; Thermo Fisher Scientific [86]

173

A Software for Lab Access and Chemical Process Logging in Shared Facilities; S Li, F Camino; FOM Networks, Inc [87]

A02 TEM Phase Contrast Imaging

1385

Electron beam-induced charging and modifications of thin films; M Malac, M Beleggia; Nat Inst for Nanotechnology; T Rowan; University of British Columbia; RF Egerton; University of Alberta;M Kawasaki; JEOL USA Inc; Y Okura; JEOL Ltd; RA McLeod; Fondation Nanosciences [692]

1389

Comparison of Cryo TEM Images Obtained with Zernike and Hole-Free Phase Plates; N Hosogi, H Iijima, A Sen; JEOL Ltd [693]

1391

Practical Aspects and Usage Tips for the Volta Phase Plate; R Danev, B Buijsse, M Khoshouei, Y Fukuda, W Baumeister; Max Planck Institute of Biochemistry [694]

1393

Combination of Different Techniques in Cryo-Electron Tomography with a Volta Phase Plate;M Khoshouei, G Gerisch, M Ecke, J Ortiz; Max-Planck Institute of Biochemistry; J Plitzko;Max-Planck Institue of Biochemistry; R Danev; Max-Planck Institute of Biochemistry; W Baumeister; Max-Planck Institue of Biochemistry [695]

1833

Automated cryo electron tomography and sub-tomogram averaging with the FEI Volta phase plate;WJ Hagen; European Molecular Biology Laboratory [915]

1835

In situ studies of cellular architecture by Electron Cryo-Tomography with Volta Phase Plate; Y Fukuda, S Asano, U Laugks, F Beck, A Aufderheide, F Fšrster, V Lu_i_, W Baumeister; Max Planck Institute of Biochemistry et al [916]

1837

Applications and New Investigations of the Volta Phase Plate; K Sader, B Buijsse; FEICompany; I Peschiera; Novartis Vaccines, Structural Microscopy; F Novartis Vaccines, Structural Microscopy [917]

2141

Zernike Phase Contrast Electron Microscopy: Observation of the Image Formation and Improvement of the Image Quality using Direct Detector; K Murata, N Miyazaki; National Institute for Physiological Sciences; K Nagayama; The Graduate University for Advanced Studies (SOKENDAI) [1069]

2143

Zernike Phase Plate Configuration at Intermediate Lens Position on JEM2200FS; W Chiu, C Fu, H Khant; Baylor College of Medicine; S Motoki; JEOL [1070]

2145

Zernike cryo-EM with a direct electron camera enables tracking protein conformations in the temporal dimension; W-H Chang; Institute of Chemistry, Academia Sinica [1071]

2297

Use of Ultrananocrystalline Diamond as a Phase-contrast Aperture Material; RM Glaeser,D Larson; University of California, Berkeley; B Muddiman, S Sassollini, S Cabrini, J Jin; University of California [1147]

2299

Evolution of Magnetic Ring Designs for Phase Plates; CJ Edgcombe; University of Cambridge, UK [1148]

2301

Development of Phase Contrast Scanning Transmission Electron Microscopy and its application; H Minoda, T Tamai; Tokyo University of Agriculture and Technology; H IIjima, K Yukihito; JEOL Ltd [1149]

2303

High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors; H Yang, L Jones; University of Oxford; H Ryll; PNSensor GmbH; M Simson, H Soltau; PNDetector GmbH; Y Kondo; JEOL Ltd; TJ Pennycook; University of Vienna, PD Nellist; University of Oxford et al [1150]

2305

Electron beam shaping; R Shiloh, R Remez; Tel Aviv University; A Arie; Tel-Aviv University [1151]

1573

Development of Amorphous Carbon Thin Film Phase Plate; Y Konyuba, H Iijima, N Hosogi;JEOL Ltd; Y Abe; Yamagata Research Institute of Technology; I Ishikawa, Y Ohkura; JEOL Ltd [785]

1575

Thin-Film-Based Phase Plates for Transmission Electron Microscopy Fabricated From Metallic Glasses; M Dries, S Hettler, T Schulze, W Send, E MŸller, R Schneider, D Gerthsen; Karlsruher Institut fŸr Technologie/Laboratorium fŸr Elektronenmikroskopie, Y Luo; UniversitŠt Gšttingen/IPhysikalisches Institut et al [786]

1577

Optimization of JEM2200FS for Zernike Phase Contrast Cryo-EM; HA Khant, C Fu; Baylor College of Medicine; S Motoki; JEOL; MH Sullivan, G DeRose; California Institute of Technology; W Chiu; Baylor College of Medicine [787]

1579

Initial Experience with the Volta Phase Plate; M Marko, C Hsieh; Wadsworth Center [788]

1581

High-Resolution Transmission Electron Microscopy With Zach Phase Plate; S Hettler, M Dries, T Schulze; Karlsruhe Institute for Technology - Laboratory for Electron Microscopy; M Oster,C Wacker, RR Schršder; BioQuant CellNetworks - University of Heidelberg; D Gerthsen; Karsruhe Institute for Technology - Laboratory for Electron Microscopy [789]

1941

Another Phase Plate in the Zoo: Reducing Charging and Optimizing the Design of Electrostatic Phase Plates; A Walter, S Steltenkamp; Lawrence Berkeley National Laboratory, National Center for X-ray Tomography; D Rhinow, W KŸhlbrandt; Max Planck Institute of Biophysics [969]

1943

Development of Phase Contrast Scanning Transmission Electron Microscopy; H Iijima, H Minoda; JEOL Ltd; T Tamai; Tokyo University of Agriculture and Technology; F Hosokawa, T Fukuda,Y Kondo; JEOL Ltd [970]

1945

Electron Differential Phase Microscopy with an A-B Effect Phase Plate; H Niimi, J Usukura, Y Yamamoto; Nagoya University; S Ohta; JEOL Ltd [971]

1947

Lorentz Transmission Electron Microscopy for Imaging Magnetic Fields from a Perpendicular Ferromagnetic Stripe Domain Thin Film; TR Kim, O Hellwig, R Sinclair; Stanford University [972]

1949

Fabrication of Self-Supporting Annular Apertures for Use in the Transmission Electron Microscope;L YU, A Johnston-Peck, A Herzing, V Luciani; National Institute of Standards and Technology [973]

A03 Electron Holography for Nanofields in Solids

1395

Electron Holography for Measuring Electrostatic Potentials and Strain Fields; M Lehmann; Technische UniversitŠt Berlin, Institut fŸr Optik und Atomare Physik, Sekr ER 1-1 [696]

1397

Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography; Z Gan, M Gu; Arizona State University; J Tang; University of California at Los Angeles; C-Y Wang; National Taiwan University of Science and Technology; KL Wang; Universityof California at Los Angeles; C Wang; Pacific Northwest National Laboratory; DJ Smith, MR McCartney; Arizona State University [697]

1399

Aberration Corrected Off-Axis Electron Holography of Layered Transition Metal Dichalcogenides; AH Tavabi, F Winkler; Ernst Ruska- Centre for Microscopy and Spectroscopy with Electrons and Peter GrŸnberg Institute 5, Forschungszentrum JŸlich; Y-C Lin; National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan; K Suenaga; National Institute of Advanced Industrial Science and Technology (AIST); E Yucelen; FEI Company; RE Dunin-Borkowski; Ernst Ruska- Centre for Microscopy and Spectroscopy with Electrons and Peter GrŸnberg Institute 5, Forschungszentrum JŸlich; B Kardynal; Peter GrŸnberg Institute 9, Forschungszentrum JŸlich, Germany [698]

1401

In Situ Electron Holography of Ferroelectric Thin Films; M-G Han, MS Marshall, L Wu; Brookhaven National Laboratory; FJ Walker, CH Ahn; Yale University; Y Zhu; Condensed Matter Physics Materials Science [699]

2147

Off-axis electron holography for the quantitative study of magnetic properties of nanostructures: from the single nanomagnet to the complex device; C Gatel, A Masseboeuf, E Snoeck; CEMES-CNRS;FJ Bonnilla, T Blon, L-M Lacroix, A Meffre; LPCNO, INSA, University of Toulouse, JF Einsle; Centre for Nanostructured Media, School of Mathematics and Physics, QueenÕs University Belfast et al [1072]

2149

Three-Dimensional Magnetic Vortex Cores Visualized by Electron Holographic Vector Field Tomography; T Tanigaki, Y Takahashi, T Shimakura, T Akashi, R Tsuneta, A Sugawara; Central Research Laboratory, Hitachi, Ltd; D Shindo; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University [1073]

2151

Towards Multiresolution Phase Retrieval using Electron Ptychography; C Phatak, Y Nashed, T Peterka; Argonne National Laboratory [1074]

2153

Skyrmion lattices observed by high-voltage holography electron microscopes; HS Park; Dong-A University [1075]

2307

A Phase Space Perspective on Electron Holography - Building Bridges Between Inline-, Off-axis Holography, Differential Phase Contrast and Diffractive Imaging; A Lubk, F Ršder, H Lichte; Triebenberg Laboratory, Institute of Structure Physics, Technische UniversitŠt Dresden [1152]

2309

Lorentz-STEM imaging of Fields and Domains using a High-Speed, High-Dynamic Range Pixel Array Detector at Atomic Resolution; KX Nguyen, RM Hovden, MW Tate, P Purohit, JT Heron; Cornell University; CS Chang; Cornell Unviersity; SM Gruner, DA Muller; Cornell University [1153]

2311

Hybrid Electron Holography; C Ozsoy Keskinbora, CB Boothroyd; MPI-IS; RE Dunin Borkowski; Forschungszentrum Julich; PA van Aken; MPI-IS; CT Koch; Ulm University [1154]

2313

Interface Magnetism Studied by Electron Holography with Multiple-biprisms; Y Murakami; Tohoku University [1155]

1951

Low Dose Electron Holography: First Steps; E Voelkl, R Herring; Hitachi High Technologies America, Inc; B Bammes; Direct Electron, LP; D Hoyle; Hitachi High-Technologies Canada Inc [974]

1953

A Practically Simple and Easy Approach for Minimizing the Influence of Fresnel Fringes on Phase Sensitivity Measured from Electron Holography; Z Wang; Micron Technology, Inc [975]

1955

Optimising Electron Holography in the Presence of Partial Coherence and Instrument Instabilities with Conventional and Direct Detection Cameras; SL Chang, C Dwyer, J Barthel, CB Boothroyd,RE Dunin-Borkowski; Forschungszentrum JŸlich [976]

1957

Coherent Electron Interference of Diffracted Beams from Amorphous Materials; RA Herring; University of Victoria [977]

1959

Three dimensional magnetic field reconstruction of artificial Skyrmion heterostructures; S Zhang, A Petford-Long, C Phatak; Argonne National Laboratory [978]

1961

Spin-Multislice applied to the electron spin interaction with materials; V Grillo, S Alexander; CNR-Istituto Nanoscienze, Centro S3; J Rusz, A Edstršm; Uppsala University; A Lubk;Triebenberg Laboratory, TU Dresden; BJ McMorran; University of Oregon; E Karimi; University of Ottawa [979]

1963

Nanoscale strain distributions in embedded SiGe semiconductor devices by precession electron diffraction and dual lens dark field electron holography; D Cooper, J Rouviere; CEA LETI MINATEC Campus; C Murray; IBM Watson Research Center; J Bruley; IBM; N Bernier; CEA LETI MINATEC Campus [980]

1965

Strain Measurement through the Thickness of Crystal using DBI; M Norouzpour, RA Herring; University of Victoria [981]

1967

Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations; J Li, P Morin; IBM; Q Liu; STMicroelectronics; K Cheng; IBM; N Loubet; STMicroelectronics; B Doris, J Gaudiello; IBM [982]

1969

Electrostatic-Potential Analysis of Charged Particles by Split-Illumination Electron Holography; T Tanigaki, Z Akase; Central Research Laboratory, Hitachi, Ltd; S Aizawa; Center for Emergent Matter Science (CEMS), RIKEN; HS Park; Dong-A University; Y Murakami, D Shindo; Tohoku University; H Kawase; Ricoh Institute of Technology, RICOH Co , Ltd [983]

1971

Crystalline phase mapping associated to the magnetic flux in cobalt nanowires; A Ponce, BJ Stadler,F Ruiz Zepeda, F Mendoza Santoyo; University of Texas at San Antonio; MM Maqableh; University of Minnesota; I Betancourt; University of Texas at San Antoni; J Cantu Valle, JE Sanchez; University of Texas at San Antonio [984]

1973

New Quantitative Phase Reconstruction Technique using Hollow-cone Probe and Annularly Arrayed Detectors in STEM; T Ishida, T Kawasaki, T Tanji; Nagoya University; T Ikuta; Osaka Electro- Communication University [985]

1975

Analysis of GaAs compound semiconductors and the semiconductor laser diode using off-axis electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM; H Sasaki, S Otomo, R Minato; Furukawa Electric Ltd; K Yamamoto, K Yamamoto; Nanostructure Research Laboratory, Japan Fine Ceramics Center; J Yamasaki; Osaka University; N Shibata; Institute of Engineering Innovation, The University of Tokyo [986]

1977

Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures; C Phatak, A Masseboeuf; Argonne National Laboratory; L de Knoop, C Gatel, M Hytch; CEMES-CNRS [987]

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

1403

The Perfect Cut: Focused Ion Beam Preparation for In Situ TEM; ML Taheri; Drexel University [700]

1405

In-Situ EDS Characterization of TEM Lamellae Created by Xe Plasma FIB; T Hrn_’_, C Lang, JV Obo_a; TESCAN Brno s r o; T Bartak; Oxford Instruments [701]

1407

Vacuum Assisted ex situ Lift Out of FIB Prepared Specimens; LA Giannuzzi, D Hess; EXpressLO LLC; T Clark; The Pennsylvania State University [702]

1409

Focused Ne+ Ion Beams for Final Polishing of TEM Lamella Prepared Through Ga-FIB Systems; D Wei, C Huynh; Ion Microscopy Innovation Center, Carl Zeiss Microscopy, LLC; A Ribbe; University of Massachusetts, Amherst [703]

1411

Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries; M Presley, D Huber, HL Fraser; The Ohio State University [704]

1839

A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation;J Huang, M Loeffler; Dresden Center for Nanoanalysis, Technische Universitaet Dresden; U Muehle; Fraunhofer Institute for Ceramic Technologies and Systems; W Moeller; Helmholtz-Zentrum Dresden-Rossendorf; H Mulders, L Kwakman; FEI Company; E Zschech; Dresden Center for Nanoanalysis, Technische Universitaet Dresden [918]

1841

Probe Optimization Studies For High current Focused Ion Beam Instruments; S Subramaniam, J Richards, K Johnson; Intel Corporation [919]

1843

Methodology for Studying Nanoscale Details of Focused Ion Beam Gas-Assisted Etching and Deposition by TEM and Numerical Modeling; V Ray, E Chang, K Toula, S-C Liou, W-A Chiou; University of Maryland [920]

1845

Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics;AW Sanders, AE Fox, PD Dresselhaus; NIST [921]

1847

In situ Femtosecond Laser and Argon Ion Beams for 3D Microanalysis using the TriBeam; MP Echlin, WC Lenthe; University California Santa Barbara; J Douglas, M Titus; UCSB; R Geurts, M Straw; FEI Company; TM Pollock; UCSB [922]

2155

Roles of Self-Assembly and Beam Damage in Gas-Assisted Electron and Ion Beam Induced Processing;M Toth; University of Technology [1076]

2157

Site-Specific TEM Specimen Preparation of Samples with Sub-Surface Features; J Deitz, S Carnevale, D McComb; The Ohio State University; S Ringel; The Ohio State Univeristy; T Grassman; The Ohio State University [1077]

2159

Micro-micromechanical Properties of Weld Metal; AK Basak, WL Costin; Adelaide Microscopy [1078]

2161

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/ SEM and TEM; JA Taillon, C Pellegrinelli, Y Huang, E Wachsman, L Salamanca-Riba; University of Maryland [1079]

2315

A Cryo-FIB Lift-Out Procedure for Cryo-TEM Sample Preparation at Soft-Hard Matter Interfaces;K Leifer; Uppsala University [1156]

2317

Temporospatial Relationship of Lipid Droplets and Mitochondria in Cardiac Muscle by Focused Ion Beam Scanning Electron Microscopy; T Chou, C Sztalryd-Woodle; Stevens Institute of Technology; R-C Hsia; University of Maryland Baltimore [1157]

2319

SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics;T Wirtz, D Dowsett, P Philipp, J-N Audinot, S Eswara-Moorthy; Luxembourg Institute of Science and Technology [1158]

2321

Application of Focused Helium Ion Beams for Direct-write Lithography of Superconducting Electronics;SA Cybart, EY Cho, BH Wehlin, MK Ma, TJ Wong, RC Dynes; University of California San Diego; C Huynh; Carl Zeiss Microscope, LLC [1159]

1979

Progression of Focused Helium Ion Beam Milling in Gold Substrates; EM Mutunga, S Tan; University of Tennessee, Knoxville; A Vladar; National Institute of Standards and Technology; K Klein; University of the District of Columbia [988]

1981

Investigation of Ar ion-milling rates for transmission electron microscopy specimens; MH Lee, K-H Kim; Korea Institute of Industrial Technology (KITECH) [989]

1983

Focused Ion Beam Micromachining Enables Novel Optics for X-ray Microscopy; K Keskinbora, UT Sanli, C GrŽvent, M Hirscher, G SchŸtz; Max Planck Institute for Intelligent Systems [990]

1985

In Situ Probing Biological Structures by Combining Focused Ion Beam and Atomic Force Microscopy;B Liu, V Adineh, J Fu; Monash University [991]

1987

Multilayer Fresnel Zone Plates for X-ray Microscopy; UT Sanli, K Keskinbora, C GrŽvent; Max Planck Institute for Intelligent Systems; A Szeghalmi; Friedrich-Schiller-UniversitŠt Jena Institut fŸrAngewandte Physik; M Knez; CIC nanoGUNE, San Sebastian and IKERBASQUE Basque Foundation for Science, Spain; G SchŸtz; Max Planck Institute for Intelligent Systems [992]

1989

FIB-assisted TEM Sample Preparation Refinement Using TRIM Simulations; BD Gauntt, AL Sutor; Intel Corporation [993]

1991

Utilization of FIB Technique in TEM Specimen Preparation of GaN-based Devices for Dislocation Investigation; J-G Zheng, Z Shao; University of California at Irvine; D Chen; Nanjing University [994]

1993

Nano and Microscale Patterning on Soft Matters with Ion Beam Irradiation; Y Kim, J Huang, AY Abuelfilat, J Fu; Monash University [995]

1995

Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns; J Jiru_e, M Havelka, J Polster, T Hrn_’_; TESCAN Brno s r o [996]

1997

Superconducting Nano Wire Circuits Fabricated using a Focused Helium Beam; EY Cho, MK Ma; University of California, San Diego; C Huynh; Carl Zeiss Microscopy, LLC; RC Dynes, SA Cybart; University of California, San Diego [997]

1999

Manipulations of Submicro-fibers of Culex Pipiens with the Help of Nano-tweezers with Shape Memory Effect into Vacuum _hamber of FIB; A Kamantsev, A Mashirov, P Mazaev, V Koledov, V Shavrov; Kotelnikov Institute of Radio-engineering and Electronics of RAS [998]

2001

Advantages of using Plasma FIB over a Gallium LMIS source; BW Arey, DE Perea, L Kovarik, J Liu; EMSL- PNNL-Battelle; O Qafoku, AR Felmy; PNNL-Battelle; R Kelley, T Landin; FEI Company et al [999]

2003

Large Volume 3D Characterization by Plasma FIB DualBeam Microscopy; T Burnett, R Kelley; University of Manchester [1000]

A05 Fast and Ultrafast Imaging with Electrons and Photons

483

Direct Observations of Photoexcitation Induced Dynamics of Charge Density Wave and Charge- Orbital Ordered State Using 2.8 MeV Ultrafast Electron Diffraction; Y Zhu, P Zhu, L Wu, J Li, T Konstantinova; Brookhaven National Laboratory; J Cao; Florida State University; Y Hidaka; Brookhaven National Laboratory, X Wang; SLAC National Accelerator Laboratory et al [242]

485

Pump-probe x-ray holographic imaging of dynamic magnetization processes down to the femtosecond timescale; S Eisebitt; Institut fŸr Optik und Atomare Physik, Technische UniversitŠt Berlin [243]

487

Probing ultrafast carrier dynamics by laser-combined STM; H Shigekawa, S Yoshida, O Takeuchi; Faculty of pure and applied sciences, University of Tsukuba [244]

649

Magnetic dynamics studied by time-resolved electron microscopy; F Carbone; EPFL [325]

651

Toward Ultrafast Electron Microscope with Femtosecond Temporal Resolution, Atomic-Level Spatial Resolution, and Single-Shot Imaging Capability; K Tanimura; The Institute of Scientific and Industrial Research, Osaka University [326]

653

RF Photoinjector Based Time-Resolved MeV Electron Microscopy; P Musumeci; UCLA [327]

655

Ultrafast Lattice Dynamics of Granular L10 Phase FePt Measured by MeV Electron Diffraction; AH Reid, X Shen; Stanford Institute for Materials and Energy Science, SLAC National Accelerator Laboratory; RK Li; SLAC National Accelerator Laboratory [328]

1203

Ultrafast transmission electron microscopy with nanoscale photoemitters; A Feist, K Echternkamp, J Schauss, SV Yalunin, S SchŠfer, C Ropers; University of Gšttingen [601]

1205

Observing Liquid Flow in Nanotubes; UJ Lorenz, AH Zewail; California Institute of Technology [602]

1207

Ultrabright Femtosecond Electron Sources: Ultrafast Structural Dynamics in Labile Organic Crystals;G Sciaini; University of Waterloo [603]

1209

Development of MeV Ultrafast Electron Scattering Instruments at SLAC National Accelerator Laboratory; R Li; SLAC National Accelerator Laboratory [604]

1413

Nanoscale Probes in Ultrafast Transmission Electron Microscopy; A Yurtsever; Centre Energie, MatŽriaux et TŽlŽcommunications, Institut National de la Recherche Scientifique (INRS) [705]

1415

Infrared Pump-Probe Spectroscopy of Plasmons in Graphene and Semiconductors; M Wagner; University of California San Diego [706]

1417

Ultrafast Plasmonic Forces Imposed by Fast Electrons on Metal Particles; MJ Lagos, A Reyes- Coronado; Rutgers University; A Konecna, P Echenique, J Aizpurua; Donostia International Physics Center; P Batson; Rutgers University [707]

1419

Photonic Processes Visualized with Electrons in Photoemission Electron Microscopy (PEEM);R Kšnenkamp, RC Word; Portland State University; JP Fitzgerald; Portland State University, [708]

1849

Using Ultrafast X-ray Lasers to Image Structure Dynamics; S Boutet; SLAC National Accelerator Laboratory [923]

1851

Studying Shocked Material Dynamics with Ultrafast X-ray Sources; RL Sandberg; Los Alamos National Laboratory [924]

1853

Imaging Irreversible Transformations with Movie-Mode Dynamic Transmission Electron Microscopy; JT McKeown, MK Santala, T Li, JD Roehling, GH Campbell; Lawrence Livermore National Laboratory [925]

1855

Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films; TT Li, MK Santala, LB Bayu Aji; Lawrence Livermore National Laboratory; H-YM Cheng; IBM/Macronix PCRAM Joint Project, IBM T J Watson Research Center; SO Kucheyev, GH Campbell; Lawrence Livermore National Laboratory [926]

2163

Ultrafast Infrared Nanoscopy with Sub-Cycle Temporal Resolution; TL Cocker, M Eisele, MA Huber, M Plankl; University of Regensburg; L Viti; Istituto Nanoscienze and Scuola Normale Superiore;D Ercolani, M Vitiello, R Huber; et al [1080]

2165

Lensless imaging of nano- and meso-scale dynamics with x-rays; JN Clark; Stanford PULSE Institute [1081]

2167

High-Resolution Phase-Contrast Imaging at XFELs; A Schropp, R Hoppe; DESY Hamburg; V Meier,J Patommel, F Seiboth; Technische UniversitŠt Dresden; HJ Lee, B Nagler, EC Galtier; SLAC National Accelerator Laboratory et al [1082]

2169

Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis; A Liebel, G Lutz, U Weber, A Niculae, H Soltau; PNDetector GmbH [1083]

2323

Materials processes observed using dynamical environmental TEM at University of Illinois; J-M Zuo, A Yoon; University of Illinois; W Gao, J Wu; Univ of Illinois; H Park; University of Illinois [1160]

2325

Strain mapping during in-situ deformation using a high-speed electron detector; C Gammer, J Kacher; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory; J Ciston; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory; C Czarnik4; Gatan, Inc; OL Warren; Hysitron, Inc; AM Minor; National Center for Electron Microscopy Molecular Foundry Lawrence Berkeley National Laboratory [1161]

2327

Fast imaging of carbon nanotube carpet growth by environmental TEM; DN Zakharov, M Bedewy; Center for Functional Nanomaterials, Brookhaven National Laboratory; V Balakrishnan,SW Pattinson; The Laboratory for Manufacturing and Productivity, Massachusetts Institute of Technology; ER Meshot; Lawrence Livermore National Laboratory; JA Hart; The Laboratory for Manufacturing and Productivity, Massachusetts Institute of Technology; AS; PO Box 5000 [1162]

2329

Compression Algorithm Analysis of In-Situ (S)TEM Video: Towards Automatic Event Detection and Characterization; JR Teuton, RL Griswold, BL Mehdi, ND Browning; Pacific Northwest National Laboratory [1163]

805

Effects of Quantized, Transient Chromatic Aberrations in Ultrafast Electron Microscopy; DA Plemmons, AJ McKenna, DJ Flannigan; University of Minnesota [403]

807

Effects of Electron-Gun and Laser Parameters on Collection Efficiency and Packet Duration in Ultrafast Electron Microscopy; E Kieft, KB Schliep; FEI; PK Suri, DJ Flannigan; University of Minnesota [404]

809

Ultrafast point projection electron microscopy; P Shakya, B Barwick; Trinity College [405]

811

Quantitative Determination of Thermal Fields and Transformation Rates in Rapidly Solidifying Aluminum by Numerical Modeling and In-situ TEM; C Liu, K Zweiacker; University of Pittsburgh; JT McKeown; Materials Science Division, Lawrence Livermore National Laboratory; T LaGrange, BW Reed; Integrated Dynamic Electron Solutions, Inc; GH Campbell; Materials Science Division, Lawrence Livermore National Laboratory; JM Wiezorek; University of Pittsburgh [406]

1583

TEM Video Compressive Sensing; A Stevens, L Kovarik; Duke University ECE; P Abellan; Pacific Northwest National Laboratory; X Yuan, L Carin; Duke University ECE; ND Browning; Pacific Northwest National Laboratory [790]

1585

Imaging At the Timescale of Micro- And Milliseconds With the pnCCD (S)TEM Camera; H Ryll,M Simson; PNSensor GmbH; M Den Hertog; Institut NŽel-CNRS; R Dunin-Borkowski; Ernst Ruska- Centre , Peter GrŸnberg Institute, Forschungszentrum JŸlich; K El Hajraoui; Institut NŽel-CNRS;V Migunov; Ernst Ruska-Centre , Peter GrŸnberg Institute, Forschungszentrum JŸlich; H Soltau; PNDetector GmbH, L StrŸder; PNSensor GmbH et al [791]

1587

NO2 Hydrogenation over Pt and Rh Catalysts: a Study at The Atomic Level by Field Emission Microscopy; C Barroo, Y De Decker; Harvard University; T Visart de BocarmŽ; UniversitŽ libre de Bruxelles (ULB); N Kruse; Washington State University [792]

1589

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime; TA Stenmark, RC Word, R Kšnenkamp; Portland State University [793]

1591

Characterization of Laser Ablation Dynamics for Nickel Thin Films on Silicon Using Movie Mode Dynamic TEM; S Hihath, M Santala; University of California Davis; G Campbell; Lawrence Livermore National Laboratory; K van Benthem; University of California Davis [794]

A06 Advanced Analytical TEM/STEM

489

Advanced Analytical Electron Microscopy: New Perspectives on Real Materials; MG Burke, SJ Haigh, J Lim, A Janssen; University of Manchester [245]

491

Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy; WJ Bowman, A Darbal; School for the Engineering of Matter, Transport and Energy, Arizona State University; M Kelly, GS Rohrer; Materials ResearchScience and Engineering Center, Carnegie Mellon University; CA Hernandez, K McGuinness, PA Crozier; School for the Engineering of Matter, Transport and Energy, Arizona State University [246]

493

Super-X EDS Characterization of Chemical Segregation within a Superlattice Extrinsic Stacking Fault of a Ni- based Superalloy; RE Williams, T Smith, BD Esser, N Antolin, W Windl, DW McComb,MJ Mills, HL Fraser; The Ohio State University [247]

495

Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices; PJ Phillips, P Longo; University of Illinois at Chicago; E Okunishi; JEOL EM Application Group; RF Klie; University of Illinois at Chicago [248]

497

Oxygen Intercalation and Doping-Induced 2D High-Tc Superconductivity at the CaCuO2/SrTiO3 Interface; C Cantoni, D Di Castro; Oak Ridge National Laboratory; G Balestrino; Universitˆ di Roma Tor Vergata [249]

657

High Spatial/Energy Resolution Band Gap Measurements: Delocalization and Other Effects in a Monochromated Cold FEG Nion Dedicated STEM; RW Carpenter, H Xie, T Aoki, F Ponce; Arizona State University [329]

659

Avoidance of Radiation Damage in Vibrational-Mode Energy-Loss Spectroscopy; RF Egerton, P Rez; University of Alberta; PA Crozier; Arizona State University [330]

661

Hydrogen Analysis by Ultra-High Energy Resolution EELS; H Cohen, P Rez; Weizmann Institute of Science; T Aoki; Center for Solid State Science; PA Crozier; School for Engineering of Matter, Transport and Energy; N Dellby; Nion Co; D Gur; Structural Biology; TC Lovejoy, OL Krivanek; Nion Co et al [331]

663

Applications of Plasmon Energy Expansion Thermometry; MH Mecklenburg, WA Hubbard; University of Southern Califronia; ER White; University of California Los Angeles; R Dhall, S Cronin; University of Southern California; S Aloni; Molecular Foundry, LBNL; BC Regan; University of California Los Angeles [332]

665

Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors; M Bugnet, G Radtke; McMaster University; S Lšffler, P Schattschneider; Vienna University of Technology;D Hawthorn; University of Waterloo; GA Sawatzky; University of British Columbia; GA Botton; McMaster University [333]

1075

What Does Quantitative Mean In Atomic-Resolution EDS STEM?; NR Lugg, G Kothleitner, B Feng, N Shibata, Y Ikuhara; Institute of Engineering Innovation, School of Engineering, The University of Tokyo [537]

1077

Channelling and atomic resolution STEM using X-ray emissions with absorption; CJ Rossouw; Monash University [538]

1079

Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy; Z Chen, AJ DÕAlfonso, M Weyland, DJ Taplin, SD Findlay; Monash University; LJ Allen; University of Melbourne [539]

1081

Theoretical Evaluation of Atomic-Resolution X-ray Analysis toward Quantification; M Watanabe; Lehigh University [540]

1083

Quantitative EDS of Surface Modified Powders for Hydrogen Storage; JD Sugar, M Homer,PG Kotula; Sandia National Laboratories; PJ Cappillino; University of Massachusetts Dartmouth; M Ong; Whitworth University; DB Robinson; Sandia National Laboratories [541]

1211

Inconsistent Normalized Intensities for Quantitative STEM: Detector Scans and Single Electron Counting; X Sang, JM LeBeau; North Carolina State University [605]

1213

Quantitative Annular Dark-Field Imaging of Single-Layer Graphene; S Yamashita, S Koshiya; Kyushu University; K Ishizuka; HREM Research Inc; K Kimoto; National Institute for Materials Science [606]

1215

Improving the SNR of Atomic Resolution STEM EELS EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging; L Jones, R Beanland, S Lozano-Perez; University of Oxford; K Baba-kishi; Department of Applied Physics, Hong Kong Polytechnic University; PD Nellist; University of Oxford [607]

1217

Correction of Linear and Nonlinear Raster Distortion from Orthogonal Image Pairs; CT Nelson, AM Minor; Lawrence Berkeley National Laboratory [608]

1219

Ptychographic Imaging in an Aberration Corrected STEM; AR Lupini, M Chi, SV Kalinin, AY Borisevich, JC Idrobo, S Jesse; Oak Ridge National Laboratory [609]

1221

Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides; I MacLaren, H Yang; University of Glasgow; L Jones, PD Nellist; University of Oxford; H Ryll; PNSensor GmbH; M Simson, H Soltau; PNDetector GmbH, Y Kondo; JEOL Ltd et al [610]

1421

Global Analysis Peak Fitting Applied to EELS Images; MH Van Benthem, PG Kotula, M Marinella, WM Mook, KL Jungjohann; Sandia National Laboratories [709]

1423

Revisiting Noise Scaling for Multivariate Statistical Analysis; PG Kotula, MH Van Benthem; Sandia National Laboratories [710]

1425

When will low-contrast features be visible in a STEM X-ray spectrum image?; CM Parish; Oak Ridge National Laboratory [711]

1427

Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials; RM Stroud, TC Lovejoy; Naval Research Laboratory; M Falke; Bruker Nano GmbH; ND Bassim; Naval Research Laboratory; A Kaeppel; Bruker Nano GmbH; N Delby, P Hrncirik, O Krivanek; Nion, Co et al [712]

1429

Single atom detection through HAADF-STEM and EELS/EDX characterization of fluorophore Ru(bpy)32+ for optical DNA-chip applications; G Nicotra, E Sciuto; CNR-IMM; MF Santangelo; distretto Tecnologico Sicilia Micro e Nano Sistemi; G Villaggio, F Sinatra; Universitˆ degli studi di Catania; C Bongiorno, S Libertino; CNR-IMM [713]

1857

Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3/SrTiO3 interface; P Longo, T Topuria; Gatan, Inc; PM Rice; IBM Research Division; A Aitouchen, PJ Thomas, RD Twesten; Gatan, Inc [927]

1859

Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS; S Eswara-Moorthy, D Dowsett, L Yedra, T Wirtz; Luxembourg Institute of Science and Technology [928]

1861

Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope; T Sasaki, H Sawada, E Okunishi, Y Jimbo, Y Iwasawa, K Miyatake,S Yuasa, T Kaneyama; JEOL Ltd [929]

1863

STEM in 4 Dimensions: Using Multivariate Analysis of Ptychographic Data to Reveal Material Functionality; S Jesse, M Chi, AY Borisevich, A Belianinov, RR Unocic, RK Archibald, SV Kalinin, AR Lupini; Oak Ridge National Laboratory et al [930]

1865

Resolution Assessment of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope; Y Takahashi, T Akashi, T Shimakura, T Tanigaki, T Kawasaki, H Shinada, N Osakabe; Central Research Laboratory, Hitachi, Ltd [931]

1867

Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a conventional SEM Using an Off-the-Shelf Transmission Detector; J Holm, R Keller; National Institute of Standards and Technology [932]

2171

Analytical Electron Tomography: Methods and Applications; G Haberfehlner, A Orthacker; Graz Centre for Electron Microscopy and Nanoanalysis; FP Schmidt; Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology; A Hšrl; Institute of Physics, University of Graz;D Knez; Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology;A TrŸgler, U Hohenester; Institute of Physics, University of Graz, G Kothleitner; Graz Centre for Electron Microscopy and Nanoanalysis Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology [1084]

2173

Multi-Dimensional Machine Learning Aided Analysis of a Nickel-Based Superalloy; D Rossouw, R Krakow, Z Saghi, CS Yeoh, P Burdet, RK Leary, PA Midgley; University of Cambridge [1085]

2175

Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution; C Zheng, Y Zhu; Monash Centre for Electron Microscopy, Monash University; S Lazar; FEI Electron Optics; J Etheridge; Monash Centre for Electron Microscopy, Monash University [1086]

2177

Depth Sensitivity of Atomic Resolution Aberration-Corrected Through-Focus STEM Imaging of Bi Dopants on Cu Grain Boundaries; CA Wade, M Watanabe; Lehigh University [1087]

2179

Super-X XEDS STEM Tomography of Gamma Prime Precipitates in the LSHR Nickel Superalloy; SJ Kuhr, JM Sosa; Center for the Accelerated Maturation of Materials,The Ohio State University; DE Huber,HL Fraser; Center for the Accelerated Maturation of Materials, The Ohio State University [1088]

2331

A New Discrete Tomographic Reconstruction Method for Electron Tomography; I Arslan, T Sanders; Pacific Northwest National Laboratory; P Binev; University of South Carolina; BC Gates; University of California-Davis; A Katz; University of California-Berkeley [1164]

2333

Challenges and Opportunities in 3D Tri-gate Transistor Characterization; J Zhang, L Pan; Intel Corporation, Corporate Quality Network; AA Herzing; National Institute of Standards and Technology, Material Measurement Laboratory; R Twesten, P Longo; Gatan Inc; N Franco,K Johnson; Intel Corporation, Corporate Quality Network, Z Ma; Intel Corporation, Corporate Quality Network [1165]

2335

Robust Physical Alignment Models for Electron Tomography; T Sanders, M Prange, P Binev; University of South Carolina; C Akatay; UOP LLC, a Honeywell Company; I Arslan; Pacific Northwest National Laboratory [1166]

2337

Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy; T Dahmen, H Kohr, P Slusallek; German Research Center for Artificial Intelligence GmbH (DFKI); N de Jonge; INM Leibniz Institute for New Materials [1167]

2339

STEM-HAADF and Super-Xª XEDS Tomographic Reconstruction of Complex Nano-scale Precipitates in a High Entropy Alloy, AlMo0.5NbTa0.5TiZr; JK Jensen, JM Sosa, DE Huber, GB Viswanathan,RE Williams, HL Fraser; The Ohio State University [1168]

2341

Linear chemically sensitive electron tomography using DualEELS and compressed sensing;A Al Afeef, WP Cockshitt; University of Glasgow; P Barges, I Zuazo; ArcelorMittal Maizires Research; J Bobynko, AJ Craven, I MacLaren; University of Glasgow [1169]

813

Dynamical Effects on Atomic-Resolution Imaging and Diffraction of the Tetragonal and Orthorhombic Phases of LaFeAsO; PK Suri, J Yan; University of Minnesota; D Mandrus; University of Tennessee;F University of Minnesota [407]

815

Phase determination of black TiO2 nanoparticles; M Tian; University of Tennessee, Knoxville [408]

817

Scanning Transmission Electron Microscopy Investigation of the Structure of Multilayered Perpendicular Magnetic Tunnel Junctions; D Reifsnyder Hickey, KA Mkhoyan; University of Minnesota [409]

819

Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis; Z Chen, SD Findlay, M Weyland; Monash University; AJ DÕAlfonso, LJ Allen; University of Melbourne [410]

821

Algorithms for quantitative symmetry measurement and symmetry mapping using convergent beam electron diffraction; K-H Kim, J-M Zuo; Korea Institue of Industrial Technology [411]

823

Concentration at Detection Limit of Dopant for Semiconductor Samples Using Dual SDD Analysis System; K-I Fukunaga, N Endo; JEOL Ltd; M Suzuki; Thermo Fisher Scientific Japan; Y Kondo; JEOL Ltd [412]

825

Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra; F Eggert, PP Camus, A Sandborg; Edax; NJ Zaluzec; Electron Microscopy Center, NST Div, Argonne National Laboratory [413]

827

Materials Selection for Ultra-Thin Diamond-Like Carbon Film Metrology and Structural Characterization by TEM; GP Souza, KC Ruthe, L Chen, L Hong, H Wang; Western Digital Corporation [414]

829

STEM characterization of Gold-Copper anisotropic nanocrystals; LS Baz‡n-D’az, R Mendoza-Cruz, JJ Vel‡zquez-Salazar, U Santiago; The University of Texas at San Antonio; D Bahena; Laboratorio Avanzado de Nanoscopia Electr—nica, CINVESTAV zacatenco; M JosŽ-Yacam‡n; The University of Texas at San Antonio [415]

831

EFTEM Contrast Tuning and EELS Fine Structure Analysis for Characterization of Carbon Containing Ultra-Low-k Dielectric Materials; BI Prenitzer, S Schwarz, B Kempshall, I Rezadad; NanoSpective [416]

1593

New Approach to Analysis of Noisy EELS Data; E Firlar, T Prozorov; Ames Laboratory [795]

1595

Use of a hybrid silicon pixel (Medipix) detector as a STEM detector; D McGrouther, M Krajnak,I MacLaren, D Maneuski, V OÕShea; University of Glasgow; PD Nellist; University of Oxford [796]

1597

Development of an Aberration corrected 1.2-MV Field Emission Transmission Electron Microscope; H Shinada, T Tanigaki, T Akashi, Y Takahashi, T Furutsu, T Shimakura, T Kawasaki, K Kasuya; Central Research Laboratory, Hitachi, Ltd , et al [797]

1599

Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages; T Ishikawa, E Okunishi, T Kaneyama, Y Kondo; JEOL Ltd; S Matsumura; Research laboratory of high-voltage electron microscope, Kyushu University [798]

1601

Ettention: building blocks for iterative reconstruction algorithms; T Dahmen, L Marsalek; German Research Center for Artificial Intelligence (DFKI) GmbH; N Marniok; Saarland University;B Turo_ov‡; Max-Planck Institute for Informatics; S Bogachev; Saarland University; P Trampert; German Research Center for Artificial Intelligence (DFKI) GmbH; S Nickels; Saarland University, P Slusallek; German Research Center for Artificial Intelligence (DFKI) GmbH [799]

1603

Analysis of TEM tomography artifacts with experiments on model specimens; JP Winterstein, J Schumacher, JA Liddle; NIST CNST [800]

1605

Rapid 3D Reconstruction in the EDS Tomography by using Iterative Series Reduction (ISER) Method;Y Aoyama, H Nishioka, Y Kondo; JEOL Ltd [801]

1607

Moving atomic-resolution imaging into the age of deep data; O Ovchinnikov, S Jesse; Vanderbilt University; A Belianinov; Oak Ridge National Laboratory; S Pantelides; Vanderbilt University; S Kalinin, A Borisevich; Oak Ridge National Laboratory [802]

1609

High-accuracy electron tomography of semiconductor devices; M Hayashida, L Gunawan; National Institute for Nanotechnology; C Pawlowicz; TechInsights; M Malac; National Institute for Nanotechnology; M Couliard; National Research Council Canada [803]

A07 Scanning Probe Microscopy: New Methods and Applications

1431

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions; R Dianoux, A Scheidemann; NanoScan AG; E Niehuis, R Moellers, F Kollmer, H Arlinghaus; ION-TOF GmbH; H-J Hug, L Bernard; Empa et al [714]

1433

AFM integrated with SEM/FIB for complete 3D metrology measurements; A Lewis, A Komissar; Hebrew University; A Ignatov, O Fedoroyov, E Maayan; Nanonics Imaging [715]

1435

Integrating Atomic Force Microscopy in Scanning Electron Microscopy; AJ Smith, K Schock,G Renka; Kleindiek Nanotechnik; A Lieb; Nanosurf; M Dadras; Centre Suisse dÕƒlectronique et de Microtechnique, CSEM SA; S Kleindiek; Kleindiek Nanotechnik [716]

1437

Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis; Y Fleming, T Wirtz, S Eswara-Moorthy; Luxembourg Institute of Science and Technology [717]

1869

Nanoscale Chemical Imaging via AFM coupled IR Spectroscopy; K Kjoller, C Prater, M Lo, Q Hu, H Yang; Anasys Instruments; C Marcott; Light Light Solutions [933]

1871

Introducing nano-FTIR - Imaging and Spectroscopy at 10nm Spatial Resolution; T Gokus, A Huber; Neaspec GmbH [934]

1873

New Hybrid Peak-Force Tapping/Near-Field Microscope for Nano-Chemical and Nano-Mechanical Imaging of Graphene Plasmons, Polymers and Proteins; M Wagner, G Andreev; Bruker Nano Surfaces; K Carneiro, S Habelitz; University of California; T Mueller; Bruker Nano Surfaces [935]

2181

Nanoscale Mechanical Scattering Experiments towards the Local Analysis of Thermal Active Modes and Dispersion Interactions at Interfaces; RM Overney; University of Washington [1089]

2183

High-Resolution Mapping of Quantitative Elastic Modulus of Polymers; S Magonov, S Belikov; NT-MDT Development Inc; M Surtchev; NT-MDT Development Inc; S Leesment, I Malovichko; NT-MDT [1090]

2185

Environmental AFM as a probe of the morphology, viscoelasticity and lubricity of crosslinked hydrophilic biomedical coatings; G Haugstad, C Colling, A McCormick, K Wormuth; University of Minnesota; M Zeng; Boston Scientific Corporation [1091]

2187

A New Variable Temperature Solution-Solid Interface Scanning Tunneling Microscope; A Jahanbekam, U Mazur, KW Hipps; Washington State University [1092]

2189

The Power of confocal Raman-AFM and Raman-SEM (RISE) Imaging in Polymer Research;U Schmidt, W Liu; WITec GmbH; J Yang; WITec Instruments Corp; T Dieing, K Weishaupt; WITec GmbH [1093]

2343

In-situ AFM and SEM Investigation of Slip Steps Evolving during Nanoindentation; MJ Cordill,J Kreith; Erich Schmid Institute of Materials Science, Austrian Academy of Sciences; GE Fantner; Laboratoray for Bio- and Nano-Instrumentation, EPFL [1170]

2345

Deep Data Analysis of Atomic Level Structure-Property Relationship in an Iron Superconductor Fe1.05Te0.75Se0.25; AG Gianfrancesco, A Belianinov; UT/ORNL Bredesen Center; SV Kalinin; Oak Ridge National Laboratory, Center for Nanophase Materials Sciences; S Jesse; Oak Ridge NationalLaboratory, Center for Nanophase Materials Science [1171]

2347

Nanoscale Photocurrent Microscopy for Thin Film Solar Cells Using Focused Electron Beam and Near-Field Optical Excitations; H Yoon, Y Yoon, P Haney, S An, J Schumacher, K Siebein, A Myers, N Zhitenev; National Institute of Standards and Technology [1172]

2349

Faster Time-Resolved Electrostatic Force Microscopy; DU Karatay, JS Harrison, M Glaz, PA Cox, DS Ginger; University of Washington [1173]

2351

Correlative nanoscopy: super resolved fluorescence and atomic force microscopy towards nanoscale manipulation and multimodal investigations; A Diaspro, J Varghese Chacko, F Cella Zanacchi,R Oropesa, S Dante, C Canale; Istituto Italiano di Tecnologia [1174]

1611

Progress in Crystallographic Image Processing for Scanning Probe Microscopy; P Moeck, JC Straton; Portland State University [804]

1613

Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads; S Mejia, SP Leary, GP Souza, KC Ruthe; Western Digital Corporation [805]

1615

Characterization of Nanocarrier Complexes with Plasmid DNA using SEM, TEM and AFM; J-Y Cho, UD Hemraz; National Institute for Nanotechnology, National Research Council CANADA;P Bhowmik, G Nowak, PL Polowick; National Research Council CANADA [806]

1617

Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy;AE Sanders, JK Faulk; NIST; DT Edwards, TT Perkins; JILA [807]

1619

Comparison of Magnetic Domain Observation by Means of Magnetic Force Microscopy and Lorentz Transmission Electron Microscopy; S Hua, M DeGraef; Carnegie Mellon University [808]

1621

Use of the unroofing technique for AFM direct imaging of the intra-cellular structure at high resolution;J Usukura, E Usukura, A Narita; Nagoya University; A Yagi, S Ito; Olympus Corporation [809]

1623

Lateral Force Microscopy using Nanomanipulation; Y-K Hseu, H McNally; Birck Nanotechnology Center, Purdue University [810]

1625

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

1085

Computational Method for Composition Determination of Multilayer Epitaxial Semiconductor Structures Using Standards-Based Energy-Dispersive X-Ray Spectrometry; M Rathi, N Zheng; University of Houston; P Ahrenkiel; South Dakota School of Mines Technology [542]

1087

Practical Considerations in Quantitative Nanoscale Energy-Dispersive X-ray Spectroscopy (EDX) and Its Application in SiGe; W Weng, FH Baumann, Y Ke, R Loesing, A Madan, Z Zhu, AD Katnani; IBM Microelectronics Division [543]

1089

Quantification of Phase Compositions and Diffusional Profiles in Simulated Solid-State Welds of Ti-17 via Super-X Energy-Dispersive X-Ray Spectroscopy; J Orsborn, RE Williams; Center forElectron Microscopy and Analysis, The Ohio State University; HL Fraser; Center for the Accelerated Maturation of Materials, The Ohio State University [544]

1091

Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors;W Xu, JH Dycus, X Sang, AA Oni, JM Lebeau; North Carolina State University [545]

1093

Influence of Convergence Angle and Finite Effective Source Size for Quantitative Atomic Resolution EDXS; JH Dycus, SD Findlay, W Xu, XH Sang; North Carolina State University; LJ Allen; University of Melbourne; JM LeBeau; North Carolina State University [546]

1223

Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM; M Watanabe, T Sasaki; Lehigh University; Y Jimbo, E Okunishi, H Sawada; JEOL ltd [611]

1225

Characterizing Atomic Ordering of High Entropy Alloys Using Super-X EDS Characterization; RE Williams, B Welk, J Jensen, BD Esser, DW McComb, HL Fraser; The Ohio State University [612]

1227

Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis; D Rossouw, P Burdet, F de la Pe–a, C Ducati, BR Knappett, AE Wheatley, PA Midgley; University of Cambridge [613]

1229

Gold and Arsenopyrite Exsolution and Limits of Arsenic Solubility in Pyrite Investigated by SEM, EPMA, and LA-ICPMS; K Goemann, AS Stepanov, S Meffre, RR Large; University of Tasmania [614]

1231

Characterization of Stannous Fluoride Uptake in Human Dentine by Super-X XEDS and Dual-EELS analysis; IN David, RE Williams, D Huber; Center for Electron Microscopy and Analysis (CEMAS), The Ohio State University; JC Earl; GlaxoSmithKline (GSK); DW McComb; Center for Electron Microscopy and Analysis, The Ohio State University [615]

1439

Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages; C Merlet; CNRS, University Montpellier [718]

1441

Multi-beam energy acquisition in FE-EPMA; S Richter, PT Pinard; RWTH Aachen [719]

1443

Improvements in EPMA: Spatial Resolution and Analytical Accuracy; PK Carpenter, BL Jolliff; Washington University [720]

1445

Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements; JJ Donovan, JT Armstrong; University of Oregon [721]

1447

Using EPMA, Raman LS, Hyperspectral CL, SIMS and EBSD to Study Impact Melt Induced Decomposition of Zircon; M Zanetti, A Wittmann, P Carpenter, BL Jolliff; Washington University in St Louis; E Vicenzi; Museum Conservation Institute, Smithsonian Institution; A Nemchin,NE Timms; Curtin University [722]

1875

Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy; DE NEWBURY, NW RITCHIE; National Institute of Standards and Technology [936]

1877

Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Electron Microprobes and SEMs; SM Seddio, JH Fournelle; Thermo Fisher Scientific [937]

1879

Evaluation of combined quantification of Cr-Ni steel using EDS and WDS; PT Pinard, R Terborg; RWTH Aachen University; T Salge; Natural History Museum; S Richter; RWTH Aachen University [938]

1881

Comparison of WDS and EDS Rare Earth Element Analysis; HA Lowers, PK Carpenter; U S Geological Survey [939]

2191

Dedicated X-Ray Mapping System for Quantitative X-Ray Mapping with Single and Multiple SDD Detectors and Processing the Data; R Wuhrer, K Moran; University of Western Sydney, Advanced Materials Characterisation Facility (AMCF), Australia [1094]

2193

Quantitative Elemental Mapping with Electron Microprobe and Automated Data Analysis;J Chouinard, J Donovan; University of Oregon [1095]

2195

Homogeneity Testing of Microanalytical Reference Materials by Electron Probe Microanalysis;D Harries; Friedrich Schiller University Jena [1096]

2353

Nanomineralogy of Meteorites by Advanced Electron Microscopy: Discovering New Minerals and New Materials from the Early Solar System; C Ma; Caltech [1175]

2355

Soft X-ray emission spectroscopy on chemical states of 3d-transition metal elements with SEM;M Terauchi, H Takahashi; IMRAM, Tohoku University; T Murano; JEOL Ltd; T Imazono, M Koike; JAEA; T Nagano, M Koeda; SHIMADZU [1176]

2357

Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!; P Hovington, M LagacŽ; Hydro-Quebec; E Principe; Tescan USA; S Burgess; Oxford Instruments NanoAnalysis; A Guerfi; Hydro-Quebec; H Demers; McGill University; K Zaghib; Hydro-Quebec, R Gauvin; McGill University [1177]

2359

High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector; H Demers, N Brodusch;McGill University; P Woo; Hitachi High-Technologies Canada Inc; R Gauvin; McGill University [1178]

1627

Pushing the Limits on SEM Quantification Ð Combined Quantification with SDD and Fully Focussing WD detectors; CL Collins, J Holland, SR Burgess; Oxford Instruments NanoAnalysis [812]

1629

Factors Affecting WDS Performance Superiority over EDS; PP Camus; EDAX Inc [813]

1631

Enhanced Theoretical Model for Avoiding Mistakes in SEM-EDS Analysis; PJ Statham; Oxford Instruments NanoAnalysis [814]

1633

Regarding the Quantitative Analysis of Heterogenous Samples by SEM/EDS; JF Konopka; Thermo Fisher Scientific [815]

1635

Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM; H Takahashi, S Asahina; JEOL Ltd;M Terauchi; Tohoku University; C Nielsen, P McSwiggen; JEOL USA [816]

1637

Characterization and Comparison of Detector Systems for Large Area X-ray Imaging; J Davis,J Schmidt; PNDetector; M Huth; PNSensor GmbH; U Weber, H Soltau, A Niculae; PNDetector GmbH; L StrŸder; PNSensor GmbH [817]

1639

Accurate EPMA Quantification of the First Series Transition Metals Using Ll Lines; M Moret, C Hombourger, M Outrequin; CAMECA [818]

1641

Multilayer Thin Films as Pseudo-Homogeneous EDX Standards; HO Colijn, J Orsborn, DJ Chmielewski, DW McComb; Ohio State University [819]

1643

A method of component extraction of EDS and EELS maps; S Wang; Micron Technology Inc [820]

1645

Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits; J Rafaelsen, T Nylese, M Bolorizadeh; EDAX Inc, A division of Ametek, Materials Analysis Division; V Carlino; ibss Group INC [821]

2005

Bulge Testing for Strength Metrics of Detector X-Ray Windows; JT Rowley, K Berry, RC Davis,RR Vanfleet; Brigham Young University; SW Cornaby, M Harker, J Abbott; MOXTEK, Inc [1001]

2007

Elemental and Phase Analysis of the Stomatopod Dactyl Club by X-Ray Mapping; NA Yaraghi, L Grunenfelder; University of California, Riverside; N Suksangpanya, N Guarin; Purdue University; S Herrera; University of California, Riverside; G Milliron; Max Planck Institute for Colloids and Interfaces; P Zavattieri; Purdue University, L Sheppard; University of Western Sydney et al [1002]

2009

EPMA analysis of corroded hot-dip galvanized carbon steel using the ÒPhaseMap MakerÓ software; R Kamiyama, P McSwiggen, N Kato, S Honda, N Mori; JEOL Ltd; C Nielsen; JEOL USA, Inc [1003]

2011

Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-XRF; AH Lee; EDAX Inc [1004]

2013

EDX Analysis of Low Concentration Dopant using HD-2700 Aberration Corrected STEM Equipped with Dual SDD; T Sato, Y Suzuki, H Matsumoto, T Hashimoto, K Nakamura; Hitachi high- technologies corporation; T Miura, H Yoshida; Vacuum Device Inc [1005]

2015

Quantitative ED(X)S: The Zeta-Factor Method; M Falke, A Kaeppel, I Nemeth, R Terborg; Bruker Nano GmbH [1006]

2017

Standardless Quantification Of Actinides By EPMA; A Moy, C Merlet; University Montpellier, CEA; O Dugne; CEA [1007]

2019

Focused Interest Group on Microanalytical Standards (FIGMAS): Assessing the Quality, Availability and Need for Standards in the Microanalytical Community; JM Allaz, OK Neill; University of Colorado Boulder; A von der Handt; University of Minnesota Twin Cities [1008]

2021

Improved Background Correction for the Quantification of Actinide M-lines in EPMA; X Ritter, P Pšml; Institut fŸr Mineralogie, WestfŠlische Wilhelms-UniversitŠt; S BrŽmier; European Commission, Joint Research Centre, Institute for Transuranium Elements; J Berndt; Institut fŸr Mineralogie, WestfŠlische Wilhelms-UniversitŠt [1009]

2023

Phase Analysis of Large EDS Datasets with Matlab; RC Hugo, S Bernsen; Portland State University; K Breen; US Geological Survey; A Ruzicka; Portland State University [1010]

2025

Investigation of Mg-Li-Ca alloys using a Wavelength Dispersive Soft X-ray Emission Spectrometer and EPMA; H Takahashi, M Takakura; JEOL Ltd; T Murano; JEOL Ltd; M Terauchi; Institute for Multidisciplinary Research for Advanced Materials, Tohoku University; M Yamasaki; Magnesium Research Center, Kumamoto University; Y Kawamura; Magnesium Research Center, Kumamoto University; P McSwiggen; JEOL USA [1011]

2027

Use of a Fast WDS Instrument for Identification of Minor EDS Peaks; JF Konopka; Thermo Fisher Scientific [1012]

A09 Advances in Combining Simulation and Experiment for Materials Design

1233

Three-Dimensional Imaging of Point Defects in Functional Materials Using Quantitative STEM;J Hwang; The Ohio State University [616]

1235

Removing elastic scattering effects from chemical maps taken under incoherent conditions; C Dwyer; Forschungszentrum Juelich [617]

1237

Identifying Atomic Reconstruction at Complex Oxide Interfaces Using Quantitative STEM;JM Johnson, J Thompson; The Ohio State University; SSA Seo; University of Kentucky; J Hwang; The Ohio State University [618]

1239

Revealing Unit Cell Level Distortions in Random Oxide Solid Solutions by Scanning Transmission Electron Microscopy and the Projected Pair Distribution Function; X Sang, E Grimley, C Niu, D Irving, JM LeBeau; North Carolina State University [619]

1449

Quantitative Electron Microscopy and the Application by Single Electron Signals; R Ishikawa,AR Lupini; University of Tokyo; SD Findlay; Monash University; T Taniguchi; NIMS; SJ Pennycook; University of Tennessee [723]

1451

Large-Scale Molecular Dynamics and High-Resolution Transmission Electron Microscopy Study of Graphene Grain Boundaries; C Ophus, HI Rasool; Lawrence Berkeley National Laboratory; A Zettl; University of California Berkeley; A Shekhawat; Lawrence Berkeley National Laboratory [724]

1453

Applications of Bicrystallography: Revealing Generic Similarities in Coincidence Site Lattice Boundaries of all Holohedral Cubic Materials and Facilitating the Design of 3D Printed Models of such Grain Boundaries; P Moeck, A Maas, J Stone-Sundberg, B York; Portland State University;W Kaminsky; University of Washington; ND Browning; Pacific Northwest National Laboratory [725]

1455

Defect Character at Grain Boundary Facet Junctions: A Combined HRSTEM and Atomistic Modeling Study of a Sigma=5 Grain Boundary in Fe; DL Medlin, KM Hattar, JA Zimmerman, FF Abdeljawad, SM Foiles; Sandia National Laboratories [726]

1883

Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential; W Van den Broek, CT Koch; Institute for Experimental Physics, Ulm University [940]

1885

Simulating inelastic scattering in scanning transmission electron microscopy using µSTEM;AJ DÕAlfonso, SD Findlay, LJ Allen; The University of Melbourne [941]

1887

Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy; J Feng, AV Kvit, AB Yankovich, C Zhang, D Morgan, PM Voyles; University of Wisconsin-Madison [942]

1889

Propagation of Bessel beams along atomic columns in crystal : a Bloch wave and multslice analysis; V Grillo, E Rotunno; CNR-Istituto Nanoscienze, Centro S3; BJ McMorran; University of Oregon; S Frabboni; Universitˆ di Modena e Reggio Emilia [943]

2197

Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design; L Jones, KE MacArthur; University of Oxford; J Aarons,C-K Skylaris; University of Southampton; M Sarwar, D Ozkaya; Johnson Matthey; PD Nellist; University of Oxford [1097]

2199

Probing Complex Nanostructures by Combining Atomic-Scale Theory and Scanning Transmission Electron Microscopy; ST Pantelides, SJ Pennycook; Vanderbilt University [1098]

2201

Integrated Computational and Experimental Structure Determination for Nanoparticles; M Yu, AB Yankovich, A Kaczmarowski, D Morgan, P Voyles; University of Wisconsin-Madison [1099]

2203

Local crystallography: phase recognition and local symmetry analysis; A Belianinov, Q He; 1 Institute for Functional Imaging of Materials, 2 The Center for Nanophase Materials Sciences; M Kravchenko; 1 Institute for Functional Imaging of Materials 2 The Center for Nanophase Materials Sciences;S Jesse; Institute for Functional Imaging of Materials The Center for Nanophase Materials Sciences; A Borisevich; Institute for Functional Imaging of Materials Materials Sciences and TechnologyDivision; S Kalinin; Institute for Functional Imaging of Materials The Center for Nanophase Materials Sciences [1100]

2205

HAADF/MAADF Observations and Image Simulations of Dislocation Core Structures in a High Entropy Alloy; TM Smith, BD Esser; The Ohio State University; EP George, F Otto; Ruhr University; M Ghazisaeidi, DW McComb, MJ Mills; The Ohio State University [1101]

2207

Strain-Mediated Asymmetric Growth of Plasmonic Nanocrystals: A Monometallic Au Nanorod- Au Nanoparticle Heterodimer; Y Zhu, J Huang, Y Han; King Abdullah University of Science and Technology [1102]

2361

Mapping Electronic Orbitals in Real Space; S Lšffler; McMaster University [1179]

2363

Excitonic Calculations of ELNES: Low Energy and High Energy Spectra; K Tomita, T Mizoguchi; Institute of Industrial Science, University of Tokyo [1180]

2365

Probing Bonding Environments in Osmium-Based Double Perovskites Using Monochromated Dual Electron-Energy Loss Spectroscopy; BD Esser, MR Ball, RC Morrow; The Ohio State University; AE Goode; Imperial College London; RE Williams, PM Woodward, WE Windl, DW McComb; The Ohio State University [1181]

2367

Analytical Method for Thickness and Wrinkling Measurements of 2D Zeolites; P Kumar, VK Agrawal, M Tsapatsis, AK Mkhoyan; University of Minnesota [1182]

2369

Determination of Surface Topography from Laser Ablation using EBSD; PG Callahan,MP Echlin, TM Pollock; University of California at Santa Barbara; M DeGraef; Carnegie Mellon University [1183]

1647

Transmission Electron Microscopic and First-principles Study of SrTiO3/GaAs Hetero-interfaces; L Hong, S Ogut, R Klie; University of Illinois at Chicago [822]

1649

Observation of Skyrmions at Room-temperature in Amorphous Fe/Gd Films; JJ Chess, S Montoya, J Lee; University of Oregon; S Roy, S Kevan; Lawrence Berkeley National Lab; EE Fullerton; University of California, San Diego; BJ McMorran; University of Oregon [823]

1651

A Biomimetic-Computational Approach to Optimizing the Quantum Efficiency of Photovoltaics;LM Perez, A Holzenburg; Texas AM University [824]

1653

Combine Simulation and Experiment EELS to Characterize Ionomer Conformation; C Wang, SJ Paddison; National Institute for Occupational Safety and Health; G Duscher; University of Tennessee [825]

1655

Investigation of the structural and electronic properties of Pt/_-Al2O3, a model catalyst system; CS Bonifacio, Q Zhu; University of Pittsburgh; D Su; Center for Functional Nanomaterials; F Vila;University of Washington; HO Ayoola, SD House; University of Pittsburgh; J Kas, JJ Rehr; University of Washington et al [826]

1657

Analysis of Surface Structures in Ru Nanocatalysts; NP Walker, BK Miller, PA Crozier; Arizona State University [827]

1659

Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structural Refinement Based on Fluctuation Microscopy; JJ Maldonis, P Zhang; University of Madison, Wisconsin; M Besser; Ames Laboratory; K Ames Laboratory; 225 Wilhelm; V University of Madison, Wisconsin [828]

A10 Advances in Electron Diffraction and Automated Mapping Techniques

1095

TEM based high resolution electron diffraction techniques for three-dimensional nanostructure determination; J-M Zuo, Y Meng, P Vivek Deshpande; University of Illinois, Urbana- Champaign [547]

1097

Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED; R dos Reis, C Ophus, J Ciston; National Center for Electron Microscopy/Molecular Foundry, LBNL; P Ercius, U Dahmen; National Center for Electron Microscopy/Molecular Foundry, LBNL [548]

1099

Mapping Valence Electron Distribution of Iron-Based Superconductors using Quantitative CBED and Precession Electron Diffraction; L Wu, C Ma; Brookhaven National Laboratory; B Ge; Institute of Physics, Chinese Academy of Sciences; W Yin, Y Zhu; Brookhaven National Laboratory [549]

1101

Transmission Kikuchi Diffraction (TKD) via a horizontally positioned detector; E Bouzy, J-J Fundenberger; UniversitŽ de Lorraine; D Goran; Bruker Nano GmbH; J Guyon,H Yuan; UniversitŽ de Lorraine; A Morawiec; Institute of Metallurgy and Materials Science - Polish Academy of Science [550]

1103

Utility of Precession Electron Diffraction Patterns with Varying Degrees of Non-parallel Illumination from the Same Nominal Sample Area; P Moeck, JC Straton; Portland State University; DJ Edwards; Pacific Northwest National Laboratory; I HŠusler; Humboldt University Berlin [551]

1241

Decomposing electron diffraction signals in multi-component microstructures; AS Eggeman,D Johnstone, R Krakow; University of Cambridge; J Hu; University of Oxford; PA Midgley; University of Cambridge; C Grovenor, S Lozano-Perez; University of Oxford [620]

1243

Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction; A Valery, EF Rauch, A Pofelski, L ClŽment, F Lorut; STMicroelectronics [621]

1245

Principles and Applications of Energy-Filtered Scanning CBED for Ferroelectric Domain Imaging and Symmetry Determination; Y-T Shao, K Kim, J-M Zuo; University of Illinois at Urbana-Champaign [622]

1247

A statistical dictionary approach to automated orientation determination from precession electron diffraction patterns; A Wang, A Leff; Carnegie Mellon University; M Taheri; Drexel University; M DeGraef; Carnegie Mellon University [623]

1249

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires; RH Geiss; Colorado State University [624]

1457

Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy; S-T Hu, L Morganti; University of Texas - Austin; S Rajesekhara, K Hattar; Sandia National Laboratories; P Ferreira; University of Texas - Austin [727]

1459

Application of EBSD and Precession-Enhanced Diffraction (PED) to Study Crystallography of -Titanium Alloy During Transformation under Severe Hot Plastic Deformation; SV Prikhodko, PE Markovsky; University of California Los Angeles; SD Sitzman; Oxford Instruments America; MA Gordillo, JM Wiezorek; University of Pittsburgh; OM Ivasishin; Kurdyumov Institute for Metal Physics, National Academy of Science of Ukraine [728]

1461

Precession Electron Diffraction and Orientation Phase Mapping of Assembled Ag/ZnO Nanoantennas; JE Sanchez, F Ruiz Zepeda, M Jose Yacaman, A Ponce-Pedraza; The University of Texas at San Antonio [729]

1463

A Precession Electron Diffraction and EELS Study of Beta-phase Evolution in Nano-crystalline Mg-9 wt.% Al Thin Films during Heat Treatment; K Kruska, DJ Edwards, RS Vemuri, L Kovarik, A Rohatgi, ND Browning; Pacific Northwest National Laboratory [730]

1465

Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by Automated Crystal Orientation Mapping in the TEM; KW Zweiacker, MA Gordillo, C Liu; University of Pittsburgh;J McKeown, G Campbell; Lawrence Livermore National Laboratory; B Reed, T LaGrange; Integrated Dynamic Electron Solutions, J Wiezorek; University of Pittsburgh [731]

1891

Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction;A Vilalta-Clemete, J Jiang; Department of Materials, University of Oxford; TB Britton; Department of Materials, Imperial College London; DM Collins, AJ Wilkinson; University of Oxford [944]

1893

Nye Tensor Dislocation Density Mapping From Precession Electron Diffraction: Effects of Filtering and Angular Resolution; AC Leff, CR Weinberger, ML Taheri; Drexel University [945]

1895

Certified Reference Material for Strain Measurement Using EBSD; MD Vaudin, WA Osborn, LH Friedman, K Siebein; National Institute of Standards and Technology [946]

1897

Novel Applications of Electron Channeling Contrast Imaging; J Deitz, S Carnevale, D McComb, S Ringel, T Grassman; The Ohio State University [947]

1899

Advances in HREBSD for Elastic Strain Measurement and its Application to Mechanical Testing;DJ Dingley; University of Bristol [948]

2209

Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution; J-L Rouviere, Y Martin; University Grenoble Alpes; N Bernier, M Vigouroux, D Cooper; CEA; ZM Zuo; University of Illinois [1103]

2211

4D-STEM imaging with the pnCCD (S)TEM-Camera; M Simson, H Ryll; PNDetector GmbH; L Jones; University of Oxford; Y Kondo; JEOL Ltd; K MŸller; UniversitŠt Bremen; PD Nellist; University of Oxford; H Soltau; PNDetector GmbH, H Yang; University of Oxford et al [1104]

2213

GPU-based defect image simulations using the scattering matrix formalism; S Singh, M DeGraef; Carnegie Mellon University [1105]

2215

EBSD Surface Topography Determination in a Martensitic Au-Cu-Zn Alloy; M Chapman, P Callahan, M DeGraef; Carnegie Mellon University [1106]

2217

High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors; A Vilalta-Clemente, G Naresh-Kumar; Department of Materials University of Oxford; M Nouf-Allehiani; Department of Physics, SUPA; PJ Parbrook; Tyndall National Institute University College Cork; ED Le Boulbar; Department of Electronic and Electrical Engineering; D Allsopp; Department of Electronic and Electrical Engineering; PA Shields; Department of Electronic and Electrical Engineering, C Trager- Cowan; Department of Physics, SUPA et al [1107]

2371

Comparison in 3D of Experiments on, and Simulations of Plastic Deformation of Polycrystals; AD Rollett, R Pokharel; Carnegie Mellon Univ; RA Lebensohn; Los Alamos Natl Lab; RM Suter; Carnegie Mellon Univ [1184]

2373

Improved EBSD Map Fidelity through Re-indexing of Neighbor Averaged Patterns; SI Wright, MM Nowell, LP Lindeman, P Camus; EDAX [1185]

2375

A novel way for determining Bravais lattice using a single electron backscatter diffractionpattern; L Li, M Han; School of Materials Science and Engineering, Fujian University of Technology [1186]

2377

Tackling Characterization Challenges in High Deformation/Stress Steel Alloys Using Transmission Kikuchi Diffraction (TKD); A Avishai, AH Heuer; Case Western Reserve University; S Sitzman; Oxford Instruments America, Inc; K Abassi, D Wang; Case Western Reserve University; V Bedekar, D wu, S Hyde; The Timken Company et al [1187]

2379

Rotation Axes Analysis of Deformed Magnesium Using Electron Backscatter Diffraction and Rotation Contour Contrast Reconstruction; S Kaboli, H Demers, R Gauvin; McGill University [1188]

1661

Orientation Mapping by Precession Transmission Electron Microscopy; D Wang, A Avishai, A Heuer; Case Western Reserve University [829]

1663

Determination of reliable grain boundary orientation using automated crystallographic orientation mapping in the transmission electron microscope; X Zhang, JF Rufner; Department of Chemical Engineering and Materials Science, University of California,Davis; T LaGrange; Ecole Polytechnique Federale de Lausanne, Interdisciplinary Center of Electron Microscopy; RH Castro, JM Schoenung; Department of Chemical Engineering and Materials Science, University of California, Davis;GH Campell; Physical and Life Sciences Directory, Lawrence Livermore National Laboratory; K van Benthem; Department of Chemical Engineering and Materials Science, University of California, Davis [830]

1665

The presence of higher-order Laue zone intensities and the Relrod effect in cubic metals in the Transmission Electron Microscope; C Miller, R Field, M Kaufman; Colorado School of Mines [831]

1667

Semi-Automated DigitalMicrograph Routine for Real-Time Phase Identification; ER White, J Weiner, A Garc’a-Trenco, SD Pike, CK Williams, MS Shaffer; Imperial College London [832]

1669

Improving Spatial Detection of Twins Achieved by Measuring Individual Kikuchi Band Intensity in EBSD Patterns; TM Rampton, DT Fullwood, SI Wright; EDAX [833]

1671

Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films; EC Estrine, N Seaton, P Dulal, B Stadler; University of Minnesota [834]

1673

Automated Image Alignment and Distortion Removal for 3D Serial Sectioning with Electron Backscatter Diffraction; AJ Levinson, DJ Rowenhorst; Naval Research Laboratory; AC Lewis; Formerly Naval Research Laboratory [835]

1675

Growth and Characterization of (110) InAs Quantum Well Heterostructures by Transmission Electron Microscopy and Electron Channeling Contrast Imaging; MB Katz, ME Twigg, AA Podpirka; US Naval Research Laboratory; M Hernandez; Hitachi High Technologies America, Inc; SC Mack, BR Bennett; US Naval Research Laboratory [836]

1677

Techniques for Transmission EBSD Mapping of Atom Probe Specimens; KP Rice, Y Chen, TJ Prosa, DJ Larson; CAMECA Instruments, Inc; M Nowell; EDAX Inc; MP Stoykovich; University of Colorado Ð Boulder [837]

2029

The Reliability of EBSD-based Microstructure Analysis; K Davut, S Zaefferer; Metal Forming Center of Excellence, Atilim University [1013]

2031

Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope; N Brodusch, H Demers, R Gauvin; McGill University [1014]

2033

Real-time discrimination of phases with similar Kikuchi patterns but different chemistry through simultaneous EBSD and EDS; J Goulden, S Sitzman, K Larsen, R Jones; Oxford Instruments [1015]

2035

Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup; J Guyon, N Gey; Laboratoire dÕEtude des Microstructures et de MŽcanique des MatŽriaux (LEM3); D Goran; Bruker Nano GmbH; S Chalal, F PŽrez-Willard; Carl Zeiss Microscopy GmbH [1016]

2037

Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of Gamma-TiAl with High Accuracy Band Detection; SD Sitzman, N-H Schmidt; Oxford Instruments NanoAnalysis; A Palomares-Garcia; IMDEA Materials Institute; R Munoz-Moreno; Rolls Royce UTC; J Goulden; Oxford Instruments NanoAnalysis [1017]

2039

Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?; M Chapman, S Singh, M DeGraef; Carnegie Mellon University [1018]

2041

Automated Dictionary-based Indexing of Electron Channeling Patterns; S Singh, M DeGraef; Carnegie Mellon University [1019]

2043

Quantitative Analysis of Correlated 3D Strontium Titanate Datasets Collected by TriBeam and Diffraction Contrast Tomography; WC Lenthe, MP Echlin; University of California, Santa Barbara; M Syha, A Trenkle, P Gumbsch; Karlsruhe Institute of Technology; TM Pollock; University of California, Santa Barbara [1020]

2045

Pattern overlap and high resolution electron backscatter diffraction; V Tong, J Jiang; Imperial College London; AJ Wilkinson; University of Oxford; B Britton; Imperial College London [1021]

2047

Electron and X-ray Diffraction Measurements of Elastic Stress and Plastic Strain from Ultrasonic Impact Treatment of Aluminum-Magnesium Alloys; LN Brewer, EF Fakhouri; University of Alabama; ME Haggett; Naval Postgraduate School; KN Tran; Naval Surface Warfare Center- Carderock Division [1022]

A11 Electron Vortex Beams and Higher-Order Beam Modes

The Surprising Dynamics of Electron Vortex Beams; S Lšffler, T Schachinger; McMaster University; M Stšger-Pollach, P Schattschneider; Vienna University of Technology [10]

Unveiling the OAM and acceleration of electron beams; R Shiloh, Y Tsur, R Remez, Y Lereah,BA Malomed; Tel-Aviv University; V Shvedov, C Hnatovsky, W Krolikowski; Australian National University et al [11]

An orbital angular momentum spectrometer for electrons; TR Harvey, V Grillo, BJ McMorran; University of Oregon [12]

Structured Electron beam illumination: a new control over the electron probe. Weird probes and new experiments; V Grillo, J Pierce; CNR-Istituto Nanoscienze, Centro S3; E Karimi; University of Ottawa; TR Harvey; of Oregon; R Balboni; CNR-IMM Bologna; GC Gazzadi; CNR-Istituto Nanoscienze, Centro S3; E Mafakheri; Universit‡ di Modena e Reggio Emilia, F Venturi; Universit‡ di Modena e Reggio Emilia, et al [13]

499

Mapping Magnetic Properties of Materials At Atomic Spatial Resolution; J Rusz, J-C Idrobo; Uppsala University; S Bhowmick; Indian Institute of Technology; J Spiegelberg; Uppsala University; S Bhowmick; Indian Institute of Technology [250]

501

At-Focus Observations of High Quality Electron Vortex Beams Created from Ferromagnetic Rods;AM Blackburn, JC Loudon; Hitachi Cambridge Laboratory; R Herring; University of Victoria; A Hrabec; University of Leeds; D Hoyle; Hitachi High-Technologies Canada [251]

503

Electron holograms encoding amplitude and phase for the generation of arbitrary wavefunctions;V Grillo, E Karimi; CNR-Istituto Nanoscienze, Centro S3; R Balboni; CNR-IMM; GC Gazzadi; CNR- Istituto Nanoscienze centro S3; F Venturi, S Frabboni; Universit‡ di Modena e Reggio Emilia;BJ McMorran; University of Oregon, RW Boyd; University of Ottawa et al [252]

505

Electron vortex beams for magnetic measurements on ferromagnetic samples via STEM; D Pohl, J Rusz, S Schneider; IFW Dresden; P Tiemeijer; FEI Company; B Rellinghaus; IFW Dresden [253]

667

Holograms for the generation of Vortex states with L=500_ fabricated by electron beam lithography; E Mafakheri, V Grillo; Dipartimento FIM, Universitˆ di Modena e Reggio Emilia; R Balboni; CNR- IMM; GC Gazzadi; CNR-Istituto Nanoscienze, Centro S3; C Menozzi, S Frabboni; Universitˆ di Modena e Reggio Emilia; E Karimi, RW Boyd; University of Ottawa [334]

669

Synthesization of vortex beams by combining fork-shaped gratings for transmission electron microscopy; K Harada, T Kohashi, T Iwane; Central Research Laboratory, Hitachi Ltd [335]

671

Propagation properties of Electron Vortex Beams; K Saitoh, H Nambu, N Tanaka; EcoTopia Science Institute, Nagoya University; M Uchida; Advanced Science Research Laboratory, Saitama Institute of Technology [336]

673

Electron singularities, matter wave catastrophes, and vortex lattice singularimetry; TC Petersen, M Welyand, DM Paganin, TP Simula, SA Eastwood, AI Bishop, MJ Morgan; Monash University [337]

675

Holographic generation of highly twisted electron beams; V Grillo, GC Gazzadi; CNR-Istituto Nanoscienze, Centro S3; E Mafakheri, S Frabboni; Universit‡ di Modena e Reggio Emilia; E Karimi, RW Boyd; University of Ottawa [338]

A12 Low Voltage Electron Microscopy

Direct Observation of Nano-porous Materials Using Low Voltage High Resolution SEM; S ASAHINA, Y SAKUDA; JEOL ltd; O TERASAKI; Stockholm Univ Sweden and KAIST Korea [14]

Examination of Graphene in a Scanning Low Energy Electron Microscope; I MŸllerov‡, E Mikmekov‡, L Frank; Institute of Scientific Instruments ASCR, v v i [15]

Conductivity contrast in SEM images of hydrogenated graphene grown on SiC; I Jozwik,JM Baranowski, K Grodecki; Institute of Electronic Materials Technology; P Dabrowski; University of Lodz; W Strupinski; Institute of Electronic Materials Technology [16]

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques; MD Zotta, YP Kandel, AN Caferra, E Lifshin; College of Nanoscale Science and Engineering, SUNY Polytechnic Institute [17]

20-kV Diffractive Imaging of Graphene by using an SEM-based Dedicated Microscope; O Kamimura, T Dobashi; Central Research Laboratory, Hitachi, Ltd; Y Maehara; Hokkaido University; R Kitaura, H Shinohara; Nagoya University; K Gohara; Hokkaido University [18]

349

Opportunities for Low-Voltage TEM/STEM; RF Egerton; University of Alberta [175]

351

Development of a monochromated and aberration-corrected low-voltage (S)TEM; M Mukai,S Morishita, H Sawada; JEOL Ltd; LH Tizei, Y-C Lin; AIST; K Kimoto; NIMS; K Suenaga; AIST [176]

353

Demonstration of 40kV TEM Diffraction of Graphite for Structural Analysis; A Barnum, J Jiao; Portland State University [177]

355

Strategies for High-Resolution Imaging of Radiation-Sensitive Materials in an Aberration-Corrected Transmission Electron Microscope; UA Kaiser; Ulm University [178]

507

Low Voltage SEM and Correlative Microscopy to Analyze Delicate Biological Material; H- Schatten; Department of Veterinary Pathobiology University of Missouri [254]

509

Structural Biology at The Single Particle Level: Imaging Tobacco Mosaic Virus by Low-Energy Electron Holography; J-N Longchamp, T Latychevskaia, C Escher, H-W Fink; University of Zurich [255]

511

Helium Ion Microscopy of Plant Tissues and Mammalian Cells; AF Loftus, MS Joens, SE Dunn, MW Adams; Salk Institute for Biological Studies; C Huynh, B Goetze; Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC; JA Fitzpatrick; Salk Institute for Biological Studies [256]

513

Imaging of Carbon Nanotubes Embedded in Polymer Composites via Low Energy Scanning Electron Microscopy and Scanning Lithium Ion Microscopy; M Zhao, KA Twedt, JJ McClelland, JA Liddle; National Institute of Standards and Technology [257]

677

Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes; H Demers, N Brodusch; McGill University; P Hovington; Institut de Recherche dÕHydro QuŽbec (IREQ); R Gauvin; McGill University; K Zaghib; Institut de Recherche dÕHydro QuŽbec (IREQ) [339]

679

Low Accelerating Voltage X-ray Microanalysis Ð Strategies and challenges; PL McSwiggen; McSwiggen Associates/JEOL USA, Inc [340]

681

Advantage of Beam Deceleration for Low kV EDS Analysis; DC Edwards, N Erdman, D Guarrera, M Shibata, V Robertson; JEOL USA, Inc; F Timischl, Y Nemoto; JEOL Technics Ltd [341]

683

Nanostructures Viewed through Low Voltage Electron Microscopy; DR Radu, C-Y Lai; Delaware State University [342]

833

The OTO Specimen Preparation Method for Optimal Scanning Electron Microscopy Imaging of Pseudomonas aeruginosa; TYJ Lee, N Avishai, KP Connie Tam; Cleveland Clinic Cole Eye Institute [417]

835

Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope; NC Barbi, MB Tzolov, OE Healy, RB Mott; PulseTor LLC; WM McDonald; Lock Haven University [418]

837

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage; Y Hashimoto, A Muto; Hitachi High Technologies America, Inc; T Walters, E Woods; Georgia Institute of Technology; DC Joy; The University of Tennessee [419]

839

Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source; I-S Hwang, W-T Chang, C-Y Lin, W-H Hsu; Institute of Physics, Academia Sinica [420]

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Bridging the gap between the modeling approach and the experiment in Atom Probe Tomography;F Vurpillot, W Lefebvre, L Rigutti, N Rolland, F Moyon, H Hideur, D Blavette; Groupe de Physique des MatŽriaux, UMR CNRS 6634, UniversitŽ et INSA de Rouen [19]

Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic Nanodiamonds; JB Lewis, D Isheim, C Floss, TL Daulton; Washington University; DN Seidman; Northwestern University [20]

Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR; RM Ulfig, TJ Prosa; CAMECA Instruments, Inc; DR Lenz, TR Payne; CAMECA Instruments, Inc [21]

Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM and APT; A Stokes, M Al-Jassim, D Diercks; Colorado School of Mines; B Egaas; Nation Renewable Energy Laboratory; B Gorman; Colorado School of Mines [22]

Development of Quantitative Standards for Atom Probe Reconstruction Parameters for Analysis of Interfacial Chemistry; S Broderick, S Dumpala, S Young, K Kaluskar, S Srinivasan, K Rajan; Iowa State University [23]

357

Investigation into Solute Stabilizing Effects in Nanocrystalline Materials: An Atom Probe Characterization Study; GB Thompson, M Kapoor, T Kaub; The University of Alabama; B Boyce,B Clarke; Sandia National Laboratories; K Darling; Army Research Laboratory; P Felfer; University of Sydney, J Cairney; The University of Sydney [179]

359

Precipitation in Highly Supersaturated Al-Sc-V, Al-Sc-Nb, and Al-Sc-Ta Alloys During Isochronal Aging; KE Knipling; U S Naval Research Laboratory [180]

361

Co-deformation of crystalline-amorphous nanolaminates; W Guo, J Yao, EA JŠgle, P-P Choi, D Raabe; Max Planck Institut fŸr Eisenforschung [181]

363

An experimental and simulation studies of a high strain-rate deformation shear band in a high-nickel steel; S-I Baik, D Isheim; Northwestern University; D Jain; Northwestern edu; RK Gupta, S Kumar; Brown University; DN Seidman; Northwestern University [182]

365

Characterization of Element Partitioning at the Austenite/Ferrite Interface of as Cast CF-3 and CF-8 Duplex Stainless Steels; RP Kolli, S Mburu; University of Maryland; DE Perea, J Liu; Pacific Northwest National Laboratory; SC Schwarm; University of Maryland; A Eaton; Pacific Northwest National Laboratory; S Ankem; University of Maryland [183]

515

Probing the Organic/Inorganic Interface of the Ferritin Protein using Atom Probe Tomography; DE Perea, J Liu, J Bartrand, Q Dicken, T Thevuthasan, N Browning, JE Evans; Pacific Northwest National Laboratory [258]

517

Methods in creating, transferring, measuring cryogenic samples for APT; SS Gerstl, R Wepf; ScopeM, ETH Zurich [259]

519

Atom Probe of Apatites Ð from Single Crystals to Interphases in Tooth Enamel; LM Gordon, KA Derocher, MJ Cohen, D Joester; Northwestern University [260]

521

3D Atomic Scale Analysis of CMOS type structures for 14 nm UTBB-SOI technology; R Estivill, A Grenier; STMicroelectronics; T Printemps; CEA, LETI; M Juhel, M Gregoire, P Caubet;STMicroelectronics; D Blavette; Groupe de Physique des MatŽriaux Ð GPM UMR CNRS 6634 [261]

523

Microscopy of Chemical and Mechanical Heterogeneities in Lithium Cobalt Oxide; DR Diercks, M Musselman, M Kumar, BP Gorman, CE Packard; Colorado School of Mines [262]

685

Nanoscale characterization of Li-ion battery cathode nanoparticles by atom probe tomography correlated with Transmission electron microscopy and scanning transmission x-ray microscopy; A Devaraj, C Szymanski, P Yan, C Wang, V Murugesan, J Zheng, JJ Zhang; Pacific Northwest National Laboratory, T Tyliszczak; Adavanced Light Source, LBNL et al [343]

687

Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy; Y Chen, KP Rice, TJ Prosa; CAMECA Instruments, Inc; EA Marquis; University of Michigan; RC Reed; University of Oxford, Impact Laboratory [344]

689

A comparative analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF- SIMS; R Estivill, P Chevalier, F Lorut, M Juhel, L ClŽment, G Servanton; STMicroelectronics; A Grenier; CEA,LETI, D Blavette; Groupe de Physique des Materiaux (GPM) - UMR CNRS 6634 et al [345]

691

CdSe1-xTex Phase Segregation in CdSe/CdTe Based Solar Cells; JD Poplawsky, NR Paudel; Oak Ridge National Laboratory; A Ng; Vanderbilt University; K More; Oak Ridge National Laboratory; Y Yan; The University of Toledo [346]

693

Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography; GL Burton, DR Diercks, BP Gorman; Colorado School of Mines [347]

695

In-Situ Deuterium Charging for Direct Detection of Hydrogen in Vanadium by Atom Probe Tomography; S Dumpala, D Haley, SR Broderick; Iowa State University; PA Bagot; University of Oxford; MP Moody; University of Oxford; K Rajan; Iowa State University [348]

841

Level Set Method for Tip Shape evolution Simulation for Atom Probe Tomography; J Bao, Z Xu,R Colby; Pacific Northwest National Laboratory; S Thevuthasan; Qatar Energy and Environmental Research Institute; A Devaraj; Pacific Northwest National Laboratory [421]

843

Atom Probe Analysis of Bulk Chemistry in Mineral Standards; FA Laiginhas, A Perez-Huerta; Dept of Geological Sciences; RL Martens; Central Analytical Facility; TJ Prosa; CAMECA Instruments, Inc; D Reinhard; CAMECA Instruments, Inc , [422]

845

Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures;MI Nandasiri, N Madaan; Environmental Molecular Sciences Laboratory (EMSL), Pacific Northwest National Laboratory; A Devaraj; EMSL, Pacific Northwest National Laboratory; J Bao, Z Xu; Computational Material Sciences, Pacific Northwest National Laboratory; T Varga, V Shutthanandan; EMSL, Pacific Northwest National Laboratory, S Thevuthasan; Qatar Environment and Energy Research Institute, Qatar Foundation [423]

847

Creating Isoconcentration Surfaces in Low-Chemical-Partitioning, High Solute-Containing Alloys;BC Hornbuckle, M Kapoor, GB Thompson; The University of Alabama [424]

849

Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography; TJ Prosa, D Lawrence, D Olson, S Strennen; CAMECA Instruments, Inc; RL Martens, J Goodwin; The University of Alabama; A Portavoce; Aix-Marseille UniversitŽ IM2NPFacultŽ des Sciences et Techniques, D Mangelinck; Aix-Marseille UniversitŽ IM2NP FacultŽ des Sciences et Techniques et al [425]

851

Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards; DA Geochronology,DE Moser; CAMECA Instruments, Inc; I Barker; University of Western Ontario - Zircon Accessory Phase Laboratory; D Olson, I Martin, KP Rice, Y Chen, D Lawrence; CAMECA Instruments, Inc et al [426]

853

Atom probe tomography of feldspars and aluminosilicate glasses; LM Gordon; Environmental Molecular Spectroscopy Lab [427]

855

Catalysis and Atom Probe Tomography: Recent Progresses and Future Developments towards the Analysis of Nanoporous Samples; C Barroo, AP Magyar, DC Bell; School of Engineering and Applied Sciences, Harvard University [428]

857

Background Recovery through the Quantification of Delayed Evaporation Multi-Ion Events in Atom- Probe Data; K Kruska, DK Schreiber; Pacific Northwest National Laboratory [429]

859

Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards; FA Laiginhas, AP Perez- Huerta, RL Martens; University of Alabama; TJ Prosa, D Reinhard; Cameca Instruments, Inc [430]

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

1251

Quest for an optical circuit probe; NX Fang, J Xu; MIT [625]

1253

Quantum and time-resolved nano-optics using auto-correlated cathodoluminescence in a STEM;S Meuret, L Tizei, R Bourrellier; Laboratoire de Physique des Solides; T Auzelle; CEA-CNRS Group ÒNanophysique et SemiconducteursÓ; F Treussart; Laboratoire AimŽ Cotton; B Daudin, B Gayral; CEA-CNRS Group ÒNanophysique et SemiconducteursÓ, M Kociak; Laboratoire de Physique des Solides et al [626]

1255

Correlative STEM-Cathodoluminescence and Low-Loss EELS of Semiconducting Oxide Nano- Heterostructures for Resistive Gas-Sensing Applications; DR Miller, S Akbar, P Morris; The Ohio State University; RE Williams, DW McComb; Center for Electron Microscopy and Analysis [627]

1257

Investigating the Origin of Luminescence in Zinc Oxide Nanostructures With STEM- Cathodoluminescence; ER White, A Howkins, CK Williams, MS Shaffer; Imperial College London [628]

1259

Combined EELS and Cathodoluminescence analysis in a STEM microscope of GaN/InGaN quantum wells for LED applications; P Longo, DJ Stowe, RD Twesten; Gatan, Inc; A Howkins; Brunel University [629]

1467

Electron Energy-Loss Spectroscopy of Organic Photovoltaics; FJ Scheltens, LF Drummy; The Ohio State University; MF Durstock; Materials and Manufacturing Directorate; JB Gilchrist, S Heutz; Imperial College London; JA Alexander, DW McComb; The Ohio State University [732]

1469

Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment; R Nicholls, FS Hage; University of Oxford; K Refson; STFC Rutherford Appleton Laboratory; J Yates; University of Oxford; DM Kepaptsoglou; SuperSTEM Laboratory; TC Lovejoy, OL Krivanek; Nion Company, QM Ramasse; SuperSTEM Laboratory et al [733]

1471

Variable Angle Spectroscopic Ellipsometry and Electron Energy-Loss Spectroscopy; JA Alexander, FJ Scheltens; The Ohio State University; LF Drummy, MF Durstock; Materials and Manufacturing Directorate; JB Gilchrist, SE Heutz; Imperial College London; DW McComb; The Ohio State University [734]

1473

Detection and Characterization of OH Vibrational Modes using High Energy Resolution EELS;L Zhang, Q Liu, PA Crozier, T Aoki; Arizona State University [735]

1475

Study Using Low-loss EELS to Compare Properties of TMDs Produced by Mechanical and Liquid Phase Exfoliation; HC Nerl, FS Hage; Trinity College Dublin; L Houben; Ernst Ruska Center for Microscopy and Spectroscopy with Electrons; QM Ramasse; SuperSTEM Laboratory; V Nicolosi; Trinity College Dublin [736]

1901

Valence-loss EELS Spectroscopy of Refractory Plasmonic Nanomaterials; AA Herzing, U Guler; Material Measurement Laboratory, National Institute of Standards and Technology; X Zhou, TB Norris; Center for Ultrafast Optical Science [949]

1903

Bandgaps and Surface Inter-Band States in Photocatalysts with High Energy Resolution EELS; Q Liu, L Zhang; Arizona State University; K March; UniversitŽ Paris-Sud; T Aoki, PA Crozier; Arizona State University [950]

1905

Observation of Inter-Bandgap States in Doped Ceria via Monochromated EELS; WJ Bowman, K March; School for the Engineering of Matter, Transport and Energy, Arizona State University; T Aoki; LeRoy Eyring Center for Solid State Science, Arizona State University; CA Hernandez, PA Crozier; School for the Engineering of Matter, Transport and Energy, Arizona State University [951]

1907

Introduction to Plasmon Energy Expansion Thermometry; BC Regan, WA Hubbard, ER White; UCLA; R Dhall, SB Cronin; USC; S Aloni; Molecular Foundary; M Mecklenburg; USC [952]

1909

Nanoscopic imaging of energy transfer from single plasmonic particles to semiconductor substrates via STEM/EELS; G Li, C Cherqui; University of Notre Dame; N Bigelow; University of Washington; G Duscher; University of Tennessee; P Straney, J Millstone; University of Pittsburgh; D Masiello; University of Washington, JP Camden; University of Notre Dame [953]

2219

Nanoplasmonics in the TEM; M Bosman; Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research) [1108]

2221

Real-space Imaging of Plasmonic Modes of Gold Tapers by EFTEM and EELS; W Sigle, N Talebi, S Guo; Max Planck Institute for Intelligent Systems; M Esmann, SF Becker, R Vogelgesang,CT Lienau; Carl von Ossietzky UniversitŠt Oldenburg, PA van Aken; Max Planck Institute for Intelligent Systems [1109]

2223

Local Variations in the Surface Plasmon at Al Grain Boundaries and its Effect on the Optical Properties of Al Nanostructures; AM Thron, CG Bischak; Molecular Foundry, Lawrence Berkeley National Laboratory; S Dhuey; Molecular Foundry, Lawrence Berkeley; S Aloni; Molecular Foundry, Lawrence Berkeley National Laboratory [1110]

2225

Three-dimensional Surface Charge Reconstructions of Surface Plasmon Modes of Silver Right Bipyramids; SM Collins, M Duchamp; University of Cambridge; E Ringe; Rice University; Z Saghi, PA Midgley; University of Cambridge [1111]

2227

High-Resolution Characterization of Plasmonic Hybridization in Silver Nanostructures; EP Bellido, IC Bicket, J McNeil, GA Botton; McMaster University [1112]

2381

Ferroplasmons: Novel Plasmons in Metal-Ferromagnetic Bimetallic Nanostructures; J Ge, A Malasi; The University of Tennessee; N Passarelli; INFIQC, Departamento de Fisicoqu’mica; LA PŽrez; INFIQC, Departamento de Fisicoqu’mica, Facultad de Ciencias Qu’micas; E Coronado; The University of Tennessee, Knoxville; R Sachan; Oak Ridge National Labs; G Duscher; The University of Tennessee, R Kalyanaraman; The University of Tennessee, Knoxville [1189]

2383

Electron impact investigation of hybridization schemes in coupled split-ring resonators; Q Liang, Y Wen; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy;T Reindl; Max Planck Institute for Solid State Research; N Talebi, PA van Aken; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy [1190]

2385

Visualizing Plasmonic Coupling in Metamaterials and Applying Angular Resolved EELS; F von Cube, J Niegemann, DC Bell; School of Engineering and Applied Sciences, Harvard University; S Irsen; Electron Microscopy and Analysis (EMA), Center of Advanced European Studies and Research (caesar); S Linden; Physikalisches Institut, UniversitŠt Bonn [1191]

2387

Edge modes of surface plasmon nanodisk antennas visualized in 3-photon PEEM; RC Word, R Kšnenkamp; Portland State University [1192]

2389

Direct Observation of Plasmonic Enhancement of Emission in Ag-nanoparticle-decorated ZnO nanostructures; JA Hachtel, DC Mayo, CE Marvinney; Vanderbilt University; R Mu; Fisk University; SJ Pennycook; National University of Singapore; MF Chisholm; Oak Ridge National Laboratory;RF Haglund, ST Pantelides; Vanderbilt University et al [1193]

1679

Characterization of Sulfonated Polysulfone Polymers by EELS; C Wang, SJ Paddison; National Institute for Occupational Safety and Health; JR Dunlap, G Duscher; University of Tennessee [838]

1681

Structural and Optical Properties of AlGaN MQWs Grown by MOCVD Using One and Two TMG Sources; S Wang, H Xie, Y Wei, AM Fischer, FA Ponce; Arizona State University; M Moseley,B Gunning, AW Doolittle; Georgia Institute of Technology [839]

1683

Probing Plasmons in Three Dimensions within Random Morphology Nanostructures; JA Hachtel, A Mouti, DC Mayo; Vanderbilt University; SJ Pennycook; National University of Singapore; AR Lupini, MF Chisholm; Oak Ridge National Laboratory; RF Haglund, ST Pantelides; Vanderbilt University et al [840]

1685

Strong Coupling between ZnO Exciton and Localized Surface Plasmon in Ag Nanoparticles Studied by STEM-EELS; J Wei, J Xu, J Liu; Arizona State University [841]

1687

Advances in Scanning Transmission Electron Microscope Cathodoluminescence; S Meuret, L Tizei, A Losquin, R Bourrellier, LF Zagonel, M TencŽ, A Zobelli, M Kociak; Laboratoire de Physique des Solides et al [842]

2049

Pushing the limits of cathodoluminescence detection: analyzing 2D materials; A Mouti, R Sachan, A Lupini, MF Chisholm; Oak Ridge National Laboratory; SJ Pennycook; National University of Singapore [1023]

2051

SPARC: a Cathodoluminescence Platform for Nanoscale Plasmonics in a Scanning Electron Microscope; T Coenen, JJ de Boer; Delmic B V [1024]

2053

Measuring Gas Adsorption on Individual Facets of a Nanoparticle by a Surface Plasmon Nanoprobe; PA Lin, JM Kohoutek, J Winterstein, H Lezec, R Sharma; National Institute of Standards and Technology [1025]

2055

Evaluating Adhesion Layers for Plasmonic Nanostructures with Monochromated STEM-EELS and Surface Enhanced Raman Spectroscopy; SJ Madsen, AL Koh, R Sinclair; Stanford University [1026]

2057

Unconventional Surface Plasmon Excitations in Bi2Se3; C Ozsoy Keskinbora, N Talebi; MPI-IS; HM Benia; MPI-FKF; CT Koch; Ulm University; PA van Aken; MPI-IS [1027]

A15 Imaging Mass Spectrometry

2229

MALDI Imaging MS: Molecular Visualization of Tissues in Drug Discovery and Development;S Castellino, MR Groseclose; GSK [1113]

2231

Development of Laser Ionization Imaging Mass Spectrometry for Multiple Drugs Administered to Cancer Cells; H Hazama, H Kannen; Graduate School of Engineering, Osaka University; J Aoki, M Toyoda; Graduate School of Science, Osaka University; T Fujino; Graduate School of Science and Engineering, Tokyo Metropolitan University; Y Kaneda; Graduate School of Medicine, Osaka University; K Awazu; Graduate School of Engineering, Osaka University [1114]

2233

Mass spectrometry imaging of microbial interactions using matrix-enhanced laser desorption/ ionization Fourier-transform ion cyclotron resonance mass spectrometry; CR Anderton, RK Chu, JB Shaw, EM Zink; Pacific Northwest National Laboratory; CA Zeiner; School of Engineering and Applied Sciences, Harvard University; D Trede; SCiLS GmbH; CM Hansel; Woods Hole Oceanographic Institution, L Pa_a-Toli_; Pacific Northwest National Laboratory [1115]

2235

Multimodal molecular imaging: Insight into the complexity of biological surfaces through speed, resolution and identification; RM Heeren, A Bruinen; M4I, The Maastricht Multimodal Molecular Imaging Insitute; N Mascini; FOM-AMOLF; G Fisher; Physical Electronics; T Porta, S Ellis; M4I [1116]

2391

Nanoscale Imaging Mass Spectrometry using Cluster Ion Beams; N Winograd; Penn State University [1194]

2393

Multimodal Imaging of Environmental and Biological Liquid Surfaces and Interfaces Using Imaging Mass Spectrometry; X-Y Yu; Pacific Northwest National Laboratory [1195]

2395

Molecular Characterization of Lubricant Degradation Produced in a Tribological Wear Test Using TOF-SIMS Imaging MS; GL Fisher, T LeMogne; Physical Electronics; JM Martin, C Forest; Ecole Centrale de Lyon [1196]

2397

High-Resolution Imaging of the Distributions of Cholesterol, Sphingolipids, and Specific Proteins in the Plasma Membrane with Secondary Ion Mass Spectrometry; MK Kraft, PK Weber, JF Frisz,HA Klitzing, RL Wilson, A Yeager; University of Illinois; J Zimmerberg; Eunice Kennedy Shriver National Institute of Child Health and Human Development [1197]

2059

Imaging Mass Spectrometry Using Ultra-high Mass Resolution Matrix-Assisted Laser Desorption/ Ionization Time-of-Flight Mass Spectrometer, SpiralTOF; T Satoh, A Kubo; JEOL Ltd; M Ubukata; JEOL USA Inc; N Moriguchi, H Hazama, K Awazu; Graduate School of Engineering, Osaka University; M Toyoda; Graduate School of Science, Osaka University [1028]

2061

MALDI and LDI Imaging of Forensic Samples by Using A Spiral-Trajectory Ion Optics Time-of-Flight Mass Spectrometer; M Ubukata, AJ Dane, RB Cody, D Guarrera, DC Edwards, N Erdman, M Shibata; JEOL USA, INC, T Satoh; JEOL Ltd [1029]

2063

Synthesis of Monolayer Molybdenum Disulfide and ToF-SIMS Characterization; X Chen, M Ambrogio; Northwestern University [1030]

2065

An Investigation of the Pancreatic Islet Tumor Microenvironment with Time-of-Flight Secondary Ion Mass Spectrometry; BM Bluestein, F Morrish; University of Washington; D Hockenbery; Fred Hutchinson Cancer Research Center; LJ Gamble; University of Washington [1031]

A16 Advances in Electron and Ion Scanning Microscopies

697

High-Throughput SEM via Multi-Beam SEM: Applications in Materials Science; JR Michael,CY Nakakura; Sandia National Laboratories; T Garbowski, A-L Eberle, T Kemen, D Zeidler; Carl Zeiss Microscopy GmbH [349]

699

Measurement of the Electron Beam Point Spread Function (PSF) in a Scanning Electron Microscope (SEM); YP Kandel, MD Zotta, AN Caferra; CNSE, SUNY PI; RL Moore; Nanojehm Inc; E Lifshin; CNSE, SUNY PI [350]

703

Low Energy BSE Imaging with a New Scintillation Detector; J Fiala, J Kolosova, J Jiruse, J Beranek; TESCAN BRNO s r o [352]

705

Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High Resolution Imaging; H Demers, N Brodusch; Department of Mining andMaterials Engineering, McGill University; P Woo; Hitachi High-Technologies Canada Inc; R Gauvin; Department of Mining and Materials Engineering, McGill University [353]

1105

Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope; MT Postek, J Villarrubia, AE Vlad‡r; National Institute of Standards and Technology; A Muto; Hitachi High Technologies America [552]

1107

Variation in Band Gap Contrast in Natural Molybdenum Disulphide (MoS2) with BSE Collection Angle and Stage Bias using a Segmented Annular BSED; BJ Griffin, DC Joy; The University of Western Australia; JR Michael; Sandia National Laboratory [553]

1109

Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM; V Nedela, I Konvalina, M Oral, J Hudec; Institute of Scientific Instruments of ASCR [554]

1111

Electron Microscopy in Air: Transparent Atomic Membranes and Imaging Modes; Y Han, K Nguyen; Applied and Engineering Physics, Cornell University; Y Ogawa; Chemistry and Chemical Biology Department, Cornell University; H Shi; Physics Department, Cornell University; J Park; Chemistry and Chemical Biology Department, Cornell University; DA Muller; Applied and Engineering Physics, Cornell University [555]

1113

Advances In Variable Pressure Imaging and Detection; L Han, C Berger, M Boese, A Thesen, F Zhou, S Meyer, E Essers; Carl-Zeiss Microscopy, FE-SEM Department [556]

1261

Low kV High Resolution Scanning Electron Microscopy study of Si nanowire surfaces; C Alfonso, L Roussel; Aix-Marseille UniversitŽ-CNRS-IM2NP; A Chara•; Aix-Marseille UniversitŽ-CNRS, IM2NP; C Dominici, AP Campos; Aix-Marseille UniversitŽ-CP2M; LY Han, F Zhou; Carl Zeiss Microscopy GmbH [630]

1263

An Analytical Scattering Model for Low Energy Annular Dark Field Transmission Scanning Electron Microscopy; TJ Woehl, J Holm, RR Keller; Material Measurement Laboratory, NIST [631]

1265

Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging; JY Howe, Y Hashimoto; Hitachi High-Technologies Canada Inc; X Wang, M Vara; Georgia Institute of Technology; D Hoyle; Hitachi High-Technologies Canada Inc; T Schamp; Hitachi High-Technologies America Inc; Y Xia; Georgia Institute of Technology, DC Joy; Oak Ridge National Laboratory [632]

1267

Sub-surface Serial Block Face Scanning Electron Microscopy; Q He, MA Aronova; National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health; DC Joy; University of Tennessee; G Zhang, RD Leapman; National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health [633]

1269

Applications of energy dependent backscatter yield variations at low voltage; A Thesen, M Boese; Zeiss Microscopy; K Sempf; Fraunhofer-Institute IKTS; F Zhou; Zeiss Microscopy [634]

1689

Modeling Ion Beam Induced Secondary Electrons; U Huh, V Iberi, W Cho; The University of Tennessee, Knoxville; R Ramachandra; The University of California, San Diego; DC Joy; The Oak Ridge National Laboratory [843]

1691

Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials; V Iberi, U Huh; University of Tennessee Knoxville; Y Wu; University of Tennessee; PD Rack; University of Tennessee Knoxville; AJ Rondinone; Center for Nanophase Materials Sciences; DC Joy; University of Tennessee Knoxville [844]

1693

Study of SEM images obtained with an electron energy and take-off angle (E-_) selective detector;T Otsuka, M Nakamura, K-I Yamashita, M Hara; JEOL Ltd; F Timischl; JEOL Technics Ltd; K Honda; JEOL Ltd; M Kudo; JEOL Technics Ltd, S-I Kitamura; JEOL Ltd [845]

1695

Repetitive Observation of Coniferous Samples in ESEM and SEM; E Tihlarikova, V Nedela; Institute of Scientific Instruments of ASCR [846]

1697

The Size and Morphological Study of Spherical Polyelectrolyte Complex Beads Using Environmental Scanning Electron Microscopy; V Nedela, M Bucko, E Tihlarikova; Institute of Scientific Instruments of ASCR; T Kraj_ovi_, P Gemeiner; Institute of Chemistry, Centre for Glycomics SAV [847]

1699

Morphological and Chemical Analysis of Impurities in Ice Using the Environmental Scanning Electron Microscopy and Fluorescence Spectroscopy; V Nedela, J Runstuk; Institute of Scientific Instruments of ASCR; J Krausko, P Klan, D Heger; Faculty of Science, Masaryk University [848]

1701

Dynamic Gas Environmental System Development for in situ Real-time SEM Imaging under Atmospheric Pressure; T Daio, H-W Li, T Ikuta, T Nishiyama; Kyushu University; K Takahashi; International Institute for Carbon-Neutral Energy Research (WPI-I2CNER); Y Takata, SM Lyth, K Sasaki; Kyushu University et al [849]

1703

Determining the Causes of Scanning Distortions in SEM and FIB; M Pluska, A Czerwinski, M Wzorek, M Juchniewicz, J K_tcki; Institute of Electron Technology [850]

1705

Secondary Electron Yield at High Voltages up to 300 keV; JY Howe; Hitachi High-Technologies Canada Inc [851]

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

1477

Standardization and Metrology for Efficiency and Reliability in Microbeam Analysis Ð No pain, no gain; V-D Hodoroaba, RB Marinenko; BAM Federal Institute for Materials Research and Testing; M Matthews; AWE; J Zhao; SAC [737]

1479

Characterizing the Geometric Detection Efficiency of EDX Detectors; FH Schamber; Retired [738]

1481

Determination of the Effective EDS Detector Area Using Experimental and Theoretical X-ray Emission Yields; M Procop, V-D Hodoroaba; IfG-Institute for Scientific Instruments; R Terborg; Bruker-nano GmbH [739]

1483

Energy Resolution of Modern EDS Spectrometers: Is the current ISO standard definition outdated?;R Terborg, M Falke; Bruker Nano GmbH [740]

2237

Standard Methods and Reference Materials for Performing a Complete EPMA WDS Instrument Diagnostic; DC Meier, ES Windsor; National Institute of Standards and Technology; JM Davis; PNDetector; RB Marinenko, JR Anderson, F Meisenkothen, SA Wight; NIST [1117]

2239

Testing of the DR Method for Image Sharpness Determination; M Matthews, J Shah; AWE [1118]

2241

The Use of Color in Elemental Maps and Electron-Microscope Images; RF Egerton; University of Alberta [1119]

2243

Tomographic measurement of buried interface roughness; M Hayashida, S Ogawa, M Malac; National Institute for Nanotechnology [1120]

2245

Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy; JH Dycus, JS Harris, XH Sang; North Carolina State University; SD Findlay; Monash University; AA Oni; North Carolina State University; LJ Allen; University of Melbourne; DL Irving, JM LeBeau; North Carolina State University et al [1121]

2399

Standardization on particle size distribution measurement of nanomaterials; K Yamamoto; National Institute of Advanced Industrial Science and Technology (AIST) [1198]

2401

Shape Recognition of Nanoparticles by High-Resolution SEM and TSEM; E Ortel, L Pelluti; BAM Federal Institute for Materials Research and Testing Division 6 8; F Pellegrino, V Maurino; University of Turin Department of Chemistry; J Mielke; BAM Federal Institute for Materials Research and Testing Division 6 8; I HŠusler, W …sterle; BAM Federal Institute for Materials Research and Testing Division5 1, V-D Hodoroaba; BAM Federal Institute for Materials Research and Testing Division 6 8 et al [1199]

2403

Assessment of Different Electron Microscopy Techniques for Particle Size Quantification of Potential Nanomaterials; P MŸller, J Mielke; BASF SE; V-D Hodoroaba; BAM Federal Institute for Materials Research and Testing; R KŠgi; EAWAG aquatic research; M Ryner; Vironova AB [1200]

2405

Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomography; M Hayashida, K Kumagai, M Malac; National Institute for Nanotechnology [1201]

2407

Repeatable and Transferable Processing for Electron Tomography: An Open Platform for Visualization and Reconstruction of 3D Materials; R Hovden, MD Hanwell; Cornell University; U Ayachit; Kitware Inc; Y Jiang; Cornell University; M Kitware Inc., M Cornell University [1202]

1707

Thin Film Porosity Determined by X-Rays at SEM; E Ortel, R Kraehnert; BAM Federal Institute for Materials Research and Testing Division 6 8; F Galbert; Technical University of Berlin;V-D Hodoroaba; BAM Federal Institute for Materials Research and Testing Division 6 8 [852]

1709

Specimen Preparation Method for Size Distribution Measurements of Nano-materials by Scanning Electron Microscopy - Fixing of Nano-particles on a Substrate with Adhesive Coating; K KUMAGAI, A KUROKAWA; National Institute of Advanced Industrial Science and Technology [853]

1711

Quantitative Measurement of Resolution as a Function of Defocus in Different Microscopy Modalities Using a Simplified Technique; AW Sanders, AE Curtin; NIST; R Skinner; University of Colorado [854]

1713

Improved Spatial Resolution of EDX/SEM for the Elemental Analysis of Nanoparticles; J Mielke, S Rades, E Ortel; BAM; T Salge; Core Research Laboratories, Natural History Museum;V-D Hodoroaba; BAM [855]

1715

What about Ionic Liquids as a ÓhotÓ Certified Reference Material Candidate to check Your EDS below 1 keV?; M Holzweber, V-D Hodoroaba, WE Unger; BAM Federal Institute for Materials Research and Testing [856]

A18 Core Facility Management

367

Designing Analytical Instrument Control Systems for Longevity and Maximum Upward Compatibility;EL Principe, V Filip; Tescan USA [184]

369

Now What am I Going to doÉ..This is Going to be a Large Data Set; CA Brantner; The George Washington University, GW Center for Nanofabrication and Imaging [185]

371

Networked Data Storage and Analysis for the Wisconsin Regional Materials Network; JJ McCarthy, PM Voyles; Wisconsin Materials Institute, University of Wisconsin - Madison; JA Last; Materials Science Center, University of Wisconsin; DR Bittner, IW Sadkovich; COMPUTER-AIDED ENGINEERING, University of Wisconsin [186]

373

Strategies for Managing Information Technology (IT) in Microscopy Facilities; JHJ Scott; National Institute of Standards and Technology [187]

525

Considerations for Physical Facility Design and Management of a State-of-the-Art Electron Microscopy and Analysis Laboratory; DE Huber, J Orsborn, H Colijn, C Begg; The Ohio State University; MJ Mills; The Ohio State Universtiy; D McComb; The Ohio State Univeristy; HL Fraser; The Ohio State University [263]

527

The Use of Online Tools in Microscopy and Microanalysis Core Facilities; MH Apperley, J Whiting, B Cribb; Australian Microscopy and Microanalysis Research Facility; C Anna; The University of Sydney [264]

529

Evolution of Data Acquisition, Storage and Analysis in a Multi-user Facility; NJ Zaluzec; Argonne National Laboratory [265]

175

Do-It-Yourself Database for Core Facility Management; R-C Hsia; University of Maryland Baltimore [88]

177

High Performance Remote Electron Microscopy; DE Huber, J Orsborn, F Scheltens, DW McComb, HL Fraser; The Ohio State University [89]

179

Lock-n-Sync for Secure Data Storage in Shared Electron Microscopy Facilities; K Li, S Li; FOM Networks, Inc [90]

Biological Science Symposia

B01 The R.P. Apkarian Memorial Symposium on Cryo-HRSEM

Ongoing Developments of the Cryo-SEM/STEM Technique; AC Robins; E A Fischione Instruments, Inc [24]

Imaging Macromolecules and Viruses in a Hydrated State Using a Field Emission Scanning Electron Microscope (FESEM); CA Ackerley, C Nielsen; Hospital for Sick Children; G Rodek; SPI Supplies [25]

Field Emission In-Lens Scanning Electron Microscopy of the Nuclear Envelope and Other Cellular Structures; MW Goldberg, J Fi_erov‡; Durham University; TD Allen; The Institute of Cancer Studies, University of Manchester [26]

375

Cryo-EM Methods for the Structural Analysis of Biomimetic Materials based on Peptides and Proteins;VP Conticello; Emory University [188]

377

Cryo-Planing Vs Freeze Fracture: Sample Preparation for Cryo-HRSEM; IY Chang, D Joester; Northwestern University [189]

379

Serial Block Face-Scanning Electron Microscopy of the Developing Rat Brain Exposed to Ketamine Reveals Changes in Mitochondrial Ultrastructure; T Eustaquio, C Wang, CK Dugard; U S Food and Drug Administration, Center for Devices and Radiological Health; F Liu, W Slikker, MG Paule,P Howard, AM Paredes; U S Food and Drug Administration, National Center for Toxicological Research et al [190]

381

Architecture of Pancreatic Islets Imaged by Serial Block Face SEM; RD Leapman, MA Aronova,A Shomorony, CR Pfeifer, JD Hoyne, GN Calco, BC Kuo, G Zhang; National Institute of Biomedical Imaging and Bioengineering, NIH et al [191]

383

Correlating Cryo-Electron Microscopy Methods for Structural Studies of Bacteria; ER Wright, H Yi, JV Taylor, RC Guerrero-Ferreira, CM Hampton; Emory University [192]

181

Characterization of a Crude Oil Emulsion by Cryo Electron Microscopies; AR Behzad, DH Anjum; King Abdullah University of Science and Technology [91]

183

Cryo-SEM and Raman Spectroscopy Study of the Involvement of Polyhydroxyalkanoates in Stress Response of Bacteria; V Krzyzanek, K Hrubanova, O Samek; Institute of Scientific Instruments of the ASCR; S Obruca, I Marova; Brno University of Technology; S Bernatova, M Siler, P Zemanek; Institute of Scientific Instruments of the ASCR [92]

185

Comparison of Sample Preparation Methods for Analysis of Mucus-Secreting Colon Cancer Cells by Scanning Electron Microscopy; X Wang, R Bleher, V Backman, GS Shekhawat, VP Dravid; Northwestern University [93]

187

Monitoring of Multilayered Bacterial Biofilm Morphology by Cryo-SEM for Raman Spectroscopy Measurements; K Hrubanova, S Bernatova, O Samek, M Sery, P Zemanek; Institute of Scientific Instruments of the ASCR; J Nebesarova; Biology center ASCR; F Ruzicka; Masaryk University, V Krzyzanek; Institute of Scientific Instruments of the ASCR [94]

189

Morphology of Organic Matrix of Human Enamel; VM Dusevich, JD McGuire, JP Gorski, Y Wang, MP Walker; UMKC School of Dentistry [95]

B02 To the Rhizosphere - and Beyond!

707

The use of Microcontact Printing of Thiols to Evaluate Attachment of Xylella fastidiosa Under Distinct Conditions of Calcium Availability; B Leite, L De La Fuente; JEOL USA Inc [354]

709

Rhizomes and Roots of Rare Arctic-Alpine Snowfield Plants on the Edges of Retreating Snowfields at Glacier National Park, Montana; ME Apple, MK Ricketts, LG Carlson; Montana Tech of the University of Montana [355]

711

Impact of Phenazine-1-carboxylic acid upon Biofilm Development in the Rhizosphere of Dryland and Irrigated Wheat; MK LeTourneau, MM Marshall; Washington State University; LS Thomashow; United States Department of Agriculture Agricultural Research Service; JB Harsh; Washington State University [356]

713

Imaging Ventral Cell Plate Formation in Guard Cells; X Qi, KU Torii; University of Washington [357]

1485

Further Differences in Biochemical Composition of Roots of Ni-Hyperaccumulating and Non- Hyperaccumulating Genotypes of Senecio coronatus; AD Barnabas, J Mesjasz-Przybylowicz; IThemba LABS, National Research Foundation; I Yousef; SESAME Synchrotron; P Dumas;SOLEIL Synchrotron; F Jamme; SOLEIL Synchrotron; PT Sechogela; iThemba LABS, National Research Foundation; WJ Przybylowicz; iThemba LABS, National Research Foundation [741]

1487

The Use of Fluorescent In Situ Hybridization in Bacterial Detection in Mycorrhizal Networks;W Chrisler, G Orr, A Dohnalkova, L Pa_a-Toli_; Pacific Northwest National Laboratory; G Stacey; University of Missouri; C Chun, M Sadowsky; University of Minnesota [742]

1489

A Multiscale Approach to Understanding Calcium Toxicity in Australian Proteaceae; PL Clode, P Hayes; University of Western Australia; N Honvault; Institut Polytechnique Lasalle Beauvais; H Lambers; University of Western Australia [743]

1491

Investigation of structure-function relationship of long-distance transport in plants: New imaging tools to answer old questions; M Knoblauch, D Mullendore, D Froelich, S Beecher, TJ Ross-Elliott,J Knoblauch; Washington State University [744]

861

The Importance of Location, Location, Location: As True for Rhodococcus fascians as for Real Estate; T Sawyer, M Putnam; Oregon State University [431]

863

Investigation into the Stabilization of Soil Organic Matter by Microbes; AC Dohnalkova; Pacific Northwest National Laboratory [432]

865

The Development and Structure of Cornalean Flowers and Fruits; T Sawyer, B Atkinson, G Rothwell, R Stockey; Oregon State University [433]

867

Motphology, Anatomy, and Development of Cunninghamia lanceolata (Cupressaceae) Pollen Cones;T Sawyer, B Atkinson, G Rothwell, R Stockey; Oregon State University [434]

869

Why Phragmites australis canes grown in Udono reed bed are the best materials for the reeds of Japanese wind instrument ÔhichirikiÕ ? -A structural and biomechanical study-; M Kawasaki,T Nobuchi; JEOL USA Inc; Y Nakafushi, M Nose; University of Toyama; M Shiojiri; Kyoto Institute of Technology [435]

871

Analysis of Plant Responses to Titanium Dioxide (TiO2) Nanoparticles; K Smith, K Ghoshroy, S Ghoshroy; University of South Carolina [436]

B04 Advances in Specimen Preparation and Correlative LM-EM (CLEM) of Biological Samples

385

Placing Molecules in a Cellular Context Using Light, Electron and X-ray Microscopy; LM Collinson; Francis Crick Institute [193]

387

Important steps in a Correlative Light Electron Microscopy Experiment; P Verkade; Wolfson Bioimaging Facility, Schools of Biochemistry and Physiology Pharmacology [194]

389

Correlating Microscopies From Differing Imaging Modalities: From Experimental Design to Alignment and Overlay of Images; DR Keene, SF Tufa; Shriners Hospital for Children [195]

531

Detection of GFP-labeled Proteins by Electron Microscopy; RG Parton, T Hall, N Ariotti; The University of Queensland [266]

533

Systematic characterization of fluorophore behavior in the presence of electron microscopy sample preparation reagents; H Li, DM Jorgens; Oregon Health Science University; L Wang, RM Strongin; Portland State University; JW Gray, SL Gibbs; Oregon Health Science University [267]

535

Studying Membrane Trafficking in Toxoplasma gondii Using Correlative Light and Electron Microscopy (CLEM); R-C Hsia, JE Strong; University of Maryland Baltimore; JD Romano, I Coppens; Johns Hopkins University [268]

537

New CLEM Method to Reveal Ultrastructural Reorganization in the Host Cell during Coronavirus Infection; G Kiss, C Bouchet-Marquis, L Pullan; FEI Company; D Keene; Shriners Hospital, Micro- Imaging Center; BW Neuman; University of Reading [269]

539

On the road to large volumes in LM and SEM: New tools for Array Tomography; I Wacker, W Spomer; Cryo EM, Centre for Advanced Materials, UniversitŠt Heidelberg; A Hofmann, U Gengenbach; Institute for Applied Computer Science, Karlsruhe Institute of Technology; M Thaler; Carl Zeiss Microscopy GmbH; L Ness, P Brey; Boeckeler Instruments, Inc, R Schršder; Cryo EM, CellNetworks, BioQuant, UniversitŠtsklinikum Heidelberg [270]

1115

Quick Freeze Substitution Processing of Biological Samples for Serial Block-face Scanning Electron Microscopy; RI Webb, RE Webb; University of Queensland [557]

1117

The Acquisition of large datasets with serial-block face scanning electron microscopy following light microscopy image acquisition: workflows from sample preparation to image acquisition; C Genoud, AA Wanner, RW Friedrich; Friedrich Miescher Institute for Biomedical Research [558]

1119

In Situ Tomography of Membrane Proteins Enabled by Advanced Cryo-FIB Sample Preparation and Phase Plate Imaging; M Schaffer, BD Engel, M Wehmer, T Gupta, E Sakata, T Laugks, J Mahamid, W Baumeister; Max Planck Institute of Biochemistry et al [559]

1121

Imaging of Vitrified Biological Specimens by Confocal Cryo-Fluorescence Microscopy and Cryo-FIB/ SEM Tomography; A Rigort, R Kirmse, V Doering; Carl Zeiss Microscopy; M Schwertner; Linkam Scientific Instruments Ltd; R Wolleschensky; Carl Zeiss Microscopy [560]

1271

Correlative Ultrastructural Analysis of Functionally Modulated Synapses Using Automatic Tape-Collecting Ultramicrotome - SEM Array Tomography; N Kamasawa, Y Sun, T Mikuni, D Guerrero-Given, R Yasuda; Max Planck Florida Institute for Neuroscience [635]

1273

Conjugate Immunofluorescence Ð SEM Array Tomography for Studying Synapses and Other Subcellular Structures in the Brain; KD Micheva; Stanford University School of Medicine [636]

1275

Protocol Development for 3D Reconstructions: Combining In Vivo Imaging, APEX2 and En Bloc Staining of Mouse Visual Cortex; J Buchanan, M Takeno, T Daigle, A Bleckert, D Bumbarger, A Bodor, D Brittain, N Maarico da Costa; Allen Institute for Brain Science et al [637]

1277

Advanced substrate holder and multi-axis manipulation tool for ultramicrotomy; W Spomer,A Hofmann; Institute for Applied Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany; I Wacker; Cryo EM, Centre for Advanced Materials, UniversitŠt Heidelberg, Heidelberg, Germany; L Ness, P Brey; RMC Boeckeler Instruments; RR Schršder; Cryo EM, CellNetworks, BioQuant, UniversitŠtsklinikum Heidelberg, Heidelberg, Germany; U Gengenbach; Institute for Applied Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany [638]

1493

Dynamics of Thrombus Formation in Mouse Testicular Surface Vein Visualized by Newly Devised ÒVascular MappingÓ Method for Live-CLEM Imaging in vivo; A Sawaguchi, S Nishimura; University of Miyazaki [745]

1495

Cryo-Planing of Frozen Hydrated Samples by Triple Ion Gun Milling (CryoTIGM); IY Chang, D Joester; Northwestern University [746]

1497

Correlative iPALM and Platinum Replica Electron Tomography to Highlight Single Molecules on Clathrin Endocytic Structures in 3D; KA Sochacki, G Shtengel, A Dickey; National Heart Lung and Blood Institute; H Hess; Janelia Farm Research Campus; J Taraska; National Heart Lung and Blood Institute [747]

1499

Correlative Electron and Fluorescence Microscopy of Magnetotactic Bacteria in Liquid: Toward In Vivo Imaging; TJ Woehl, S Kashyap, E Firlar; Ames Laboratory; T Perez-Gonzalez, D Faivre; Max Planck Institute of Colloids and Interfaces; D Trubitsyn, D Bazylinski; University of Nevada at Las Vegas,T Prozorov; Ames Laboratory [748]

1501

Indium-Tin-Oxide (ITO) as Stable and Effective Coating Material for Correlative Confocal and Immuno-Scanning Electron Microscopy Studies; A Falqui, S Rodighiero; King Abdullah University for Science and Technology (KAUST) - Biological and Environmental Sciences and Engineering Division; E Sogne; Fondazione Filarete; B Torre; King Abdullah University for Science and Technology (KAUST) - Physical Sciences and Engineering Division; R Ruffilli; CEMES/CNRS;M Francolini, C Cagnoli; Fondazione Filarete, E Di Fabrizio; King Abdullah University for Science and Technology (KAUST) - Physical Sciences and Engineering Division [749]

1503

Wide Area Observation of Fully Hydrophilic Tissue Achieved by Sliding It on the Dish of the Atmospheric Scanning Electron Microscope (ASEM); C Sato, M Sato, T Ebihara; Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST); H Nishiyama, M Suga; Advanced Technology Division, JEOL Ltd; N Memtily; Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) [750]

873

Correlative Light and Electron Microscopy Techniques: Challenges and Successes; ES Stempinski, XS Wu; NIH, NHLBI; CA Brantner; The George Washington University [437]

875

Characterizing Microtubule Organization in the Arabidopsis Thaliana Root Apical Meristem via Correlative Microscopy; K Celler, C Ambrose, Y Ruan, B Ross, G Wasteneys; University of British Columbia [438]

877

Cryogenic Sample Preparation Preserves Elemental Composition for Correlative Light and X-ray Fluorescence Microscopy; Q Jin, B Lai; Northwestern University; S chen; Argonne national Lab; T Paunesku; Northwestern University; SC Gleber, L Finney, D vine; argonne national lab,G Woloschak; northwestern university et al [439]

879

Methodology Development at NYULMC Microscopy Core - Correlative Light and Electron Microscopy Applications; F Liang, C Petzold, K Dancel-Manning, Y Deng, M Cammer; New York University Langone Medical Center [440]

881

Investigating Kinetochore Structural Dynamics during Mitosis by Employing Combinations of Several Microscopic Techniques; V Magidson, J He, JG Ault, CB OÕConnell, N Yang, H Sui, BF McEwen,A Khodjakov; Wadsworth Center, New York State Department of Health [441]

883

Cryo-Ultramicrotomy of Complex Molecular Fluids; M Gao; Liquid Crystal Institute, Kent State University [442]

885

Optimized and Improved Immunogold Labeling on Ultrathin Sections of Nervous Tissue Following High Pressure Freezing, Freeze Substitution and Low Temperature Embedding; W-P Li, S Viswanathan, Y Wang; Electron Microscopy Shared Resource, Howard Hughes Medical Institute/ Janelia Research Campus; LL Looger; Looger Laboratory, Howard Hughes Medical Institute/Janelia Research Campus; PK Rivlin; Electron Microscopy Shared Resource, Howard Hughes Medical Institute/Janelia Research Campus [443]

887

Agar Assisted Embedding: Visualizing Plant Pathogen Interactions at The Root Ð Soil Interface;J Kilcrease, J Hammond; United States Department of Agriculture/ORISE, Agricultural Research Service, U S National Arboretum Floral and Nursery Plants Research Unit [444]

889

The Atmospheric Scanning Electron Microscope (ASEM) observes the Cultured Fluorescent Neuron; T Ebihara, M Suga; National Institute of Industrial Science and Technology (AIST); H Nishiyama; JEOL Ltd; C Sato; National Institute of Industrial Science and Technology (AIST) [445]

891

Radiation Damage of Biological Specimen in Environmental Electron Microscopy; J Hermannsdšrfer, N de Jonge; Leibniz Institute for New Materials [446]

B05 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells

Heterogeneity in the pre-40S ribosomal subunit reveals two distinct regions of variation at functionally important structural elements; MC Johnson, H Ghalei; Florida State University; K Karbstein; The Scripps Research Institute; ME Stroupe; Florida State University [27]

Determining a Sub-nanometer Resolution Structure of a Helicobacter pylori VacA Toxin Oligomer; TM Pyburn, NJ Foegeding, TL Cover, MD Ohi; Vanderbilt University Medical Center [28]

Sar1 Forms Ordered Arrays That Can Facilitate Vesicle Scission in the COPII Pathway; H Hariri, A Noble, A Omran, S Stagg; Florida State University [29]

Regulation of cytoplasmic dynein by Lis1; K Toropova, S Zou; Harvard University; AJ Roberts,SL Reck-Peterson; Harvard Medical School; AE Leschziner; Department of Molecular and Cellular Biology [30]

541

Modeling Protein Structure in Macromolecular Assemblies at Near Atomic Resolutions; ML Baker, M Chen, PR Baldwin, SJ Ludtke, W Chiu; Baylor College of Medicine [271]

543

IP3R1 Ð Assessing Map Interpretability at Near Atomic Resolution; SJ Ludtke, G Fan, ML Baker, Z Wang; Baylor College of Medicine; MR Baker; University of Texas at Houston Medical School; SC Murray, W Chiu; Baylor College of Medicine, II Serysheva; University of Texas at Houston Medical School [272]

545

Exploiting the Susceptibility of HIV-1 Nucleocapsid Protein to Radiation Damage in Tomo- Bubblegram Imaging; J Fontana; Laboratory of Structural Biology Research, National Institute of Arthritis, Musculoskeletal and Skin Diseases, National Institutes of Health; KA Jurado, N Cheng; National Institute of Arthritis, Musculoskeletal and Skin Diseases, National Institutes of Health; A Engelman; Dana-Farber Cancer Institute; AC Steven; National Institute of Arthritis, Musculoskeletal and Skin Diseases, National Institutes of Health [273]

547

Affinity Cryo-Electron Microscopy Studies of Viral Particles Captured Directly From Cell Culture; C Zhang, F Vago, F Guo, Z Liu, G Yu; Purdue University; P Serwer; University of Texas Health Science Center; W Jiang; Purdue University [274]

1279

Complementary Approaches to Dissecting Mechanisms of Protein-mediated Membrane Fusion;KK Lee, L Gui, J Ebner, NK Garcia, M Guttman; University of Washington [639]

1281

Characterization of Outer Membrane Vesicle Release in Vibrio vulnificus; CM Hampton, RC Guerrero-Ferreira, ER Wright; Emory University [640]

1283

Molecular Characterization of Leading Edge Protrusions in the Absence of Arp2/3 Complex; KL Anderson, C Page; sanford Burnham Medical research Institute; P Suraneni, R Li; Stowers Institute for Medical Research; N Volkmann, D Hanein; SBMRI [641]

1285

_-Synuclein Amyloid Fibrils Formed of Two Protofibrils; AD Dearborn, N Cheng, JB Heymann; Laboratory of Structural Biology Research, National Institute of Arthritis and Musculoskeletal and Skin Diseases, National Institutes of Health; JS Wall; Department of Biology, Brookhaven National Laboratory; J Varkey, R Langen; Zilkha Neurogenetic Institute, University of Southern California; AC Steven; Laboratory of Structural Biology Research, National Institute of Arthritis and Musculoskeletal and Skin Diseases, National Institutes of Health [642]

1287

Bright-Field STEM Tomography of Blood Platelets in Thick Sections; RD Leapman, GN Calco,JD Hoyne, MM Aronova, BC Kuo, Q He; National Institute of Biomedical Imaging and Bioengineering, NIH; ID Pokrovskaya, LJ MacDonald; University of Arkansas for Medical Sciences et al [643]

893

The 3D-structure analysis of spermatids in the seminiferous epithelia by the serial block-face SEM method; Y Hasebe, T Haruta; JEOL Ltd; N Erdman; JEOL USA inc; M Suga, H Nishioka, T Suzuki; JEOL Ltd [447]

895

Crustacean cuticle: synthesis and remodeling of a dynamic extracellular matrix during molt cycle; J Strus, N Znidarsic; University of Ljubljana; A Blejec, M Tusek Znidaric; National Institute of Biology [448]

897

Structure and Assembly of the Bacillus anthracis Exosporium; CM Rodenburg, SA McPherson, CL Turnbough, T Dokland; University of Alabama at Birmingham [449]

899

Tomographic Analysis of EmaA Adhesin Glycosylation in Aggregatibacter actinomycetemcomitans; A Watson, H Naughton, M Radermacher, KP Mintz, T Ruiz; University of Vermont [450]

901

3D Reconstruction of Mitochondrial Complex I Analyzed After Biogenesis in the Absence of Assembly Factor NB7ML (NDUFAF2); CT Nolan, K Kmita; University of Vermont; V Zickemann; University of Frankfurt/Main; T Ruiz, M Radermacher; University of Vermont [451]

903

Three-Dimensional Visualization of Herpesvirus Envelopment at High Resolution Using STEM Tomography and Serial Sectioning on High Pressure Frozen/Freeze-Substituted Cells; M Schauflinger, C Villinger; Electron Microscopy Core Facility, University of Missouri; J von Einem; Institute of Virology, University Medical Center Ulm; P Walther; Central Facility for Electron Microscopy, Ulm University [452]

905

Ebola virus reconstruction using compressed sensing cryo-electron tomography; A AlAfeef, WP Cockshott; University of Glasgow; IM MacLaren; University of Glasgow [453]

907

Whole-Cell Tomography Using a Conventional Scanning Electron Microscope; T Okumura, M Shoji, A Hisada; Hitachi, Ltd , Central Research Laboratory; Y Ominami; Hitachi High-Technologies Corporation; T Ushiki, M Nakajima; Graduate School of Medical and Dental Sciences, Niigata University; T Ohshima; Hitachi, Ltd , Central Research Laboratory [454]

909

3D Imaging of the Early Embryonic Chicken Heart After Altered Blood Flow with Focused Ion Beam Scanning Electron Microscopy; M Midgett, CS L—pez, S Rugonyi; Biomedical Engineering, Oregon Health Science University [455]

911

Boosting Contrast of Cryo-EM Images Without a Phase Plate; MS Spilman, H Guo, BE Bammes, L Jin, R Bilhorn; Direct Electron, LP [456]

913

The best of both world, how a ÒChristmas treeÓ TEM can please biologist and material scientists; E Hanssen, MP Watts; The University of Melbourne; ER Smith; The Royal Melbourne; P Gosavi, PA Gleeson, JW Moreau; The University of Melbourne [457]

915

Adhesion Pili from Enterotoxigenic Escherichia coli Share Similar Biophysical Properties Despite Their Different Assembly Pathways; N Mortezaei, CR Epler; UmeŒ University; PP Shao; Princeton Univ;M Shirdel, B Singh, BE Uhlin; UmeŒ University; SJ Savarino; Naval Med Research Center, M Andersson; UmeŒ University et al [458]

B06 Deep Tissue Imaging and Light Sheet Microscopy

715

Scanless lattice light sheet microscopy; B-C Chen; Research Center for Applied Science, Academia Sinica [358]

717

Rapid High-resolution Brain Mapping with CLARITY Optimized Light Sheet Microscopy (COLM);R Tomer, K Deisseroth; Howard Hughes Medical Institute [359]

719

Three-color two-photon three-axis digital scanned light-sheet microscopy (3c2p3a-DSLM); L Chen, W Zong; Institute of Molecule Medicine, Peking University; A Wang; State Key Laboratory of Advanced Optical Communication System and Networks, School of Electronics Engineering and Computer Science, Peking University [360]

863

ÔRuptureÕ type thrombopoiesis from bone megakaryocyte is regulated by IL-1alpha: visualization by two photon microscope and software analysis; S Nishimura, A Sawaguchi; Jichi Med Univ, and the Univ of Tokyo [857]

1719

In vivo imaging and software analysis revealed the contribution of endothelial damage to thrombus development processes; S Nishimura, A Sawaguchi; Jichi Med Univ and the Univ of Tokyo [858]

1721

In vivo Three Photon Imaging of Neuronal Activities from Hippocampus in Intact Mouse Brain; T Wang, D Ouzounov, NG Horton, JC Cruz Hern‡ndez, D Feng, N Nishimura; Cornell University [859]

1723

Airy Beams for Light-sheet Microscopy; J Nylk, Z Yang, M Preciado, M Mazilu; University of St Andrews; T Vettenburg; Univ Carlos III de Madrid; C Coll-Llado, DE Ferrier; University of St Andrews, T Cizmar; University of Dundee et al [860]

B07 Microscopy, Microanalysis and Image Cytometry in the Pharmaceutical Sciences

Microscopy, Microbiology and Regulations of Paper and Paperboard Utilized in Pharmaceutical Packaging; JH Woodward; Buckman [31]

Microscopic Techniques for Sterility Assurance Support in the Medical Products Industry; JR Mantei, MA Murphy, L Stojanovic, L Wahlen, M Pasmore, J DiOrio; Baxter Healthcare [32]

Electron Microscopy as an Emerging Analytical Tool for Characterizing Biopharmaceuticals;B Carragher, A Schneemann, JJ Sung, SK Mulligan, JA Speir, K On, J Quispe, CS Potter; NanoImaging Services [33]

391

Simultaneously Measuring Red Blood Cell Flux in vivo for a Large Number of Retinal Capillary Vessels Using Optical Coherence Tomography; RK Wang, Z Zhi; University of Washington [196]

393

Efficient and Documented Preparation of Pharmaceutical Particles for Correlative Microscopy Analyses using mPrepTM Capsule Processing; SL Goodman; Microscopy Innovations LLC [197]

395

Characterization of Glass Delamination by TEM: Results from a New Sample Preparation Technique;EF Schumacher, HM Talesky, KJ Diebold; McCrone Associates, Inc [198]

397

Prospects for High Resolution Analytical Electron Microscopy of Organic Crystalline Particles; J Cattle, M SÕari; University of Leeds; N Wilkinson; Gatan UK; N Hondow, A Brown, R Brydson; University of Leeds [199]

549

Using Microscopy to Qualitatively and Quantitatively Assess Crystalline Content in Amorphous Active Pharmaceutical Ingredients and Drug Product; A Vogt, J Neilly; AbbVie Inc [275]

551

Advantages of Using Low Voltage for Elemental Mapping by Energy Dispersive X-Ray Spectroscopy in Pharmaceutical Systems; JP Neilly, JR Roth; AbbVie, Inc [276]

553

Streamlining Identification of Compounds in Pharmaceutical Drug Products; T Nylese, J Rafaelsen, M Bolorizadeh; EDAX, A Division of Ametek, Materials Analysis Division; D Edwards; JEOL [277]

191

Analysis of Glass Vial Interior Surfaces in Parenteral Drug Stability Studies; RA Carlton; GlaxoSmithKline [96]

193

ESEM Study of Magnetic Bubbles Ð Surface Morphological and Fluidic Aspects; Z Barkay, Y Gao; Wolfson Applied Materials Research Center, Tel-Aviv University; C Xu; Division of Bioengineering, Nanyang Technological University; C-D Ohl; Division of Physics and Applied Physics, Nanyang Technological University [97]

195

Measurement of radiation-induced autophagic flux in human brain cancer cells; LS Yasui, M Johnson, H Savage, A Baker, E Baker, C Burns; Northern Illinois University [98]

B08 Dynamic Fluorescence Microscopy

Imaging the dynamic release and capture of vesicle membrane proteins in mammalian cells;JW Taraska, KA Sochacki, BT Larson; NHLBI, NIH [34]

Focal Adhesion Kinase Anchoring Kinetics and Regulatory Interactions Quantified by Total Internal Reflection Fluorescence Microscopy; T Zak, AM Samarel, SL Robia; Loyola University Chicago [35]

The Biogenesis of Endophilin B1 Containing Vesicles; Y Chen, J li, JD Mueller; University of Minnesota; B Barylko, JP Albanesi; UT Southwestern Medical Center [36]

197

Sparse Feature Selection Identifies H2A.Z as a Novel, Pattern-Specific Biomarker for Asymmetrically Self-Renewing Distributed Stem Cells; YH Huh, M Noh; Korea Basic Science Institute; FR Burden; CSIRO Manufacturing Flagship; JC Chen; The Senator Paul D Wellstone Muscular Dystrophy Cooperative Research Center; DA Winkler; CSIRO Manufacturing Flagship; JL Sherley; Asymmetrex; H-S Kweon; Korea Basic Science Institute [99]

199

Novel Regulated Secretion Mechanism For a Nerve-Secreted Cell Signaling Molecule in C. elegans; RD Schultz, K Beifuss, S Bageshwar; Texas AM University Health Science Center; EA Ellis; Texas AM University; TL Gumienny; Texas WomanÕs University [100]

201

Mechanics of Interdigitating Morphogenesis in Pavement Cells; A Jafari Bidhendi, B Altartouri, A Geitmann; Institut de Recherche en Biologie VŽgŽtale, University of Montreal [101]

B09 Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants, and Animals

Ebola Virus Hemorrhagic Fever; CS Goldsmith; Centers for Disease Control and Prevention [37]

Microwave Assisted Rapid Diagnosis of Plant Virus Diseases by TEM; B Zechmann, G Zellnig; Baylor University [38]

Immunoelectron Microscopy Reveals Varied Surface Expression of Potential Vaccine Targets of Chlamydia trachomatis; R-C Hsia, JM Sotiris, PM Bavoil; University of Maryland Baltimore [39]

EM Detection of Viruses in Organ Transplant Patients; SE Miller, DN Howell; Duke University [40]

399

Quick Observation of Tissues in Solution by Atmospheric Scanning Electron Microscope (ASEM); N Memtily, M Sato; Graduate School of Comprehensive Human Sciences, University of Tsukuba; T Okada; Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST); T Ebihara; Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST); K Mio; Graduate School of ComprehensiveHuman Sciences, University of Tsukuba; M Suga, N Hiditoshi; Advanced Technology Division, JEOL Ltd., C Sato; Graduate School of Comprehensive Human Sciences, University of Tsukuba [200]

401

Elemental Analysis of RatÕs Femoral Neck with Experimental Diabetes by means of Scanning Electron Microscopy; XS Ram’rez-G—mez, E Rodr’guez-Miranda; Universidad de Guanajuato Campus Celaya; R Vargas-Bernal, G Herrera-PŽrez; Instituto Tecnol—gico Superior de Irapuato [201]

403

MacCallumÕs Triangle Ð Is It Rheumatic? Is It Traumatic? Or Is It Both?; S Siew; Michigan State University [202]

405

Nanoscale 3D Refractive Indices Mapping on Native Cheek Cells by Axial Scanning Transmission Electron Tomography; Y Li, J Wu, R Bleher, V Dravid, V Backman; Northwestern University [203]

407

Is Electron Microscopy Relevant Anymore in Diagnosis of Disease?; WT Ginning; University of Toledo [204]

555

Mitochondrial fission arrest phenotype in brain tissue of patients and animal models of familial AlzheimerÕs Disease revealed with 3D EM; E Trushina, TA Christensen, L Zhang, S Trushin,JL Salisbury; Mayo Clinic [278]

557

A Tunable Approach to Visualize BRCA1 Assemblies in Hereditary Breast Cancer; CE Winton, BL Gilmore, AC Demmert, Z Sheng, DF Kelly; Virginia Tech Carilion School of Medicine and Research Institute [279]

559

mApoE-Functionalized Nanoliposomes Delivering Doxorubicin and Ultrasmall Superparamagnetic Iron Oxide to Glioblastoma Cells Characterized by TEM and Confocal Microscopy; S Rodighiero, M Gregori; Fondazione Filarete; M Francolini, E Vezzoli, M Tamborini; University of Milan;M Masserini; University of Milano-Bicocca; M Matteoli; Humanitas Clinical and Research Center, L Passoni; University of Milan [280]

561

Type VII Collagen: From Discovery of the Anchoring Fibril Protein to Clinical Trials Ameliorating the Human Blistering Disease Epidermolysis Bullosa; DR Keene, SF Tufa; Shriners Hospital for Children [281]

203

Loss of STARD7 Expression Compromises Epithelial Barrier Integrity in Airway of the Shh+/-Cre/ STARD7-/- Mice; C-L Na, L Yang, TE Weaver; Cincinnati ChildrenÕs Hospital Med Ctr [102]

205

FIB/SEM Tomography of Wound Biofilm; B Deng, KG Barki, S Ghatak, S Roy, DM McComb, CK Sen; The Ohio State University [103]

207

Visualization of Plaque/Vessel Interfaces using FIB-SEM; G Wetzel, SM Lessner; Clemson University [104]

209

Enhanced Large-Area TEM Analysis on Mitochondrial Alteration in Brain Neuronal Cell of ParkinsonÕs Disease Model Mouse Using Montage Function Installed in JEM 1400-Plus System;H-J Kim, AR Je, MJ Kim, J-K Hyun; Korea Basic Science Institute; H-G Kim; Dankook University; YH Huh, H-S Kweon; Korea Basic Science Institute [105]

211

Renal Biopsy Diagnosis of IGA Nephropathy in Chin Refugees living in the United States; N Rush, MP Goheen; Indiana University School of Medicine/Pathology; CL Phillips; Indiana University School of Medicine/Pathology [106]

213

Visualizing the Distribution and Stoichiometry of Growth Factor Receptors in Intact Cells in Liquid Phase with Correlative Fluorescence and Scanning Transmission Electron Microscopy; DB Peckys, J Hermannsdšrfer, V Tinnemann; Leibniz Institute for New Materials; U Korf; German Cancer Research Center; N de Jonge; Leibniz Institute for New Materials [107]

215

Centrin Phosphorylation and Localization Dynamics During The Centriole Cycle; TA Christensen, JL Salisbury; Mayo Clinic [108]

217

Immunofluorescence Microscopy As a Critical Confirmation Technique in Cell Cycle-Related Proteomics Studies; SL Faitar; DÕYouville College [109]

219

Using Optical Tweezers to Quantify the Interaction Force of Dengue Virus with Host Cellular Receptors; B Tsai; Institute of Biophotonics, National Yang-Ming University [110]

221

Application of FRET microscopy for visualizing the uncoating process of a single Dengue virus in living cells; L-W Chu, Y-H Lin; National Yang-Ming University; C-H Lee; Research Center for Applied Sciences, Academia Sinica; Y-H Ping; National Yang-Ming University [111]

223

The Observation of Saccharomyces cerevisiae Ultrastructure Changes under Proline Limitation;H Chen, X Liang; Microscopy Core Facility, Center of Biotechnology, University of Nebraska Lincoln; D Becker; University of Nebraska Lincoln [112]

225

The Wisconsin Electron Microscopy Diagnostic Proficiency Program; CA Radi, SE Miller; Wisconsin Veterinary Diagnostic Laboratory; C Goldsmith; Centers for Disease Control and Prevention;K Toohey-Kurth; Wisconsin Veterinary Diagnostic Laboratory [113]

227

Wheat Leaf Rust Fungus: RIMAPS Analysis to Detect Germ-tube Orientation Pattern; LM Setten, N Lendoiro, EA Favret; Instituto Nacional de Tecnolog’a Agropecuaria (INTA) [114]

229

Ice Contamination Issues in the Visualization of the Ultrastructure of the Nuclear Envelope by Freeze-Fracture Technique; N Vaskovicova, V Krzyzanek, A Patak; Institute of Scientific Instruments of the ASCR [115]

231

Imaging of Polyethylene Glycol Layers on Nanoparticles; SR Anderson, MC Smith; Electron Microscopy Laboratory, Cancer Research Technology Program, Leidos Biomedical Research, Inc, Frederick National Laboratory for Cancer Research; JD Clogston, AK Patri, SE McNeil; Nanotechnology Characterization Laboratory, Cancer Research Technology Program, Leidos Biomedical Research, Inc, Frederick National Laboratory for Cancer Research; U Baxa; ElectronMicroscopy Laboratory, Cancer Research Technology Program, Leidos Biomedical Research, Inc, Frederick National Laboratory for Cancer Research [116]

233

Treatment of Influenza-Induced Acute Lung Injury with Iron Oxide Nanoparticles using an Ischemic- Reperfusion Model; K Chew, A Waldron, C Queenan, R Pergolizzi; Bergen County Academies;T Hoffmann; Englewood Hospital and Medical Center [117]

235

Structure of Microtubule-Based Microtentacles; AN Killilea, R Csencsits; Lawrence Berkeley National Laboratory; S Kenny, K Xu; University of California Berkeley; KH Downing; Lawrence Berkeley National Laboratory [118]

237

Bartonella spp. biofilm identified in patients; ME Ericson, M Weber-Sanders; University of Minnesota; M Neves da SIlva; State University of Campinas (UNICAMP) Medical Sciences School; VB Pelegati,CL Cesar; National Institute of Science and Technology on Photonics Applied to Cell Biology (INFABIC); G Vieira-Damiani, PE Velho; State University of Campinas (UNICAMP) Medical Sciences School [119]

B10 Multiscale Biological Imaging: From Micro to Macro - Animal to Clinical Models

In-situ Topographical and Elemental Characterisation of Biological Soft Matter; CL Collins, C McCarthy; Oxford Instruments NanoAnalysis [41]

Biomineralization at Interfaces Revealed with 4D Electron and Atom Probe Tomographies; X Wang, B Langelier; McMaster University; A Palmquist; University of Gothenburg; K Grandfield; McMaster University [42]

Magnetotactic Bacteria and Honey Bees: Model Systems for Characterising an Iron Oxide Mediated Magnetoreceptor; J Shaw, A Boyd; Centre for Microscopy, Characterisation and Analysis, The University of Western Australia; M House; Biomagnetics Group, The University of Western Australia; M Saunders; Centre for Microscopy, Characterisation and Analysis, The University of Western Australia; F Mathes; School of Earth and Environment, The University of Western Australia; B Baer; Centre for Integrative Bee Research (CIBER), The University of Western Australia [43]

Development of a Bioinspired Stroma Model to Study the Role of Collagen Topology in Pancreatic Ductal Adenocarcinoma; C Drifka, A Loeffler, K Eliceiri, J Kao; University of Wisconsin-Madison [44]

From Image Tiles to Web-Based Interactive Measurements in One Stop; A Vandecreme, T Blattner, M Majurski, P Bajcsy, K Scott, JHJ Scott; NIST [45]

409

Imaging the alphavirus exit pathway; MG Martinez, E-L Snapp; Department of Cell Biology, Albert Einstein College of Medicine; GS Perumal, FP Macaluso; Analytical Imaging Facility, Albert Einstein College of Medicine; M Kielian; Department of Cell Biology, Albert Einstein College of Medicine [205]

411

Localization and Number of Au Nanoparticles in Optically Indexed Cells Using FIB Tomography;AW Sanders, KM Jeerage, AE Curtin, AN Chiaramonti; NIST [206]

413

Swept Confocally-Aligned Planar Excitation (SCAPE) Microscopy for High Speed Volumetric Imaging in Behaving Animals; EM Hillman; Columbia University [207]

415

Correlative large volume imaging across scales; RR Schroeder, H Blank; UniversitŠtsklinikum Heidelberg, UniversitŠt Heidelberg; A Schertel, M Thaler, A Orchowski; Carl Zeiss Microscopy GmbH; I Wacker; UniversitŠt Heidelberg [208]

917

X-ray Tomographic Microscopy of Drosophila Brain Network and Skeletonized Model Building in the Three-Dimensional Image; R Mizutani, R Saiga; Tokai University; K Uesugi, A Takeuchi, Y Terada, Y Suzuki; Japan Synchrotron Radiation Research Institute (JASRI/SPring-8) [459]

919

Three-Dimensional Neuronal Structure of Human Cerebral Cortex Determined by Synchrotron- Radiation Microtomography; R Saiga, S Takekoshi; Tokai University; C Inomoto, N Nakamura,A Tsuboi, M Osawa; Tokai University School of Medicine; M Arai, K Oshima; Tokyo Metropolitan Institute of Medical Science et al [460]

921

A Reverse Engineering Approach for Imaging Spinal Cord Architecture Ð Large Area High-Resolution SEM Imaging; CA Brantner, M Rasche; The George Washington University, GW Center for Nanofabrication and Imaging; KE Burcham, J Klingfus, JE Sanabia; International Applications Center, Raith America, Inc; CE Korman, A Popratiloff; The George Washington University, GW Center for Nanofabrication and Imaging [461]

923

Simplified Biological Tissue Analysis with Combination of Atmospheric Scanning Electron Microscope and Light Microscope; A Hisada, Y Ominami; Hitachi Central Research Laboratory [462]

925

3D X-ray Microscopy: A New High Resolution Tomographic Technology for Biological Specimens;L Lavery, A Merkle; Carl Zeiss X-ray Microscopy [463]

B11 Specimen Preparation for Biological Sciences

721

Easier and Safer Biological Staining: High Contrast UranyLess Staining of TEM Grids using mPrep/g Capsules; N Benmeradi, B Payre; Delta Microscopies; SL Goodman; Microscopy Innovations LLC [361]

723

HSV-1 Scaffolding Protein Bubbles Readily in the Absence or Presence of DNA, Allowing its Localization in Immature and Mature Nucleocapsids; DC Winkler, WW Newcomb, A Aksyuk, W Wu, N Cheng, AC Steven; National Institutes of Health [362]

725

Improving the Reliability, Ease, and Efficiency of Section Staining in a Diagnostic Laboratory with the mPrep/g System for TEM Grid Processing; CA Radi; Wisconsin Veterinary Diagnostic Laboratory [363]

727

Capabilities of a New Sample Preparation Method for Probing Polymer Penetration and Localization into Wood Without Embedding; B Dorvel, P Boopalachandran; Dow Chemical Company- Analytical Sciences; A Bowling; Dow Agrosciences- Advanced Technology Development; X Chen, S King; Dow Chemical Company- Industrials RD [364]

927

Cryo Transmission Electron Microscopy of Three Research-Grade Liposomal Formulations of Doxorubicin; W Monroe, A Paredes; U S Food and Drug Administration, National Center for Toxicological Research; P Sisco; U S Food and Drug Administration, Office of Regulatory Affairs; K Ahlschwede; U S Food and Drug Administration, National Center for Toxicological Research; S Linder; U S Food and Drug Administration, Office of Regulatory Affairs [464]

929

Using a White Light Confocal Profiler for Ancient Diet Reconstruction; ARJ Remy, C Schmidt; University of Indianapolis; R DÕAnastasio; Museo Universitario Universitˆ [465]

931

Testate Amoebae Diversity, from the Atlantic Forest Aquatic and Edaphic Environments, Collected Within the Rio de Janeiro State, Brazil; ID da Silva-Neto, B Leite; Dep de Zoologia, Inst de Biologia [466]

933

Inactivation of Bacterial Endospores in an Artificial Tissue for Electron Microscopy Analysis;RM Hannah, BM Leroux, RK Pope; NBACC [467]

935

Aspergillus fumigatus Biofilms: a Comparison of Processing Techniques for Scanning Electron Microscopy of Fungal Mycelium and Extracellular Matrix; L-M Joubert, JA Ferreira, DA Stevens, L Cegelski; Stanford University [468]

937

Sure, We Can Image That! An Attempt to Image the Edge of a Growing Bacterial Colony; GD Martens, K Hodgson; University of British Columbia [469]

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Zen-like simplicity is hard work, and other secrets I learned from Peter Swann; OL Krivanek; Nion Co [46]

Peter SwannÕs Key Role in the Past, Present and Future of Dynamic In-situ TEM; ED Boyes, PL Gai; University of York, UK; A Howie; University of Cambridge [47]

In-Situ Tensile Deformation of Additively Manufactured Ti 6Al 4V; JR Porter, M Velez; UES Inc; R Wheeler; UES Inc [48]

Computer-Controlled In Situ Gas Reactions via a MEMS-based Closed-Cell System; LF Allard, WC Bigelow, Z Wu, SH Overbury, KA Unocic, M Chi; Oak Ridge National Laboratory;WB Carpenter, FS Walden; Protochips, Inc et al [49]

Approaching the ÒLab in the GapÓ: First Results from a Versatile In-situ (S)TEM; F Bšrrnert,H MŸller; Speziallabor Triebenberg; M Linck; CEOS GmbH; A Horst; IFW Dresden; AI Kirkland; University of Oxford; B BŸchner; IFW Dresden; H Lichte; Speziallabor Triebenberg [50]

417

Latest developments for in situ measurements of gasÐsolid interactions; R Sharma, PA Lin; 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology; M Picher;University of Maryland; Z Hussaini; Center for Nanoscale Science and Technology, National Institute of Standards and Technology [209]

419

Electron Microscopy Advances for Studies of Catalysis at Atomic-Resolution and at Ambient Pressure Levels; CF Elkj¾r, SB Vendelbo; Haldor Tops¿e A/S; P Dona; FEI Company; R van Rijn; Leiden Probe Microscopy BV; F Creemer; DIMES-ECTM, Delft University of Technology; I Chorkendorff; Technical University of Denmark; P Kooyman; ChemE, Delft University of Technology, S Helveg; Haldor Tops¿e A/S et al [210]

421

Atomic-scale Dynamics in Catalysts for Sulfur Chemistry; LP Hansen, F Cavalca, CC Appel, M Brorson, P Beato, J Hyldtoft, KA Christensen, S Helveg; Haldor Topsoe A/S [211]

423

In Situ Observation of Ag Nanoparticle Catalyzed Oxidation of Carbon Nanotubes in an Aberration- corrected Environmental TEM; Y Yue, D Yuchi, J Xu; Arizona State University; L Guo; Beihang University; J Liu; Arizona State University [212]

425

In situ environmental transmission electron microscopy of ice nucleation; LM Gordon, L Kovarik; Environmental Molecular Spectroscopy Lab [213]

563

Characterizing working catalysts with correlated electron and photon probes; EA Stach, Y Li; Brookhaven National Laboratory; S Zhao; University of Illinois at Urbana-Champaign; A Gamalski, K Chen-Weigart, R Tappero; Brookhaven National Laboratory; J Chen; Columbia University [282]

565

In situ Analytical TEM of Ilmenite Reduction in Hydrogen; A Janssen, E Prestat, M Smith, SJ Haigh, G Burke; School of Materials, The University of Manchester [283]

567

Resolving Surface Structures of Catalytic Ru Nanoparticles during Catalysis; BK Miller, PA Crozier; Arizona State University [284]

569

In situ Environmental TEM and DFT Studies on the Highly Stable AuIr Bimetallic Catalyst; CW Han, P Majumdar, EE Marinero; School of Materials Engineering, Purdue University; A Aguilar-Tapia,R Zanella; Centro de Ciencias Aplicadas y Desarrollo Technologico, Universidad Nacional Autonoma de Mexico; J Greeley; School of Chemical Engineering, Purdue University; V Ortalan; School of Materials Engineering, Purdue University [285]

571

Dynamic structural changes in a single catalyst particle during single walled carbon nanotube growth; PA Lin, Z Hussaini; National Institute of Standards and Technology; JC Burgos Beltran, JL Gomez Ballesteros, PB Balbuena; Texas AM University; R Sharma; National Institute of Standards and Technology [286]

729

Toward Quantitative In Situ TEM of Materials and Devices in Gases and Liquids at the Atomic Scale;S Takeda, H Yoshida, K Soma; Institute of Scientific and Industrial Research, Osaka University [365]

731

Recent Progress with AC E(S)TEM and Application to Single Atom Catalysis; PL Gai, L Lari; University of York, UK; MR Ward; University of York; T Martin, RW Mitchell, D Lloyd, A LaGrow, ED Boyes; University of York et al [366]

733

XEDS Performance of Atmospheric Membrane Holders in the AEM; NJ Zaluzec; Argonne National Laboratory [367]

735

Opportunities and Challenges of In-Situ Characterization of Photocatalysts in Environmental TEM;L Zhang, Q Liu, BK Miller, PA Crozier; Arizona State University [368]

1123

Growth of Transition Metal Oxides in Solution under Liquid Cell Electron Microscopy and Electron Beam Effects; W-I Liang, H Zheng; Materials Sciences Division, Lawrence Berkeley National Laboratory [561]

1125

The Stability of Gold Nanoparticles in Liquid Scanning Transmission Electron Microscopy Experiments Studied under Varied Conditions; A Verch, J Hermannsdšrfer, N de Jonge; INM Ð Leibniz Institute for New Materials [562]

1127

Automated and Shaped-Controlled Liquid STEM Nanolithography; RR Unocic, AR Lupini, AY Borisevich, SV Kalinin, S Jesse; Oak Ridge National Laboratory [563]

1129

Manipulating Size and Shape of Silica Nanoparticles with Liquid-Phase Transmission Electron Microscopy; J Zecevic, KP de Jong; Utrecht University; N de Jonge; INM - Leibniz Institute for New Materials [564]

1289

Using graphene liquid cells for high-resolution chemical analysis of nano-particle reactions; RF Klie, C Wang; University of Illinois - Chicago; T Shokuhfar; Michigan Technical University [644]

1291

Liquid In Situ Analytical Electron Microscopy: Examining SCC Precursor Events for Type 304 Stainless Steel in H2O; S Schilling, A Janssen, XL Zhong; The University of Manchester; NJ Zaluzec; Argonne National Laboratory; MG Burke; The University of Manchester [645]

1293

Design of a Heated Liquid Cell for in-situ Transmission Electron Microscopy; AJ Leenheer, KL Jungjohann, CT Harris; Sandia National Laboratories [646]

1295

In situ Liquid TEM Study for Degradation Mechanisms of Fuel Cell Catalysts during Potential Cycling Test; S Nagashima, K Yoshida, T Hiroyama, K Liu, Y Kang; Japan Fine Ceramics Center; T Ikai,H Kato, T Nagami; Toyota Motor Corporation et al [647]

1297

In situ TEM imaging of Nanoparticles interacting with Glioblastoma Stem Cells; ES Pohlmann, K Patel, S Gao; Virginia Tech Carilion School of Medicine and Research Institute; MJ Dukes; Protochips, Inc; Z Sheng, DF Kelly; Virginia Tech Carilion School of Medicine and Research Institute [648]

1505

Building and Imaging Silicide Nanostructures in Nanowires; F Panciera, Y-C Chou; University of Cambridge; MC Reuter; IBM T J Watson Research Center; D Zakharov, EA Stach; Center forFunctional Nanomaterials; K M¿lhave; DTU-Nanotech; S Hofmann; Department of Engineering, FM Ross; IBM T J Watson Research Center et al [751]

1507

Understanding nanomaterial synthesis with in situ transmission electron microscopy; BM Hudak,Y-J Chang, L Yu; University of Kentucky; G Li; Anhui University; DN Edwards, ME Park, BS Guiton; University of Kentucky [752]

1509

In Situ TEM for Quantitative Electrochemistry of Energy Systems; ME Holtz, Y Yu, J Rivera, HD Abruna, DA Muller; Cornell University [753]

1511

Effects of non-contact electric fields on consolidation behavior of agglomerated yttria-stablized zirconia;H Majidi, K van Benthem; University of California, Davis [754]

1513

In-Situ Analytical Transmission Electron Microscopy Study of Electrochemical Lithiation of a Sulfur Ð Carbon Nanotube Composite Cathode; J Ticey, V Oleshko, Y Zhu, C Wang, J Cumings; University of Maryland - College Park [755]

1911

Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements; WA Hubbard, ER White, A Kerelsky, G Jasmin, J Lodico; UCLA; MH Mecklenburg; University of Southern California; BC Regan; UCLA [954]

1913

Dynamic rate mechanism of V2O5 coated SnO2 nanowires for lithium ion batteries studied by in situ TEM; L Wang, Z Xu; Electron Microscopy Center - Center for Nanoscale Materials, ArgonneNational Laboratory, Argonne, IL 60439; X Bai; Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190,China; J Wen,D Miller; Electron Microscopy Center - Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 [955]

1915

Elastic Properties of GaN Nanowires: Revealing the influence of planar defects on YoungÕs modulus at nanoscale; S Dai, J Zhao; Department of Materials Science and Engineering, University of Michigan; Beijing National Center for Electron Microscopy, School of Materials Science and Engineering, Tsinghua University;; X Wang, Z Shan; Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano) Hysitron Applied Research Center in China (HARCC), XiÕan Jiaotong University; J Zhu; Beijing National Center for Electron Microscopy, School of Materials Science and Engineering, Tsinghua University [956]

1917

Quantification of Electrochemical Nanoscale Processes in Lithium Batteries by Operando ec-(S)TEM; BL Mehdi, J Qian; Joint Center for Energy Storage Research, Fundamental and Computational Science Directorate, PNNL; E Nasybulin; Joint Center for Energy Storage Research, Energyand Environmental Directorate, PNNL; C Park; Department of Industrial and Manufacturing Engineering, Florida State University; DA Welch; Department of Chemical Engineering and Materials Science,University of California, Davis; H Mehta; Joint Center for Energy Storage Research, Environmental Molecular Sciences Laboratory, PNNL; ND Browning; Joint Center for Energy Storage Research, Fundamental and Computational Science Directorate, PNNL [957]

239

Low Angle Annular Dark Field Scanning Transmission Electron Microscopy is Sensitive to Oxidation State in CeO2 Nanoparticles; AC Johnston-Peck, JP Winterstein; National Institute of Standards and Technology; JS DuChene, BC Sweeny, WD Wei; University of Florida; R Sharma; National Institute of Standards and Technology; EA Stach; Brookhaven National Laboratory, AA Herzing; National Institute of Standards and Technology et al [120]

241

Reduction of Electron Scattering Image Blur for Atmospheric Scanning Electron Microscopy;Y Ominami, K Nakahira, S Kawanishi, S Ito; Hitachi High-Technologies Corporation [121]

243

In-situ ETEM Observation of Propene Epoxidation by Gold Nanoparticles Supported on Anatase TiO2; T Kawasaki, H Murase, K Yoshida; Japan Fine Ceramics Center; T Tanji; Ecotopia Science Institute, Nagoya University [122]

245

In situ observation of degradation of electrocatalysts in humidified air atmosphere using a cold FE 60-300 kV ETEM; M Shirai, H Matsumoto, I Nagaoki, T Yaguchi; Hitachi High-Technologies Corporation; T Shimizu, T Kamino; Japan Automobile Research Institute [123]

247

XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature; E Prestat, M Smith, A Janssen, TJ Slater; University of Manchester; PH Camargo; Universidade deS‹o Paulo; MA Kulzick; BP Corporate Research Center; MG Burke, SJ Haigh; University of Manchester et al [124]

249

A Controllable Environmental-Cell (EC) for Wet Environmental TEM (WETEM); R Kagawa,Y Kuwamura; Tokyo University of Agriculture and Technology; W-A Chiou; NISP Lab, NanoCenter, University of Maryland; H Minoda; Tokyo University of Agriculture and Technology [125]

251

Exploring the Carbon Deposition Mechanism on Ni/Gd Ceria Catalysts; EL Lawrence, PA Crozier; Arizona State University [126]

253

In-situ TEM study of the Initial Oxidation Behavior of Zry-4; W Harlow, ML Taheri; Drexel University [127]

255

Transmission Electron Microscopy of Crystallization of Lysozyme in a Solution; T Yamazaki, M Shirai; Institute of Low Temperature Science, Hokkaido University; H Matsumoto; Hitachi High-Technologies Corporation; Y Kimura; Institute of Low Temperature Science, Hokkaido University [128]

257

Effect of Electron Beam on Nanoparticle Dynamics in Solution during in situ TEM Observation; J Lu, Z Aabdin, U Anand, U Mirsaidov; National University of Singapore [129]

259

Role of Fluid-mediated Interactions in Guiding Nanoparticle Assembly; UM Mirsaidov, G Lin; National University of Singapore; D Loh; National University of Singapore; J Lu, Z Aabdin; National University of Singapore [130]

261

The Two Dimensional Nanoplate Dynamics Revealed by in situ Liquid Cell TEM; X Tian,UM Mirsaidov; Berkeley Education Alliance for Research in Singapore; H Zheng; Sciences Division, Lawrence Berkeley National Lab [131]

263

Dynamic studies of solution-based reactions using operando TEM; K He, Y Yuan; Shandong University/Michigan Technological University; Y-P Lu; Shandong University; T Shokuhfar, R Shahbazian-Yassar; Michigan Technological University [132]

265

Precision In Situ Control of Local Liquid Chemistry via Electron Irradiation; C Wang, T Shokuhfar, R Klie; University of Illinois at Chicago [133]

267

Probing Nanoparticle Dynamics in 200 nm Thick Liquid Layers at Millisecond Time Resolution; SW Chee, D Loh, U Mirsaidov; Center of BioImaging Sciences, Department of Biological Sciences, National University of Singapore; P Matsudaira; Department of Biological Sciences, National University of Singapore [134]

269

Bonding Pathways of Gold Nanocrystals in Solution; Z Aabdin, J Lu, U Anand, ND Loh, U Mirsaidov; National University of Singapore [135]

271

Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed By Transmission Electron Microscopy; JL Hart, M Arredondo, M Taheri; Drexel University [136]

273

In Situ Analysis of the Fracture Behavior of Nanocrystalline Copper Using Precession-Assisted Crystal Orientation Mapping; PF Rottmann, K Hemker; Johns Hopkins University [137]

939

Atomic-level fabrication of crystalline oxides in STEM; Q He, S Jesse, AR Lupini, DN Leonard; Oak Ridge National Laboratory; MP Oxley, OS Ovchinnikov; Vanderbilt University; R Unocic, A Tselev; Oak Ridge National Laboratory et al [470]

941

TEM In situ Plastic Deformation of Silver Nanowires; JE Ortega Aguilar, D Alducin, A Ponce Pedraza; University of Texas at San Antonio [471]

943

In Situ Visualization of Metallurgical Reactions in Nanoscale Cu/Sn Diffusion Couples; Q Yin, F Gao; St Univ of New York at Binghamton; Z Gu; University of Massachusetts Lowell; E Stach; Brookhaven National Lab; G Zhou; St Univ of New York at Binghamton [472]

945

Visualization of gold nanoparticle self-assembly kinetics; TJ Woehl, T Prozorov; Ames Laboratory [473]

947

Thermally driven cation exchange at solid state between Cu2Se and CdSe nanocrystals: an In-situ TEM study; A Falqui, A Casu, A Genovese; King Abdullah University of Science and Technology;L Manna; Istituto Italiano di Tecnologia; P Longo; Gatan, Inc; GA Botton; McMaster University; S Lazar; FEI Electron Optics, M UpadhyayKahaly; King Abdullah University of Science and Technology et al [474]

949

Improved Environmental Control and Experimental Repeatability with New In-Situ Devices; T Moser, T Shokuhfar; Michigan Technological University; J Evans; Pacific Northwest National Laboratory Environmental Molecular Sciences Laboratory [475]

951

In situ STEM Investigation of Shape-Controlled Synthesis of Au-Pd Core-Shell Nanocube; N Bhattarai, T Prozorov; Ames Laboratory US DOE [476]

953

In-situ STEM Observation of Strain Field Movement in a LiMn2O4 Nanowire Battery; S Lee,Y Oshima; Tokyo Institute of Technology; E Hosono, H Zhou; National Institute of AdvancedIndustrial Science and Technology; R Kanno, K Takayanagi; Tokyo Institute of Technology [477]

955

On the weak forces on nanoparticles; D Alducin, M JosŽ-Yacam‡n, A Ponce; University of Texas at San Antonio [478]

957

In situ observation of annealing effects in Ga(NAsP) multi quantum well structures; R Straubinger, A Beyer, L Duschek, T Wegele, W Stolz, K Volz; Philipps-UniversitŠt Marburg [479]

959

When is Si3N4 not Si3N4? When it is a Low Stress SiNx Membrane Window; NJ Zaluzec; Argonne National Laboratory [480]

961

Modifications to Membrane Heater Holders to Enable XEDS in the AEM; NJ Zaluzec, A Janssen; Argonne National Laboratory; MG Burke; University of Manchester; D Gardiner; Protochips Inc; S Walden; Protochips Inc [481]

963

Annular Bright-Field Electron Microscopy Tracking Solid-State Chemical Reaction; P Gao, R Ishikawa, E Tochigi, A Kumamoto, N Shibata, Y Ikuhara; The University of Tokyo [482]

965

Ex Situ and In Situ (S)TEM of Iron Oxide Nanoparticles Synthesized by Decomposition of an Organometallic Precursor; R Hufschmid, H Arami, KM Krishnan; University of Washington; ND Browning; Pacific Northwest National Laboratory [483]

967

Diffraction-Ring Contraction as a Method for In Situ Thermometry in TEM; DR Cremons, DJ Flannigan; University of Minnesota [484]

969

Studying Perovskite-based Solar Cells with Correlative In-Situ Microscopy; JA Aguiar, S Wozny; National Renewable Energy Laboratory; W Zhou; University of New Orleans; H Guthrey,AG Norman, H Mountinho, CS Jiang, J Berry; National Renewable Energy Laboratory et al [485]

971

Quantitative Analysis of Nucleation and Growth Behavior from in situ Liquid Cell Studies; AV Ievlev, S Jesse, SV Kalinin; Institute for Functional Imaging of Materials, Oak Ridge National Laboratory; TJ Cochell; Chemical and Materials Engineering, University of Kentucky; RR Unocic; Institute for Functional Imaging of Materials, Oak Ridge National Laboratory [486]

973

Imaging of Nano-Structures at High Temperatures and Pressures above One Atmosphere Using a Windowed TEM Gas Cell Specimen Holder; J Murphy, NJ Salmon, DH Alsem; Hummingbird Scientific [487]

P02 Materials Problem Solving with Aberration-Corrected EM

1131

Materials Science Applications of Aberration Corrected TEM and/or STEM; G Van Tendeloo, AM Abakumov, S Bals, S Van Aert, J Verbeeck; EMAT, University of Antwerp [565]

1133

50pm Aberration Corrected In-situ Electron Microscopy----How Ion behaves in Lithium Ion Nanowire Battery; K Takayanagi, S Lee; Tokyo Institute of Technology; Y Oshima; Japan Advanced Institute of Science and Technology; Y Tanishiro; Tokyo Institute of Technology [566]

1135

Depth-Resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration- Corrected TEM; J Yamasaki, A Hirata, Y Hirotsu, K Hirahara; Osaka University; N Tanaka; Nagoya University [567]

1137

Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS;DJ Baek, D Lu; Cornell University; Y Hikita, HY Hwang; Stanford University; LF Kourkoutis; Cornell University [568]

1299

Atomic study of Fe3O4/SrTiO3 Interface; D Gilks, D Kepaptsoglou, L Lari; University of York; QR Ramasse; SuperSTEM; K Matsuzaki, T Susaki; Tokyo Institute of Technology; K McKenna, VK Lazarov; University of York [649]

1301

Interfacial Structure in Epitaxial Perovskite Oxides on (001) Ge Crystal; X Shen, KA Majlan; Brookhaven National Laboratory; J Ngai; University of Texas at Arlington; D Wu; Nanjing University; D Su; Brookhaven National Laboratory [650]

1303

Imaging Local Polarization and Domain Boundaries in Multiferroic (LuFeO3)m/(LuFe2O4)n Superlattices; ME Holtz, JA Mundy; Cornell University; JA Moyer; University of Illinois at Urbana- Champaign; R Hovden, CJ Fennie; Cornell University; P Schiffer; University of Illinois Urbana- Champaign; DG Schlom, DA Muller; Cornell University et al [651]

1305

Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM; H Wu, T Aoki; Arizona State University; A Posadas, A Demkov; The University of Texas at Austin; D Smith; Arizona State University [652]

1307

Atomic-scale Mechanisms of Defect-Induced Retention Failure in Ferroelectric Materials; L Li, L Xie, Y Zhang, J Jokisaari; Department of Materials Science and Engineering, University of Michigan; H Christen; Materials Science and Technology Division, Oak Ridge National Laboratory; X Pan; Department of Chemical Engineering and Materials Science, University of California - Irvine [653]

1309

Characterization of two-dimensional electron gas at the _-Al_O_/SrTiO_ interface; S Lu, K Kormondy; School of Engineering for Matter, Transport and Energy, Arizona State University; T Ngo, J Ekerdt, A Demkov; University of Texas at Austin; M McCartney, D Smith; Arizona State University [654]

1515

Materials development aided by atomic-resolution electron microscopy; R Holmestad, S Wenner; Department of Physics, Norwegian University of Science and Technology; M Nord; Department of Physics, Norwegian University of Science and Technology; PE Vullum, CD Marioara; SINTEF Materials and Chemistry [756]

1517

Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope; Y Zheng, R Williams, H Fraser; The Ohio State University [757]

1519

Direct Observation of Chemical Pressure in Intermetallic Alloys by Scanning Transmission Electron Microscopy; A Oni, X Sang; North Carolina State University; A Kumar, SB Sinnott; University of Florida; JM LeBeau; North Carolina State University [758]

1521

Physical and Practical Challenges in Analytical Electron Tomography of Aluminum Alloys; A Orthacker, G Haberfehlner; Graz Centre for Electron Microscopy, Graz, Austria; J TŠndl,C Poletti; Institute of Materials Science and Welding, Graz University of Technology, Graz, Austria;LJ Allen; School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia; G Kothleitner; Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Graz [759]

1523

Implementation of Atomic Resolution Electron Tomography of a Needle Sample; MC Scott, W Theis, R Xu, L Wu, C-C Chen; University of California, Los Angeles; C Ophus, P Ercius; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, J Miao; University of California, Los Angeles [760]

1919

Resolving the Atomic Structure of Materials Containing Light Elements by Annular-Bright-Field Electron Microscopy; L Gu, D Xiao; Institute of Physics, Chinese Academy of Sciences/Beijing National Laboratory for Condensed, Matter Physics; Y Ikuhara; Institute of Engineering Innovation, The University of Tokyo [958]

1921

Large-Collection-Angle BF STEM Imaging of Compound Semiconductors; T Aoki, MR McCartney, DJ Smith; Arizona State University [959]

1923

Atomic Scale Structure and Bonding Configurations in Monocrystalline Al1-xBxPSi3 Alloys Grown Lattice Matched on Si(001) Platforms; P Sims, T Aoki, J MenŽndez, J Kouvetakis; Arizona State University [960]

1925

Local chemical and deformation profiles in InAs/AlSb multilayer structures for quantum cascade lasers; B Warot-Fonrose, J Nicola•, M Vallet, C Gatel; CEMES-CNRS; R Teissier, A Baranov; IES; C Magen; LMA-INA, A Ponchet; CEMES-CNRS [961]

1927

STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures; H Yang,JG Lozano; University of Oxford; TJ Pennycook; University of Vienna; L Jones, PB Hirsch; University of Oxford; DN; Department of Materials, Parks Rd [962]

2247

Atomic Resolution Imaging and Spectroscopy of Pt-Alloy Electrocatalytic Nanoparticles; S Prabhudev, M Bugnet, CN Chiang, M Chatzidakis; McMaster University; G-Z Zhu; Shanghai Jiao Tong University; GA Botton; McMaster University [1122]

2249

Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films; P Lu, E Romero, J Ihlefeld, W Pan; Sandia National Laboratories; W Zhang, H Wang; Texas A M University; Q Jia; Los Alamos National Laboratory [1123]

2251

Inversion of STEM EELS Data to Obtain Site Occupancy and Near Edge Structure; MP Oxley,MJ Neish; Vanderbilt University; LJ Allen; University of Melbourne; MF Chisholm; ORNL [1124]

2253

Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images; R Hovden, Y Jiang; Cornell University; HL Xin; Brookhaven National Laboratory; LF Kourkoutis; Cornell

2255

Aberration-corrected STEM of Four-atom Rhenium Nanowires Confined within Carbon Nanotubes; F Zhang, P Ren, X Pan, X Bao; Dalian Institute of Chemical Physics; J Liu; Arizona State University, [1126]

2257

Collective Atomic Motion at a 90¡ <110> Tilt Grain Boundary in Gold; ML Bowers, A Gautam,C Ophus; Molecular Foundry, National Center for Electron Microscopy, LBNL; F Lancon; Laboratoire de Simulation Atomistique (L_Sim), SP2M, INAC, CEA; U Dahmen; Molecular Foundry, National Center for Electron Microscopy, LBNL [1127]

2409

Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data; AB Yankovich, J Feng; University of Wisconsin - Madison; A Kvit; University of Wisconsin - Madison; T Slater, S Haigh; University of Manchester;D Morgan, PM Voyles; University of Wisconsin - Madison [1203]

2411

Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors; L Jones, H Yang, KE MacArthur; University of Oxford; H Ryll; PNSensor GmbH; M Simson, H Soltau; PNDetector GmbH; Y Kondo; JEOL Ltd, PD Nellist; University of Oxford et al [1204]

2413

Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3; AV Kvit, J Feng; University of Wisconsin-Madison; AB Yankovich, D Morgan, PM Voyles; UW- Madison [1205]

2415

Maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials; Y Zhu, H Katz-Boon, C Zheng, MJ Walsh; Monash University; C Dwyer; Peter Gruenberg Institute, Forschungszentrum Juelich; LN Bourgeois; Monash University; R Withers; Australian National University, J Etheridge; Monash University [1206]

2417

Direct Observation of Interfacial Au atoms Using STEM Depth Sectioning; W Gao,S Sivaramakrishnan, J Wen, J-M Zuo; University of Illinois at Urbana-Champaign [1207]

1725

Effect of Interfacial Structure on Gold-assisted Growth of Oxides; G-Z Zhu, X Li, F Liu, W Zhou; Shanghai Jiao Tong University [861]

1727

Quantifying and Correlating the Composition and Conductivity of Grain Boundaries in Ca-doped CeO2 Electrolytes, an AC-STEM EELS Study; WJ Bowman, CA Hernandez, K McGuinness,PA Crozier; School for the Engineering of Matter, Transport and Energy, Arizona State University [862]

1729

Aberration-corrected STEM of Highly Loaded Pt1/NiO Single-atom Catalysts: Structural and Catalytic Stability; S Duan, R Wang, J Liu; Arizona State University [863]

1731

Aberration-Corrected STEM and Tomography of Pd_Pt Nanoparticles: Core_Shell Cubic and Core_ Frame Concave Structures; N Lu, J Wang; The University of Texas at Dallas; S Xie; Georgia Institute of Technology and Emory University; J Brink, K McIlwrath; JEOL USA, Inc; Y Xia; Georgia Institute of Technology; MJ Kim; The University of Texas at Dallas [864]

1733

Aberration-corrected STEM Study of Atomically Dispersed Pt1/FeOx Catalyst with High Loading of Pt; B Qiao, A Wang; Arizona State University; T Zhang; Chinese Academy of Sciences; JJ Liu; Arizona State University [865]

1735

Multislice HAADF STEM Image Simulation of Complex Oxidation Catalyst ÒM1Ó; DA Blom; University of South Carolina [866]

1737

Structural and Optical Characterization of Biosynthesized CdS Quantum Dots; L Lu, Z Yang, VF Berard, CJ Kiely, S McIntosh, BW Berger; Lehigh University [867]

1739

Aberration-corrected STEM of Cross-sectional View of Core-shell Nanowires Prepared by Ultramicrotomy; J Xu, J Liu; Arizona State University [868]

1741

Microscopy Guided Design of Radial p-n Junction in Single TiO2 Nanotubes; M Chi, M Yoon, P Paranthaman; Oak Ridge National Laboratory [869]

1743

Direct TEM/STEM Observation and Analysis of Bismuth Segregation to Grain Boundary Dislocation Cores in Bismuth Embrittled Copper Bicrystals; CA Wade, M Watanabe; Lehigh University [870]

1745

Fe-25Mn-3Al-3Si TWIP-TRIP Steel Deformed at High Strain-Rates; JT Benzing, J Wittig; Vanderbilt University; M Mills, T Smith; The Ohio State University (Center for Electron Microscopy and Analysis); G Daehn; The Ohio State University; J Bentley; Microscopy and Microanalytical Sciences; D Raabe; Max-Planck-Institut fŸr Eisenforschung, C Ophus; National Center for Electron Microscopy (Molecular Foundry, Lawrence Berkeley National Laboratory) et al [871]

1747

Tracking the Evolution of in-situ Radiochemistry with Transmission Electron Microscopy; JA Aguiar, L Wolfsberg, W Taylor, BP Uberuaga, B Scott, C Stanek; Los Alamos National Laboratory [872]

2067

Manganese Segregation at Antiphase Boundaries Connecting ZrO2 Pillars in ZrO2-La2/3Sr1/3MnO3 Pillar-matrix Structures; D Zhou, W Sigle, M Kelsch; Max Planck Institute for Intelligent Systems,Stuttgart Center for Electron Microscopy, Stuttgart, Germany; H-U Habermeier; Max Planck Institute for Solid State Research, Stuttgart, Germany; PA van Aken; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy, Stuttgart, Germany [1032]

2069

Atomic-resolution EELS study of Titanium dopant effects of Ca3Co4O9 thin film; X Hu, P Phillips, S Ogut, R Klie; University of Illinois at Chicago [1033]

2071

Atomic-scale quantitative and analytical STEM investigation of Sr-d-doped La2CuO4 multilayers; Y Wang, W Sigle, D Zhou; Max Planck Institute for Intelligent Systems; F Baiutti, G Logvenov, G Gregori, G Cristiani, J Maier; Max Planck Institute for Solid State Research et al [1034]

2073

Electronic Structure of New Line Defect in Strained NdTiO3 on SrTiO3; JS Jeong, M Topsakal, P Xu, RM Wentzcovitch, B Jalan, KA Mkhoyan;University of Minnesota [1035]

2075

Characterization of Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping; WW Zhao, M Gribelyuk, JD Russell; GLOBALFOUNDRIES [1036]

2077

Investigation of Co-doped BaTiO3 by atomic-resolution EELS; D Zhang, T Aoki; Arizona State University; P Ponath, A Posadas, A Demkov; University of Texas at Austin; D Smith; Arizona State

2079

Study on the atomic and electronic structure in CrN (VN, TiN) films using CS-corrected TEM; Z Zhang, G Dehm; Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, [1038]

2081

Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM; A Beyer, N Knaub, K Volz; Philipps-UniversitŠt Marburg [1039]

2083

Determination of local chemistry composition of low-dimensional semiconductor nanostructures through the use of High-Resolution HAADF images; D Hernandez-Maldonado, M Herrera; SuperSTEM/University of Oxford; AR Lupini; Oak Ridge National Laboratory; SI Molina; Universidad de Cadiz [1040]

2085

TEM Characterization of Balled Milled CIS and CIGS Nanoparticles; II Santana Garcia, C Kisielowski, HA Calderon; ESFM-IPN [1041]

2087

Atomic scale study of LomerÐCottrell and Hirth lock dislocations in CdTe; T Paulauskas, C Buurma, B Stafford; University of Illinois at Chicago; C Sun; University of Dallas at Texas; M Chan; ArgonneNational Laboratory; M Kim; University of Texas at Dallas; R Klie; University of Illinois at Chicago [1042]

2089

Atomic resolution studies of the (K, Na)NbO3/SrTiO3 interface using aberration corrected STEM; C Li, G Yang, L Wang, Z Wang; XiÕan Jiaotong University [1043]

P03 Advances in Microanalysis of Earth and Planetary Materials

1139

The Use of Auger Spectroscopy for the Elemental Analysis of Presolar Silicate Grains; C Floss; Washington University in St Louis [569]

1141

Practical aspects of the electron probe analysis of boron in silicates using a LSM device with large 2d;GB Morgan; University of Oklahoma [570]

1143

CHILI, a Nanobeam Secondary Neutral Mass Spectrometer with Extraordinary Spatial Resolution, Sensitivity, and Selectivity: First Results; AM Davis, T Stephan, R Trappitsch; The University of Chicago; MJ Pellin; Argonne National Laboratory; D Rost; The University of Chicago; MR Savina; Argonne National Laboratory; N Dauphas; The University of Chicago [571]

1145

Electron Microprobe Analysis of Complex Y-REE-Ta-Nb-Ti Minerals from the Petaca Pegmatite District, New Mexico; MN Spilde, WP Moats; University of New Mexico; S Dubyk, B Salem; Private individual [572]

1311

Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomography; BP Gorman, DR Diercks; Colorado School of Mines; S Parman, R Cooper; Brown University [655]

1313

Correlative Transmission Electron Microscopy and Atom-Probe Tomography of an Iron Meteorite; SS Rout, PR Heck; Robert A Pritzker Center for Meteoritics and Polar Studies, The Field Museum of Natural History; D Isheim; Northwestern University; T Stephan, AM Davis; The University of Chicago; DN Seidman; Northwestern University [656]

1315

Atomic Scale Investigation of Orthopyroxene and Olivine Grain Boundaries by Atom Probe Tomography; M Bachhav, Y Dong; University of Michigan; P Skemer; Washington University Washington University; E Marquis; University of Michigan [657]

1317

Quantitative microstructural analysis of geological materials by atom probe: understanding the mechano-chemical behaviour of zircon; JM Cairney, A La Fontaine, P Trimby, L Yang; The University of Sydney; S Piazolo; Macquarie University [658]

1319

Electron Probe Microanalysis and Microscopy: Focused Electron Beam Techniques and Applications in Characterization of Mineral Inclusions in Diamond; D Zhao; University of Texas at Austin [659]

1525

The Oxidation State of Nanophase Fe Particles Produced by Space Weathering as Revealed Through Aberration-Corrected Transmission Electron Microscopy; MS Thompson, TJ Zega; University of Arizona [761]

1527

Aberration-Corrected STEM-EELS Measurements in Fe-bearing Silicate Glasses; KD Burgess,BT De Gregorio; Naval Research Laboratory; MD Dyar; Mount Holyoke College; MC McCanta; Tufts University; RM Stroud; Naval Research Laboratory [762]

1529

Ti Valence States in Al,Ti-rich Pyroxenes from Comet Particles: Anchoring Ti ELNES Spectra with Vanadium Thin-films; D Joswiak, D Brownlee; University of Washington [763]

1531

Insights Into Regolith Evolution from TEM Studies of Space Weathering of Itokawa Particles;EL Berger, LP Keller; GeoControl Systems - Jacobs JETS - NASA Johnson Space Center [764]

1533

Novel Microtomy Methods For Small, Hard And Precious Extraterrestrial And Terrestrial Rocky Materials; D Brpownlee, D Joswiak; University of Washington [765]

2259

Electron Holography Unveiled Formation Process of Extraterrestrial Magnetite; Y Kimura,K Yamamoto; Institute of low temperature science, Hokkaido University; T Sato; Hitachi High- Technologies Corporation [1128]

2261

Focused Ion Beam Nanotomography of Chondritic Meteorites: Closing the Mesoscale Length Gap in Paleomagnetic Studies; JF Einsle, RR Fu; Department of Earth Sciences, University of Cambridge; BP Weiss; Department of Earth, Atmospheric and Planetary Sciences, MIT; T Kasama; Center forElectron Nanoscopy, Technical University of Denmark; P î Conbhu’, W Williams; School of Geosciences, University of Edinburgh; PA Midgley; Department of Materials Science and Metallurgy, University of Cambridge, RJ Harrison; Department of Earth Sciences, University of Cambridge et al [1129]

2263

Correlating Mineralogy and Amino Acid Contents of Milligram-Scale Murchison Carbonaceous Chondrite Samples; AS Burton, EL Berger; NASA Johnson Space Center; DR Locke; HX5/JacobsJETS contract/NASA JSC; JE Elsila, DP Glavin, JP Dworkin; NASA Goddard Space Flight Center [1130]

2265

Nanoscale Variation in Carbonaceous Matter from Primitive Meteorites Revealed by Aberration- Corrected STEM; BT De Gregorio, RM Stroud; Nova Research, Inc; KD Burgess; Naval Research Laboratory; CM Alexander; Carnegie Institution of Washington [1131]

2091

Solving the Controversy of EarthÕs Oldest Fossils using Electron Microscopy; D Wacey, M Saunders; University of Western Australia; C Kong; University of New South Wales; M Brasier; Oxford University [1044]

2093

Standards-Based Quantitative EDS Mapping; SM Seddio; Thermo Fisher Scientific [1045]

2095

Survey for Fe-Si in Apollo 16 Regolith Sample 61501,22; P Gopon, J Fournelle, M Spicuzza, JW Valley; University of Wisconsin [1046]

2097

Sintering of Ice Spheres under Difference Thermal Conditions; X Wang, I Baker; Thayer School of Engineering, Dartmouth College [1047]

2099

Characterization of Individual Particles in Air Quality Program with Sem-Eds; R Ramirez-Leal, M Valle-Martinez, ME Cruz-Campas; Sonora State University [1048]

2101

Towards Automated Segmentation Methods for 3D Tomography Studies of the Morphology of Carbon Nanoglobules in Chondritic Meteorites; K Yakal-Kremski, N Bassim; Naval Research Laboratory;K Scott; National Institute of Standards and Technology; R Stroud; Naval Research Laboratory [1049]

2103

Combined Major and Trace Element Characterization of Tourmaline: Using EPMA to Address Elemental Fractionation by Laser Ablation; JW Singer, M Lupulescu; Rennselaer Polytechnic Institute [1050]

2105

The First Solar System Solids as Revealed Through Slice-and-View Imaging; T Zega; University of Arizona [1051]

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

101

Growth Morphology and Defects in 2D Heterostructures and Interfaces; JA Robinson, S Eichfeld, Y-C Lin; The Pennsylvania State University; N Lu, MJ Kim; The University of Texas at Dallas [51]

103

Characterization of Layer Thickness and Orientation of 2D WSe2/MoS2 Heterostructures using EDS, EBSD and AFM; C Lang, M Hiscock; Oxford Instruments Nanoanalysis; R Sundaram; Oxford Instruments Plasma Technology; J Moffat; Asylum Research [52]

105

Interfaces in Two-Dimensional Heterostructures of Transition Metal Dichalcogenides; W Zhou, J Lin; Oak Ridge National Laboratory; Y Gong; Rice University; X Wang, BK Tay; Nanyang Technological University; J Lou; Rice University; Z Lou; Nanyang Technological University, S Pantelides; Vanderbilt University et al [53]

107

Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices; SJ Haigh, AP Rooney; School of Materials, University of Manchester; E Prestat; University of Manchester [54]

109

Measuring the Atomic and Electronic Structure of Black Phosphorus with STEM; RJ Wu, M Topsakal, MC Robbins, N Haratipour, JS Jeong, RM Wentzcovitch, SJ Koester, A Mkhoyan; University of Minnesota [55]

427

STEM and EELS investigation on black phosphorus at atomic resolution; G Nicotra, AM Mio;CNR-IMM; A Cupolillo; Universitˆ della Calabria; J Hu, J Wei, Z Mao; Tulane University; A Poitano; Universitˆ della Calabria, C Spinella; CNR-IMM et al [214]

429

Atomic resolved Phase Map of MoS2 Monolayer Sheet retrieved by Spherical Aberration Corrected Transport of Intensity Equation; X Zhang, Y Oshima; Tokyo institute of Technology [215]

431

Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs); J Wang, N Lu, JP Oviedo, X Peng, G Lian, MJ Kim; The University of Texas at Dallas [216]

433

Defect dynamics in 2D transition metal dichalcogenide monolayers; J Lin, Y Zhang; Vanderbilt University/ Oak Ridge National Lab; S Pantelides; Vanderbilt University; W Zhou; Oak Ridge National Lab [217]

435

Individual Mo Dopant Atoms in WS2 Monolayers: Atomic Structure and Induced Strain; A Azizi, B Jiang, Z Lin, A Laura El’as, M Terrones, N Alem; The Pennsylvania State University [218]

573

Detailed Atomic Structure of Defects in 2D Materials: From Graphene to Transition Metal Dichalcogenides; JH Warner; University of Oxford [287]

575

Multimodal Characterization of Graphene; S Freitag; Carl Zeiss Microscopy GmbH [288]

577

Nano-Sculpting of Suspended CVD Graphene with Helium and Neon Ion Beams; DA Cullen, J Swett, AJ Rondinone; Oak Ridge National Laboratory; P Bedworth, S Heise, S Sinton; Lockheed Martin Space Systems Company [289]

737

Functionalization of Graphene; M Chisholm, J Lee; Oak Ridge National Laboratory; J Guo; Taiyuan University of Technology; Z Yang; Chinese Academy of Sciences, Institute of Metal Research;SJ Pennycook; National University of Singapore; ST Pantelides; Vanderbilt University; W Zhou; Oak Ridge National Laboratory [369]

739

Dynamics of Triangular Hole Growth in Monolayer Hexagonal Boron Nitride under Electron Irradiation; GH Ryu, HJ Park, Z Lee; Ulsan National Institute of Science and Technology [370]

741

Cu Atoms Reknit the Graphene Structures; E Kano, A Hashimoto; Graduate School of Pure and Applied Sciences, University of Tsukuba; M Takeguchi; National Institute for Materials Science [371]

743

VEELS Study of Boron and Nitrogen Doped Single Layer Graphene; FS Hage, D Kepaptsoglou; SuperSTEM Laboratory; T Hardcastle, C Seabourne, A Scott, R Brydson; University of Leeds; U Bangert; University of Limerick, Q Ramasse; SuperSTEM Laboratory et al [372]

745

Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis;KB Borisenko, CS Allen, JH Warner, AI Kirkland; University of Oxford [373]

1147

New avenues for electron and scanned probe studies of 2D materials; JC Meyer, J Kotakoski, G Argentero, C Mangler, B Bayer, C Kramberger-Kaplan, S Hummel, A Mittelberger; University of Vienna et al [573]

1149

Towards the Electron Spectroscopy Graphene Fingerprint; LF Lampert, A Barnum, J Jiao; Portland State University [574]

1151

STEM and EELS study of the Graphene/Bi2Se3 Interface; D Kepaptsoglou, D Gilks; SuperSTEM;P Galindo; Universidad de C‡diz; Q Ramasse; SuperSTEM; L Lari; University of York; M Weinert;University of Wisconsin Milwaukee; G Nicotra; Institute for microelectronics and microsystems, CNR Catania, V Lazarov; University of York et al [575]

1153

Core Structure of Dissociated Dislocations in Bi2Te3 Nanowires; DL Medlin, KJ Erickson, SJ Limmer, WG Yelton, MP Siegal; Sandia National Laboratories [576]

1155

Fabrication and Simultaneous Electrical Measurement of Graphene Nanoribbon Devices Inside a S/TEM; JA Rodr’guez-Manzo, ZJ Qi, M Puster, A Balan, ATC Johnson, M Drndi_; University of Pennsylvania [577]

1321

Controlling beam-sample interaction in low dimensional materials by low dose rate electron microscopy; C Kisielowski, S Helveg; The Molecular Foundry and Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory; L Hansen; Haldor Tops¿e A/S; P Specht; UC Berkeley [660]

1323

Structural Rearrangement of 2D Zeolite Nanosheets under Electron Beam; P Kumar, ML Odlyzko, N Rangnekar, M Tsapatsis, AK Mkhoyan; University of Minnesota [661]

1325

Imaging of Quantum Materials; F von Cube, E Kalfon-Cohen; School of Engineering and Applied Sciences, Harvard University; Y Ivry; Quantum Nanostructures and Nanofabrication, Massachusetts Institute of Technology (MIT); A Knšller; Institut fŸr Materialwissenschaften, Lehrstuhl 3, UniversitŠt Stuttgart; T Webb, D Huang; Department of Physics, Harvard University; T Brower- Thomas; College of Engineering Architecture and Computer Science, Howard University, DC Bell; School of Engineering and Applied Sciences, Harvard University et al [662]

1327

Quantitative High Resolution Chemical Analysis of the (PbxSn1-xSe)1+_TiSe2 Intergrowth System; J Ditto, D Merrill, DC Johnson; University of Oregon; DL Medlin; Sandia National Laboratories [663]

1329

Long Range Order and Atomic Connectivity in Two-Dimensional Square PbSe Nanocrystal Superlattices; BH Savitzky, R Hovden, K Whitham, T Hanrath, LF Kourkoutis; Cornell University [664]

975

Structural analysis of carbon nanotubes of various diameters grown by spray pyrolysis using Raman spectroscopy; EG Ordo–ez, M Roman; Universidad Autonoma de ciudad juarez; A Aguilar, F Espinosa; Centro de investigaciones en materiales avanzados [488]

977

Cu/MWCNT Interfaces in Room Temperature Aged Nanocomposites Revealed by HRTEM and EELS;ME Mendoza, G Sol—rzano; National Institute of Metrology, Quality and Technology; T Aoki, DJ Smith; Arizona State University [489]

979

981

Electron Microscopy and Photocatalytic Studies of 1D TiO2 Nanostructures Synthesized by two different routes; DR Acosta; Universidad Nacional Autonoma De Mexico [491]

983

Strain relaxation in InAs quantum dots and its suppression by indium flushing; H Xie, FA Ponce; School for Engineering of Matter, Transport, and Energy, Arizona State University; R Jakomin,M Pires; Universidade Federal do Rio de Janeiro; P Rodrigo, PL Souza; Pontifical Catholic University of Rio de Janeiro [492]

985

Peculiar Plasmon Peak Position in Electron Energy Loss Spectrum of Hexagonal Boron Nitride/ Graphene Double Layer; NG Cross, L Liu, A Mohsin, G Gu, G Duscher; University of Tennessee, Knoxville [493]

987

Nanostructured Ruthenium Disulfide catalyst high active in the HDS of DBT; CE Ornelas, CC Leyva; CIMAV, Laboratorio Nacional de Nanotecnolog’a Mx; A Aguilar-ElguŽzabal, L Alvarez-Contreras; CIMAV; DM Carrillo; UACJ [494]

989

Template Synthesis of Hollow Carbon Nanofibers; Y Song, J Wei, J Liu; Arizona State Univerasity [495]

991

Atomic Resolution Study of W-Doped VO2 Nanowires; H Asayesh-Ardakani, A Nie; Michigan Technological University; PM Marley; University at Buffalo, State University of New York;Y Zhu; Advanced Membranes and Porous Materials Center, King Abdullah University of Science Technology; PJ Phillips; University of Illinois at Chicago; RF Klie; University of Illinois at Chicago, Chicago; S Banerjee; University at Buffalo, State University of New York, R Shahbazian-Yassar; Michigan Technological University et al [496]

993

Influence of Nonlinear Intensity Attenuation in Bright-Field TEM Images on Tomographic Reconstructions of Micron-Scaled Materials; J Yamasaki, M Mutoh; Osaka University; S Ohta, S Yuasa; JEOL Ltd; S Arai, K Sasaki, N Tanaka; Nagoya University [497]

995

Atomic-Scale Characterization of the Reduction of _-Fe2O3 Nanowires; W Zhu, JP Winterstein; State University of New York at Binghamton; R Sharma; Center for Nanoscale Science and Technology, National Institute of Standards and Technology; G Zhou; State University of New York at Binghamton [498]

997

Atomic Structure of Amorphous 2D Carbon Structures as Revealed by Scanning Transmission Electron Microscopy; J Kotakoski, F Eder, G Argentero, S Hummel, D Lindner, JC Meyer; University of Vienna [499]

P05 Nuclear and Irradiated Materials: Fundamental Defect Properties

111

Using In-Situ TEM to Characterize the Microstructure evolution of Metallic Systems under External Solicitation; D Kaoumi, T Gautier, J Adamson; University of South Carolina; M Kirk; Argonne National Laboratory [56]

113

In-Situ TEM He+ Implantation and Thermal Aging of Nanocrystalline Fe; BR Muntifering,A Dunn; Northwestern University; RP Dingreville; Sandia National Laboratories; J Qu; Northwestern University; KM Hattar; Sandia National Laboratories [57]

115

A New Method for Studying He Damage in Materials Demonstrated on Nanotwinned Cu Nanopillars; Z Wang, F Allen, Z Shan; Center for Advancing Materials Performance from the Nanoscale (CAMP- Nano) Hysitron Applied Research Center in China (HARCC), State Key Laboratory for Mechanical Behavior of Materials, XiÕan Jiaotong University; P Hosemann; University of California, Berkeley [58]

117

In-situ electron microscope observations and analysis of radiation damage in tungsten; X Yi, ML Jenkins; University of Oxford; MA Kirk; Argonne National Laboratory; SG Roberts; University of Oxford [59]

437

TEM with in situ Ion Irradiation of Nuclear Materials: The IVEM-Tandem User Facility; M Li, MA Kirk, PM Baldo, EA Ryan; ANL [219]

439

Effect of Grain Boundary Structure on Defect Absorption and Denuded Zone Formation in Irradiated Nanocrystalline Iron; O El-Atwani, K Hattar, GA Vetterick, ML Taheri; Drexel University [220]

441

Correlative and dynamic in situ S/TEM characterization of heavily irradiated pyrochlores and fluorites; TG Holesinger, S Dey; Los Alamos National Laboratory; JA Aguiar; National Renewable Energy Lab; PA Papin, JA Valdez, Y Wang, BP Uberuaga; Los Alamos National Laboratory,RH Castro; University of California at Davis [221]

443

In situ probing of the evolution of irradiation-induced defects in copper; N Li, K Hattar; Los Alamos National Laboratory; A Misra; University of Michigan [222]

579

Atomic Scale, 3-Dimensional Characterization of Radiation Effects in Tungsten for Fusion Applications; P Edmondson; Oak Ridge National Laboratory; LR Hanna, M Dagan, SG Roberts; University of Oxford; LL Snead; Oak Ridge National Laboratory; AD Xu, GD Smtih, B Gault; University of Oxford et al [290]

581

Clustering and Radiation Induced Segregation in Neutron Irradiated Fe-(3-18)Cr Alloys; M Bachhav, E Marquis; University of Michigan; GR Odette; University of California [291]

583

TEM Analysis of Structure Transformation in Al/Ni Nanomaterials under High Energy Ion Irradiation; S Rouvimov, K Manukyan, CE Shuck, AS Mukasyan; University of Notre Dame [292]

585

TEM Examination of Precipitation Behaviour of M23C6 and Sigma Phases and Dislocations in SS 310S under Creep Deformation at 800¡C; B Shalchi Amirkhiz, S Xu; Natural Resources Canada, CanmetMATERIALS [293]

587

Correlative TEM and APT of Helium Bubbles in Ion-Irradiated RAFM Steel; B Mazumder, C Parish, MK Miller; Oak Ridge National Laboratory [294]

747

Advanced electron microscopy study of fission product distribution in the failed SiC layer of a neutron irradiated TRISO coated particle; H Wen, IJ van Rooyen; Idaho National Laboratory; JD Hunn,TJ Gerczak, CA Baldwin, FC Montgomery; Oak Ridge National Laboratory [374]

749

Post-Irradiation Examinations of Irradiation Creep Tested Zircaloy-2; W Karlsen, M Ivanchenko,U Ehrnsten; VTT Technical Research Centre; KR Anderson; Bechtel Marine Propulsion Corp , Bettis Laboratory [375]

751

Inert Gas Measurement of Single Bubble in CeO2; L He, J Pakarinen, X Bai, J Gan; Idaho National Laboratory; Y Wang; Los Alamos National Laboratory; A El-Azab; Purdue University; TR Allen; Idaho National Laboratory [376]

753

Exploring Helium Mitigation in Ferritic Alloys by Advanced Microscopy; CM Parish, PD Edmondson, FW Meyer, ME Bannister, B Mazumder, MK Miller; ORNL [377]

755

Evolution of Oxide Structures in Friction Stir Welded Alloy MA956; LN Brewer, BW Baker; University of Alabama; MJ Bird; Naval Postgraduate School; S Osswald; Purdue University [378]

757

Structural Effects in Oxide Dispersion Strengthened (ODS) Steel Neutron Irradiated to 3 dpa at 500ûC;A Mairov, J He, K Sridharan; University of Wisconsin-Madison [379]

1331

Defect Microstructure in Irradiated Silicon Carbide; S Kondo; Institute of Advanced Energy, Kyoto University [665]

1333

Short-range atomic ordering in amorphous ion-tracks in pyrochlores; R Sachan, B Liu, D Aidhy,Y Zhang, MF Chisholm; Oak Ridge National Laboratory; WJ Weber; University of Tennessee [666]

1335

TEM Characterization of ion radiation damage in Ca(1-x)La2x/3TiO3 Perovskites; M Danaie,S Pedrazzini, NP Young, PA Bagot; University of Oxford; KR Whittle; University of Sheffield;PD Edmondson; Oak Ridge National Laboratory [667]

1337

Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide; L He, H Jiang,Y Zhai; Department of Materials Science and Engineering, University of Wisconsin-Madison; C Liu;Department of Engineering Physics, University of Wisconsin-Madison; I Szlufarska; Department of Materials Science and Engineering, University of Wisconsin-Madison; B Tyburska-PŸschel,K Sridharan; Department of Engineering Physics, University of Wisconsin-Madison, P Voyles; Department of Materials Science and Engineering, University of Wisconsin-Madison [668]

999

Sample preparation artifacts in nuclear materials and mitigation strategies; A Aitkaliyeva, JW Madden, BD Miller, J Cole, J Gan; Idaho National Laboratory [500]

1001

Microstructural Characterization of Hydrogen Irradiated Austenitic Stainless Steel; H-H Jin, E Ko, J Kwon; Nuclear Material Safety Research Division, Korea Atomic Energy Research Institute [501]

1003

LAMDA: Irradiated-Materials Microscopy at Oak Ridge National Laboratory; CM Parish, K Kumar, PD Edmondson, KG Field, CM Silva, M Williams, K Linton, KJ Leonard; ORNL et al [502]

1005

Analysis of Radiation Damage in Magnesium Aluminate Spinel by Means of Cathodoluminescence; I Jozwik, J Jagielski, G Gawlik, P Jozwik; Institute of Electronic Materials Technology; R Ratajczak; National Centre for Nuclear Research; G Panczer; Institut Lumire Matire ILM, UMR5306 UniversitŽ Lyon 1-CNRS, UniversitŽ de Lyon; N Moncoffre; Institut de Physique NuclŽaire de Lyon IPNL, UniversitŽ de Lyon, UniversitŽ Lyon 1, A Wajler; Institute of Electronic Materials Technology et al [503]

1007

Stability of Precipitates in Zirconium Alloys under Self-ion Irradiation; X Wang, M Zhao, F Zhang; Xiamen University University of Michigan; L Wang; University of Michigan [504]

1009

The evolution of precipitates in high Cu and high Ni RPV weld under long-term thermal ageing; JJ Lim, GM Burke; The University of Manchester; PD Styman; National Nuclear Laboratory; I Maclaren; The University of Glasgow; S Lozano-Perez, CR Grovenor; The University of Oxford; K Wilford; Rolls Royce [505]

1011

Amorphization of Indium Phosphide Single Crystals by Swift Heavy Ion Bombardment; AS Khalil; Tabbin Institute for Metallurgical Studies [506]

1013

In Situ Observation of Single Ion Damage in Electronic Materials; DC Bufford, R Dingreville, K Hattar; Sandia National Laboratories [507]

1015

A Combined Effect of Electron Beam and Stress on Plastic Flow of Amorphous Silica Microparticles;S Bhowmick, D Stauffer, R Major, O Warren, S Asif; Hysitron, Inc [508]

1017

Quantitative Stress Measurements Near Blocked Slip Bands in Austenitic Stainless Steel Using High Resolution Electron Backscatter Diffraction; DC Johnson, MD McMurtrey, GS Was; University of Michigan [509]

1019

Microstructural Changes in a Highly Irradiated ODS Ferritic MA957 Alloy; DJ Edwards, MT Toloczko; Pacific Northwest National Laboratory [510]

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

445

The Role of Computed X-ray Tomography in a Metallurgical Analysis; ND Budiansky, O Van Der Schijff, J Forman; Exponent [223]

447

Characterizing Failure in Commercial Li-Ion Batteries with 4D X-Ray Microscopy; J Gelb, P Shearing; San Jose State University; D Finegan, D Brett; University College London [224]

449

X-Ray Microcomputed Tomography for Analysis of Retrieved Medical Devices; JS Day, DW MacDonald; Exponent, Inc; SM Kurtz; Implant Research Center Drexel University [225]

451

MicroStamping for Improved Speckle Patterns to Enable Digital Image Correlation; AH Cannon,JD Hochhalter; 1900 Engineering; AW Mello; Purdue University; GF Bomarito; NASA Langley Research Center; MD Sangid; Purdue University [226]

589

Metallographic Characterization of Thermal Damage in Boiler Tubes; MP Carroll; Lisin Metallurgical Services [295]

591

Failure Analysis in Support of Deformation Modeling; LA Deibler, E Corona, S Williams; Sandia National Laboratories [2986]

593

Cross-sectioning Sub-millimetre Sized Defects in Ornamental Chrome-plated Component; AJ Lockley; Canadian Nuclear Laboratories [297]

595

Preparing and Etching Titanium to Document Surface Affects; LM Gammon, RR Boyer; IMS [298]

597

Microstructure Enhancement Using Ion Beam Milling; LD Hanke, D Scholz; Materials Evaluation and Engineering, Inc [299]

759

Titanium (Ti) Alloy Electron Beam (EB) Weld Fracture Surface Interpretation; SJ Gentz; NASA NESC [380]

761

Space Shuttle Stiffener Ring Foam Failure Analysis, a Non-conventional Approach; PM Howard; NASA Kennedy Space Center [381]

763

Research Projects and Failure Investigations Conducted Through a Commercial Materials Testing Laboratory; JJ Frafjord; IMR Test Labs [382]

765

Using Visual Communication Elements in Technical Reports; C McNee, A Kueck; Metallurgist; D Christie; Curtiss-Wright Corporation, Ithaca Materials Research [383]

1157

Kink Band Formation in High-strength Bulk Metallic Nanolaminates; TJ Nizolek, NA Mara; University of California Santa Barbara; RJ McCabe; Material Science and Technology Division;JT Avallone; University of California Santa Barbara; IJ Beyerlein; Los Alamos National Laboratory; TM Pollock; University of California Santa Barbara [578]

1159

Nanostructures Formation in Al-B4C Neutron Absorbing Materials after Accelerated Irradiation and Corrosion Tests; F Zhang, JB Wierschke, X Wang, L Wang; University of Michigan [579]

1161

A Study of Glass Composition and Crizzling in Two Claude Laurent Glass Flutes from the Library of Congress; AC Buechele, LB Brostoff, I Muller; The Catholic University of America, Vitreous State Laboratory; CL Ward-Bamford; Library of Congress; X Xie; The Catholic University of America, Vitreous State Laboratory [580]

1163

Characterization of Void-Dominated Ductile Failure in Pure Ta; BG Clark, JR Michael, B McKenzie, J Carroll, H Lim, BL Boyce; Sandia National Laboratories [581]

1165

Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS); D Xia, H Wu, B Goetze, D Ferranti, L Stern, J Notte; Carl Zeiss Microscopy [582]

275

Observation of the potential distribution in GaN-based devices by a scanning electron microscope;T Karumi, S Tanaka; Nagoya University [138]

277

Denickelification and Dezincification of Copper Alloys in Water Environments; J-F Liu, M Esmacher, D Kotwica; GE Power Water, Water Process Technologies [139]

279

Application of EFTEM and XEDS Elemental Mapping to Characterization of Nanometer Devices in Semiconductor Wafer-Foundries; WW Zhao, M Gribelyuk, JD Russell; GLOBALFOUNDRIES [140]

281

Isolating the Photocatalytic Degradation of Methylene Blue Dye on TiO2 Surface; SP Fowler, E Molina, E Rodriguez-Ariza; Portland State University; S Quinton-Cox; Oregon State University; J Jiao; Portland State University [141]

283

Influence of Hydrogen on Fracture Mode API X60 Steel Aged; GG Gonzalez-Mancera,VC Cortes; Universidad Nacional Autonoma De Mexico; MA Alberto; Universidad Autonoma De Mexico [142]

285

Electron energy-loss spectroscopy study of NbOx film for resistive memory applications; J Zhang,K Norris; Hewlett Packard Labs; K Samuels, N Ge, M Zhang; HP Labs; J Park; Stanford University;Z li, RS Williams; HP Labs et al [143]

287

Microscopic Origin of Strength and MicroHardness of Titanium Alloy at Elevated Temperature;M Islam, C Fermin, H Aglan; Tuskegee University [144]

P07 Metallography and Microstructural Characterization of Metals

453

Microstructural Characterization and Image Analysis in Ex-Service Ethylene Pyrolysis Tubes;AC McLeod, CM Bishop; University of Canterbury; KJ Stevens; Quest Integrity NZL Ltd; MV Kral; University of Canterbury [227]

455

MIPARª: 2D and 3D Microstructural Characterization Software Designed for Materials Scientists, by Materials Scientists; JM Sosa, DE Huber, BA Welk, HL Fraser; The Ohio State University [228]

457

Industrial Application of Thixomet Image Analyzer for Quantitative Description of Steel and Alloys Microstructure; AA Kazakov, D Kiselev; St Petersburg State Polytechnical University [229]

459

Quantitative image analysis of white etching areas in SAE52100 bearing steel; PT Pinard, M …zel, M Plo§, S Richter; RWTH Aachen University [230]

599

Characterization of Hot-Compressed Magnesium Alloys in a Scanning Electron Microscope; S Kaboli, H Demers, R Gauvin; McGill University [300]

601

Characterization of a Sub-Grain Boundary Using Accurate Electron Channeling Contrast Imaging;H Mansour, MA Crimp, N Gey, N Maloufi; Laboratoire dÕƒtude des Microstructures et de MŽcanique des MatŽriaux (LEM3), UniversitŽ de Lorraine, [301]

603

3D Crystallographic Imaging Using Laboratory-Based Diffraction Contrast Tomography (DCT);A Merkle, C Holzner, M Feser; Carl Zeiss X-ray Microscopy; S McDonald, P Withers; University of Manchester; W Harris; Carl Zeiss X-ray Microscopy; E Lauridsen, P Reischig; Xnovo Technology ApS et al [302]

605

Characterization of Elastic Strain Field and Geometrically Necessary Dislocation Distribution in Stress Corrosion Cracking of 316 Stainless Steels by Transmission Kikuchi Diffraction; A Vilalta-Clemente, M Meisnar; Department of Materials University of Oxford; S Lozano-Perez; Department of Materials University of Oxford; AJ Wilkinson; Department of Materials University of Oxford [303]

607

Transformation and Deformation Characterization of NiTiHf and NiTiAu High Temperature Shape Memory Alloys; L Casalena, DR Coughlin, F Yang, X Chen; The Ohio State University; RD Noebe; NASA Glenn Research Center; W Yunzhi, PM Anderson, MJ Mills; The Ohio State University et al [304]

767

Failure Analysis to Unambiguously Clarify Hydrogen Fracturing in Steels; M Pohl; Ruhr-UniversitŠt Bochum [384]

769

Developing Mechanistic Understanding of the Effect of Temperature and Environment on the Hold Time Fatigue Behavior of Haynes 282 Alloy; D Ellis, T Hanlon, C Shen, E Hall; GE Global Research [385]

771

Metallography - A Powerful Instrument for Material Characterisation, Material Development and Failure Analysis; M Panzenbšck, F Mendez-Martin, B Rashkova, P SchŸtz; MontanuniversitŠt Leoben, Austria [386]

773

Classifying the Severity of Grain Boundary Corrosion in CoCrMo Biomedical Implants; A Lin, E Hoffman, LD Marks; Northwestern University [387]

1167

Digital Image Correlation of Heterogeneous Deformation in Polycrystalline Material with Electron Backscatter Diffraction; J Esquivel, MD Sangid; Purdue University [583]

1169

Metallographic Preparation of Incoloy 800 Tube Material for EBSD; AJ Lockley; Canadian Nuclear Laboratories [584]

1171

The Atomic Interfacial Structure between _2 and _ Phases within a TiAl Alloy in Lamellar Form;F Liu, G-Z Zhu; Shanghai Jiao Tong University [585]

1173

New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction; MM Nowell, SI Wright, T Rampton; EDAX Inc; RJ Stromberg, S Bhowmick; Hysitron Inc; M Shibata, N Erdman; JEOL USA Inc [586]

1175

Electron Microscopy Analysis of Grain Boundary Corrosion in Ni-Cr Binary Alloys Exposed to High Temperature Hydrogenated Water; MJ Olszta, DK Schreiber, SM Bruemmer; Pacific Northwest National Laboratory [587]

1177

The Effects of Electron Beam Melting on the Microstructure and Mechanical Properties of Ti-6Al- 4V and Gamma-TiAl; T McLouth, Y-W Chang; University of California, Los Angeles; J Wooten; CalRAM Inc; J-M Yang; University of California, Los Angeles [588]

1339

Application of Quantitative Metallography to Cast Nickel-Based Superalloys; A Szczotok, J Cwajna; Silesian University of Technology [669]

1341

Quantitative Nano-Analysis of Superconducting Materials via SEM-FIB 3D EDS Tomography; G Pavia, M Kienle, I Schulmeyer; Carl Zeiss Microscopy GmbH; F Bauer; Oxford Instruments GmbH; M Cantoni; CIME - EPFL; K Lagarec; Fibics Incorporated [670]

1343

Microstructural characterization of alnico 9 alloy; L Zhou, M Miller; Ames Lab; D Cullen; Oak Ridge National Laboratory; P Lu; Sandia National Laboratories; RW McCallum, I Anderson; Ames Lab;S Constantinides; Arnold Magnetic Technologies Corp, MJ Kramer; Ames Lab [671]

1345

Automated Correlative Tomography of an Aluminum 7075 Alloy Spanning Length Scales and Modalities; AP Merkle, L Lechner, L Hunter, J Gelb; Carl Zeiss X-ray Microscopy, Inc; SS Singh, N Chawla; Arizona State University [672]

2267

LOM Characterization of Heat-Resistant Cast Steels for the Lime/Cement Industry; J Asensio, G Vander Voort; The University of Oviedo [1132]

2269

Metallographic Sample Preparation and Characterisation of Oxide Scales on Hot-Rolled Steel Strips;O Elkoca, K Davut; Eregli Iron and Steel Works, Inc [1133]

2271

Mšssbauer Spectroscopy and Transmission Electron Microscopy Analysis of Transition Carbides in Quenched and Partitioned Steel; DT Pierce, DR Coughlin, DL Williamson; Colorado School of Mines; KD Clarke, AJ Clarke; Los Alamos National Laboratory; JG Speer, DK Matlock, E De Moor; Colorado School of Mines [1134]

2273

Measurement of Grain Size Distributions; GF Vander Voort; Consultant - Struers Inc [1135]

2275

Microstructural Stability of Nanostructured Ferritic Alloys (NFA); R Sharghi-Moshtaghin, S Huang, R DiDomizio, L Dial; GE-Global Research Center [1136]

2419

3D Multiscale Characterization of Discontinuities in Underwater Wet Welds; S Paciornik, LF Silva, VR dos Santos; DEQM PUC-Rio; N Chawla; Materials Science and Engineering Arizona State University; T Bernthaler, G Schneider; Materials Research Institute, Aalen University [1208]

2421

EBSD Texture Analysis as a Measure of Local Flow in Friction Stir Welding; D Rowenhorst, K Knipling, R Fonda; The US Naval Research Laboratory [1209]

2423

EBSD Characterization of Microstructural Variations in Solid-State Welds as a Function of Distance from the Weld Interface in Ti-17; J Orsborn, TF Broderick; Center for Electron Microscopy and Analysis, The Ohio State University; HL Fraser; Center for the Accelerated Maturation of Materials, The Ohio State University [1210]

2425

Optimization and Characterization of a Niobium-Platinum Resistance Spot Weld Using Scanning Transmission Electron Microscopy and Micropillar Compression Testing; D Sorensen, E Rosario,J Heffelfinger; Medtronic plc; JS Jeong; University of Minnesota Department of Chemical Engineering and Materials Science; J Myers; University of Minnesota Characterization Facility; J Lippold,A Ramirez; Ohio State University Department of Materials Science and Engineering [1211]

2427

Metallography of Robonaut 2 Battery Spot Welds; JE Martinez, S Yayathi, J Figuered, Z Bilc; NASA Johnson Space Center [1212]

1749

Nonmetallic Inclusions and Acicular Ferrite in Arc Welds of Pipeline Steels; AA Kazakov, DA Lyubochko; St Petersburg State Polytechnical University [873]

1751

Distribution Pattern of Nonmetallic Inclusions on _ Cross Section of Continuous-Cast Steel Billets For Rails; AA Kazakov, AI Zhitenev, PV Kovalev; St Petersburg State Polytechnical University [874]

1753

As-Cast Structure and Metallurgical Inheritance of High Nitrogen Austenitic Stainless Steel;AA Kazakov, EY Kolpishon; St Petersburg State Polytechnical University; AV Shakhmatov, RP Badrak; Weatherford [875]

1755

Research on the Origin of Nonmetallic Inclusions in High-Strength Low-Alloy Steel Using Automated Feature Analysis; AA Kazakov, S Ryaboshuk, D Lyubochko, L Chigintsev; St Petersburg State Polytechnical University [876]

1757

Influence of Additional Annealing on Properties of Ni-Mn-In-Co Heusler Alloy; A Kamantsev, E Dilmieva, A Mashirov, V Koledov, V Shavrov; Kotelnikov Institute of Radio-engineering and Electronics of RAS [877]

1759

A microstructure comparison of Iron borides formed on AISI 1040 and D2 steels; JL Bernal,AI Mart’nez, E Vera; Universidad PolitŽcnica de Pachuca; A Garc’a; Universidad Aut—noma del Estado de Hidalgo; A Medina, L BŽjar, S Borjas; UMSNH, A Juanico; UPVM [878]

1761

Effect of Preheating Temperature on the Microstructural Features of Welded Rail Head;KR Prayakarao, H Aglan; Tuskegee University [879]

1763

Study of precipitation along a concentration gradient; CG Garay-Reyes, I Estrada-Guel; Centro de Investigaci—n en Materiales Avanzados (CIMAV); JL Hern‡ndez-Rivera; Universidad Aut—noma de San Luis Potos’, Instituto de Metalurgia; JM Mendoza-Duarte, E Cuadros-Lugo; Centro de Investigaci—n en Materiales Avanzados (CIMAV); SE Hernandez-Martinez, JJ Cruz-Rivera; Universidad Aut—noma de San Luis Potos’, Instituto de Metalurgia, R Mart’nez-S‡nchez; Centro de Investigaci—n en Materiales Avanzados (CIMAV) [880]

1765

Evolution of microstructure in an Al-Si system modified with the transition element addition and its effect on mechanicals properties; HM Medrano-Prieto, CG Garay-Reyes, CD G—mez-Esparza; Centro de Investigaci—n en Materiales Avanzados (CIMAV); R Mart’nez-S‡nchez; Centro de Investigaci—n en Materiales Avanzados (CIMAV) [881]

1767

Characterization of Microstructural Inhomogeneities in Rolled Microalloyed Steels Based on EBSD Data; NY Zolotorevsky, SN Petrov, SN Panpurin, AA Kazakov, O Pakhomova; St Petersburg State Polytechnical University [882]

1769

Effect of Cu on Hydrogen Permeation for the Low Carbon Steel under Mildly Sour Environments;H Nakamichi, K Baba, D Mizuno, K Yasuda, N Ishikawa; Steel Res Lab , JFE Steel Corp [883]

2107

Comparing Field Emission Electron Microprobe to Traditional EPMA for Analysis of Metallurgical Specimens; DF Susan, RP Grant, JM Rodelas, JR Michael, MC Maguire; Sandia National Laboratories [1052]

2109

Influence of thermo-mechanical treatments on the microstructure and hardness of the Al-2024 alloy; CG Garay-Reyes, L Gonz‡lez-Rodelas, E Cuadros-Lugo, I Estrada-Guel, R Mart’nez-S‡nchez; Centro de Investigaci—n en Materiales Avanzados (CIMAV) [1053]

2111

Development of Quantitative Methods for Estimation of Aluminum Alloys Structure by Means of Image Analysis; AA Kazakov, AA Kur; St Petersburg State Polytechnical University; K St. Petersburg State Polytechnical University [1054]

2113

Microscale torsion test to investigate initial yielding phenomenon of a single crystal copper;T Yokoyama, N Shishido, K Koiwa, S Kamiya, H Sato; Nagoya Institute of Technology; M Omiya; Keio University; T Nokuo, T Suzuki; JEOL Ltd et al [1055]

2115

RIMAPS Studies on Structured Copper Foils; EA Favret, M Flores Zavala; Instituto Nacional de Tecnolog’a Agropecuaria (INTA); P Lšthman; KIST Europe Forschungsgesellschaft GmbH [1056]

2115

Microstructure Evolution of Discontinuous Precipitation and Coarsening of Co Rod-like Precipitates in Supersaturated Cu-Co alloys; NM Suguihiro, G Sol—rzano, EM Saitovitch; Brazilian Center for Research in Physics [1057]

2119

Effect on Microstructure and Hardness of A2024 Aluminum Alloy Doped Cerium Oxide Nanoparticle; FJ Baldenebro-Lopez, JA Baldenebro-Lopez; Facultad de Ingenier’a Mochis, Universidad Aut—noma de Sinaloa; A Santos-Beltr‡n, V Gallegos-Orozco; Universidad Tecnol—gica de Chihuahua Sur;CD Gomez-Esparza; Centro de Investigaci—n en Materiales Avanzados (CIMAV); R Mart’nez- S‡nchez; Centro de Investigaci—n en Materiales Avanzados (CIMAV) [1058]

2121

Characterization of Precipitate Phases in a NiCoAlFeCrTi High Entropy Alloy by Transmission Electron Microscopy; CD G—mez Esparza, FJ Baldenebro L—pez; Centro de Investigaci—n en Materiales Avanzados; JA Baldenebro L—pez, R Corral Higuera; Universidad Aut—noma de Sinaloa; JM Herrera Ram’rez, R Mart’nez S‡nchez; Centro de Investigaci—n en Materiales Avanzados [1059]

2123

Direct Observation of the Strain Aging Effects Using the in-situ Heating and Straining Stage for TEM; S-P Hong, S-I Kim, T-Y Ahn; Seoul National University; C-S Lee; Technical Research Laboratories Plate Research Group, POSCO; Y-W Kim; Seoul National University [1060]

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

119

Convergent-beam electron diffraction study of local structural fluctuations in perovskite-type ferroelectrics; K Tsuda; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University [60]

121

Chemical Bonding Effects in HAADF-STEM Imaging of Light-Element Ceramics; M Odlyzko, J Held, A Mkhoyan; University of Minnesota, Twin Cities [61]

123

Enhancement of Oxygen Contrast in a STEM HAADF Image of Perovskite Oxide SrTiO3 Using Maximum Entropy Method; L Xie, X Pan; Department of Materials Science and Engineering, University of Michigan [62]

125

Cationic ordering and magnetic properties of Re-based double perovskite oxides; S-Y Choi, M Choi,S-D Kim; Korea Institute of Materials Science; HJ Jeen; Pusan National University; Y-M Rhyim; Korea Institute of Materials Science [63]

609

Crystallographic Orientation and Deformation Mechanisms of Laser-processed Directionally Solidified WC-W2C Eutectoids; W-T Chen, EC Dickey; North Carolina State University [305]

611

Staining Block Copolymers using Sequential Infiltration Synthesis for High Contrast Imaging and STEM tomography; T Segal-Peretz, J Winterstein; Institute for Molecular Engineering, University of Chicago; M Biswas; Energy Systems Division, Argonne National Laboratory; JA Liddle; Center for Nanoscale Science and Technology, National Institute of Standards and Technology; JW Elam; Energy SystemsDivision, Argonne National Laboratory; NJ Zaluzec; Electron Microscopy Center, NST Division , Argonne National Laboratory; PF Nealey; Institute for Molecular Engineering, University of Chicago [306]

613

Understanding the Structure-Process-Property Balance in PC/PEI blends by Morphology (using Scanning Transmission Electron Microscopy in Field Emission - Scanning Electron Microscopy) and Correlative Deformation Mechanics; P Bajaj, D Bajaj, C Strom, H Zhou, K Leung; Sabic Innovative plastics [307]

615

A Green Method for Graphite Exfoliation Using High-Energy Ball Milling; I Estrada-Guel, FC Robles- Hernadez, JM Mendoza-Duarte, R PŽrez-Bustamante, R Mart’nez-S‡nchez; CIMAV S C [308]

617

Atomic Resolution STEM-EELS study of transition electronic localization state induced by strain;Y Gao, MA Roldan, J Zhang; Shanghai University; L Qiao, M Chi, D Mandrus; Oak Ridge National Laboratory; X Shen; Chinese Academy of Sciences, G Cao; Oak Ridge National Laboratory et al [309]

775

Wetting and dewetting of ultra-thin Ni films on Si and SiO2 substrates; K van Benthem; University of California, Davis [388]

777

Domain Structure of Bulk and Thin-Film Ferroelectrics By Transmission Kikuchi Diffraction;MJ Burch, DT Harris, CM Fancher, J-P Maria, EC Dickey; North Carolina State University [389]

779

Origin of Ferroelectricity in Thin Film HfO2 Probed by Revolving STEM and PACBED; X Sang, ED Grimley; North Carolina State University; T Schenk, U Schroeder; NaMLab gGmbH/TU Dresden; JM LeBeau; North Carolina State University [390]

781

Role of Interface Structure and Chemistry in Resistive Switching of NiO Nanocrystals on SrTiO3; X Cheng, J Sullaphen; UNSW Australia; M Weyland; Monash University; H Liu; University of Sydney; N Valanoor; UNSW Australia [391]

783

Local Domain Wall Structure in Polycrystalline BiFeO3; A Bencan, G Drazic, H Ursic; Jozef Stefan Institute; N Sakamoto; Shizuoka University; B Jancar; Jozef Stefan Insitute; B Malic; Jotef Stefan Institute; D Damjanovic; Swiss Federal Institute of Technology - EPFL, T Rojac; Jozef Stefan Institute et al [392]

1347

Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In Situ TEM;ML Taheri; Drexel University [673]

1349

Chemical Homogeneity in Entropy-Stabilized Complex Metal Oxides; A Moballegh, C Rost, J-P Maria, E Dickey; NC State University [674]

1351

Microstructure evolution of a Cu and _-Al2O3 composite observed by aberration corrected HAADF- STEM; Z Yu, M Kracum, A Kundu; Lehigh University; HM Chan, MP Harmer; Center for Advanced Materials and Nanotechnology, Department of Materials Science and Engineering [675]

1353

Absence of phase separation in nano-chessboard super-lattices in A-site deficient Ca-stabilized Nd2/3TiO3; D Kepaptsoglou, F Azough, QM Ramasse, B Schaffer; SuperSTEM; R Freer; School of Materials, Materials Science Centre, University of Manchester [676]

1355

Quantitative analysis of a lithium ion battery cathode material with X-ray photoelectron spectroscopy and Auger electron spectroscopy; M Shima, K Tsutsumi, A Tanaka, H Onodera,T Tazawa; JEOL Ltd, [677]

1535

Microscopy and Chemical Analysis of Topological Insulator Bi2Se3 and Topological Crystalline Insulator SnTe Nanostructures; J Cha; Yale University [766]

1537

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS; JA Taillon, K Gaskell; University of Maryland; G Liu, L Feldman; Rutgers University; S Dhar; Auburn University; T Zheleva, A Lelis; US Army Research Laboratory, L Salamanca-Riba; University of Maryland [767]

1539

Hybrid calcium phosphate neuron-like structures under the microscope; V Srot, M Espanol; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy; Z Zhao; Technical University of Catalo; PA van Aken; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy; M-P Ginebra; Technical University of Catalonia [768]

289

Microstructural Properties of Piezoelectric 0.95(Na0.05Bi0.05TiO3)-0.05(BaTiO3) Thin Films on SrTiO3 (1) Substrates; X-W JIN, L LU, S-B MI, C-L JIA; International Center for Dielectric Research, TheSchool of Electronic and Information Engineering [145]

291

TEM Study of Nano Crystals in Li2O-Al2O3-SiO2 Glass-Ceramics; S-C Liou, W-A Chiou; NISP lab, NanoCenter, University of Maryland [146]

293

A New Method to Characterize Non-oxide Thin Film Uniformity at Device Level using Electron Energy Loss Spectroscopy; Z Li, L Chen, J Fang, H Wang, L Hong, X Jiang, Y Zheng; Western Digital Corporation [147]

295

The Influence of pH Buffer as Agent Reaction Moderator in the Growth of CdS/ZnS Films by CBD Technique for Solar Cell Applications; F V‡zquez-Monroy, A Garc’a-Barrientos; Universidad Tecnol—gica Tula-Tepeji; JL Bernal-Ponce; Universidad PolitŽcnica de Pachuca; J Plaza-Castillo; Universidad del Atl‡ntico; H Romero-Trejo; Universidad Aut—noma del Estado de Hidalgo; R Ram’rez-Bon; CINVESTAV-IPN Unidad QuerŽtaro [148]

297

Pressure Effect on the Deposition in the a-Si:H films by PECVD Process for Solar Cell Applications;J Plaza-Castillo, A Garcia-Barrientos; Universidad del Atl‡ntico, Barranquilla; M Moreno-Moreno; INAOE; K Vizca’no; Universidad del Atl‡ntico; JA Hoyo-Monta–o, G Valencia-Palomo; Instituto Tecnol—gico de Hermosillo [149]

299

Direct evidence of basal-bonded MoS2 cluster on Al2O3 support; C Angeles-Chavez, JA Toledo-Antonio, MA Cortes-Jacome; Instituto Mexicano del Petroleo [150]

301

Observations on Orientation Relationships between Rutile and Brookite; MJ Arellano-Jimenez,MT Janish; The University of Texas at San Antonio; WA Rodriguez-Rodriquez; University of Connecticut; BB McKenzie, JR Michael; Sandia National Laboratories; CB Carter; University of Connecticut [151]

303

The Use of Electron Microscopy Techniques to Determine the Oxidation Mechanism SiAlON Ceramics Containing Yb203+Sm203+CaO as Sintering Additives; S Baskut, S Turan; Anadolu University [152]

305

Microstructural Characteristics of (Na0.5K0.5)NbO3 Ceramics with Additives: Transmission Electron Microscopy Study; YH Kim, H Ryu, H-J Lee, Y-K Cho; Korea Research Institute of Standards and Science; S Nahm; Korea University; SJ Ahn; Korea Research Institute of Standards and Science [153]

307

Synthesis of Mesopores of Zirconia by Using CTAC as Template; A Medina, S Borjas, B Quezadas, L BŽjar; Universidad Michoacana de San Nicol‡s de Hidalgo; C Aguilar; Universidad TŽcnica Federico Santa Mar’a; JL Bernal; Universidad PolitŽcnica de Pachuca [154]

309

Effect zirconiaÕs phases in the production of hydroxyapatite; HE Esparza, KA Jurado, A REYES, MC Arag—n; CIMAV [155]

311

ClosingÐLoops Producing Added-Value Products as a Cost-Reduction Strategy in the Operation of Biorefineries; LA Dempere, W Kerstein, E Ten, W Vermerris; University of Florida [156]

313

TEM/HREM observations of thin foils obtained by SEM-FIB for the study of the phase transitions in chromium slag vitrification; S Ballesteros, JM Rinc—n; CETYS Universidad, Campus Tijuana [157]

315

An Improved TEM Sample Preparation Technique for Heavily Deformed Ceramic Materials having Extensive Sub-Surface Cracking; JJ Swab, CV Weiss Brennan; U S Army ResearchLaboratory; SD Walck; TKC Global (contractor) U S Army Research Laboratory; JC LaSalvia; U S Army Research Laboratory; KD Behler; TKC Global (contractor) U S Army Research Laboratory [158]

317

Microtomy on heat-treated electro-spun TiO2 fibers; MJ Arellano-Jimenez, M Janish; The University of Texas at San Antonio; P Kotula; Sandia National Laboratories; W Rodriguez, CB Carter; University of Connecticut [159]

319

From Flat Membranes to Fabrication of Hollow Spun Fibers of Polyethersulfone/Polyvinylpyrillidone (PES/PVP) - Correlative Scanning Electron Microscopy (FE-SEM), 3D X ray Microscopy and Ultrafiltration Properties; P Bajaj, A Berzinis, R Halbfinger, CP Strom; Sabic Innovative Plastics;L Peters; RWTH, Aachen University; M Wessling; RWTH, Aachen; N Kotwal; Carl Zeiss Microscopy, Inc [160]

1021

Sulfidation of Metal Oxide Crystallites: An Ex-Situ TEM Study; CE Kliewer, SL Soled, S Miseo; ExxonMobil Research Engineering [511]

1023

Synthesis and Characterization of LiNbO3 nanofibers; MC Maldonado, JE Sosa, MT Ochoa, F Espinosa; Cimav [512]

1025

ZnO Nanofibers Easily Synthesized by Electrospinning. A New Formula; JE Sosa-Marquez, MC Maldonado-Orozco, FF Espinosa-Maga–a, MT Ochoa-Lara; Centro de Investigaci—n en Materiales Avanzados, S C , Laboratorio Nacional de Nanotecnolog’a [513]

1027

Cr(Al)N/Al2O3 nanocomposite coatings fabricated by differential pumping cosputtering; M Kawasaki, M Nose; JEOL USA Inc; I Onishi; JEOL Ltd; K Matsuda; University of Toyama; M Shiojiri; Kyoto Institute of Technology [514]

1029

Synthesis of Hexagonal Bar Shape of ZnO Particles by Using Hydrothermal Treatment; A Medina, S Borjas, P Mart’nez, L BŽjar; Universidad Michoacana de San Nicol‡s de Hidalgo; C Aguilar; Universidad TŽcnica Federico Santa Mar’a; JL Bernal; Universidad PolitŽcnica de Pachuca [515]

1031

Fe Doped-ZnO Nanofibers Synthesized by Electrospinning; JE Sosa- Marquez, MC Maldonado- Orozco, F Espinosa-Maga–a, MT Ochoa-Lara; Centro de Investigaci—n en Materiales Avanzados, S C , Laboratorio Nacional de Nanotecnolog’a [516]

1033

Chemical and structural characterization of PbS-SiO2 Core-shell structures synthesized by ultrasonic wave-assisted chemical bath deposition; P Moreno-Wong, J Alvarado-Rivera, G Moreno; Departamento de F’sica, Universidad de Sonora; MC Acosta, J Castillo; Departamento de Investigaci—n en F’sica, Universidad de Sonora [517]

1035

Chemical Synthesis and Structural/Analytical Characterization of CuNi-Al2O3 Nanocomposites; MIR Ramos Navarro, GS Solorzano; PUC-RIO (BRAZIL) [518]

1037

Recycled Al reinforced with oxide nanoparticles produced by stir-casting method; A Santos,V Gallegos; Universidad Tecnol—gica de Chihuahua Sur; M Santos, FJ Baldenebro, CD Gomez; Centro de Investigaci—n en Materiales Avanzados (CIMAV); I Ronquillo; Universidad Tecnol—gica de Chihuahua Sur; R Martinez; Centro de Investigaci—n en Materiales Avanzados (CIMAV) [519]

1039

Microstructure and mechanical properties of Al-composites reinforcing with Gr/Ni nanoparticles processed by high-energy ball milling; JM Mendoza-Duarte, R Mart’nez-S‡nchez, C Carre–o-Gallardo, I Estrada-Guel; CIMAV S C [520]

1041

Evaluation of Mechanical Properties of Aluminum Alloy (Al-2024) Reinforced with carbon-coated silver nanoparticles (AgCNP) Metal Matrix composites; C Carre–o-Gallardo, J Mendoza-Duarte; Centro de Investigaci—n en Materiales Avanzados; C L—pez-MelŽndez; Universidad La Salle Chihuahua; I Estrada-Guel, R Mart’nez-S‡nchez; Centro de Investigaci—n en Materiales Avanzados [521]

1043

Synthesis of Ti-Nb-Ta-Zr Alloys Foams by Powder Metallurgy; C Aguilar, A Medina; Universidad TŽcnica Federico Santa Mar’a; L BŽjar; Universidad Michoacana de San Nicol‡s de Hidalgo;D Guzman, S Lascano; Universidad TŽcnica Federico Santa Mar’a; H Carre—n; Universidad Michoacana de San Nicol‡s de Hidalgo; I Alfonso; UNAM, [522]

1045

Synthesis of Ti-Nb-Ta-Mn Alloys by Mechanical Alloying; L BŽjar, A Medina; Universidad Michoacana de San Nicol‡s de Hidalgo; D Guzman, C Aguilar, S Lascano; Universidad TŽcnica Federico Santa Mar’a; H Carre—n; Universidad Michoacana de San Nicol‡s de Hidalgo; I Alfonso; UNAM [523]

1047

Microstructural Investigation of Multi-state Resistive Switching Characteristics in Multi-layered Platinum/Tantalum Oxide using In-situ TEM; S-I Kim, S-P Hong, Y-W Kim; Seoul National University [524]

1049

Generating Large Magnetic Field in a High Resolution Electron Beam Lithography; C Wan, P Guo, Q Zhang; Institute of Physics, Chinese Academy of Sciences, Beijing National Laboratory ofCondensed Matter Physics; A Rudzinski, T Kliem, R Jede; Raith GmbH; X Sun; GermanTech Co, Ltd, X Han; Institute of Physics, Chinese Academy of Sciences, Beijing National Laboratory of Condensed Matter Physics [525]

1051

Densification and Microhardness of Spark Plasma Sintered ZrB2+SiC Nano-Composites; NV Seetala, MT Webb; Grambling State University; LE Matson; Air Force Research Laboratory, Wright-Patterson Air Force Base; H Lee; UES, Inc; CM Carney; Air Force Research Laboratory, Wright-Patterson Air Force Base; TS Key; UES, Inc [526]

1053

Metal/ceramic interface structures and segregation behavior in aluminum-based composites; X Zhang,T Hu, J Rufner; University of California, Davis; T LaGrange, GH Campbell; Lawrence Livermore National Laboratory; EJ Lavernia, JM Schoenung, K van Benthem; University of California, Davis [527]

P09 Microscopy of Additive Manufacturing and 3D Printing in Materials and Biology

127

High Performance Polymers in Additive Manufacturing Processes: Understanding Process, Structure and Property; M Garcia-Leiner, DP Dennies, A Yardimci; Exponent, Inc [64]

129

Micro-scale X-ray Computed Tomography of Additively Manufactured Cellular Materials under Uniaxial Compression; NL Cordes, K Henderson; Los Alamos National Laboratory; JJ Williams; Arizona State University; X Xiao; Advanced Photon Source; MW Robinson; Atomic Weapons Establishment; TA Schaedler; HRL Laboratories, LLC; N Chawla; Arizona State University,BM Patterson; Los Alamos National Laboratory et al [65]

131

Recent Advancements in 3D X-ray Microscopes for Additive Manufacturing; L Lavery, W Harris; Carl Zeiss X-ray Microscopy, Inc; A Merkle; Carl Zeiss X-ray Microscopy [66]

133

Characterization of Grain Structure and Porosity in Selective Laser Melted Cu-4.3Sn for Enhancing Electrical Connector Fabrication; AP Ventura, CA Wade, WZ Misiolek, M Watanabe; Lehigh University; G Pawlikowski; TE Connectivity; M Bayes; TE Conectivity [67]

135

Examination of 3D Manufactured Alloys and Materials for High-performance Drilling and Oilfield Service Tools; JN Williard, S Mukherjee, J Leal; Baker Hughes [68]

461

Novel Materials and Structures Fabricated by Electron Beam Melting; H West, O Harrysson,T Horn; North Carolina State University; D Cormier, R Aman; Rochester Institute of Technology; D Marcellin-Little; North Carolina State University [231]

463

Microstructural Analysis of 3D-Printed Alloy 718; G Bertali, Y Wang, J Lim, F Scenini; The University of Manchester; CJ Long, PD Freyer; Westinghouse Electric Company LLC; G Burke; The University of Manchester [232]

465

Characterization of Nickel Based Superalloys Processed Through Direct Metal Laser Sintering Technique of Additive Manufacturing; Y Idell, C Campbell, L Levine, F Zhang; National Institute of Standards and Technology; G Olson, D Snyder; QuesTek Innovations, LLC [233]

467

Comparison of Additive Manufactured and Conventional 316L Stainless Steels; JJ Lim, LR Malheiros, G Bertali, GM Burke; The University of Manchester; PD Freyer, CJ Long; Westinghouse Electric Company [234]

469

Imaging the Rapid Solidification of Metallic Alloys in the TEM; JD Roehling, A Perron, J-L Fattebert; Lawrence Livermore National Laboratory; DR Coughlin, PJ Gibbs, AJ Clarke; Los Alamos National Laboratory; PE Turchi, JT McKeown; Lawrence Livermore National Laboratory et al [235]

619

Biofabrication of Dynamic, 3-Dimensional, In vitro Models of Disease; RL Goodwin, P-H Chang; University of South Carolina, School of Medicine; RS Jones, KA Harmon, T Perahia, BA Lane, JF Eberth, D Fan; University of South Carolina et al [310]

621

Deposition of Cell-Laden Hydrogels in a Complex Geometry Using A 3D BioPrinter; MJ Yost, SG Dennis; Medical University of South Carolina [311]

623

3D printable in-situ fluorescent microscope; H Osman; Indiana University School of Medicine [312]

P10 Microscopy and Microanalysis for Real World Problem Solving

625

Nanoscale Materials Characterization in Industry: Aerosols Produced from Abraded Composite Restoratives; MI Buckett, A Bogdan, D Japuntich; 3M Company [313]

627

Nanoparticle Safety in the Workplace: Developing a Methodology to Monitor and Remediate Spills;S Rubino, B Lute, I Guo, K Cadieux, BD Gates; Simon Fraser University [314]

629

In-Situ Liquid Cell TEM Observations of Silicate Mineral Dissolution; DN Leonard, R Unocic; Oak Ridge National Laboratory; R Hellmann; UniversitŽ Grenoble Alpes, ISTerre [315]

631

3D FIB SEM imaging of oil filled chalk: What are the challenges?; KN Dalby, RP Harti, HO S¿rensen, SS Stipp; NanoGeoScience Group [316]

633

Cryo-Transmission Electron Microscopy of Sea Spray Aerosols; JP Patterson, NC Gianneschi, KA Prather; University of California San Diego [317]

785

X-Ray Microanalysis of Art Glass Surfaces; RB Simmons; Georgia State University [393]

787

Homogeneity and Sample Preparation from Grams to Microns using NAA, µXRF, and SEM- EDS; AP Lindstrom, JM Davis; National Institute of Standards and Technology Materials Measurement Laboratory; R Zeisler, NW Ritchie, RM Lindstrom; National Institute of Standards and Technology [394]

789

Quantitative Analysis of Sulfur in Polymer Materials; S McKernan, MI Buckett, WG Stratton; 3M [395]

791

Quantification of the boron speciation and Cu oxidation states in alkali borosilicate glasses by electron energy loss spectroscopy; G Yang, S Cheng, C Li; XiÕan Jiaotong University; M Peng; South China University of Technology; Y Yue; Aalborg University [396]

793

Elemental Analysis of Rare-earth Magnet Utilizing Cathodoluminescence; S Imashuku, J Kawai; Kyoto University [397]

1179

Electron Microscopy Investigations on Catalyst Coatings; Y Zhao, L Cirjak; Johnson Matthey Process Technologies, Inc; D Ozkaya; Johnson Matthey Technology Centre [589]

1181

Spatially-Resolved EELS Analysis of Surface Chemistry of Metallic Lithium for the Development of Li- Air Battery; ML Trudeau, R Veillette, P Bouchard, K Zaghib; Hydro-Quebec Research Institute [590]

1183

High Efficiency Chemical State Surface Analysis Imaging with XPS; S Raman, JF Moulder, JS Hammond; Physical Electronics USA, Inc [591]

1185

An analysis of the formation and growth process of the Nanocrystalline Diamond (NCD) particles on various interlayer; D-B Park, C-H Kang, D-H Cha; Precision Analysis Development Lab/Material Analysis Lab [592]

1187

Characterization of the Thickness and Distribution of Latex Coatings on Polyvinylidene Chloride Beads by Backscattered Electron Imaging; CS Todd, DE Beyer; The Dow Chemical Company [593]

1357

Microstructure and Strain Hardening in Tensile-Tested Fe-Mn-Al-Si Steels; DT Pierce, JA JimŽnez; Colorado School of Mines; J Bentley; Microscopy and Microanalytical Sciences; D Raabe; Max- Planck-Institut fŸr Eisenforschung; JE Wittig; Vanderbilt University [678]

1359

Stability and Transformation of Quasicrystalline Phase in Transition Metal Modified Al-(Mn-Fe)- based Alloys; K Stan-Glowinska, L Litynska-Dobrzynska, J Dutkiewicz; Polish Academy of Sciences; MA Gordillo, JM Wiezorek; University of Pittsburgh [679]

1361

An Overview Of How Microscopy Is Employed By the Oregon State Police Forensic Services Division;CM Grover; Oregon State Police Forensic Services Division [680]

1363

Firearm Serial Number Restoration with Electron Backscatter Diffraction; RM White, RR Keller; National Institute of Standards and Technology [681]

1365

New Possibilities of Using Microscopic Techniques in Forensic Field; M Kotrl_; Institute of Criminalistics Prague [682]

1771

Optical and structural properties of rare earths-doped ZnO nanorods synthetized by sonochemical method; G Moreno, R Sanchez, ME Alvarez, EU Leon; Universidad de Sonora [884]

1773

Light Microscopic Analysis for Bone Responses to Implant Surfaces; I-S Yeo, J-H Sim; School of Dentistry and Dental Research Institute, Seoul National University; T-K Kwon; St Catholic Hospital, Catholic University of Korea [885]

1775

SEM and Raman Spectroscopy Applied to Biomass Analysis for Application in the Field of Biofuels and Food Industry; O Samek, A Haronikova, N Vaskovicova, K Hrubanova, J Jezek; Institute of Scientific Instruments of the ASCR; I Marova; Brno University of Technology; V Krzyzanek, P Zemanek; Institute of Scientific Instruments of the ASCR [886]

1777

Addressing Catalytic Material Problems using Automated Feature Analysis; D Pollick, P Nelson; BASF Corporation [887]

1779

Coloration Defects in Industrial-Grade Zirconium Sponge; M Eastman, J Jiao; Portland State University [888]

1781

Synthesis of Mesoporous Zirconia by Using CTAB as Template; SE Borjas Garc’a, A Medina Flores,L BŽjar G—mez; Universidad Michoacana de San Nicol‡s de Hidalgo; C Aguilar; Universidad tŽcnica Federico Santa Mar’a; JL Bernal Ponce; Universidad PolitŽcnica de Pachuca [889]

1783

High Resolution TEM Observation of Nanocrystalline Silicon Fabricated by High Pressure Torsion (HPT); Y Fukushima, K Edalati; Department of Materials Science Engineering, Kyushu University Department of Physics, Arizona State University; Y Ikoma; Department of Materials Science Engineering, Kyushu University; Z Horita; Department of Materials Science Engineering, Kyushu University and WPI-I2CNER; DJ Smith; Department of Physics, Arizona State University [890]

1785

Energy-dispersive x-ray spectrum simulation and emprical observation of 22NM node High-K metal gate structure; I Rezadad, B Prenitzer; University of Central Florida - Physics department; S Schwarz, B Kempshall; NanoSpective, Inc; R Peale; University of Central Florida - Physics Department [891]

1787

Na-induced Structural Unit in _3 [-110]/(-1-11) Grain Boundaries of Si; M Shamsuzzoha; The University of Alabama [892]

1789

Towards a Comprehensive TEM Toolbox for Complex Molecular Fluids; M Gao; Liquid Crystal Institute, Kent State University [893]

1791

In Situ LC-TEM Studies of Corrosion of Metal Thin Films in Aqueous Solutions; JH Park, SW Chee, S Kodambaka; Department of Materials Science and Engineering, University of California Los Angeles; FM Ross; IBM T J Watson Research Center [894]

1793

Multi-modal Microscopy of Almost Nothing Ð Aerogels; EC Humphrey, GA Beer; University of Victoria; A Olin; Triumf/University of Victoria [895]

1795

Studying Mass Transfer in Glasses using Cathodoluminescence; PL McSwiggen, CM MacRae; McSwiggen Associates/JEOL USA, Inc [896]

1797

Structure and electrical property changes of ZnO:Al films, prepared by radio frequency magnetron sputtering, by thermal annealing; Y-Y Chen, P-Y Chen; National Taiwan University; S-L Cheng; National Central University; B-M Huang, J-R Yang; National Taiwan University; M Kawasaki; JEOL USA Inc; M Shiojiri; Kyoto Institute of Technology [897]

1799

Aluminum and Tantalum Doping of Sputtered TiO2 Thin Films; I Goetz, R Liu; Flensburg University of Applied Sciences; R Wuhrer; University of Western Sydney AMC Facility; L Sheppard; University of Western Sydney [898]

1801

Microstructure and dislocation analysis of L10 FePt for HAMR media application; Y Yang, J Hu, KK Cher, SK Wong, YYK Hnin, NC Lim, SL Ng, J Shi; Data Storage Institute, A*STAR (Agency for Science, Technology and Research) [899]

1803

TEM Analysis of Defects in AlGaN Heterostructures Grown on c-Al2O3 by Plasma Assisted Molecular Beam Epitaxy; S Rouvimov, VN Jmerik; University of Notre Dame; DV Nechaev, SV Ivanov; A F Ioffe Physical-Technical Institute [900]

1805

Study of the phase equilibria in the L-alanine Ð sodium nitrate system by optical microscopy and X-ray powder diffraction; D M‡rquez-Ruiz, J Hern‡ndez-Paredes, G Moreno-Corella; Departamento de F’sica, Universidad de Sonora (UNISON); HE Esparza-Ponce; Departamento de F’sica, Centro de Investigaci—n en Materiales Avanzados S C (CIMAV); O Hern‡ndez-Negrete, ME çlvarez-Ramos; Departamento de F’sica, Universidad de Sonora (UNISON) [901]

1807

Microscopy study of morphological and optical changes in ZnO nanostructures induced by pulsed optical excitation; ZM Peterson, RC Word, R Kšnenkamp; Portland State University [902]

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

137

AC-STEM studies of phase transformation and evolution of Li-rich layered cathode materials induced by battery charge-discharge cycling and by electron-beam irradiation; P Lu, P Yan, E Romero, ED Spoerke; Sandia National Laboratories; J-G Zhang, CM Wang; Pacific Northwest National Laboratory [69]

139

Structural Evolution During Electrochemical Cycling of Epitaxial LiCoO2 Films Studied by S/TEM; LA Bendersky, H Tan; National Institute of Standards and Technology [70]

141

Structural and Chemical Evolution of Li and Mn Rich Layered Oxide Cathode and Correlation with Capacity and Voltage Fading; C Wang, P Yan, J-G Zhang; Pacific Northwest National Laboratory [71]

143

Multiscale Structural Architectures of Novel Sulfur Copolymer Composite Cathodes for High-Energy Density Li-S Batteries Studied by Analytical Multimode STEM Imaging and Tomography; VP Oleshko, A Herzing, J Kim, JL Schaefer; National Institute of Standards and Technology; CL Soles; National Institute of Standards and Technoloogy; D-C Pyun, AG Simmonds, J Griebel; University of Arizona et al [72]

145

Structural Characterization of Powders and Thin Films of Layered Li1.2Mn0.55Ni0.15Co0.1O2 Cathode Materials; AC Johnston-Peck, KK Bharathi, S Takeuchi, I Levin, AA Herzing, LA Bendersky; National Institute of Standards and Technology [73]

471

Advanced Electron Microscopy for Energy Related Materials; R Ishikawa, N Shibata, Y Ikuhara; Institute of Engineering Innovation, University of Tokyo [236]

473

charge-discharge cycling induced structural and chemical evolution of Li2MnO3 cathode for Li-ion batteries; P yan; PNNL [237]

475

Lithium Ordering in Next-Generation High-Voltage Lithium-Rich Layered Oxide Cathode Battery Materials; M Behr, M Lowe; The Dow Chemical Company; V The Dow Chemical Company, Z The Dow Chemical Company, L The Dow Chemical Company, L The Dow Chemical Company [238]

477

Comparison of Co3O4 and CoO nanoparticles as anodes for lithium-ion batteries; JC Li, K He; Stony Brook University and Brookhaven National Laboratory; EA Stach, D Su; Brookhaven National Laboratory [239]

635

Towards Atomic Level Understanding of Transition Alumina Phases and Their Phase Transformations; L Kovarik, M Bowden; Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory; D Shi; Pacific Northwest National Laboratory; A Anderson; Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory; J Hu,J Sznayi; Pacific Northwest National Laboratory; JH Kwak; UNIST, CH Peden; Pacific Northwest National Laboratory [318]

637

In situ studies of reaction-driven restructuring of Ni-Co core-shell nanoparticles; CS Bonifacio, HL Xin; University of Pittsburgh; S Carenco; Chemical Science Division, Lawrence Berkeley National Lab;M Salmeron; Lawrence Berkeley National Lab; EA Stach; Center for Functional Nanomaterials; JC Yang; University of Pittsburgh [319]

639

Nano-level Structure-Reactivity Relationships of Ni-NiO Core-shell Co-catalysts on Ta2O5 for Solar Hydrogen Production; Q Liu, L Zhang, PA Crozier; Arizona State University [320]

641

Atomic level element specific investigation of bimetallic structures by Z-contrast imaging; C Akatay, SI Sanchez, SA Bradley; UOP LLC, A Honeywell Company [321]

643

In-situ study of coarsening mechanisms of supported metal particles in reducing gas; S zhang,M Cargnello; University of michigan; CB Murray; University of Pennsylvania; GW Graham, X Pan; University of Michigan [322]

795

Toward 5D Imaging in an In-Situ Environmental TEM; H Xin, L Han, R Lin; Brookhaven National Laboratory [398]

797

In-situ Transmission Electron Microscopy to Probe the Electrochemical Deposition of Nanostructured Materials; J Yang, C Andrei; School of Biomedical Engineering; G Botton; Department of Materials Science and Engineering; L Soleymani; School of Biomedical Engineering [399]

799

Quantitative Structural Analysis of Fuel Cell Catalysts and Carbon Supports by TEM and Cryo-STEM Tomography; E Padgett, N Andrejevic; Cornell University School of Applied and Engineering Physics; Z Liu; General Motors; K Moriyama; Honda Motor Co; R Kukreja; General Motors; Y Jiang, V Elser; Cornell University Department of Physics, DA Muller; Cornell University School of Applied and Engineering Physics [400]

801

A Quasi In Situ HRTEM Study of the Air Stability of (Ni/Co)MoS2 Hydrodesulfurization Catalysts; GM Bremmer, L van Haandel; Leiden University, Leiden Institute of Physics, Huygens-Kamerlingh Onnes Laboratory; EJ Hensen; Eindhoven University of Technology, Schuit Institute of Catalysis;JW Frenken; Leiden University, Leiden Institute of Physics, Huygens-Kamerlingh Onnes Laboratory; PJ Kooyman; Delft University of Technology, ChemE [401]

803

Tracking Ionic Transport and Electrochemical Dynamics in Battery Electrodes Using in situ TEM-EELS; F Wang, W Zhang; Brookhaven National Laboratory; P Gao, K Karki; Brookhaven National Lab [402]

1189

In Situ TEM Studies of Li and Na ion Transport and Li/Na-Induced Phase Transitions in Crystalline Materials; R Shahbazian-Yassar; Michigan Technological University [594]

1191

Electrochemical reactions in an all-solid-state Li-ion battery observed by ex situ and in situ spatially- resolved TEM EELS; K Yamamoto, A Shimoyamada, T Sato, R Yoshida, H Kurobe; Japan Fine Ceramics Center; H Matsumoto; Hitachi High-Technologies Corporation; T Hirayama; Japan Fine Ceramics Center, Y Iriyama; Nagoya University [595]

1193

In Situ Scanning Transmission Electron Microscopy (STEM) of Individual Electrochemical Intercalation Events in Graphite; JJ Lodico, ER White, WA Hubbard, E Garcia, B Parks, B Zutter, BC Regan; University of California, Los Angeles [596]

1195

Can Na+ Transport Faster Than Li+ inside Zn-Sb Intermetallic Nanomaterials?; A Nie, Y Cheng; Michigan Technological University; RF Klie; University of Illinois at Chicago; S Vaddiraju; Texas AM University; R Shahbazian -Yassar; Michigan Technological University [597]

1197

Reaction Mechanism and Kinetic of Graphene Supported Co3O4 Nanocubes with Lithium and Magnesium Studied by in situ TEM; J Wu, L Luo, Q Li, V Dravid; Northwestern University; Q Rao; Shanghai Jiao-Tong University; J Xu; Hangzhou Dianzi University [598]

1367

Progress toward understanding lithiation mechanisms of TiO2 via in-situ TEM; X Pan, SJ Kim; University of California - Irvine; K Zhang, JR Jokisaari; University of Michigan; A Kargar, D Wang; University of California - San Diego; GW Graham; University of Michigan [683]

1369

Revealing Near-Surface to Interior Redox upon Lithiation in Conversion Electrode Materials Using Electron Microscopy; K He, HL Xin, J Li, EA Stach, D Su; Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York, USA [684]

1371

In situ TEM Observation of Lithiation and Sodiation Process of ZnO Nanowire; H Asayesh-Ardakani, A Nie; Michigan Technological University; F Mashayek, RF Klie; University of Illinois at Chicago;R Shahbazian-Yassar; Michigan Technological University [685]

1373

Microstructural Characterization of Air Electrode Architectures in Lithium-Oxygen Batteries; JG Wen,J Lu, DJ Miller, X Luo, H-H Wang, KC Lau, S Vajda, LA Curtiss; Argonne National Laboratory et al [686]

1375

Understanding the Surface Structure of LiMn2O4 Spinel Cathodes with Aberration-Corrected HAADF STEM and EELS; CD Amos, M Roldan; The University of Texas at Austin; M Varela; Oak Ridge National Laboratory; JB Goodenough, PJ Ferreira; The University of Texas at Austin [687]

1541

Exploring Lithium-ion Battery Performance through in situ Characterization; DJ Miller, A Demortiere, L Wang, J Wen, J Lu, K Amine; Argonne National Laboratory [769]

1543

Dynamic Study of Sodiation Process in Single Crystalline _-MnO2 Nanowires; Y Yuan, A Nie, W Yao, R Shahbazian-Yassar; Michigan Technological University [770]

1545

TEM study of heavily twinned Cu3Pt nanoparticles; G Drazic, M Bele, A Pavlisic, P Jovanovic, M Zorko, B Jozinovic, M Gaberscek; National Institute of Chemistry [771]

1547

The Role of Aberration-Corrected STEM in the Characterization of Oxide Cathode Materials;PJ Phillips, DP Abraham; University of Illinois at Chicago; J Bareno; Argonne National Lab; C Kim, T Li, J Cabana, RF Klie; University of Illinois at Chicago [772]

1549

Challenges for ABF-STEM characterization of Li battery materials; B Levin, DA Muller; Cornell University [773]

1929

A Multiple-Technique Approach for Resolving the Surface Structure of Lithium and ManganeseRich Transition Metal Oxides; AK Shukla, Q Ramasse; Energy Storage and Distributed Resources Division, Lawrence Berkeley National Laboratory; C Ophus; National Center of ElectronMicroscopy, Molecular Foundry, Lawrence Berkeley National Laboratory; H Duncan; Kinestral Technologies; G Chen; Energy Storage and Distributed Resources, Lawrence Berkeley National Laboratory [963]

1931

Structure of Ru/Pt nanocomposite films fabricated by plasma-enhanced atomic layer depositions; M Kawasaki, C-N Hsiao; JEOL USA Inc; J-R Yang; National Taiwan University; M Shiojiri; Kyoto Institute of Technology [964]

1933

Microstructural and Chemical Analysis of HgCdTe/CdTe/ZnTe/Si (211) for Infrared Detectors; M Vaghayenegar, BL VanMil; Arizona State University; S Simingalam, Y Chen; Army Research Laboratory; DJ Smith; Arizona State University [965]

1935

Beam effects during in situ potential cycling and imaging of sulfuric acid and platinum electrodes;TH Brintlinger, C Love, O Baturina; U S Naval Research Laboratory [966]

1937

A study in the formation of Li7La3Zr2O12 as a Garnet-Type Ionic Conductor Synthesized by Flame Combustion; JM Roller, Y Wang; FEI Company; R Maric; University of Connecticut [967]

2277

ALCHEMI Studies of Spinel Oxides for SOFC Interconnect Alloy Coatings; LV Gambino, NJ Magdefrau, M Aindow; University of Connecticut [1137]

2279

Linking Microstructure and Local Chemistry in Cu(In,Ga)Se2 Thin-Film Solar Cells; E Simsek, QM Ramasse; Max Planck Institute for Intelligent Systems, Stuttgart Center for ElectronMicroscopy; D Abou-Ras, R Mainz, A Weber; Helmholtz Zentrum Berlin; HJ Kleebe; Technische UniversitŠt Darmstadt, Institute fŸr Angewandte Geowissenschaften; PA van Aken; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy [1138]

2281

Identical Location Aberration Corrected TEM Study on the Degradation Mechanism of Platinum Nanoparticles on Carbon Nanotubes in High Temperature Fuel Cells; S Rasouli, MR Berber; the University of Texas at Austin; IH Hafez, T Fujigaya, N Nakashima; Kyushu University; PJ Ferreira; the University of Texas at Austin [1139]

2283

Atomic-resolution STEM-EDS mapping of grain boundary solute segregation in yttria-stabilized zirconia; B Feng, A kumamoto; Institute of Engineering Innovation, The University of Tokyo;N Lugg; Institute of Engineering Innovation The University of Tokyo; N Shibata, Y Ikuhara; Institute of Engineering Innovation, The University of Tokyo [1140]

2429

Phase Transformations and Surface/Interface Properties in Functional Perovskites with Aberration-Corrected STEM/EELS; JH Jang, R Mishra; Oak Ridge NationalLaboratory; Y-M Kim; Korea Basic Science Institure; Q He; Oak Ridge National Laboratory; L, Y, B; 1 Bethel Valley Rd [1213]

2431

In-Situ Liquid Cell TEM Studies of Electrochemical reactions in Lithium-ion Batteries; W Zhang, DH Alsem; Brookhaven National Lab; N Salmon; Hummingbird Scientific; F Wang; Brookhaven National Lab [1214]

2433

Controlled Electrochemical Li Cycling in a TEM to Observe Li Morphology Evolution; KL Jungjohann, KL Harrison, AJ Leenheer, NT Hahn, KR Zavadil; Sandia National Laboratories [1215]

2435

Estimation of Nanoscale Current Density Distributions during Electrodeposition; NM Schneider, JH Park; University of Pennsylvania; S Kodambaka; University of California Los Angeles; H Bau; University of Pennsylvania; F Ross; IBM T J Watson Research Center [1216]

2437

In situ Electrochemical TEM for Quantitative Nanoscale Imaging Dynamics of Solid Electrolyte Interphase and Lithium Electrodeposition; RL Sacci, JM Black, N Balke, NJ Dudney, KL More, RR Unocic; Oak Ridge National Laboratory [1217]

321

Surface coating effect on Si Nanowires Anode for Lithium Ion Batteries; L Luo, P Yan; Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory; J-G Zhang; Energy and Environmental Directorate, Pacific Northwest National Laboratory; C Ban; National Renewable Energy Laboratory; C Wang; Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory [161]

323

EELS Investigations of Aging Mechanisms in LiFePO4 Cathodes Resulting From Prolonged Electrochemical Cycling; SA Channagiri, FJ Scheltens, NA Warner, M Canova,Y Guezennec, DW Mccomb; The Ohio State University [162]

325

Contrasting Reaction Modality between Electrochemical Sodiation and Lithiation in NiO Conversion Electrode Materials; K He, F Lin, EA Stach; Brookhaven National Laboratory; Y Mo; University of Maryland; HL Xin, D Su; Brookhaven National Laboratory [163]

327

STEM-HAADF Imaging Study of Spinel Cubic Li4Ti5O12 Nanocrystals; XS Sun, K Sun, B Cui; University of Waterloo [164]

329

Dynamic Observation of Tunnel-driven Lithiation Process in Single Crystalline _-MnO2 Nanowires; Y Yuan, A Nie, G Odegard; Michigan Technological University; K He; Shandong University; D Zhou;Argonne National Laboratory; S Santhanagopalan, D Meng; University of Texas at Arlington, R Klie;University of Illinois at Chicago et al [165]

331

EELS Analysis Of Lithiation/Delithiation Reactions In LiFePO4; J Schneider-Haefner, D Su; Rutgers University; Y Wang; Binghamton University; J Fang, F Omenya; Binghamton; N Chernova; Binghamton University; F Cosandey; Rutgers University [166]

333

Atomic Observation of Phase Transformation from Spinel to Rock Salt in Lithium Manganese Oxide;P Gao, R Ishikawa, E Tochigi, A Kumamoto, N Shibata, Y Ikuhara; The University of Tokyo [167]

335

Microscopic Characterization of Electrodeposited Mg Layers for Battery Application; M Bachhav,P-W Chu, E Nelson, A Crowe, B Bartlett; University of Michigan; N Hahn, K Zavadil; Sandia National Laboratories, E Marquis; University of Michigan [168]

1055

Preliminary Investigations of Chemical Morphological Inhomogeneities in La0.6 Sr0.4CoO3-Single-Crystalline Perovskite Thin Films by ACTEM and STEM-EELS; B …gŸt, ML Machala, AL Koh,R Sinclair, WC Chueh; Stanford University [528]

1057

Low Dose Electron Microscopy of Interlayer Expanded Molybdenum Disulfide Nanocomposites;HA Calderon, Y Liang; Departamento de F’sica, ESFM-IPN; H Deog Yoo, Y Li; University of Houston; FC Hernandez; University of Houston, Houston; C Kisielowski; Lawrence Berkeley National Laboratory; Y Yao; University of Houston, [529]

1059

Structure evolution of Mo2C catalysts upon exposure to oxygen; JT Held, M Sullivan, A Bhan, A Mkhoyan; University of Minnesota [530]

1061

TEM and EDX studies on the structural and compositional evolution of PtNi3 concave nanocubes; L Zhang, C Wang; Brookhaven National Laboratory; J Fang; State University of New York at Binghamton, [531]

1063

Machine-Learning Aided Evolution Studies of Nano-composite Electrodes and Nano-particle Catalysts for Fuel Cell Applications; D Rossouw, LE Chinchilla, S Prabhudev; McMaster University; T Trefz,N Kremliakova; Automobile Fuel Cell Cooperation; GA Botton; McMaster University [532]

1067

Atomic-scale characterization of restructured PtCu Nanocubes; CS Bonifacio, J Shan; University of Pittsburgh; FF Tao; University of Kansas; JC Yang; University of Pittsburgh [533]

1069

Characterization of core/shell bi-metallic cube-shaped nanoparticles with scanning transmission electron microscopy; DH Anjum, A Samal, MA Roldan-Gutierrez; King Abdullah University of Science Technology (KAUST) [534]

1071

Crystal Plane Effect of CeO2 in Metal-CeO2 Nanocatalysts for CO Oxidation; R Wang; Youngstown State University [535]

1809

TEM Characterization of a Mg2Si0.5Sn0.5 Solid Solution for High-Performance Thermoelectrics; M Song, J-W Liu, M Takeguchi, N Tsujii, Y Isoda; National Institute for Materials Science [903]

1811

Real-time Observation of Electrochemical Sodiation of Co3O4/CNTs by in-situ Transmission Electron Microscopy; Q Li, J Wu, VP Dravid; EPIC/NUANCE, Northwestern University [904]

1813

In Situ TEM Characterization of Nanostructured Dielectrics; M-S Hsiao, Y Yuan, C Grabowski; Materials and Manufacturing Directorate, Air Force Research Laboratory; A Nie, R Shabazian-Yassar; Michigan Technological University; LF Drummy; Materials and Manufacturing Directorate, Air Force Research Laboratory [905]

1815

Preparation of Electron and X-Ray Transparent Inorganic Particles for Analytical Microscopy Using the Ultramicrotome; M Homer, F El Gabaly; Sandia National Laboratories; H Gnaegi; Diatome Ltd; DB Robinson, JD Sugar; Sandia National Laboratories [906]

1817

Development of TEM techniques dedicated for characterization of energy related composites and its application; T Yaguchi, K Tamura, T Kubo, M Kondo; Hitachi High-Technologies Corp; T Shimizu, T Kamino; Japan Automobile Research Institute [907]

1819

Investigation of Li ion and Multivalent Battery Systems using In Situ TEM and High Resolution EELS; A Mukherjee, H Asayesh Ardakani, PJ Phillips; University Of Illinois At Chicago; RS Yassar; Michigan Technological University; RF Klie; University Of Illinois At Chicago [908]

1821

Phase Transformation of Molybdenum Carbide in Carburization of MoS2 Studied by in-situ Environmental TEM; J Chen, Q Wei; National Institute for Nanotechnology (NINT), NationalResearch Council Canada; J Chen; CanmetENERGY-Devon, Natural Resources Canada[909]

1823

Real Structure and Structural Changes of Functional Tellurides; L Kienle, T Dankwort; Institute for Material Science; J Kšnig, M Winkler; Fraunhofer IPM; A Hansen, C Koch; Anorganische Chemie; J Ditto, DC Johnson; Department of Chemistry and Materials Science Institute et al [910]

2125

Controlled radiolytic synthesis in the fluid stage. Towards understanding the effect of the electron beam in liquids; P Abellan, LR Parent; SuperSTEM laboratory; TH Moser; Michigan Technological University; C Park; Florida State University; N Al Hasan, I Arslan, JE Evans, ND Browning; Pacific Northwest National Laboratory et al [1061]

2127

Development of Quantitative STEM for a Conventional S/TEM and Real-Time Current Calibration for Performing QSTEM with a Cold Field Emission Gun; SD House, L Li; University of Pittsburgh; CT Schamp, R Henry; Hitachi High Technologies America, Inc; D Su, E Stach; Brookhaven National Laboratory; JC Yang; University of Pittsburgh [1062]

2129

High-Speed analysis of Pt based alloys at high spatial resolution using EELS; P Longo, RD Twesten; Gatan, Inc; M Bugnet, S Prabhudev, GA Botton; McMaster University [1063]

2131

Verifying the Structure and Composition of Prepared Porous Catalytic Supports; MT Paul, X Zhang, B Yee, BD Gates; Simon Fraser University [1064]

2133

A Correlative Study of HRTEM, HAADF-STEM, and STEM-EELS Spectrum Imaging for Biphasic Electrochemically Active TiO2; CW Han, V Etacheri; School of Materials Engineering, Purdue University; CN Hong, VG Pol; School of Chemical Engineering, Purdue University; V Ortalan;School of Materials Engineering, Purdue University [1065]

2135

Interface Sharpness in Amorphous Multilayer Heterostructures and their Effect on Quantum Confinement; S Aloni, AM Thron, A Schwartzberg; Molecular Foundry, Lawrence Berkeley National Laboratory [1066]

2137

Influence of Device Microstructure on The Optical Properties of Ge1-ySny (y = 0-0.11) LEDs Produced by Next Generation Deposition Methods; JD Gallagher, T Aoki, P Sims, J Menendez, J Kouvetakis; Arizona State University [1067]

2139

Inter-Diffusion Characterization of SnOx /CuOx Grown on Cu Foil; G Eng, G Baty, M Hughes,Z Chen; Center for Electron Microscopy and Nanofabrication, Portland State University [1068]

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

1551

Artefacts Induced on Soft Layer of Hybrid Metallic Nanoparticles in TEM; H Qian, L Laurentius;National Institute for Nanotechnology; RF Egerton; University of Alberta [774]

1553

Serial block face SEM and TEM imaging for quantitative measurement of cellular uptake of semiconductor quantum dot nanoparticles; N Hondow, MR Brown; University of Leeds; T Starborg; University of Manchester; AG Monteith; Gatan UK; R Brydson; University of Leeds; HD Summers, P Rees; Swansea University, A Brown;University of Leeds [775]

1555

Thickness mapping of freestanding Ionic Liquid films using Electron Energy Loss Spectroscopy in the TEM; AE Ribbe, P Kim, D Hoagland, T Russell; University of Massachusetts Amherst [776]

1557

PSRT: Progressive Stochastic Reconstruction Technique for Cryo Electron Tomography; B Turonova, L Marsalek, T Davidovic, P Slusallek; Saarland University [777]

1559

First Results of Integrating a Compression/Tension Load Cell with Nano-scale X-ray Transmission Microscopy; NL Cordes, K Henderson; Los Alamos National Laboratory; B Hornberger; Carl Zeiss X-ray Microscopy Inc; BM Patterson; Los Alamos National Laboratory [778]

1561

Non-local Prior Modeling for Tomographic Reconstruction of Bright Field Transmission Electron Microscopy Images; S Sreehari, SV Venkatakrishnan; Purdue University; JP Simmons, LF Drummy; Air Force Research Laboratory; CA Bouman; Purdue University [779]

2285

Designer Nanoparticle-Liposome Hybrid Capsules for Drug Delivery; JA Zasadzinski, N Forbes, JE Shin, MO Ogunyankin; University of Minnesota [1141]

2287

Observations of in vivo Processing of Metal Oxide Nanoparticles by Analytical TEM/STEM;UM Graham, AK Dozier; University of Kentucky; G Oberdoerster; University of Rochester Medical Center; C Wang; NIOSH; MT Tseng; University of Louisville; JE Fernback, EM Birch; NIOSH,BH Davis; University of Kentucky [1142]

2289

Surprising high iron enrichment in hard dental tissues of rodents; V Srot, U Salzberger, B Bussmann; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy; B Pokorny; ERICo Velenje, Ecological Research and Industrial Cooperation; Environmental Protection College; I Jelenko; ERICo Velenje, Ecological Research and Industrial Cooperation; PA van Aken; Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy [1143]

2291

Revealing the Internal Structure and Local Chemistry of Nanocrystals Grown in Hydrogel with Cryo-FIB Lift-Out and Cryo-STEM; MJ Zachman, E Asenath-Smith, LA Estroff, LF Kourkoutis; Cornell University [1144]

2293

Chemical Imaging of Interfaces and in Interphases in Tooth Enamel; LM Gordon, MJ Cohen, D Joester; Northwestern University [1145]

2439

Understanding the Role of Additives in Improving the Performance of Bulk Heterojunction Organic Solar Cells; W Chen, SB Darling; Materials Science Division, Argonne National Laboratory Institute for Molecular Engineering, the University of Chicago [1218]

2441

Low Dose Electron Microscopy of ZnSÐBipy based Hybrid OrganicÐInorganic Materials for Energy Applications; HA Calderon, S Ramirez-Grave; ESFM-IPN; A Galano; UAM-Iztapalapa;C Kisielowski; Molecular Foundry and JCAP, LBNL; R Gomez; UAM-Iztapalapa, [1219]

2443

Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy; LG Melo, GA Botton, AP Hitchcock; McMaster University [1220]

2445

Observing the Self-assembly of Metal-Organic Frameworks by In-Situ Liquid Cell TEM; JP Patterson, P Abellan; University of California, San Diego; MS Denny; University of California, San Diego;C Park; Florida State University; ND Browning; Pacific Northwest National Laboratory; SM Cohen; University of California, San Diego; JE Evans; Pacific Northwest National Laboratory,NC Gianneschi; University of California, San Diego [1221]

1825

In Situ Electrochemical Deposition of Poly(3,4-ethylenedioxythiophene) (PEDOT); J Liu, B Wei, J Sloppy, L Ouyang, C Ni, D Martin; University of Delaware [911]

1827

Cryo-STEM Reveals Humidity-Controlled Shape Change in Silica Nanoparticles; KA Spoth, Y Sun, U Wiesner, LF Kourkoutis; Cornell University [912]

1829

Direct Conversion Biogas to Multiwall Carbon Nanotubes and Syngas over Starch Derived Ni@C Nanoparticles; Q Yan, I-W Chu; Department of Agricultural and Biological Engineering, Mississippi State University; A Lawrence; Institute for Imaging and Analytical Technologies, Mississippi State University [913]

1831

The Biomineral-Cell Interface in the Sea Urchin Embryo; IY Chang, D Joester; Northwestern University [914]

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists Forum: Emerging New Specialized Techniques for Correlative Microscopy

1377

Optimizing Workflows in Correlative Light and Electron Microscopy; K Czymmek, J Caplan; Carl Zeiss Microscopy; C Warner, J Sherrier; University of Delaware; A Elli; Carl Zeiss Microscopy [688]

1379

Correlative Light and Electron Microscopy (CLEM) on Biological Samples Using Immuno Electron Microscopy; J Klumperman, CT ten Brink, VM Oorschot; University Medical Center Utrecht [689]

1381

Correlative Microscopy using Serial Blockface Scanning EM; TJ Deerinck, E Bushong, M Ellisman; NCMIR/UCSD [690]

1563

A Modern Correlative Workflow Environment to Master the Multi-scale Challenge; AP Merkle, L Lechner, A Steinbach; Carl Zeiss X-ray Microscopy, Inc [780]

1565

Cryo-Correlative Light and Electron Microscopy (Cryo-CLEM): Specimen Workflow Paths and Recent Instrument Developments; M Schwertner, D Stacey; Linkam Scientific Instruments Limited [781]

1567

Correlative Array Tomography - from 2D towards 3D; AF Elli, R Kirmse; Carl Zeiss Microscopy GmbH; JL Caplan, CA Warner, J Sherrier; University of Delaware; K Czymmek; Carl Zeiss Microscopy LLC [782]

1569

Micro Computed Tomographic X-ray Imaging (Micro CT): A Versatile and Non-Destructive Method for Biological Specimens; JC Williams; Indiana University School of Medicine [783]

X31 TechnologistsÕ Forum: Safety in the Microscopy Laboratory

1199

TechnologistsÕ Forum: Safety in the Microscopy Laboratory; BE Maleeff, EA Ellis; GlaxoSmithKline [599] Roundtable Discussion [602]

X40 Physical Sciences Tutorial: ABF STEM - Direct and Robust Atomic- resolution Imaging of Light Elements in Crystalline Materials Tutorial

1939

Annular Bright Field Scanning Transmission Electron Microscopy Ð Direct and Robust Atomic- Resolution Imaging of Light Elements in Crystalline Materials; SD Findlay; Monash University [968]

X41 Physical Sciences Tutorial: In situ Liquid S/TEM: Practical Aspects, Challenges, and Opportunities

2295

In situ Liquid S/TEM: Practical Aspects, Challenges, and Opportunities; RR Unocic; Oak Ridge National Laboratory [1146]

X42 Biological Sciences Tutorial: Maximizing the Likelihood of Successful Maximum Likelihood Classification

1201

Large-Scale 3D Heterogeneity Analysis of CryoEM Data Using Likelihood-Based Classification in Frealign; D Oliveira dos Passos, D Lyunkis; The Salk Institute [600]

X43 BioTutorial - Advances in Light Sheet Microscopy

1571

Optimization of the Excitation Light Sheet in Selective Plane Illumination Microscopy; L Gao; Stony Brook University [784]

X44 Bio Tutorial - Optimizing Specimen Preparation for Macromolecular Electron Microscopy

1383

Improving Our Vision of Nanobiology; DF Kelly; Virginia Tech Carilion School of Medicine and Research Institute [691]

X90 Microscopy in the Classroom

479

The Evolution of Project NANO: A Program that Enables Students to Explore in Real Time Several Crosscutting Concepts of the Next Generation Science Standards; SL Cady, M Blok; PNNL; K Grosse; Lake Oswego High School; J Wells; Portland State University [240]

481

Electron Microscopy Education Outreach for Secondary and Professional Education; G Baty, B Miner; Portland State University; E Koehler; Saturday Academy; Z Chen; Portland State University [241]

645

FEI and National Geographic STEM Outreach - Mysteries of the Unseen World; J Williams; FEI [323]

647

Using Microscopy for Authentic Science Teaching: A Learning Sciences Perspective; M Storksdieck; Oregon State University [324]

1073

Democratizing the Micro-Scale: A Simplified, Miniaturized SEM for K-12 and Informal Student Scientists; L Own, S Whitmer; The Evergreen School; CS Own; Voxa; L Own; HiveBio [536]